CN102096180B - 超分辨率显微镜 - Google Patents
超分辨率显微镜 Download PDFInfo
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- CN102096180B CN102096180B CN201010580742.8A CN201010580742A CN102096180B CN 102096180 B CN102096180 B CN 102096180B CN 201010580742 A CN201010580742 A CN 201010580742A CN 102096180 B CN102096180 B CN 102096180B
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0068—Optical details of the image generation arrangements using polarisation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009-281179 | 2009-12-11 | ||
| JP2009281179A JP5484879B2 (ja) | 2009-12-11 | 2009-12-11 | 超解像顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102096180A CN102096180A (zh) | 2011-06-15 |
| CN102096180B true CN102096180B (zh) | 2015-10-28 |
Family
ID=44129343
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010580742.8A Expired - Fee Related CN102096180B (zh) | 2009-12-11 | 2010-12-09 | 超分辨率显微镜 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8536543B2 (https=) |
| JP (1) | JP5484879B2 (https=) |
| CN (1) | CN102096180B (https=) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7586583B2 (en) * | 2005-09-15 | 2009-09-08 | Franklin Mark Schellenberg | Nanolithography system |
| GB0907965D0 (en) * | 2009-05-08 | 2009-06-24 | King S College London | Imaging system |
| JP5703126B2 (ja) * | 2010-09-30 | 2015-04-15 | 富士フイルム株式会社 | 生体分子検出装置および生体分子検出方法 |
| DE102011013613A1 (de) * | 2010-10-01 | 2012-04-05 | Carl Zeiss Microimaging Gmbh | Mikroskop und Mikroskopierverfahren |
| CN102866492A (zh) * | 2011-07-06 | 2013-01-09 | 黄书伟 | 平衡检测共聚焦显微镜成像系统及其三维影像重建方法 |
| US9866379B2 (en) * | 2011-09-30 | 2018-01-09 | Los Alamos National Security, Llc | Polarization tracking system for free-space optical communication, including quantum communication |
| JP6255389B2 (ja) | 2012-05-07 | 2017-12-27 | アンセルム（アンスティチュ ナシオナル ドゥ ラ サンテ エ ドゥ ラ ルシェルシュ メディカル） | 試料中の関心組織を高空間分解能で画像化するための顕微鏡 |
| CN102735617B (zh) * | 2012-06-29 | 2014-06-04 | 浙江大学 | 一种超分辨显微方法和装置 |
| CA2882288C (en) | 2012-08-17 | 2020-10-27 | Los Alamos National Security, Llc | Quantum communications system with integrated photonic devices |
| CN103048299B (zh) * | 2012-11-26 | 2015-01-21 | 浙江大学 | 基于荧光寿命差分的超分辨显微方法和装置 |
| WO2014087624A1 (ja) | 2012-12-05 | 2014-06-12 | パナソニック株式会社 | 画像生成装置及び画像生成方法 |
| JP2014182239A (ja) | 2013-03-19 | 2014-09-29 | Olympus Corp | 超解像顕微鏡 |
| US9971136B2 (en) * | 2013-03-21 | 2018-05-15 | ETH Zürich | Method and device to achieve spatially confined photointeraction at the focal volume of a microscope |
| JP6234105B2 (ja) * | 2013-08-05 | 2017-11-22 | オリンパス株式会社 | 超解像顕微鏡 |
| CN103592278B (zh) * | 2013-11-21 | 2016-01-20 | 中国计量学院 | 基于荧光发射抑制机理的随机定位超分辨显微方法及装置 |
| JP6278707B2 (ja) * | 2014-01-09 | 2018-02-14 | オリンパス株式会社 | 光学装置 |
| GB2541308B (en) * | 2014-05-29 | 2021-05-19 | Hitachi High Tech Corp | Microscope observation container and observation device |
| CN104062750B (zh) * | 2014-06-18 | 2016-07-06 | 浙江大学 | 一种双光子荧光受激发射微分超分辨率显微方法与装置 |
| CN104515760B (zh) | 2014-12-17 | 2017-10-31 | 深圳市纳观生物有限公司 | 双色荧光定位超分辨率生物显微方法及系统 |
| TWI563288B (en) * | 2015-03-03 | 2016-12-21 | Southport Corp | Optical image scanning component and microscope device |
| GB201515862D0 (en) * | 2015-09-08 | 2015-10-21 | Univ Southampton | Polarisation microscope |
| US9645376B1 (en) * | 2015-10-14 | 2017-05-09 | Abberior Instruments Gmbh | Scanner head and device with scanner head |
| CN105242408A (zh) * | 2015-11-13 | 2016-01-13 | 上海理工大学 | 一种超分辨光学管道的生成方法 |
| CN105973853B (zh) * | 2016-05-10 | 2018-11-09 | 浙江大学 | 一种基于双模式竞争激发的超分辨显微方法和装置 |
| CN107783267B (zh) * | 2016-08-30 | 2024-04-26 | 北京大学 | 显微放大系统 |
| US10852519B2 (en) * | 2016-11-30 | 2020-12-01 | Asm Technology Singapore Pte Ltd | Confocal imaging of an object utilising a pinhole array |
| JP2018120006A (ja) * | 2017-01-23 | 2018-08-02 | オリンパス株式会社 | 超解像顕微鏡 |
| CN107607203B (zh) * | 2017-09-08 | 2019-08-06 | 武汉大学 | 基于结构相似度的显著性波段选择方法 |
| JP2019091029A (ja) * | 2017-11-10 | 2019-06-13 | 住友化学株式会社 | 複合位相差板、光学積層体、及び画像表示装置 |
| CN108254340B (zh) * | 2017-12-28 | 2021-11-16 | 苏州国科医工科技发展(集团)有限公司 | 基于线偏振调制的扫描显微镜 |
| CN109211854B (zh) * | 2018-08-10 | 2021-07-02 | 国家纳米科学中心 | 多光束多光子重扫描显微成像装置 |
| DE102019101777B4 (de) * | 2019-01-24 | 2023-11-02 | Carl Zeiss Meditec Ag | Mikroskopieverfahren |
| DE102019102330C5 (de) | 2019-01-30 | 2023-02-23 | Leica Microsystems Cms Gmbh | Optisches System für ein Mikroskop, Mikroskop mit einem optischen System und Verfahren zur Abbildung eines Objekts unter Verwendung eines Mikroskops |
| CN111443496B (zh) * | 2020-03-26 | 2021-12-14 | 上海理工大学 | 一种实现双光束共轴输出的耦合装置和方法 |
| CN113252565B (zh) * | 2021-05-31 | 2023-06-16 | 山东省日照市人民医院 | 一种基于ai人工智能的肺癌循环肿瘤细胞检测装置 |
| CN115903216B (zh) * | 2022-10-31 | 2025-08-22 | 南京大学 | 一种偏振选择的双波长消色差集成荧光成像器件及方法 |
| KR20240142678A (ko) * | 2023-03-22 | 2024-10-02 | 경북대학교 산학협력단 | 렌즈 위상 파면 변조 기능 및 파면 투과 기능을 제공하는 기하학적 위상 광학 소자 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6184535B1 (en) * | 1997-09-19 | 2001-02-06 | Olympus Optical Co., Ltd. | Method of microscopic observation |
| US6667830B1 (en) * | 1998-04-09 | 2003-12-23 | Japan Science And Technology Corporation | Super-resolution microscope system and method for illumination |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07234382A (ja) * | 1994-02-24 | 1995-09-05 | Matsushita Electric Ind Co Ltd | 超解像走査光学装置 |
| US5866911A (en) * | 1994-07-15 | 1999-02-02 | Baer; Stephen C. | Method and apparatus for improving resolution in scanned optical system |
| JP3164989B2 (ja) | 1994-12-28 | 2001-05-14 | 科学技術振興事業団 | 試料観察方法および多波長光光学顕微鏡 |
| US6844963B2 (en) * | 2000-03-23 | 2005-01-18 | Olympus Optical Co., Ltd. | Double-resonance-absorption microscope |
| JP4334835B2 (ja) * | 2002-08-28 | 2009-09-30 | 独立行政法人科学技術振興機構 | 顕微鏡 |
| JP3993553B2 (ja) * | 2003-10-15 | 2007-10-17 | 独立行政法人科学技術振興機構 | ３次元分析装置 |
| JP2006047912A (ja) * | 2004-08-09 | 2006-02-16 | Olympus Corp | 超解像顕微鏡 |
| JP4258814B2 (ja) * | 2004-11-11 | 2009-04-30 | オリンパス株式会社 | 顕微鏡の照明装置 |
| US7776613B2 (en) * | 2006-08-07 | 2010-08-17 | President And Fellows Of Harvard College | Sub-diffraction image resolution and other imaging techniques |
| JP2008058003A (ja) * | 2006-08-29 | 2008-03-13 | Olympus Corp | 顕微鏡 |
| JP2010102332A (ja) * | 2008-09-29 | 2010-05-06 | Nikon Corp | 光活性化限局顕微鏡及び光活性化限局観察方法 |
-
2009
- 2009-12-11 JP JP2009281179A patent/JP5484879B2/ja not_active Expired - Fee Related
-
2010
- 2010-12-07 US US12/961,917 patent/US8536543B2/en not_active Expired - Fee Related
- 2010-12-09 CN CN201010580742.8A patent/CN102096180B/zh not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6184535B1 (en) * | 1997-09-19 | 2001-02-06 | Olympus Optical Co., Ltd. | Method of microscopic observation |
| US6667830B1 (en) * | 1998-04-09 | 2003-12-23 | Japan Science And Technology Corporation | Super-resolution microscope system and method for illumination |
Non-Patent Citations (1)
| Title |
|---|
| 《Investigation of the center intensity of first- and second-order Laguerre–Gaussian beams with linear and circular polarization》;Yoshinori Iketaki等;《OPTICS LETTERS》;20070815;第32卷(第16期);2357-2359页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102096180A (zh) | 2011-06-15 |
| US8536543B2 (en) | 2013-09-17 |
| JP2011123314A (ja) | 2011-06-23 |
| US20110140000A1 (en) | 2011-06-16 |
| JP5484879B2 (ja) | 2014-05-07 |
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Granted publication date: 20151028 Termination date: 20191209 |