CN101900691B - 玻璃板检查系统 - Google Patents
玻璃板检查系统 Download PDFInfo
- Publication number
- CN101900691B CN101900691B CN201010233477.6A CN201010233477A CN101900691B CN 101900691 B CN101900691 B CN 101900691B CN 201010233477 A CN201010233477 A CN 201010233477A CN 101900691 B CN101900691 B CN 101900691B
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- CN
- China
- Prior art keywords
- line scan
- glass plate
- scan camera
- mirror
- concave surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000011521 glass Substances 0.000 title claims abstract description 143
- 238000007689 inspection Methods 0.000 title claims abstract description 26
- 230000007547 defect Effects 0.000 claims abstract description 43
- 230000003287 optical effect Effects 0.000 claims description 81
- 230000002950 deficient Effects 0.000 claims description 34
- 238000000034 method Methods 0.000 claims description 23
- 238000012546 transfer Methods 0.000 claims description 3
- 230000033001 locomotion Effects 0.000 abstract description 6
- 239000002245 particle Substances 0.000 abstract description 5
- 230000000007 visual effect Effects 0.000 description 16
- 238000010586 diagram Methods 0.000 description 11
- 238000003384 imaging method Methods 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 230000000747 cardiac effect Effects 0.000 description 5
- 238000012937 correction Methods 0.000 description 5
- 230000011514 reflex Effects 0.000 description 5
- 238000005452 bending Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000005538 encapsulation Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000000875 corresponding effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
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- 230000005855 radiation Effects 0.000 description 2
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- 125000004122 cyclic group Chemical group 0.000 description 1
- 230000009365 direct transmission Effects 0.000 description 1
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- 239000000835 fiber Substances 0.000 description 1
- 210000003734 kidney Anatomy 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US18046909P | 2009-05-22 | 2009-05-22 | |
| US61/180,469 | 2009-05-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101900691A CN101900691A (zh) | 2010-12-01 |
| CN101900691B true CN101900691B (zh) | 2013-05-22 |
Family
ID=42993794
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010202671366U Expired - Lifetime CN201795992U (zh) | 2009-05-22 | 2010-05-24 | 用于检查具有第一表面和第二表面的透明玻璃板的装置 |
| CN201010233477.6A Expired - Fee Related CN101900691B (zh) | 2009-05-22 | 2010-05-24 | 玻璃板检查系统 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010202671366U Expired - Lifetime CN201795992U (zh) | 2009-05-22 | 2010-05-24 | 用于检查具有第一表面和第二表面的透明玻璃板的装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7929129B2 (enExample) |
| JP (1) | JP5610844B2 (enExample) |
| KR (1) | KR101600094B1 (enExample) |
| CN (2) | CN201795992U (enExample) |
| DE (1) | DE102010029216A1 (enExample) |
| TW (1) | TWI427286B (enExample) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2475726C1 (ru) * | 2011-06-16 | 2013-02-20 | Некоммерческая организация Научно-техническое учреждение "Инженерно-технический центр" открытого акционерного общества "Ижевский мотозавод "Аксион-холдинг" (НТУ "ИТЦ") | Устройство контроля качества стекла |
| JP6033041B2 (ja) * | 2012-10-31 | 2016-11-30 | 株式会社オハラ | 光学ガラス母材の自動品質検査装置及び光学ガラス母材の自動品質検査方法 |
| US9389187B2 (en) * | 2012-11-29 | 2016-07-12 | Corning Incorporated | Glass-sheet optical inspection systems and methods with illumination and exposure control |
| US20140152804A1 (en) * | 2012-12-05 | 2014-06-05 | Seagate Technology Llc | Sub-pixel imaging for enhanced pixel resolution |
| US8941825B2 (en) | 2013-03-15 | 2015-01-27 | Owens-Brockway Glass Container Inc. | Container inspection |
| JP6311267B2 (ja) * | 2013-05-10 | 2018-04-18 | 株式会社リコー | 分光特性取得装置、画像評価装置、画像形成装置 |
| KR20160102244A (ko) * | 2013-12-23 | 2016-08-29 | 코닝 인코포레이티드 | 광학 검사를 위한 비-이미징 코히어런트 라인 스캐너 시스템 및 방법 |
| US9588056B2 (en) | 2014-05-29 | 2017-03-07 | Corning Incorporated | Method for particle detection on flexible substrates |
| KR102460969B1 (ko) | 2014-10-29 | 2022-10-31 | 코닝 인코포레이티드 | 세포 배양 인서트 |
| CN105278131B (zh) * | 2015-11-17 | 2018-07-10 | 武汉华星光电技术有限公司 | 基板表面颗粒物的间隔式检测方法 |
| KR20170133113A (ko) * | 2016-05-25 | 2017-12-05 | 코닝정밀소재 주식회사 | 유리 상면 상의 이물질 검출 방법과 장치, 및 입사광 조사 방법 |
| CN106238341A (zh) * | 2016-08-08 | 2016-12-21 | 凡音环保科技(苏州)有限公司 | 一种便捷式平面玻璃自动化光学检测设备 |
| CN107884318B (zh) | 2016-09-30 | 2020-04-10 | 上海微电子装备(集团)股份有限公司 | 一种平板颗粒度检测方法 |
| WO2018085233A1 (en) * | 2016-11-02 | 2018-05-11 | Corning Incorporated | Method and apparatus for inspecting defects on transparent substrate |
| US10337977B1 (en) | 2016-11-22 | 2019-07-02 | Corning Incorporated | Systems and methods for glass particle detection |
| US11857970B2 (en) | 2017-07-14 | 2024-01-02 | Corning Incorporated | Cell culture vessel |
| CN107505321B (zh) * | 2017-08-14 | 2024-08-16 | 江苏杰克仪表有限公司 | 一种自动组装系统的玻璃片组装子系统 |
| US11055836B2 (en) * | 2018-02-13 | 2021-07-06 | Camtek Ltd. | Optical contrast enhancement for defect inspection |
| KR102580389B1 (ko) * | 2018-02-13 | 2023-09-19 | 코닝 인코포레이티드 | 유리 시트 검사 장치 및 방법 |
| CN111032851B (zh) | 2018-07-13 | 2024-03-29 | 康宁股份有限公司 | 具有包含液体介质传递表面的侧壁的微腔皿 |
| PL3649229T3 (pl) | 2018-07-13 | 2021-12-06 | Corning Incorporated | Naczynia do hodowli komórkowych ze stabilizującymi urządzeniami |
| JP7171696B2 (ja) | 2018-07-13 | 2022-11-15 | コーニング インコーポレイテッド | 相互接続されたウェルを有するマイクロプレートを備えた流体デバイス |
| CN109297991B (zh) * | 2018-11-26 | 2019-12-17 | 深圳市麓邦技术有限公司 | 一种玻璃表面缺陷检测系统及方法 |
| WO2020163054A1 (en) | 2019-02-06 | 2020-08-13 | Corning Incorporated | Methods of processing a viscous ribbon |
| CN110806412A (zh) * | 2019-11-15 | 2020-02-18 | 中国工程物理研究院激光聚变研究中心 | 一种基于光学元件的缺陷尺寸检测方法及系统 |
| CN115997118A (zh) | 2020-08-04 | 2023-04-21 | 康宁公司 | 用于检查材料的方法和装置 |
| CN112986258B (zh) * | 2021-02-09 | 2023-12-22 | 厦门威芯泰科技有限公司 | 一种表面缺陷检测装置和判断表面缺陷所在表面的方法 |
| CN113074660B (zh) * | 2021-03-26 | 2022-09-20 | 深度光学科技(天津)有限公司 | 一种大尺寸透明物体的面型测量方法 |
| CN113533351B (zh) * | 2021-08-20 | 2023-12-22 | 合肥御微半导体技术有限公司 | 一种面板缺陷检测装置及检测方法 |
| KR102786782B1 (ko) * | 2022-10-20 | 2025-03-28 | 주식회사 에스에프에이 | 비파괴형 투명체 가공 깊이 측정장치 |
| CN115797360B (zh) * | 2023-02-11 | 2023-04-25 | 深圳市汉高建设有限公司 | 一种玻璃幕墙生产质量监测系统 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1756949A (zh) * | 2003-03-05 | 2006-04-05 | 康宁股份有限公司 | 用于检测透明基片中的缺陷的检测装置 |
| EP1727416A1 (en) * | 2004-03-15 | 2006-11-29 | Matsushita Electric Industries Co., Ltd. | Method and equipment for inspecting mounting accuracy of component |
| CN101372090A (zh) * | 2007-08-24 | 2009-02-25 | 株式会社迪思科 | 基板的厚度测量方法及基板的加工装置 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3748015A (en) * | 1971-06-21 | 1973-07-24 | Perkin Elmer Corp | Unit power imaging catoptric anastigmat |
| US3951546A (en) | 1974-09-26 | 1976-04-20 | The Perkin-Elmer Corporation | Three-fold mirror assembly for a scanning projection system |
| JP3174615B2 (ja) * | 1992-03-24 | 2001-06-11 | コニカ株式会社 | 欠陥検査装置における投光光学系 |
| JPH06188173A (ja) * | 1992-12-16 | 1994-07-08 | Nikon Corp | 表面位置検出装置 |
| IL113789A (en) * | 1994-05-23 | 1999-01-26 | Hughes Aircraft Co | A non-focusing device with three hinged mirrors and a corrective mirror |
| JP2705753B2 (ja) * | 1994-07-26 | 1998-01-28 | 防衛庁技術研究本部長 | 像検出光学系 |
| JPH08221792A (ja) * | 1995-02-20 | 1996-08-30 | Matsushita Electric Ind Co Ltd | 光集積素子 |
| US6064517A (en) | 1996-07-22 | 2000-05-16 | Kla-Tencor Corporation | High NA system for multiple mode imaging |
| US6483638B1 (en) | 1996-07-22 | 2002-11-19 | Kla-Tencor Corporation | Ultra-broadband UV microscope imaging system with wide range zoom capability |
| WO1998010268A1 (en) * | 1996-09-05 | 1998-03-12 | Wea Manufacturing, Inc. | Glass master surface inspector |
| JP2000275169A (ja) * | 1999-03-23 | 2000-10-06 | Chino Corp | 光学的測定装置 |
| US6362923B1 (en) | 2000-03-10 | 2002-03-26 | Kla-Tencor | Lens for microscopic inspection |
| JP4104924B2 (ja) | 2002-07-08 | 2008-06-18 | 東レエンジニアリング株式会社 | 光学的測定方法およびその装置 |
| JP4230758B2 (ja) * | 2002-12-06 | 2009-02-25 | 日本板硝子株式会社 | 非接触断面形状測定方法および装置 |
| US7158215B2 (en) | 2003-06-30 | 2007-01-02 | Asml Holding N.V. | Large field of view protection optical system with aberration correctability for flat panel displays |
| JP4537131B2 (ja) * | 2004-06-30 | 2010-09-01 | 友達光電股▲ふん▼有限公司 | レーザー結晶シリコンの検査方法及びその装置 |
| US7714996B2 (en) * | 2007-01-23 | 2010-05-11 | 3i Systems Corporation | Automatic inspection system for flat panel substrate |
| JP4512627B2 (ja) * | 2007-10-03 | 2010-07-28 | キヤノン株式会社 | 測定装置、露光装置及びデバイス製造方法 |
-
2010
- 2010-05-19 US US12/782,832 patent/US7929129B2/en not_active Expired - Fee Related
- 2010-05-21 TW TW099116371A patent/TWI427286B/zh not_active IP Right Cessation
- 2010-05-21 DE DE102010029216A patent/DE102010029216A1/de not_active Withdrawn
- 2010-05-24 JP JP2010118163A patent/JP5610844B2/ja not_active Expired - Fee Related
- 2010-05-24 CN CN2010202671366U patent/CN201795992U/zh not_active Expired - Lifetime
- 2010-05-24 KR KR1020100048233A patent/KR101600094B1/ko not_active Expired - Fee Related
- 2010-05-24 CN CN201010233477.6A patent/CN101900691B/zh not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1756949A (zh) * | 2003-03-05 | 2006-04-05 | 康宁股份有限公司 | 用于检测透明基片中的缺陷的检测装置 |
| EP1727416A1 (en) * | 2004-03-15 | 2006-11-29 | Matsushita Electric Industries Co., Ltd. | Method and equipment for inspecting mounting accuracy of component |
| CN101372090A (zh) * | 2007-08-24 | 2009-02-25 | 株式会社迪思科 | 基板的厚度测量方法及基板的加工装置 |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2006-19408A 2006.01.19 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101900691A (zh) | 2010-12-01 |
| DE102010029216A1 (de) | 2010-11-25 |
| KR101600094B1 (ko) | 2016-03-04 |
| TW201109646A (en) | 2011-03-16 |
| JP5610844B2 (ja) | 2014-10-22 |
| US20100296084A1 (en) | 2010-11-25 |
| US7929129B2 (en) | 2011-04-19 |
| TWI427286B (zh) | 2014-02-21 |
| CN201795992U (zh) | 2011-04-13 |
| JP2010271320A (ja) | 2010-12-02 |
| KR20100126233A (ko) | 2010-12-01 |
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| PB01 | Publication | ||
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| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
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Granted publication date: 20130522 Termination date: 20210524 |