CN102445750B - 显微镜照明系统、显微镜和倾斜入射照明方法 - Google Patents
显微镜照明系统、显微镜和倾斜入射照明方法 Download PDFInfo
- Publication number
- CN102445750B CN102445750B CN201110306770.5A CN201110306770A CN102445750B CN 102445750 B CN102445750 B CN 102445750B CN 201110306770 A CN201110306770 A CN 201110306770A CN 102445750 B CN102445750 B CN 102445750B
- Authority
- CN
- China
- Prior art keywords
- aperture
- optical axis
- illumination system
- microscope
- camera images
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005286 illumination Methods 0.000 title claims abstract description 152
- 230000003287 optical effect Effects 0.000 claims abstract description 97
- 238000000034 method Methods 0.000 claims abstract description 32
- 238000009826 distribution Methods 0.000 claims abstract description 28
- 238000006073 displacement reaction Methods 0.000 claims abstract description 10
- 238000001228 spectrum Methods 0.000 claims description 21
- 230000008859 change Effects 0.000 claims description 17
- 238000004458 analytical method Methods 0.000 claims description 13
- 238000005457 optimization Methods 0.000 claims description 9
- 230000021615 conjugation Effects 0.000 claims description 6
- 210000001747 pupil Anatomy 0.000 claims description 5
- 238000010191 image analysis Methods 0.000 claims description 3
- 230000000644 propagated effect Effects 0.000 claims description 2
- 230000004044 response Effects 0.000 claims description 2
- 239000011148 porous material Substances 0.000 abstract description 7
- 238000003384 imaging method Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 230000000007 visual effect Effects 0.000 description 6
- 238000007689 inspection Methods 0.000 description 4
- 230000003595 spectral effect Effects 0.000 description 4
- 238000002211 ultraviolet spectrum Methods 0.000 description 4
- 241000276498 Pollachius virens Species 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000002349 favourable effect Effects 0.000 description 3
- 230000004304 visual acuity Effects 0.000 description 3
- 230000001276 controlling effect Effects 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000003672 processing method Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000001429 visible spectrum Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004438 eyesight Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000005293 physical law Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/082—Condensers for incident illumination only
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102010042351.3A DE102010042351B4 (de) | 2010-10-12 | 2010-10-12 | Mikroskopbeleuchtungssystem, Mikroskop und Verfahren zur schrägen Auflichtbeleuchtung |
| DE102010042351.3 | 2010-10-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102445750A CN102445750A (zh) | 2012-05-09 |
| CN102445750B true CN102445750B (zh) | 2016-04-13 |
Family
ID=45872283
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110306770.5A Active CN102445750B (zh) | 2010-10-12 | 2011-10-11 | 显微镜照明系统、显微镜和倾斜入射照明方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9250432B2 (enExample) |
| JP (1) | JP5764455B2 (enExample) |
| CN (1) | CN102445750B (enExample) |
| DE (1) | DE102010042351B4 (enExample) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5721042B2 (ja) | 2010-10-20 | 2015-05-20 | 株式会社ニコン | 顕微鏡システム |
| JP5757458B2 (ja) | 2011-04-12 | 2015-07-29 | 株式会社ニコン | 顕微鏡システム、サーバー及びプログラム |
| DE102011051042B4 (de) * | 2011-06-14 | 2016-04-28 | Leica Microsystems Cms Gmbh | Abtastmikroskop und Verfahren zur lichtmikroskopischen Abbildung eines Objektes |
| GB2497975B (en) * | 2011-12-23 | 2016-05-11 | Agilent Technologies Inc | Adjustable aperture device with integral aperture holes |
| DE102013003900A1 (de) * | 2012-03-28 | 2013-10-02 | Carl Zeiss Microscopy Gmbh | Lichtmikroskop und Verfahren zur Bildaufnahme mit einem Lichtmikroskop |
| DE102012206120B4 (de) * | 2012-04-13 | 2017-05-24 | Leica Microsystems (Schweiz) Ag | Blendenanordnung zur Erzeugung einer schiefen Beleuchtung in einem Mikroskop und Mikroskop |
| CN102768084B (zh) * | 2012-07-31 | 2014-11-05 | 绍兴精功机电有限公司 | 带双光路瞄准系统的点温测温仪 |
| KR101884397B1 (ko) * | 2012-10-24 | 2018-08-02 | 에이치피프린팅코리아 주식회사 | 광 주사 장치 및 이를 채용한 전자 사진 방식의 화상 형성 장치 |
| DE102014114467A1 (de) | 2014-10-06 | 2016-04-07 | Leica Microsystems (Schweiz) Ag | Mikroskop mit überdimensioniertem Zoomsystem |
| DE102014114471C5 (de) * | 2014-10-06 | 2021-02-18 | Leica Microsystems (Schweiz) Ag | Mikroskop mit sich automatisch anpassender Irisblende |
| JP5971621B2 (ja) * | 2015-03-31 | 2016-08-17 | 株式会社ニコン | 顕微鏡システム |
| EP3121637B1 (de) * | 2015-07-24 | 2021-09-01 | Leica Instruments (Singapore) Pte. Ltd. | Mikroskop und verfahren zum erzeugen eines kombinierten bildes aus mehreren einzelbildern eines objekts |
| DE102015220566B4 (de) * | 2015-10-21 | 2021-03-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung mit einer Multiaperturabbildungsvorrichtung, Verfahren zum Bereitstellen derselben und Verfahren zum Erfassen eines Gesamtgesichtsfeldes |
| JP6797564B2 (ja) | 2016-06-01 | 2020-12-09 | オリンパス株式会社 | 位相物体可視化装置、位相物体可視化方法 |
| JP6264715B2 (ja) * | 2016-07-15 | 2018-01-24 | 株式会社ニコン | 顕微鏡システム |
| DE102016115856B4 (de) | 2016-08-25 | 2020-01-02 | Leica Microsystems Cms Gmbh | Verfahren zur Bildgebung in einem Mikroskop mit schiefer Beleuchtung |
| DE102016122528A1 (de) * | 2016-11-22 | 2018-05-24 | Carl Zeiss Microscopy Gmbh | Verfahren zum Steuern oder Regeln einer Mikroskopbeleuchtung |
| JP7356351B2 (ja) | 2016-12-12 | 2023-10-04 | エクセラ・バイオサイエンシーズ・インコーポレイテッド | マイクロキャピラリーアレイを使用したスクリーニングのための方法およびシステム |
| WO2018125832A1 (en) * | 2016-12-30 | 2018-07-05 | xCella Biosciences, Inc. | Multi-stage sample recovery system |
| CN106580267B (zh) * | 2017-01-24 | 2024-03-29 | 青岛大学附属医院 | 基于侧流暗场成像技术的人体微血管三维超微结构的成像系统 |
| US10663392B2 (en) | 2017-08-09 | 2020-05-26 | Kla Corporation | Variable aperture mask |
| JP6940696B2 (ja) * | 2017-09-29 | 2021-09-29 | ライカ バイオシステムズ イメージング インコーポレイテッドＬｅｉｃａ Ｂｉｏｓｙｓｔｅｍｓ Ｉｍａｇｉｎｇ， Ｉｎｃ． | 二次元および三次元の固定式ｚ走査 |
| DE102018201250B3 (de) | 2018-01-26 | 2019-06-27 | Carl Zeiss Industrielle Messtechnik Gmbh | Variable Blendenvorrichtung und Computertomograph umfassend eine variable Blendenvorrichtung |
| ES3039910T3 (en) | 2018-12-06 | 2025-10-27 | Xcella Biosciences Inc | Lateral loading of microcapillary arrays |
| DE102018132337A1 (de) * | 2018-12-14 | 2020-06-18 | Leica Microsystems Cms Gmbh | Mikroskopsystem mit Eingabeeinheit zum gleichzeitigen Einstellen von wenigstens drei Einstellparametern mittels eines in einer Eingabefläche positionierbaren Eingabezeigers |
| CN111208638B (zh) * | 2020-02-27 | 2021-09-10 | 浙江蓝特光学股份有限公司 | 基于透镜原理的光学成像装置 |
| CN117242330A (zh) * | 2021-05-24 | 2023-12-15 | 贝克曼库尔特有限公司 | 使用流通显微镜术成像的样本的倾斜照明 |
| EP4453624A1 (en) * | 2021-12-23 | 2024-10-30 | Radiometer Medical ApS | Biological fluid analyser with adaptive aperture device |
| CN115644795B (zh) * | 2022-12-12 | 2024-04-09 | 图湃(北京)医疗科技有限公司 | 手术显微镜系统及手术显微镜 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0069263B1 (de) * | 1981-07-07 | 1984-12-19 | Firma Carl Zeiss | Einrichtung zur wahlweisen Realisierung von Phasenkontrast- und Reliefbeobachtung an Mikroskopen |
| DE3527426C1 (de) * | 1985-07-31 | 1986-07-10 | Dietmar 4290 Bocholt Enk | Opakilluminator für ein Mikroskop |
| EP0794462A2 (en) * | 1996-03-04 | 1997-09-10 | Siemens Aktiengesellschaft | Independently controllable shutters and variable area apertures for off axis illumination |
| DE10110597A1 (de) * | 2001-03-06 | 2002-09-12 | Leica Microsystems | Anordnung zur Strahlabschwächung |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1503800A (en) * | 1923-05-25 | 1924-08-05 | Spencer Lens Co | Oblique-light diaphragm |
| US1784425A (en) * | 1924-06-30 | 1930-12-09 | Electro Metallurg Co | Illumination for microscopy |
| US4871257A (en) * | 1982-12-01 | 1989-10-03 | Canon Kabushiki Kaisha | Optical apparatus for observing patterned article |
| US5969856A (en) * | 1994-10-25 | 1999-10-19 | Edge Scientific Instrument Company Llc | Center masking add-on illuminator |
| JPH08122649A (ja) * | 1994-10-27 | 1996-05-17 | Nippon Telegr & Teleph Corp <Ntt> | 顕微鏡用落射照明装置 |
| JPH09197289A (ja) * | 1996-01-23 | 1997-07-31 | Nikon Corp | 顕微鏡 |
| JP3891663B2 (ja) * | 1997-09-30 | 2007-03-14 | オリンパス株式会社 | 実体顕微鏡 |
| JP4493122B2 (ja) * | 1998-11-20 | 2010-06-30 | オリンパス株式会社 | 自動化顕微鏡 |
| US6891671B1 (en) * | 2000-04-18 | 2005-05-10 | Gary Greenberg | Apparatus and methods for creating real-time 3-D images and constructing 3-D models of an object imaged in an optical system |
| DE10144062B4 (de) * | 2001-09-07 | 2010-05-27 | Leica Microsystems Ag | Mikroskop mit einer Beleuchtungseinspiegelung |
| DE102006017327A1 (de) * | 2006-04-11 | 2007-10-18 | Leica Microsystems Cms Gmbh | Polarisations-Interferenzmikroskop |
| JP2009128881A (ja) * | 2007-11-28 | 2009-06-11 | Keyence Corp | 拡大観察装置 |
| JP2009175316A (ja) * | 2008-01-23 | 2009-08-06 | Olympus Corp | 観察装置 |
| JP2010164647A (ja) * | 2009-01-13 | 2010-07-29 | Olympus Corp | 顕微鏡および検査装置 |
-
2010
- 2010-10-12 DE DE102010042351.3A patent/DE102010042351B4/de active Active
-
2011
- 2011-10-06 JP JP2011221747A patent/JP5764455B2/ja active Active
- 2011-10-11 CN CN201110306770.5A patent/CN102445750B/zh active Active
- 2011-10-11 US US13/270,267 patent/US9250432B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0069263B1 (de) * | 1981-07-07 | 1984-12-19 | Firma Carl Zeiss | Einrichtung zur wahlweisen Realisierung von Phasenkontrast- und Reliefbeobachtung an Mikroskopen |
| DE3527426C1 (de) * | 1985-07-31 | 1986-07-10 | Dietmar 4290 Bocholt Enk | Opakilluminator für ein Mikroskop |
| EP0794462A2 (en) * | 1996-03-04 | 1997-09-10 | Siemens Aktiengesellschaft | Independently controllable shutters and variable area apertures for off axis illumination |
| DE10110597A1 (de) * | 2001-03-06 | 2002-09-12 | Leica Microsystems | Anordnung zur Strahlabschwächung |
Also Published As
| Publication number | Publication date |
|---|---|
| US20120086795A1 (en) | 2012-04-12 |
| DE102010042351A1 (de) | 2012-04-12 |
| JP5764455B2 (ja) | 2015-08-19 |
| US9250432B2 (en) | 2016-02-02 |
| DE102010042351B4 (de) | 2014-02-13 |
| JP2012083755A (ja) | 2012-04-26 |
| CN102445750A (zh) | 2012-05-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102445750B (zh) | 显微镜照明系统、显微镜和倾斜入射照明方法 | |
| US6898004B2 (en) | Microscope system | |
| CN105929560B (zh) | 一种宽带远场超分辨成像装置 | |
| JP6557682B2 (ja) | 機能的に統合されたレーザ走査型顕微鏡 | |
| JP7193571B2 (ja) | 照明システム、照明システムを有する検査ツール、および照明システムを作動させる方法 | |
| JP6061958B2 (ja) | ソフトウェア定義式顕微鏡 | |
| CN103069436B (zh) | 照明系统 | |
| US20140368904A1 (en) | Software Defined Microscope | |
| CN101354481A (zh) | 激光照射装置及使用其的激光加工系统 | |
| WO2007050743A3 (en) | An optical system for illumination of an evanescent field | |
| US8462328B2 (en) | Efficient telecentric optical system (ETOS) | |
| JP2016025316A (ja) | 照明光学系、照明装置、及び照明光学素子 | |
| JP5465123B2 (ja) | 画像測定装置のための入射角高速可変照射装置 | |
| US20070033680A1 (en) | Optical inspection system and its illumination method | |
| JPH10513268A (ja) | センター・マスキング照明システムおよび方法 | |
| CN109937360B (zh) | 一种用于检测可透光光学部件的装置和方法 | |
| US11754826B2 (en) | TIRFM-capable microscope and method for operating a TIRFM-capable microscope | |
| US8456623B2 (en) | Optical component focus testing apparatus and method | |
| US9052500B2 (en) | Fast pinhole changer for confocal microscopy or spatial filter | |
| JP2007033381A (ja) | 光学式検査装置及びその照明方法 | |
| JP7266514B2 (ja) | 撮像装置及び表面検査装置 | |
| JPH08334668A (ja) | 自動合焦点装置を備えた光学顕微鏡 | |
| JP2002196218A (ja) | 顕微鏡 | |
| JP4149304B2 (ja) | 顕微鏡 | |
| JP7251957B2 (ja) | 拡大観察装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |