CN104054175B - 具有绝缘层和二级层的层叠芯片组及其形成方法 - Google Patents

具有绝缘层和二级层的层叠芯片组及其形成方法 Download PDF

Info

Publication number
CN104054175B
CN104054175B CN201280067053.4A CN201280067053A CN104054175B CN 104054175 B CN104054175 B CN 104054175B CN 201280067053 A CN201280067053 A CN 201280067053A CN 104054175 B CN104054175 B CN 104054175B
Authority
CN
China
Prior art keywords
insulating barrier
layer
circuit layer
silicon
semiconductor layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201280067053.4A
Other languages
English (en)
Chinese (zh)
Other versions
CN104054175A (zh
Inventor
C·左
C·尹
S-J·朴
C·S·罗
M·F·维伦茨
J·金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of CN104054175A publication Critical patent/CN104054175A/zh
Application granted granted Critical
Publication of CN104054175B publication Critical patent/CN104054175B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D88/00Three-dimensional [3D] integrated devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Thin Film Transistor (AREA)
  • Micromachines (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Laminated Bodies (AREA)
CN201280067053.4A 2011-11-16 2012-11-16 具有绝缘层和二级层的层叠芯片组及其形成方法 Active CN104054175B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161560471P 2011-11-16 2011-11-16
US61/560,471 2011-11-16
US13/356,717 2012-01-24
US13/356,717 US9496255B2 (en) 2011-11-16 2012-01-24 Stacked CMOS chipset having an insulating layer and a secondary layer and method of forming same
PCT/US2012/065644 WO2013075007A1 (en) 2011-11-16 2012-11-16 Stacked chipset having an insulating layer and a secondary layer and method of forming same

Publications (2)

Publication Number Publication Date
CN104054175A CN104054175A (zh) 2014-09-17
CN104054175B true CN104054175B (zh) 2018-03-06

Family

ID=48280458

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280067053.4A Active CN104054175B (zh) 2011-11-16 2012-11-16 具有绝缘层和二级层的层叠芯片组及其形成方法

Country Status (7)

Country Link
US (1) US9496255B2 (enExample)
EP (1) EP2780942A1 (enExample)
JP (2) JP5937225B2 (enExample)
KR (2) KR20140100526A (enExample)
CN (1) CN104054175B (enExample)
IN (1) IN2014MN01027A (enExample)
WO (1) WO2013075007A1 (enExample)

Families Citing this family (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104058363B (zh) * 2013-03-22 2016-01-20 上海丽恒光微电子科技有限公司 基于mems透射光阀的显示装置及其形成方法
US9418985B2 (en) * 2013-07-16 2016-08-16 Qualcomm Incorporated Complete system-on-chip (SOC) using monolithic three dimensional (3D) integrated circuit (IC) (3DIC) technology
US9032353B2 (en) 2013-10-10 2015-05-12 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for three-dimensional layout design of integrated circuit elements in stacked CMOS
US9257407B2 (en) * 2013-10-28 2016-02-09 Qualcomm Incorporated Heterogeneous channel material integration into wafer
US9443758B2 (en) 2013-12-11 2016-09-13 Taiwan Semiconductor Manufacturing Co., Ltd. Connecting techniques for stacked CMOS devices
WO2015112308A1 (en) 2014-01-23 2015-07-30 Sunedison Semiconductor Limited High resistivity soi wafers and a method of manufacturing thereof
US9786613B2 (en) * 2014-08-07 2017-10-10 Qualcomm Incorporated EMI shield for high frequency layer transferred devices
US20160043108A1 (en) * 2014-08-07 2016-02-11 Silanna Semiconductor U.S.A., Inc. Semiconductor Structure with Multiple Active Layers in an SOI Wafer
US9899499B2 (en) 2014-09-04 2018-02-20 Sunedison Semiconductor Limited (Uen201334164H) High resistivity silicon-on-insulator wafer manufacturing method for reducing substrate loss
WO2016081367A1 (en) 2014-11-18 2016-05-26 Sunedison Semiconductor Limited HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE TRAPPING LAYER FORMED BY He-N2 CO-IMPLANTATION
JP6726180B2 (ja) 2014-11-18 2020-07-22 グローバルウェーハズ カンパニー リミテッドGlobalWafers Co.,Ltd. 高抵抗率半導体・オン・インシュレータウエハおよび製造方法
WO2016081363A1 (en) * 2014-11-18 2016-05-26 Sunedison Semiconductor Limited A system-on-chip on a semiconductor-on-insulator wafer and a method of manufacturing
EP3221884B1 (en) 2014-11-18 2022-06-01 GlobalWafers Co., Ltd. High resistivity semiconductor-on-insulator wafers with charge trapping layers and method of manufacturing thereof
US10283402B2 (en) 2015-03-03 2019-05-07 Globalwafers Co., Ltd. Method of depositing charge trapping polycrystalline silicon films on silicon substrates with controllable film stress
US9881832B2 (en) 2015-03-17 2018-01-30 Sunedison Semiconductor Limited (Uen201334164H) Handle substrate for use in manufacture of semiconductor-on-insulator structure and method of manufacturing thereof
US10290533B2 (en) 2015-03-17 2019-05-14 Globalwafers Co., Ltd. Thermally stable charge trapping layer for use in manufacture of semiconductor-on-insulator structures
JP6533309B2 (ja) 2015-06-01 2019-06-19 サンエディソン・セミコンダクター・リミテッドSunEdison Semiconductor Limited 多層構造体の製造方法
JP6592534B2 (ja) 2015-06-01 2019-10-16 サンエディソン・セミコンダクター・リミテッドSunEdison Semiconductor Limited 多層構造体及びその製造方法
US20160379943A1 (en) * 2015-06-25 2016-12-29 Skyworks Solutions, Inc. Method and apparatus for high performance passive-active circuit integration
WO2017019676A1 (en) * 2015-07-28 2017-02-02 Skyworks Solutions, Inc. Integrated passive device on soi substrate
US9768109B2 (en) * 2015-09-22 2017-09-19 Qualcomm Incorporated Integrated circuits (ICS) on a glass substrate
JP6585978B2 (ja) 2015-09-24 2019-10-02 ラピスセミコンダクタ株式会社 半導体装置および半導体装置の製造方法
JP6749394B2 (ja) 2015-11-20 2020-09-02 グローバルウェーハズ カンパニー リミテッドGlobalWafers Co.,Ltd. 滑らかな半導体表面の製造方法
US10256863B2 (en) * 2016-01-11 2019-04-09 Qualcomm Incorporated Monolithic integration of antenna switch and diplexer
US10468294B2 (en) 2016-02-19 2019-11-05 Globalwafers Co., Ltd. High resistivity silicon-on-insulator substrate comprising a charge trapping layer formed on a substrate with a rough surface
US9831115B2 (en) 2016-02-19 2017-11-28 Sunedison Semiconductor Limited (Uen201334164H) Process flow for manufacturing semiconductor on insulator structures in parallel
US10622247B2 (en) 2016-02-19 2020-04-14 Globalwafers Co., Ltd. Semiconductor on insulator structure comprising a buried high resistivity layer
US10573550B2 (en) 2016-03-07 2020-02-25 Globalwafers Co., Ltd. Semiconductor on insulator structure comprising a plasma oxide layer and method of manufacture thereof
US11114332B2 (en) 2016-03-07 2021-09-07 Globalwafers Co., Ltd. Semiconductor on insulator structure comprising a plasma nitride layer and method of manufacture thereof
EP3758050A1 (en) 2016-03-07 2020-12-30 GlobalWafers Co., Ltd. Semiconductor on insulator structure comprising a low temperature flowable oxide layer and method of manufacture thereof
WO2017155804A1 (en) 2016-03-07 2017-09-14 Sunedison Semiconductor Limited Method of manufacturing a semiconductor on insulator structure by a pressurized bond treatment
CN116314384A (zh) 2016-06-08 2023-06-23 环球晶圆股份有限公司 具有经改进的机械强度的高电阻率单晶硅锭及晶片
US10269617B2 (en) 2016-06-22 2019-04-23 Globalwafers Co., Ltd. High resistivity silicon-on-insulator substrate comprising an isolation region
US20180068886A1 (en) * 2016-09-02 2018-03-08 Qualcomm Incorporated Porous semiconductor layer transfer for an integrated circuit structure
US9812580B1 (en) * 2016-09-06 2017-11-07 Qualcomm Incorporated Deep trench active device with backside body contact
WO2018080772A1 (en) 2016-10-26 2018-05-03 Sunedison Semiconductor Limited High resistivity silicon-on-insulator substrate having enhanced charge trapping efficiency
EP4009361B1 (en) 2016-12-05 2025-02-19 GlobalWafers Co., Ltd. High resistivity silicon-on-insulator structure
KR102306730B1 (ko) 2016-12-28 2021-09-30 썬에디슨 세미컨덕터 리미티드 고유 게터링 및 게이트 산화물 무결성 수율을 갖도록 규소 웨이퍼들을 처리하는 방법
JP6881066B2 (ja) * 2017-06-19 2021-06-02 大日本印刷株式会社 貫通電極基板および貫通電極基板の製造方法
EP3993018B1 (en) 2017-07-14 2024-09-11 Sunedison Semiconductor Limited Method of manufacture of a semiconductor on insulator structure
EP3785293B1 (en) 2018-04-27 2023-06-07 GlobalWafers Co., Ltd. Light assisted platelet formation facilitating layer transfer from a semiconductor donor substrate
JP2019212729A (ja) * 2018-06-04 2019-12-12 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
JP7123182B2 (ja) 2018-06-08 2022-08-22 グローバルウェーハズ カンパニー リミテッド シリコン箔層の移転方法
EP3675168A1 (en) * 2018-12-24 2020-07-01 IMEC vzw 3d power semiconductor device and system
FR3091004B1 (fr) * 2018-12-24 2020-12-04 Soitec Silicon On Insulator Structure de type semi-conducteur pour applications digitales et radiofréquences
JP2020141090A (ja) * 2019-03-01 2020-09-03 ソニーセミコンダクタソリューションズ株式会社 容量素子、半導体素子基板及び電子機器
KR102804065B1 (ko) 2020-07-13 2025-05-09 삼성전자주식회사 반도체 패키지 및 반도체 패키지의 제조 방법
CN114122134B (zh) * 2020-09-01 2023-12-22 苏州华太电子技术股份有限公司 一种射频ldmos集成器件
DE102022211198A1 (de) * 2022-10-21 2024-05-02 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Herstellung eines mikromechanischen Bauelements

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6399997B1 (en) * 2000-08-01 2002-06-04 Megic Corporation High performance system-on-chip using post passivation process and glass substrates

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001102523A (ja) 1999-09-28 2001-04-13 Sony Corp 薄膜デバイスおよびその製造方法
TW548860B (en) 2001-06-20 2003-08-21 Semiconductor Energy Lab Light emitting device and method of manufacturing the same
JP4244120B2 (ja) 2001-06-20 2009-03-25 株式会社半導体エネルギー研究所 発光装置及びその作製方法
AU2003255254A1 (en) 2002-08-08 2004-02-25 Glenn J. Leedy Vertical system integration
JP2004165269A (ja) 2002-11-11 2004-06-10 Canon Inc 積層形半導体装置
JP2004349513A (ja) 2003-05-22 2004-12-09 Seiko Epson Corp 薄膜回路装置及びその製造方法、並びに電気光学装置、電子機器
CN101048868B (zh) * 2004-08-20 2010-06-09 佐伊科比株式会社 具有三维层叠结构的半导体器件的制造方法
US7179719B2 (en) 2004-09-28 2007-02-20 Sharp Laboratories Of America, Inc. System and method for hydrogen exfoliation
US20070207592A1 (en) 2006-03-03 2007-09-06 Lu James J Wafer bonding of damascene-patterned metal/adhesive redistribution layers
US7408798B2 (en) 2006-03-31 2008-08-05 International Business Machines Corporation 3-dimensional integrated circuit architecture, structure and method for fabrication thereof
US20080128901A1 (en) * 2006-11-30 2008-06-05 Peter Zurcher Micro-electro-mechanical systems device and integrated circuit device integrated in a three-dimensional semiconductor structure
US20080149832A1 (en) * 2006-12-20 2008-06-26 Miguel Zorn Scanning Probe Microscope, Nanomanipulator with Nanospool, Motor, nucleotide cassette and Gaming application
JP2009067098A (ja) 2007-09-10 2009-04-02 Harison Toshiba Lighting Corp 照明装置
JP2009267098A (ja) * 2008-04-25 2009-11-12 Denso Corp 半導体装置及びその製造方法
US7943428B2 (en) * 2008-12-24 2011-05-17 International Business Machines Corporation Bonded semiconductor substrate including a cooling mechanism
US7943423B2 (en) 2009-03-10 2011-05-17 Infineon Technologies Ag Reconfigured wafer alignment
US9406561B2 (en) 2009-04-20 2016-08-02 International Business Machines Corporation Three dimensional integrated circuit integration using dielectric bonding first and through via formation last
JP2011029609A (ja) * 2009-06-26 2011-02-10 Semiconductor Energy Lab Co Ltd Soi基板の作製方法およびsoi基板
US9076664B2 (en) * 2011-10-07 2015-07-07 Freescale Semiconductor, Inc. Stacked semiconductor die with continuous conductive vias

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6399997B1 (en) * 2000-08-01 2002-06-04 Megic Corporation High performance system-on-chip using post passivation process and glass substrates

Also Published As

Publication number Publication date
US9496255B2 (en) 2016-11-15
CN104054175A (zh) 2014-09-17
KR101759689B1 (ko) 2017-07-19
KR20160044591A (ko) 2016-04-25
IN2014MN01027A (enExample) 2015-05-01
JP6099794B2 (ja) 2017-03-22
JP5937225B2 (ja) 2016-06-22
EP2780942A1 (en) 2014-09-24
KR20140100526A (ko) 2014-08-14
US20130120951A1 (en) 2013-05-16
JP2016174170A (ja) 2016-09-29
WO2013075007A1 (en) 2013-05-23
JP2015503228A (ja) 2015-01-29

Similar Documents

Publication Publication Date Title
CN104054175B (zh) 具有绝缘层和二级层的层叠芯片组及其形成方法
CN110088891B (zh) 利用双面处理的逻辑电路块布局
JP6232124B2 (ja) 相補型金属酸化膜半導体(cmos)超音波振動子およびその形成方法
US7663196B2 (en) Integrated passive device and method of fabrication
US11309352B2 (en) Integrated acoustic filter on complementary metal oxide semiconductor (CMOS) die
KR102257709B1 (ko) 디바이스 기판들과 결합되는 매립된 미세 전자기계 구조들을 형성하는 방법들 및 그에 의해 형성되는 구조들
JP6203934B2 (ja) 誘電体基板上への複製回路および変成器の統合
CN107709225B (zh) 集成mems结构与互连和过孔
KR102675753B1 (ko) 후면 실리사이드화에 의한 벌크 층 전사 프로세싱
KR20160061959A (ko) 매립 수직 커패시터들을 형성하는 방법들 및 그에 의해 형성되는 구조들
CN1884038B (zh) 半导体复合装置及其制造方法
US8872289B2 (en) Micro-electro-mechanical system (MEMS) structures and design structures
US12016247B2 (en) Package comprising an integrated passive device configured as a cap for a filter
CA3073721C (en) Bulk layer transfer processing with backside silicidation

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant