CN103715183A - 半导体器件 - Google Patents
半导体器件 Download PDFInfo
- Publication number
- CN103715183A CN103715183A CN201310447281.0A CN201310447281A CN103715183A CN 103715183 A CN103715183 A CN 103715183A CN 201310447281 A CN201310447281 A CN 201310447281A CN 103715183 A CN103715183 A CN 103715183A
- Authority
- CN
- China
- Prior art keywords
- electrode
- chip
- power supply
- coupled
- grounding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/07—Structure, shape, material or disposition of the bonding areas after the connecting process
- H01L24/09—Structure, shape, material or disposition of the bonding areas after the connecting process of a plurality of bonding areas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0401—Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/0557—Disposition the external layer being disposed on a via connection of the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0618—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/06181—On opposite sides of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06513—Bump or bump-like direct electrical connections between devices, e.g. flip-chip connection, solder bumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06517—Bump or bump-like direct electrical connections from device to substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06541—Conductive via connections through the device, e.g. vertical interconnects, through silicon via [TSV]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012-215860 | 2012-09-28 | ||
JP2012215860A JP6058336B2 (ja) | 2012-09-28 | 2012-09-28 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103715183A true CN103715183A (zh) | 2014-04-09 |
CN103715183B CN103715183B (zh) | 2018-05-15 |
Family
ID=50408027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310447281.0A Expired - Fee Related CN103715183B (zh) | 2012-09-28 | 2013-09-27 | 半导体器件 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9123554B2 (zh) |
JP (1) | JP6058336B2 (zh) |
KR (1) | KR20140042717A (zh) |
CN (1) | CN103715183B (zh) |
TW (1) | TWI575669B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110047764A (zh) * | 2019-04-01 | 2019-07-23 | 京微齐力(北京)科技有限公司 | 一种集成fpga芯片和人工智能芯片的系统级封装方法 |
CN110069834A (zh) * | 2019-04-01 | 2019-07-30 | 京微齐力(北京)科技有限公司 | 一种集成fpga芯片和人工智能芯片的系统级封装方法 |
CN112614820A (zh) * | 2019-10-04 | 2021-04-06 | 三星电子株式会社 | 具有叠层封装(PoP)结构的半导体封装件 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI838943B (zh) * | 2015-01-13 | 2024-04-11 | 日商迪睿合股份有限公司 | 各向異性導電膜、連接構造體、以及連接構造體的製造方法 |
JP6543129B2 (ja) | 2015-07-29 | 2019-07-10 | ルネサスエレクトロニクス株式会社 | 電子装置 |
US10147676B1 (en) | 2017-05-15 | 2018-12-04 | International Business Machines Corporation | Wafer-scale power delivery |
US10057976B1 (en) * | 2017-08-31 | 2018-08-21 | Xilinx, Inc. | Power-ground co-reference transceiver structure to deliver ultra-low crosstalk |
JP7272587B2 (ja) * | 2019-10-04 | 2023-05-12 | 本田技研工業株式会社 | 半導体装置 |
US11616019B2 (en) * | 2020-12-21 | 2023-03-28 | Nvidia Corp. | Semiconductor assembly |
US20230009901A1 (en) * | 2021-07-09 | 2023-01-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor package and manufacturing method thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008004853A (ja) * | 2006-06-26 | 2008-01-10 | Hitachi Ltd | 積層半導体装置およびモジュール |
US20110193086A1 (en) * | 2010-02-09 | 2011-08-11 | Samsung Electronics Co., Ltd. | Semiconductor memory devices and semiconductor packages |
CN102543941A (zh) * | 2010-12-28 | 2012-07-04 | 三星电子株式会社 | 半导体器件、半导体存储器件及其操作方法 |
US20120187401A1 (en) * | 2011-01-25 | 2012-07-26 | Elpida Memory, Inc. | Device allowing suppression of stress on chip |
US20120208322A1 (en) * | 2008-05-28 | 2012-08-16 | Renesas Electronics Corporation | Semiconductor device and manufacturing method therefor |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3789955B2 (ja) * | 1994-05-20 | 2006-06-28 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
JP2003204030A (ja) * | 2002-01-07 | 2003-07-18 | Hitachi Ltd | 半導体装置およびその製造方法 |
US6812656B2 (en) * | 2002-02-27 | 2004-11-02 | Railpower Technologies Corp. | Sequenced pulse width modulation method and apparatus for controlling and powering a plurality of direct current motors |
JP4601365B2 (ja) | 2004-09-21 | 2010-12-22 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP4674850B2 (ja) | 2005-02-25 | 2011-04-20 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP2011061090A (ja) * | 2009-09-11 | 2011-03-24 | Elpida Memory Inc | 半導体装置及びこれを備える半導体パッケージ |
JP5420671B2 (ja) * | 2009-09-14 | 2014-02-19 | 株式会社日立製作所 | 半導体装置 |
JP2013211292A (ja) * | 2012-03-30 | 2013-10-10 | Elpida Memory Inc | 半導体装置 |
-
2012
- 2012-09-28 JP JP2012215860A patent/JP6058336B2/ja not_active Expired - Fee Related
-
2013
- 2013-09-17 TW TW102133659A patent/TWI575669B/zh not_active IP Right Cessation
- 2013-09-26 KR KR20130114786A patent/KR20140042717A/ko not_active Application Discontinuation
- 2013-09-26 US US14/037,620 patent/US9123554B2/en not_active Expired - Fee Related
- 2013-09-27 CN CN201310447281.0A patent/CN103715183B/zh not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008004853A (ja) * | 2006-06-26 | 2008-01-10 | Hitachi Ltd | 積層半導体装置およびモジュール |
US20120208322A1 (en) * | 2008-05-28 | 2012-08-16 | Renesas Electronics Corporation | Semiconductor device and manufacturing method therefor |
US20110193086A1 (en) * | 2010-02-09 | 2011-08-11 | Samsung Electronics Co., Ltd. | Semiconductor memory devices and semiconductor packages |
JP2011166147A (ja) * | 2010-02-09 | 2011-08-25 | Samsung Electronics Co Ltd | 半導体メモリ装置及びそれを含む半導体パッケージ |
CN102543941A (zh) * | 2010-12-28 | 2012-07-04 | 三星电子株式会社 | 半导体器件、半导体存储器件及其操作方法 |
US20120187401A1 (en) * | 2011-01-25 | 2012-07-26 | Elpida Memory, Inc. | Device allowing suppression of stress on chip |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110047764A (zh) * | 2019-04-01 | 2019-07-23 | 京微齐力(北京)科技有限公司 | 一种集成fpga芯片和人工智能芯片的系统级封装方法 |
CN110069834A (zh) * | 2019-04-01 | 2019-07-30 | 京微齐力(北京)科技有限公司 | 一种集成fpga芯片和人工智能芯片的系统级封装方法 |
CN110047764B (zh) * | 2019-04-01 | 2021-07-30 | 京微齐力(北京)科技有限公司 | 一种集成fpga芯片和人工智能芯片的系统级封装方法 |
CN112614820A (zh) * | 2019-10-04 | 2021-04-06 | 三星电子株式会社 | 具有叠层封装(PoP)结构的半导体封装件 |
Also Published As
Publication number | Publication date |
---|---|
KR20140042717A (ko) | 2014-04-07 |
US20140097547A1 (en) | 2014-04-10 |
US9123554B2 (en) | 2015-09-01 |
TWI575669B (zh) | 2017-03-21 |
JP6058336B2 (ja) | 2017-01-11 |
JP2014072289A (ja) | 2014-04-21 |
CN103715183B (zh) | 2018-05-15 |
TW201431010A (zh) | 2014-08-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103715183A (zh) | 半导体器件 | |
CN103843136B (zh) | 在ic封装中封装dram和soc | |
US9070569B2 (en) | Semiconductor memory devices and semiconductor packages | |
CN100552815C (zh) | 半导体器件 | |
US7420281B2 (en) | Stacked chip semiconductor device | |
US8502084B2 (en) | Semiconductor package including power ball matrix and power ring having improved power integrity | |
US20100244238A1 (en) | Semiconductor device | |
US20090189293A1 (en) | Semiconductor device | |
US20130021760A1 (en) | Multi-channel package and electronic system including the same | |
US9478525B2 (en) | Semiconductor device | |
TW201715692A (zh) | 半導體晶片模組及包含其之半導體封裝 | |
US7745932B2 (en) | Semiconductor package, semiconductor package module including the semiconductor package, and methods of fabricating the same | |
US9337139B2 (en) | Semiconductor device having compensation capacitor to stabilize power supply voltage | |
US7786566B2 (en) | Semiconductor integrated circuit | |
US20210351164A1 (en) | Semiconductor devices with duplicated die bond pads and associated device packages and methods of manufacture | |
CN103066068A (zh) | 集成电路封装结构 | |
JP2013131688A (ja) | 半導体チップおよび半導体装置 | |
JP2012235048A (ja) | 半導体装置 | |
CN108352178A (zh) | 具有受控制的阻抗负载的高带宽内存应用 | |
KR20120118763A (ko) | 디램 패키지, 디램 패키지를 포함하는 디램 모듈, 디램 패키지를 포함하는 그래픽 모듈, 그리고 디램 패키지를 포함하는 멀티미디어 장치 | |
US6835971B2 (en) | Semiconductor integrated circuit device with a plurality of limiter circuits | |
JPH11345908A (ja) | 互換性を有するicパッケ―ジおよびマイグレ―ション経路を確保する方法 | |
JPH1187640A (ja) | 半導体装置および電子装置 | |
JP4754201B2 (ja) | 半導体装置 | |
KR20070055984A (ko) | 멀티칩 모듈 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
REG | Reference to a national code |
Ref country code: HK Ref legal event code: DE Ref document number: 1194860 Country of ref document: HK |
|
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information |
Address after: Tokyo, Japan Applicant after: Renesas Electronics Corporation Address before: Kanagawa, Japan Applicant before: Renesas Electronics Corporation |
|
COR | Change of bibliographic data | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
REG | Reference to a national code |
Ref country code: HK Ref legal event code: GR Ref document number: 1194860 Country of ref document: HK |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180515 Termination date: 20190927 |
|
CF01 | Termination of patent right due to non-payment of annual fee |