IN2014CN01546A - - Google Patents
Info
- Publication number
- IN2014CN01546A IN2014CN01546A IN1546CHN2014A IN2014CN01546A IN 2014CN01546 A IN2014CN01546 A IN 2014CN01546A IN 1546CHN2014 A IN1546CHN2014 A IN 1546CHN2014A IN 2014CN01546 A IN2014CN01546 A IN 2014CN01546A
- Authority
- IN
- India
- Prior art keywords
- pixel
- phase gradient
- image data
- phase
- energy
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0012—Biomedical image inspection
- G06T7/0014—Biomedical image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration by the use of more than one image, e.g. averaging, subtraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/005—Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2211/00—Image generation
- G06T2211/40—Computed tomography
- G06T2211/408—Dual energy
Abstract
For correcting differential phase image data 52 differential phase image data 52 acquired with radiation at different energy levels is received wherein the differential phase image data 52 comprises pixels 60 each pixel 60 having a phase gradient value 62a 62b 62c for each energy level. After that an energy dependent behavior of phase gradient values 62a 62b 62c of a pixel 60 is determined and a corrected phase gradient value 68 for the pixel 60 is determined from the phase gradient values 62a 62b 62c of the pixel 60 and a model for the energy dependence of the phase gradient values 62a 62b 62c.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161529450P | 2011-08-31 | 2011-08-31 | |
PCT/IB2012/054032 WO2013030698A1 (en) | 2011-08-31 | 2012-08-08 | Differential phase contrast imaging with energy sensitive detection |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2014CN01546A true IN2014CN01546A (en) | 2015-05-08 |
Family
ID=47089091
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN1546CHN2014 IN2014CN01546A (en) | 2011-08-31 | 2012-08-08 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9430832B2 (en) |
EP (1) | EP2761586B1 (en) |
JP (1) | JP6105586B2 (en) |
CN (1) | CN103918005B (en) |
IN (1) | IN2014CN01546A (en) |
RU (1) | RU2598310C2 (en) |
WO (1) | WO2013030698A1 (en) |
Families Citing this family (29)
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US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
KR20140111818A (en) * | 2013-03-12 | 2014-09-22 | 삼성전자주식회사 | X-ray imaging apparatus and control method for the same |
US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
US10416099B2 (en) | 2013-09-19 | 2019-09-17 | Sigray, Inc. | Method of performing X-ray spectroscopy and X-ray absorption spectrometer system |
US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
US10037600B2 (en) * | 2014-06-02 | 2018-07-31 | Koninklijke Philips N.V. | Bias-free regularization for spectral phase-unwrapping in differential phase contrast imaging |
US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
US10706536B2 (en) | 2015-07-20 | 2020-07-07 | Min Xu | Photon structure and chemometrics pathologic system |
US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
JP6683118B2 (en) * | 2016-12-20 | 2020-04-15 | 株式会社島津製作所 | X-ray phase imaging device |
US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
US11113851B2 (en) * | 2018-07-20 | 2021-09-07 | The Board Of Trustees Of The Leland Stanford Junior University | Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification |
US10658145B2 (en) | 2018-07-26 | 2020-05-19 | Sigray, Inc. | High brightness x-ray reflection source |
US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
DE112019004433T5 (en) | 2018-09-04 | 2021-05-20 | Sigray, Inc. | SYSTEM AND PROCEDURE FOR X-RAY FLUORESCENCE WITH FILTERING |
WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
US11143605B2 (en) | 2019-09-03 | 2021-10-12 | Sigray, Inc. | System and method for computed laminography x-ray fluorescence imaging |
US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
WO2021237237A1 (en) | 2020-05-18 | 2021-11-25 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
DE112021004828T5 (en) | 2020-09-17 | 2023-08-03 | Sigray, Inc. | SYSTEM AND PROCEDURE USING X-RAYS FOR DEPTH RESOLUTION MEASUREMENT AND ANALYSIS |
DE112021006348T5 (en) | 2020-12-07 | 2023-09-21 | Sigray, Inc. | HIGH-THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE |
US11885755B2 (en) | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
CN117475172B (en) * | 2023-12-28 | 2024-03-26 | 湖北工业大学 | Deep learning-based high-noise environment phase diagram wrapping method and system |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6526121B1 (en) * | 2000-03-29 | 2003-02-25 | Yeu-Kuang Hwu | Apparatus and method for imaging an object with real-time response |
JP2002336230A (en) * | 2001-05-16 | 2002-11-26 | Fuji Photo Film Co Ltd | Phase contrast picture forming method and device, and program |
US7424173B2 (en) | 2002-09-30 | 2008-09-09 | Fujifilm Corporation | Method, apparatus and program for restoring phase information |
US8014575B2 (en) * | 2004-03-11 | 2011-09-06 | Weiss Kenneth L | Automated neuroaxis (brain and spine) imaging with iterative scan prescriptions, analysis, reconstructions, labeling, surface localization and guided intervention |
EP1731099A1 (en) * | 2005-06-06 | 2006-12-13 | Paul Scherrer Institut | Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source |
JP4834518B2 (en) * | 2005-11-29 | 2011-12-14 | キヤノン株式会社 | Radiation imaging apparatus, control method therefor, and recording medium on which program for executing the same is recorded |
DE102006037257B4 (en) * | 2006-02-01 | 2017-06-01 | Siemens Healthcare Gmbh | Method and measuring arrangement for the non-destructive analysis of an examination object with X-radiation |
US20080299588A1 (en) * | 2007-05-30 | 2008-12-04 | The Curators Of The University Of Missouri A Public Corporation Of The State Of Missouri | Methods For Measuring Bone Formation |
US7924973B2 (en) * | 2007-11-15 | 2011-04-12 | Csem Centre Suisse D'electronique Et De Microtechnique Sa | Interferometer device and method |
US8306183B2 (en) * | 2007-11-26 | 2012-11-06 | Koninklijke Philips Electronics N.V. | Detection setup for X-ray phase contrast imaging |
CN101647706B (en) * | 2008-08-13 | 2012-05-30 | 清华大学 | Image reconstruction method for high-energy double-energy CT system |
CN101413905B (en) * | 2008-10-10 | 2011-03-16 | 深圳大学 | X ray differentiation interference phase contrast imaging system |
US8855265B2 (en) * | 2009-06-16 | 2014-10-07 | Koninklijke Philips N.V. | Correction method for differential phase contrast imaging |
JP5697370B2 (en) * | 2009-07-24 | 2015-04-08 | キヤノン株式会社 | X-ray imaging device |
DE102009035286A1 (en) * | 2009-07-30 | 2011-02-10 | Siemens Aktiengesellschaft | Method and device for displaying computed tomographic examination data of an examination object |
EP2488104A1 (en) * | 2009-10-13 | 2012-08-22 | Koninklijke Philips Electronics N.V. | Device and method for generating soft tissue contrast images |
US20110142316A1 (en) * | 2009-10-29 | 2011-06-16 | Ge Wang | Tomography-Based and MRI-Based Imaging Systems |
US8208602B2 (en) * | 2010-02-22 | 2012-06-26 | General Electric Company | High flux photon beams using optic devices |
US9177366B2 (en) * | 2010-05-21 | 2015-11-03 | Koninklijke Philips N.V. | Edge-preserving noise filtering |
US9518105B2 (en) * | 2010-12-08 | 2016-12-13 | The Research Foundation For The State University Of New York | Polypeptides derived from calcitonin receptors and methods of use |
US9486175B2 (en) * | 2011-07-04 | 2016-11-08 | Koninklijke Philips N.V. | Phase contrast imaging apparatus |
JP5624253B2 (en) * | 2011-07-29 | 2014-11-12 | ザ・ジョンズ・ホプキンス・ユニバーシティ | Differential phase contrast X-ray imaging system and components therefor |
-
2012
- 2012-08-08 WO PCT/IB2012/054032 patent/WO2013030698A1/en active Application Filing
- 2012-08-08 CN CN201280053647.XA patent/CN103918005B/en active Active
- 2012-08-08 JP JP2014527761A patent/JP6105586B2/en not_active Expired - Fee Related
- 2012-08-08 US US14/240,783 patent/US9430832B2/en active Active
- 2012-08-08 IN IN1546CHN2014 patent/IN2014CN01546A/en unknown
- 2012-08-08 RU RU2014111826/08A patent/RU2598310C2/en not_active IP Right Cessation
- 2012-08-08 EP EP12779159.8A patent/EP2761586B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20140205057A1 (en) | 2014-07-24 |
CN103918005B (en) | 2017-06-09 |
JP6105586B2 (en) | 2017-03-29 |
US9430832B2 (en) | 2016-08-30 |
EP2761586A1 (en) | 2014-08-06 |
JP2014525304A (en) | 2014-09-29 |
WO2013030698A1 (en) | 2013-03-07 |
RU2598310C2 (en) | 2016-09-20 |
EP2761586B1 (en) | 2022-10-12 |
CN103918005A (en) | 2014-07-09 |
RU2014111826A (en) | 2015-10-10 |
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