CN103178106B - 用于异质结构的场效应晶体管的屏蔽罩 - Google Patents
用于异质结构的场效应晶体管的屏蔽罩 Download PDFInfo
- Publication number
- CN103178106B CN103178106B CN201210552008.XA CN201210552008A CN103178106B CN 103178106 B CN103178106 B CN 103178106B CN 201210552008 A CN201210552008 A CN 201210552008A CN 103178106 B CN103178106 B CN 103178106B
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- Prior art keywords
- semiconductor device
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- shield
- passivation film
- active region
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having 2D charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
- H10D30/471—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
- H10D30/475—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
- H10D30/4755—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs having wide bandgap charge-carrier supplying layers, e.g. modulation doped HEMTs such as n-AlGaAs/GaAs HEMTs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3135—Double encapsulation or coating and encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
- H01L23/3171—Partial encapsulation or coating the coating being directly applied to the semiconductor body, e.g. passivation layer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/111—Field plates
- H10D64/112—Field plates comprising multiple field plate segments
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Junction Field-Effect Transistors (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/333,843 US10002957B2 (en) | 2011-12-21 | 2011-12-21 | Shield wrap for a heterostructure field effect transistor |
| US13/333,843 | 2011-12-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103178106A CN103178106A (zh) | 2013-06-26 |
| CN103178106B true CN103178106B (zh) | 2016-10-05 |
Family
ID=47749594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210552008.XA Active CN103178106B (zh) | 2011-12-21 | 2012-12-18 | 用于异质结构的场效应晶体管的屏蔽罩 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US10002957B2 (enExample) |
| EP (1) | EP2608271B1 (enExample) |
| JP (1) | JP6644456B2 (enExample) |
| CN (1) | CN103178106B (enExample) |
| TW (1) | TWI496286B (enExample) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10002957B2 (en) * | 2011-12-21 | 2018-06-19 | Power Integrations, Inc. | Shield wrap for a heterostructure field effect transistor |
| US9443941B2 (en) * | 2012-06-04 | 2016-09-13 | Infineon Technologies Austria Ag | Compound semiconductor transistor with self aligned gate |
| JP2014082233A (ja) * | 2012-10-12 | 2014-05-08 | Sumitomo Electric Ind Ltd | 半導体装置及びその製造方法 |
| US10833185B2 (en) | 2013-09-10 | 2020-11-10 | Delta Electronics, Inc. | Heterojunction semiconductor device having source and drain pads with improved current crowding |
| US10910491B2 (en) | 2013-09-10 | 2021-02-02 | Delta Electronics, Inc. | Semiconductor device having reduced capacitance between source and drain pads |
| US10665709B2 (en) | 2013-09-10 | 2020-05-26 | Delta Electronics, Inc. | Power semiconductor device integrated with ESD protection circuit under source pad, drain pad, and/or gate pad |
| US10236236B2 (en) | 2013-09-10 | 2019-03-19 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| TWI577022B (zh) | 2014-02-27 | 2017-04-01 | 台達電子工業股份有限公司 | 半導體裝置與應用其之半導體裝置封裝體 |
| JP6230456B2 (ja) * | 2014-03-19 | 2017-11-15 | 株式会社東芝 | 半導体装置 |
| US20150340483A1 (en) * | 2014-05-21 | 2015-11-26 | International Rectifier Corporation | Group III-V Device Including a Shield Plate |
| JP6879662B2 (ja) * | 2014-12-23 | 2021-06-02 | パワー・インテグレーションズ・インコーポレーテッド | 高電子移動度トランジスタ |
| US9543402B1 (en) | 2015-08-04 | 2017-01-10 | Power Integrations, Inc. | Integrated high performance lateral schottky diode |
| US10056478B2 (en) | 2015-11-06 | 2018-08-21 | Taiwan Semiconductor Manufacturing Company Ltd. | High-electron-mobility transistor and manufacturing method thereof |
| US9871067B2 (en) * | 2015-11-17 | 2018-01-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Infrared image sensor component |
| US9722063B1 (en) | 2016-04-11 | 2017-08-01 | Power Integrations, Inc. | Protective insulator for HFET devices |
| JP6233547B1 (ja) * | 2016-10-24 | 2017-11-22 | 三菱電機株式会社 | 化合物半導体デバイス |
| JP7154015B2 (ja) * | 2017-03-03 | 2022-10-17 | パワー・インテグレーションズ・インコーポレーテッド | 電荷分配構造物を含むスイッチングデバイス |
| US10680090B2 (en) * | 2017-07-20 | 2020-06-09 | Delta Electronics, Inc. | Enclosed gate runner for eliminating miller turn-on |
| US10204791B1 (en) * | 2017-09-22 | 2019-02-12 | Power Integrations, Inc. | Contact plug for high-voltage devices |
| US11694954B2 (en) * | 2018-01-19 | 2023-07-04 | Rohm Co., Ltd. | Semiconductor device and method for producing same |
| US10770391B2 (en) | 2018-03-27 | 2020-09-08 | Qualcomm Incorporated | Transistor with gate extension to limit second gate effect |
| JP6924166B2 (ja) * | 2018-05-14 | 2021-08-25 | 株式会社東芝 | 半導体装置 |
| WO2023015496A1 (en) * | 2021-08-11 | 2023-02-16 | Innoscience (suzhou) Semiconductor Co., Ltd. | Semiconductor device and method for manufacturing the same |
| CN115547990A (zh) * | 2022-08-15 | 2022-12-30 | 河源市众拓光电科技有限公司 | 抗辐照氮化镓基场效应管及其制备方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101299437A (zh) * | 2007-05-01 | 2008-11-05 | 冲电气工业株式会社 | 场效应晶体管 |
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-
2011
- 2011-12-21 US US13/333,843 patent/US10002957B2/en active Active
-
2012
- 2012-12-03 EP EP12195320.2A patent/EP2608271B1/en active Active
- 2012-12-18 CN CN201210552008.XA patent/CN103178106B/zh active Active
- 2012-12-20 JP JP2012278136A patent/JP6644456B2/ja active Active
- 2012-12-20 TW TW101148577A patent/TWI496286B/zh active
-
2016
- 2016-12-21 US US15/387,510 patent/US10199488B2/en active Active
-
2018
- 2018-12-20 US US16/228,159 patent/US20190214493A1/en not_active Abandoned
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101299437A (zh) * | 2007-05-01 | 2008-11-05 | 冲电气工业株式会社 | 场效应晶体管 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI496286B (zh) | 2015-08-11 |
| US20190214493A1 (en) | 2019-07-11 |
| EP2608271A1 (en) | 2013-06-26 |
| TW201342594A (zh) | 2013-10-16 |
| EP2608271B1 (en) | 2016-10-19 |
| US10199488B2 (en) | 2019-02-05 |
| US20130161692A1 (en) | 2013-06-27 |
| US10002957B2 (en) | 2018-06-19 |
| CN103178106A (zh) | 2013-06-26 |
| US20170098704A1 (en) | 2017-04-06 |
| JP2013131758A (ja) | 2013-07-04 |
| JP6644456B2 (ja) | 2020-02-12 |
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