CN104242934A - 带冗余位全异步sar adc亚稳态消除电路与方法 - Google Patents
带冗余位全异步sar adc亚稳态消除电路与方法 Download PDFInfo
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Cited By (7)
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CN105991138A (zh) * | 2015-01-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991140A (zh) * | 2015-01-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991139A (zh) * | 2015-01-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
US9755657B2 (en) | 2015-09-24 | 2017-09-05 | Samsung Electronics Co., Ltd. | Successive approximation register analog-to-digital converter and semiconductor device including the same |
CN109428595A (zh) * | 2017-08-21 | 2019-03-05 | 瑞昱半导体股份有限公司 | 连续逼近式模拟至数字转换的校正装置 |
US10623011B2 (en) | 2018-06-20 | 2020-04-14 | Nuvoton Technology Corporation | Successive approximation analog-to-digital converter and calibration method thereof |
WO2020173225A1 (zh) * | 2019-02-26 | 2020-09-03 | 中国电子科技集团公司第二十四研究所 | 用于sar_adc的高速数字逻辑电路及采样调节方法 |
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Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105991138A (zh) * | 2015-01-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991140A (zh) * | 2015-01-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991139A (zh) * | 2015-01-30 | 2016-10-05 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991139B (zh) * | 2015-01-30 | 2019-05-28 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991138B (zh) * | 2015-01-30 | 2019-07-02 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
CN105991140B (zh) * | 2015-01-30 | 2019-08-27 | 中芯国际集成电路制造(上海)有限公司 | 异步逐次逼近型模数转换电路 |
US9755657B2 (en) | 2015-09-24 | 2017-09-05 | Samsung Electronics Co., Ltd. | Successive approximation register analog-to-digital converter and semiconductor device including the same |
CN109428595A (zh) * | 2017-08-21 | 2019-03-05 | 瑞昱半导体股份有限公司 | 连续逼近式模拟至数字转换的校正装置 |
US10623011B2 (en) | 2018-06-20 | 2020-04-14 | Nuvoton Technology Corporation | Successive approximation analog-to-digital converter and calibration method thereof |
WO2020173225A1 (zh) * | 2019-02-26 | 2020-09-03 | 中国电子科技集团公司第二十四研究所 | 用于sar_adc的高速数字逻辑电路及采样调节方法 |
US11728820B2 (en) | 2019-02-26 | 2023-08-15 | No.24 Research Institute Of China Electronics Technology Group Corporation | High-speed digital logic circuit for SAR_ADC and sampling adjustment method |
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Denomination of invention: Circuit and method for eliminating metastable state of full-asynchronism SAR ADC with redundancy bits Effective date of registration: 20190311 Granted publication date: 20171229 Pledgee: Agricultural Bank of China Limited by Share Ltd Chengdu Shuangliu Branch Pledgor: Chengdu Rui core micro Polytron Technologies Inc Registration number: 2019510000025 |
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