IN2014CN01546A - - Google Patents

Info

Publication number
IN2014CN01546A
IN2014CN01546A IN1546CHN2014A IN2014CN01546A IN 2014CN01546 A IN2014CN01546 A IN 2014CN01546A IN 1546CHN2014 A IN1546CHN2014 A IN 1546CHN2014A IN 2014CN01546 A IN2014CN01546 A IN 2014CN01546A
Authority
IN
India
Prior art keywords
pixel
phase gradient
image data
phase
energy
Prior art date
Application number
Other languages
English (en)
Inventor
Thomas Koehler
Jens Peter Schlomka
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN01546A publication Critical patent/IN2014CN01546A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • G06T7/0014—Biomedical image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G06T12/10—
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/408—Dual energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Pulmonology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
IN1546CHN2014 2011-08-31 2012-08-08 IN2014CN01546A (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161529450P 2011-08-31 2011-08-31
PCT/IB2012/054032 WO2013030698A1 (en) 2011-08-31 2012-08-08 Differential phase contrast imaging with energy sensitive detection

Publications (1)

Publication Number Publication Date
IN2014CN01546A true IN2014CN01546A (enExample) 2015-05-08

Family

ID=47089091

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1546CHN2014 IN2014CN01546A (enExample) 2011-08-31 2012-08-08

Country Status (7)

Country Link
US (1) US9430832B2 (enExample)
EP (1) EP2761586B1 (enExample)
JP (1) JP6105586B2 (enExample)
CN (1) CN103918005B (enExample)
IN (1) IN2014CN01546A (enExample)
RU (1) RU2598310C2 (enExample)
WO (1) WO2013030698A1 (enExample)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
KR20140111818A (ko) * 2013-03-12 2014-09-22 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
WO2015185259A1 (en) * 2014-06-02 2015-12-10 Koninklijke Philips N.V. Biais-free regularization for spectral phase-unwrapping in differential phase contrast imaging.
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
CN107847145B (zh) * 2015-07-20 2020-08-14 徐敏 光子结构和化学计量学病理系统
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
JP6937380B2 (ja) 2017-03-22 2021-09-22 シグレイ、インコーポレイテッド Ｘ線分光を実施するための方法およびｘ線吸収分光システム
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
CN112424591B (zh) 2018-06-04 2024-05-24 斯格瑞公司 波长色散x射线光谱仪
US11113851B2 (en) * 2018-07-20 2021-09-07 The Board Of Trustees Of The Leland Stanford Junior University Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
DE112019004433B4 (de) 2018-09-04 2024-09-12 Sigray, Inc. System und verfahren für röntgenstrahlfluoreszenz mit filterung
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2021046059A1 (en) 2019-09-03 2021-03-11 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11215572B2 (en) 2020-05-18 2022-01-04 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
DE112021004828T5 (de) 2020-09-17 2023-08-03 Sigray, Inc. System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse
DE112021006348T5 (de) 2020-12-07 2023-09-21 Sigray, Inc. 3d-röntgenbildgebungssystem mit hohem durchsatz, das eine transmissionsröntgenquelle verwendet
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
JP2025515085A (ja) 2022-05-02 2025-05-13 シグレイ、インコーポレイテッド Ｘ線シーケンシャルアレイ波長分散型分光計
DE112024000873T5 (de) 2023-02-16 2026-01-15 Sigray, Inc. Röntgen-detektorsystem mit mindestens zwei gestapelten flachen bragg-diffraktoren
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
CN117475172B (zh) * 2023-12-28 2024-03-26 湖北工业大学 一种基于深度学习的高噪声环境相位图解包裹方法和系统
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6526121B1 (en) * 2000-03-29 2003-02-25 Yeu-Kuang Hwu Apparatus and method for imaging an object with real-time response
JP2002336230A (ja) * 2001-05-16 2002-11-26 Fuji Photo Film Co Ltd 位相コントラスト画像生成方法および装置並びにプログラム
US7424173B2 (en) 2002-09-30 2008-09-09 Fujifilm Corporation Method, apparatus and program for restoring phase information
WO2005088520A1 (en) * 2004-03-11 2005-09-22 University Of Cincinnati Automated spine survey iterative scan technique (assist)
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
JP4834518B2 (ja) * 2005-11-29 2011-12-14 キヤノン株式会社 放射線撮像装置、その制御方法、及びそれを実行させるためのプログラムを記録した記録媒体
DE102006037257B4 (de) * 2006-02-01 2017-06-01 Siemens Healthcare Gmbh Verfahren und Messanordnung zur zerstörungsfreien Analyse eines Untersuchungsobjektes mit Röntgenstrahlung
US20080299588A1 (en) * 2007-05-30 2008-12-04 The Curators Of The University Of Missouri A Public Corporation Of The State Of Missouri Methods For Measuring Bone Formation
EP2060909B1 (en) * 2007-11-15 2011-09-07 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Interferometer device and method
EP2214558B1 (en) * 2007-11-26 2017-08-30 Koninklijke Philips N.V. Detection setup for x-ray phase contrast imaging
CN101647706B (zh) * 2008-08-13 2012-05-30 清华大学 高能双能ct系统的图象重建方法
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
WO2010146503A1 (en) * 2009-06-16 2010-12-23 Koninklijke Philips Electronics N. V. Correction method for differential phase contrast imaging
JP5697370B2 (ja) * 2009-07-24 2015-04-08 キヤノン株式会社 Ｘ線撮像装置
DE102009035286A1 (de) * 2009-07-30 2011-02-10 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Darstellung computertomographischer Untersuchungsdaten eines Untersuchungsobjektes
WO2011045705A1 (en) * 2009-10-13 2011-04-21 Koninklijke Philips Electronics N.V. Device and method for generating soft tissue contrast images
US8208602B2 (en) * 2010-02-22 2012-06-26 General Electric Company High flux photon beams using optic devices
WO2011145040A1 (en) * 2010-05-21 2011-11-24 Koninklijke Philips Electronics N.V. Edge-preserving noise filtering
US9518105B2 (en) * 2010-12-08 2016-12-13 The Research Foundation For The State University Of New York Polypeptides derived from calcitonin receptors and methods of use
US9486175B2 (en) * 2011-07-04 2016-11-08 Koninklijke Philips N.V. Phase contrast imaging apparatus
US8767915B2 (en) * 2011-07-29 2014-07-01 The Johns Hopkins University Differential phase contrast X-ray imaging system and components

Also Published As

Publication number Publication date
JP6105586B2 (ja) 2017-03-29
US9430832B2 (en) 2016-08-30
CN103918005A (zh) 2014-07-09
RU2014111826A (ru) 2015-10-10
CN103918005B (zh) 2017-06-09
US20140205057A1 (en) 2014-07-24
WO2013030698A1 (en) 2013-03-07
RU2598310C2 (ru) 2016-09-20
JP2014525304A (ja) 2014-09-29
EP2761586A1 (en) 2014-08-06
EP2761586B1 (en) 2022-10-12

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