CN107153090B - 质量分析方法及感应耦合等离子体质量分析装置 - Google Patents

质量分析方法及感应耦合等离子体质量分析装置 Download PDF

Info

Publication number
CN107153090B
CN107153090B CN201710121183.6A CN201710121183A CN107153090B CN 107153090 B CN107153090 B CN 107153090B CN 201710121183 A CN201710121183 A CN 201710121183A CN 107153090 B CN107153090 B CN 107153090B
Authority
CN
China
Prior art keywords
mass
ion
charge ratio
sample
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710121183.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN107153090A (zh
Inventor
谷口理
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN107153090A publication Critical patent/CN107153090A/zh
Application granted granted Critical
Publication of CN107153090B publication Critical patent/CN107153090B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201710121183.6A 2016-03-04 2017-03-02 质量分析方法及感应耦合等离子体质量分析装置 Active CN107153090B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016042885A JP6642125B2 (ja) 2016-03-04 2016-03-04 質量分析方法及び誘導結合プラズマ質量分析装置
JP2016-042885 2016-03-04

Publications (2)

Publication Number Publication Date
CN107153090A CN107153090A (zh) 2017-09-12
CN107153090B true CN107153090B (zh) 2019-12-03

Family

ID=59724333

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710121183.6A Active CN107153090B (zh) 2016-03-04 2017-03-02 质量分析方法及感应耦合等离子体质量分析装置

Country Status (3)

Country Link
US (1) US9865443B2 (https=)
JP (1) JP6642125B2 (https=)
CN (1) CN107153090B (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6971141B2 (ja) * 2017-12-15 2021-11-24 アジレント・テクノロジーズ・インクAgilent Technologies, Inc. プラズマイオン源を用いた質量分析
JP6954143B2 (ja) * 2018-01-18 2021-10-27 株式会社島津製作所 クロマトグラフ質量分析装置
JP6973123B2 (ja) * 2018-01-26 2021-11-24 株式会社島津製作所 分析制御装置、分析装置、分析制御方法および分析方法
EP3805748A4 (en) * 2018-05-30 2021-06-23 Shimadzu Corporation Spectral data processing device and analysis device
JP7450443B2 (ja) * 2020-04-01 2024-03-15 東京応化工業株式会社 金属成分の分析方法
JP2025516038A (ja) 2022-04-27 2025-05-26 エレメンタル・サイエンティフィック・インコーポレイテッド マルチデータ処理スイッチングによるナノ粒子ベースライン及び検出閾値の決定
US12085497B1 (en) 2023-04-12 2024-09-10 Elemental Scientific, Inc. Nanoparticle analysis for ultra-low level concentrations of nanoparticles in fluid samples
JPWO2024262074A1 (https=) 2023-06-20 2024-12-26
CN118961858B (zh) * 2024-06-14 2025-03-25 山东英盛生物技术有限公司 一种干血斑中多种元素的检测方法
WO2026034062A1 (ja) * 2024-08-05 2026-02-12 株式会社島津製作所 質量分析装置および表示方法
CN118604106B (zh) * 2024-08-08 2024-11-26 江苏第三代半导体研究院有限公司 基于测试设备的元素浓度测试方法及电子设备

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104246488A (zh) * 2012-04-12 2014-12-24 株式会社岛津制作所 质量分析装置
CN104781659A (zh) * 2012-11-09 2015-07-15 株式会社岛津制作所 质量分析装置和质量校正方法
CN105190303A (zh) * 2013-04-22 2015-12-23 株式会社岛津制作所 成像质量分析数据处理方法及成像质量分析装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000100374A (ja) 1998-09-24 2000-04-07 Shimadzu Corp Ｉｃｐ−ｍｓ分析装置
JP3701133B2 (ja) * 1999-02-01 2005-09-28 株式会社日立製作所 質量分析装置及び分析値の自動診断方法
JP2001133439A (ja) * 1999-11-09 2001-05-18 Jeol Ltd 高周波誘導結合プラズマ質量分析方法及び装置
JP2001324476A (ja) * 2000-05-15 2001-11-22 Murata Mfg Co Ltd 誘導結合プラズマ質量分析方法
JP4163534B2 (ja) * 2002-04-01 2008-10-08 日本電子株式会社 質量スペクトルの解析方法および装置
EP2576811A1 (en) * 2010-06-02 2013-04-10 Johns Hopkins University System and methods for determining drug resistance in microorganisms
GB2561998A (en) * 2012-10-10 2018-10-31 California Inst Of Techn Mass spectrometer, system comprising the same, and methods for determining isotopic anatomy of compounds
JP6345934B2 (ja) * 2013-12-27 2018-06-20 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． 質量分析メソッドの自動生成方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104246488A (zh) * 2012-04-12 2014-12-24 株式会社岛津制作所 质量分析装置
CN104781659A (zh) * 2012-11-09 2015-07-15 株式会社岛津制作所 质量分析装置和质量校正方法
CN105190303A (zh) * 2013-04-22 2015-12-23 株式会社岛津制作所 成像质量分析数据处理方法及成像质量分析装置

Also Published As

Publication number Publication date
JP2017156332A (ja) 2017-09-07
JP6642125B2 (ja) 2020-02-05
US9865443B2 (en) 2018-01-09
US20170256388A1 (en) 2017-09-07
CN107153090A (zh) 2017-09-12

Similar Documents

Publication Publication Date Title
CN107153090B (zh) 质量分析方法及感应耦合等离子体质量分析装置
JP7409462B2 (ja) クロマトグラム表示装置
CN104422684B (zh) 发射光谱中的背景校正
JPH10508386A (ja) 元素質量分析計において干渉を減少させる方法
US9711339B2 (en) Method to generate data acquisition method of mass spectrometry
US10699890B2 (en) Determination of isobaric interferences in a mass spectrometer
JP2011033346A (ja) クロマトグラフ質量分析データ解析方法及び装置
CN108139356A (zh) 用于定性分析的质谱分析数据处理装置
US8145438B2 (en) Method for quantitating substance to be measured
US12474309B2 (en) Waveform analytical method and waveform analytical device
JP5757264B2 (ja) クロマトグラフ質量分析データ処理装置
Olive et al. A protocol for the determination of the rare earth elements at picomole level in rocks by ICP‐MS: Results on geological reference materials USGS PCC‐1 and DTS‐1
JP2018504600A (ja) 干渉検出および着目ピークのデコンボルーション
JP3663140B2 (ja) 質量分析方法および質量分析装置
JP5993259B2 (ja) 質量分析システム
US8134121B2 (en) Chromatographic mass spectrometer
CN115516302B (zh) 色谱质量分析数据处理方法、色谱质量分析装置以及色谱质量分析数据处理用程序
US6765200B2 (en) Mass spectrometry and mass spetrometer using the same
JP6505268B1 (ja) 質量分析装置及び質量分析方法
EP3968355B1 (en) Method of control of a mass spectrometer
CN115605749B (zh) 色谱质量分析数据处理方法、色谱质量分析装置及色谱质量分析数据处理用程序
WO2025192658A1 (ja) 質量分析結果の評価方法および装置
JP4999995B1 (ja) 解析装置、解析方法、及びプログラム
CN116930302A (zh) 一种四（三氟膦）镍中镍稳定同位素丰度质谱分析方法
JP2019128334A (ja) 分析制御装置、分析装置、分析制御方法および分析方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant