CN108254340B - 基于线偏振调制的扫描显微镜 - Google Patents
基于线偏振调制的扫描显微镜 Download PDFInfo
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- CN108254340B CN108254340B CN201711461379.6A CN201711461379A CN108254340B CN 108254340 B CN108254340 B CN 108254340B CN 201711461379 A CN201711461379 A CN 201711461379A CN 108254340 B CN108254340 B CN 108254340B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0068—Optical details of the image generation arrangements using polarisation
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CN201711461379.6A CN108254340B (zh) | 2017-12-28 | 2017-12-28 | 基于线偏振调制的扫描显微镜 |
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CN108254340B true CN108254340B (zh) | 2021-11-16 |
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Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109283674A (zh) * | 2018-10-08 | 2019-01-29 | 西北大学 | 一种荧光差分显微镜光路装置 |
CN111257295A (zh) * | 2019-11-14 | 2020-06-09 | 江苏省医疗器械检验所 | 一种基于径向偏振光的高分辨差分共聚焦成像系统及成像方法 |
CN114216887B (zh) * | 2021-12-02 | 2023-11-28 | 南昌大学 | 偏振调制提高受激发射损耗显微系统分辨率的方法 |
CN116755234A (zh) * | 2023-08-17 | 2023-09-15 | 浙江荷湖科技有限公司 | 一种线光扫描共聚焦显微成像系统及方法 |
Citations (8)
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CN102096180A (zh) * | 2009-12-11 | 2011-06-15 | 奥林巴斯株式会社 | 超分辨率显微镜 |
CN102230883A (zh) * | 2011-04-26 | 2011-11-02 | 上海理工大学 | 一种高分辨率的高速偏振差异成像方法 |
EP2713195A1 (en) * | 2012-09-28 | 2014-04-02 | Universität Heidelberg | High resolution microscopy by means of structured illumination at large working distances |
CN104062750A (zh) * | 2014-06-18 | 2014-09-24 | 浙江大学 | 一种双光子荧光受激发射微分超分辨率显微方法与装置 |
US8867130B1 (en) * | 2010-07-22 | 2014-10-21 | Vuv Analytics, Inc. | Polarization device for vacuum ultraviolet or shorter wavelengths |
JP2015190992A (ja) * | 2014-03-27 | 2015-11-02 | 株式会社ニコン | 共焦点顕微鏡装置及び共焦点観察方法 |
CN105510290A (zh) * | 2015-12-22 | 2016-04-20 | 浙江大学 | 光子重组的非线性超分辨显微方法及装置 |
CN107092086A (zh) * | 2017-02-24 | 2017-08-25 | 浙江大学 | 基于相位调制的激光扫描饱和结构光照明的显微方法及装置 |
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2017
- 2017-12-28 CN CN201711461379.6A patent/CN108254340B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102096180A (zh) * | 2009-12-11 | 2011-06-15 | 奥林巴斯株式会社 | 超分辨率显微镜 |
US8867130B1 (en) * | 2010-07-22 | 2014-10-21 | Vuv Analytics, Inc. | Polarization device for vacuum ultraviolet or shorter wavelengths |
CN102230883A (zh) * | 2011-04-26 | 2011-11-02 | 上海理工大学 | 一种高分辨率的高速偏振差异成像方法 |
EP2713195A1 (en) * | 2012-09-28 | 2014-04-02 | Universität Heidelberg | High resolution microscopy by means of structured illumination at large working distances |
JP2015190992A (ja) * | 2014-03-27 | 2015-11-02 | 株式会社ニコン | 共焦点顕微鏡装置及び共焦点観察方法 |
CN104062750A (zh) * | 2014-06-18 | 2014-09-24 | 浙江大学 | 一种双光子荧光受激发射微分超分辨率显微方法与装置 |
CN105510290A (zh) * | 2015-12-22 | 2016-04-20 | 浙江大学 | 光子重组的非线性超分辨显微方法及装置 |
CN107092086A (zh) * | 2017-02-24 | 2017-08-25 | 浙江大学 | 基于相位调制的激光扫描饱和结构光照明的显微方法及装置 |
Non-Patent Citations (4)
Title |
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Intensity weighted subtraction microscopy approach for imagecontrast and resolution enhancement;K. Korobchevskaya,et al;《Sci. Rep.》;20161231;第1-9页 * |
Polarization modulation for fluorescence emission difference microscopy;N. Wang,et al;《Opt. Express》;20151231;第13704-13712页 * |
Resolution enhancement of confocal microscopy by subtraction method with vector beams;S. Segawa,et al;《Opt. Lett.》;20141231;第3118-3121页 * |
共聚焦激光扫描光学显微成像关键技术研究;魏通达;《中国博士学位论文全文数据库 工程科技Ⅱ辑》;20140915;第11-64页 * |
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