CN103918005B - 具有能量敏感探测的差分相位对比成像 - Google Patents

具有能量敏感探测的差分相位对比成像 Download PDF

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Publication number
CN103918005B
CN103918005B CN201280053647.XA CN201280053647A CN103918005B CN 103918005 B CN103918005 B CN 103918005B CN 201280053647 A CN201280053647 A CN 201280053647A CN 103918005 B CN103918005 B CN 103918005B
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China
Prior art keywords
pixel
phase
gradient value
phase gradient
energy level
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Expired - Fee Related
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CN201280053647.XA
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English (en)
Chinese (zh)
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CN103918005A (zh
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T·克勒
J-P·施洛姆卡
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • G06T7/0014—Biomedical image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T12/00—Tomographic reconstruction from projections
    • G06T12/10—Image preprocessing, e.g. calibration, positioning of sources or scatter correction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/408—Dual energy

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Pulmonology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201280053647.XA 2011-08-31 2012-08-08 具有能量敏感探测的差分相位对比成像 Expired - Fee Related CN103918005B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161529450P 2011-08-31 2011-08-31
US61/529,450 2011-08-31
PCT/IB2012/054032 WO2013030698A1 (en) 2011-08-31 2012-08-08 Differential phase contrast imaging with energy sensitive detection

Publications (2)

Publication Number Publication Date
CN103918005A CN103918005A (zh) 2014-07-09
CN103918005B true CN103918005B (zh) 2017-06-09

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US (1) US9430832B2 (enExample)
EP (1) EP2761586B1 (enExample)
JP (1) JP6105586B2 (enExample)
CN (1) CN103918005B (enExample)
IN (1) IN2014CN01546A (enExample)
RU (1) RU2598310C2 (enExample)
WO (1) WO2013030698A1 (enExample)

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US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN112638261B (zh) 2018-09-04 2025-06-27 斯格瑞公司 利用滤波的x射线荧光的系统和方法
CN112823280B (zh) 2018-09-07 2024-11-05 斯格瑞公司 用于深度可选x射线分析的系统和方法
WO2021046059A1 (en) 2019-09-03 2021-03-11 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
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US11686692B2 (en) 2020-12-07 2023-06-27 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
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DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
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Publication number Publication date
IN2014CN01546A (enExample) 2015-05-08
JP6105586B2 (ja) 2017-03-29
JP2014525304A (ja) 2014-09-29
WO2013030698A1 (en) 2013-03-07
RU2014111826A (ru) 2015-10-10
US20140205057A1 (en) 2014-07-24
CN103918005A (zh) 2014-07-09
EP2761586B1 (en) 2022-10-12
US9430832B2 (en) 2016-08-30
RU2598310C2 (ru) 2016-09-20
EP2761586A1 (en) 2014-08-06

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Granted publication date: 20170609