CN102859603A - 具有交替选择的相变存储阵列块 - Google Patents

具有交替选择的相变存储阵列块 Download PDF

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Publication number
CN102859603A
CN102859603A CN2011800210004A CN201180021000A CN102859603A CN 102859603 A CN102859603 A CN 102859603A CN 2011800210004 A CN2011800210004 A CN 2011800210004A CN 201180021000 A CN201180021000 A CN 201180021000A CN 102859603 A CN102859603 A CN 102859603A
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CN
China
Prior art keywords
group
unit
pcm
word line
storage unit
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Pending
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CN2011800210004A
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English (en)
Chinese (zh)
Inventor
潘弘柏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mosaid Technologies Inc
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Mosaid Technologies Inc
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Filing date
Publication date
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Publication of CN102859603A publication Critical patent/CN102859603A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/02—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using elements whose operation depends upon chemical change
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0023—Address circuits or decoders
    • G11C13/0028—Word-line or row circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0023—Address circuits or decoders
    • G11C13/0026—Bit-line or column circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0033—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G11C2013/0088—Write with the simultaneous writing of a plurality of cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70—Resistive array aspects
    • G11C2213/72—Array wherein the access device being a diode
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
CN2011800210004A 2010-04-27 2011-03-10 具有交替选择的相变存储阵列块 Pending CN102859603A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US32842110P 2010-04-27 2010-04-27
US61/328,421 2010-04-27
PCT/CA2011/050136 WO2011134079A1 (en) 2010-04-27 2011-03-10 Phase change memory array blocks with alternate selection

Publications (1)

Publication Number Publication Date
CN102859603A true CN102859603A (zh) 2013-01-02

Family

ID=44815698

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800210004A Pending CN102859603A (zh) 2010-04-27 2011-03-10 具有交替选择的相变存储阵列块

Country Status (8)

Country Link
US (1) US20110261613A1 (enExample)
EP (1) EP2564391A4 (enExample)
JP (1) JP5602941B2 (enExample)
KR (1) KR20130107199A (enExample)
CN (1) CN102859603A (enExample)
CA (1) CA2793927A1 (enExample)
TW (1) TW201203250A (enExample)
WO (1) WO2011134079A1 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105845077A (zh) * 2015-01-29 2016-08-10 三星显示有限公司 数据补偿器以及包括数据补偿器的显示装置
CN107545917A (zh) * 2016-06-29 2018-01-05 爱思开海力士有限公司 存储器件
CN108022619A (zh) * 2016-11-01 2018-05-11 爱思开海力士有限公司 阻变存储装置
CN108091361A (zh) * 2016-11-23 2018-05-29 爱思开海力士有限公司 相变存储器件
CN111919255A (zh) * 2018-03-23 2020-11-10 硅存储技术股份有限公司 用于在非易失性存储器阵列中管理峰值电力需求和噪声的系统和方法

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US8773891B2 (en) 2012-09-07 2014-07-08 Being Advanced Memory Corporation Systems, methods, and devices with write optimization in phase change memory
US8913425B2 (en) * 2013-03-12 2014-12-16 Intel Corporation Phase change memory mask
US10867661B2 (en) 2019-04-30 2020-12-15 Micron Technology, Inc. Main word line driver circuit
US10910049B2 (en) * 2019-04-30 2021-02-02 Micron Technology, Inc. Sub-word line driver circuit
US11183236B2 (en) * 2019-07-31 2021-11-23 Taiwan Semiconductor Manufacturing Company, Ltd. Memory cell with built-in amplifying function, memory device and method using the same
US12456510B2 (en) * 2021-12-20 2025-10-28 Micron Technology, Inc. Memory device control schemes, and associated methods, devices, and systems

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060209616A1 (en) * 2005-03-21 2006-09-21 Kim Hye-Jin Phase change memory device and associated wordline driving circuit
CN101009136A (zh) * 2006-01-25 2007-08-01 尔必达存储器株式会社 半导体存储装置
CN101409105A (zh) * 2007-10-10 2009-04-15 海力士半导体有限公司 快闪存储设备

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US6163495A (en) * 1999-09-17 2000-12-19 Cypress Semiconductor Corp. Architecture, method(s) and circuitry for low power memories
JP4540352B2 (ja) * 2003-09-12 2010-09-08 ルネサスエレクトロニクス株式会社 記憶装置
KR100597636B1 (ko) * 2004-06-08 2006-07-05 삼성전자주식회사 상 변화 반도체 메모리 장치
KR100699848B1 (ko) * 2005-06-21 2007-03-27 삼성전자주식회사 코어 구조가 개선된 상 변화 메모리 장치
KR100735525B1 (ko) * 2006-01-04 2007-07-04 삼성전자주식회사 상변화 메모리 장치
KR100719383B1 (ko) * 2006-04-12 2007-05-18 삼성전자주식회사 멀티 프로그램 방법을 사용하는 상 변화 메모리 장치
US7525866B2 (en) * 2006-04-19 2009-04-28 Freescale Semiconductor, Inc. Memory circuit
US7450414B2 (en) * 2006-07-31 2008-11-11 Sandisk 3D Llc Method for using a mixed-use memory array
US8009476B2 (en) * 2006-09-19 2011-08-30 Samsung Electronics Co., Ltd. Semiconductor memory device using variable resistor
KR101258983B1 (ko) * 2006-09-19 2013-04-29 삼성전자주식회사 가변저항 소자를 이용한 반도체 메모리 장치 및 그 동작방법
KR101317754B1 (ko) * 2007-10-12 2013-10-11 삼성전자주식회사 상 변화 메모리 장치
JP5222619B2 (ja) * 2008-05-02 2013-06-26 株式会社日立製作所 半導体装置
KR20090117189A (ko) * 2008-05-09 2009-11-12 삼성전자주식회사 멀티 라이트를 위한 효율적인 코아 구조를 갖는 반도체메모리 장치
JP2010044827A (ja) * 2008-08-13 2010-02-25 Toshiba Corp 不揮発性半導体記憶装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060209616A1 (en) * 2005-03-21 2006-09-21 Kim Hye-Jin Phase change memory device and associated wordline driving circuit
CN101009136A (zh) * 2006-01-25 2007-08-01 尔必达存储器株式会社 半导体存储装置
CN101409105A (zh) * 2007-10-10 2009-04-15 海力士半导体有限公司 快闪存储设备

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105845077A (zh) * 2015-01-29 2016-08-10 三星显示有限公司 数据补偿器以及包括数据补偿器的显示装置
CN107545917A (zh) * 2016-06-29 2018-01-05 爱思开海力士有限公司 存储器件
CN107545917B (zh) * 2016-06-29 2021-07-13 爱思开海力士有限公司 存储器件
CN108022619A (zh) * 2016-11-01 2018-05-11 爱思开海力士有限公司 阻变存储装置
CN108091361A (zh) * 2016-11-23 2018-05-29 爱思开海力士有限公司 相变存储器件
CN108091361B (zh) * 2016-11-23 2021-06-25 爱思开海力士有限公司 相变存储器件
CN111919255A (zh) * 2018-03-23 2020-11-10 硅存储技术股份有限公司 用于在非易失性存储器阵列中管理峰值电力需求和噪声的系统和方法

Also Published As

Publication number Publication date
WO2011134079A8 (en) 2012-01-12
US20110261613A1 (en) 2011-10-27
JP5602941B2 (ja) 2014-10-08
EP2564391A1 (en) 2013-03-06
KR20130107199A (ko) 2013-10-01
CA2793927A1 (en) 2011-11-03
JP2013527550A (ja) 2013-06-27
EP2564391A4 (en) 2015-09-02
WO2011134079A1 (en) 2011-11-03
TW201203250A (en) 2012-01-16

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SE01 Entry into force of request for substantive examination
C53 Correction of patent of invention or patent application
CB02 Change of applicant information

Address after: Ontario, Canada

Applicant after: Examine Vincent Zhi Cai management company

Address before: Ontario, Canada

Applicant before: Mosaid Technologies Inc.

COR Change of bibliographic data

Free format text: CORRECT: APPLICANT; FROM: MOSAID TECHNOLOGIES INC. TO: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.

C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20130102