CN104134645B - 一种封装导线材料结构及其加工方法 - Google Patents
一种封装导线材料结构及其加工方法 Download PDFInfo
- Publication number
- CN104134645B CN104134645B CN201410303386.3A CN201410303386A CN104134645B CN 104134645 B CN104134645 B CN 104134645B CN 201410303386 A CN201410303386 A CN 201410303386A CN 104134645 B CN104134645 B CN 104134645B
- Authority
- CN
- China
- Prior art keywords
- tungsten
- gold
- rod
- microns
- conductive wire
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000463 material Substances 0.000 title claims abstract description 18
- 238000004806 packaging method and process Methods 0.000 title claims abstract description 18
- 238000003672 processing method Methods 0.000 title claims abstract description 7
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical group [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims abstract description 60
- 229910052721 tungsten Inorganic materials 0.000 claims abstract description 55
- 239000010937 tungsten Substances 0.000 claims abstract description 55
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 19
- 229910052737 gold Inorganic materials 0.000 claims abstract description 16
- 239000010931 gold Substances 0.000 claims abstract description 16
- 238000005245 sintering Methods 0.000 claims abstract description 14
- 238000005242 forging Methods 0.000 claims abstract description 8
- 238000007747 plating Methods 0.000 claims abstract description 5
- 238000005491 wire drawing Methods 0.000 claims abstract description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 4
- 239000013078 crystal Substances 0.000 claims abstract description 4
- 239000001257 hydrogen Substances 0.000 claims abstract description 4
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 4
- 239000013528 metallic particle Substances 0.000 claims abstract description 4
- 238000000465 moulding Methods 0.000 claims abstract description 4
- 238000003825 pressing Methods 0.000 claims description 3
- 239000003870 refractory metal Substances 0.000 claims description 3
- 229910001220 stainless steel Inorganic materials 0.000 claims description 3
- 239000010935 stainless steel Substances 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract description 13
- 229910052802 copper Inorganic materials 0.000 abstract description 13
- 239000010949 copper Substances 0.000 abstract description 13
- 239000011248 coating agent Substances 0.000 abstract description 8
- 238000000576 coating method Methods 0.000 abstract description 8
- 238000001816 cooling Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 244000247747 Coptis groenlandica Species 0.000 description 4
- 235000002991 Coptis groenlandica Nutrition 0.000 description 4
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000010009 beating Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 241000784726 Lycaena thetis Species 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 208000029091 Refraction disease Diseases 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000004430 ametropia Effects 0.000 description 1
- 230000003064 anti-oxidating effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 230000035800 maturation Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 208000014733 refractive error Diseases 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45163—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
- H01L2224/45184—Tungsten (W) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/4554—Coating
- H01L2224/45565—Single coating layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/4554—Coating
- H01L2224/45599—Material
- H01L2224/456—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45644—Gold (Au) as principal constituent
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Processing (AREA)
- Powder Metallurgy (AREA)
Abstract
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410303386.3A CN104134645B (zh) | 2014-06-30 | 2014-06-30 | 一种封装导线材料结构及其加工方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410303386.3A CN104134645B (zh) | 2014-06-30 | 2014-06-30 | 一种封装导线材料结构及其加工方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104134645A CN104134645A (zh) | 2014-11-05 |
CN104134645B true CN104134645B (zh) | 2017-06-27 |
Family
ID=51807274
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410303386.3A Active CN104134645B (zh) | 2014-06-30 | 2014-06-30 | 一种封装导线材料结构及其加工方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN104134645B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115074794B (zh) * | 2022-05-13 | 2023-06-30 | 重庆材料研究院有限公司 | 一种气体探测器用镀金钨丝的制备方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101521187A (zh) * | 2008-02-28 | 2009-09-02 | 爱特梅尔公司 | 具有顶部及底部侧电连接的晶片级集成电路封装 |
CN201975388U (zh) * | 2010-12-15 | 2011-09-14 | 广州佳博金丝科技有限公司 | 防氧化铜基键合丝 |
CN102324392A (zh) * | 2011-10-19 | 2012-01-18 | 广东佳博电子科技有限公司 | 一种防氧化的铜基键合丝的制备工艺 |
TW201347060A (zh) * | 2012-02-27 | 2013-11-16 | Nippon Micrometal Corp | 功率半導體裝置及其製造方法、以及接合線 |
CN204130521U (zh) * | 2014-06-30 | 2015-01-28 | 厦门润晶光电有限公司 | 一种封装导线材料结构 |
-
2014
- 2014-06-30 CN CN201410303386.3A patent/CN104134645B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101521187A (zh) * | 2008-02-28 | 2009-09-02 | 爱特梅尔公司 | 具有顶部及底部侧电连接的晶片级集成电路封装 |
CN201975388U (zh) * | 2010-12-15 | 2011-09-14 | 广州佳博金丝科技有限公司 | 防氧化铜基键合丝 |
CN102324392A (zh) * | 2011-10-19 | 2012-01-18 | 广东佳博电子科技有限公司 | 一种防氧化的铜基键合丝的制备工艺 |
TW201347060A (zh) * | 2012-02-27 | 2013-11-16 | Nippon Micrometal Corp | 功率半導體裝置及其製造方法、以及接合線 |
CN204130521U (zh) * | 2014-06-30 | 2015-01-28 | 厦门润晶光电有限公司 | 一种封装导线材料结构 |
Also Published As
Publication number | Publication date |
---|---|
CN104134645A (zh) | 2014-11-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103474408B (zh) | 一种表面有镀金层的金银合金键合丝及其制备方法 | |
CN201975388U (zh) | 防氧化铜基键合丝 | |
CN109628793A (zh) | 一种铜镀钯镀镍再镀金键合丝及其制备方法 | |
CN104388861B (zh) | 一种多晶串联led用微细银金合金键合线的制造方法 | |
CN106011516B (zh) | 一种掺杂金合金键合丝及其深冷处理制备方法 | |
CN103194637A (zh) | 一种键合合金银丝及制备方法 | |
CN102324392B (zh) | 一种防氧化的铜基键合丝的制备工艺 | |
CN103219246B (zh) | 一种镀钯镀银的双镀层键合铜丝的制造方法 | |
CN103199073A (zh) | 银钯合金单晶键合丝及其制造方法 | |
CN103219249B (zh) | 一种镀钯镀金的双镀层键合铜丝的制造方法 | |
CN104134645B (zh) | 一种封装导线材料结构及其加工方法 | |
CN201435388Y (zh) | 一种用于mosfet封装的引线框架 | |
CN103219312B (zh) | 一种镀钯镀金的双镀层键合铜丝 | |
CN204130521U (zh) | 一种封装导线材料结构 | |
CN101170152A (zh) | Led大功率管晶片散热方法 | |
CN109449087A (zh) | 一种铜镀钯再镀镍键合丝及其制备方法 | |
CN110284023B (zh) | 一种铜合金键合丝及其制备方法和应用 | |
CN102222658A (zh) | 多圈排列ic芯片封装件及其生产方法 | |
CN104810462B (zh) | 一种中大功率led驱动芯片的esop8引线框架 | |
CN207637785U (zh) | 新型高频微波大功率限幅器焊接组装结构 | |
CN106244844A (zh) | 一种半导体用的铜线及其制备方法 | |
CN103996668A (zh) | 银镧钙合金键合丝及其制造方法 | |
CN109055800A (zh) | 一种键合金线及其制备方法 | |
CN103219247B (zh) | 一种镀银键合铜丝的制造方法 | |
CN103219311B (zh) | 一种镀钯镀银的双镀层键合铜丝 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information |
Address after: 361000 Fujian, Xiamen torch hi tech Zone (Xiangan) Industrial Zone, Yue Yue Road, No. 4, building No. 1, layer 1 Applicant after: SUNPHIRE Opt-tronic Co., Ltd. Address before: 361000 Fujian, Xiamen torch hi tech Zone (Xiangan) Industrial Zone, Yue Yue Road, No. 4, building No. 1, layer 1 Applicant before: XIAMEN CRYSTAL EMBELLISH PHOTOELECTRIC CO., LTD. |
|
COR | Change of bibliographic data | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
PP01 | Preservation of patent right | ||
PP01 | Preservation of patent right |
Effective date of registration: 20181109 Granted publication date: 20170627 |
|
PD01 | Discharge of preservation of patent | ||
PD01 | Discharge of preservation of patent |
Date of cancellation: 20211109 Granted publication date: 20170627 |
|
PP01 | Preservation of patent right | ||
PP01 | Preservation of patent right |
Effective date of registration: 20211109 Granted publication date: 20170627 |