CN101887026B - 非点亮检查装置 - Google Patents

非点亮检查装置 Download PDF

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Publication number
CN101887026B
CN101887026B CN2010101741667A CN201010174166A CN101887026B CN 101887026 B CN101887026 B CN 101887026B CN 2010101741667 A CN2010101741667 A CN 2010101741667A CN 201010174166 A CN201010174166 A CN 201010174166A CN 101887026 B CN101887026 B CN 101887026B
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China
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mentioned
panel
examine
digital camera
line
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Expired - Fee Related
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CN2010101741667A
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English (en)
Chinese (zh)
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CN101887026A (zh
Inventor
水野邦广
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Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Publication of CN101887026A publication Critical patent/CN101887026A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN2010101741667A 2009-05-13 2010-05-13 非点亮检查装置 Expired - Fee Related CN101887026B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009116695A JP2010266284A (ja) 2009-05-13 2009-05-13 非点灯検査装置
JP2009-116695 2009-05-13

Publications (2)

Publication Number Publication Date
CN101887026A CN101887026A (zh) 2010-11-17
CN101887026B true CN101887026B (zh) 2012-10-24

Family

ID=43073029

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010101741667A Expired - Fee Related CN101887026B (zh) 2009-05-13 2010-05-13 非点亮检查装置

Country Status (4)

Country Link
JP (1) JP2010266284A (ko)
KR (1) KR101118192B1 (ko)
CN (1) CN101887026B (ko)
TW (1) TWI432720B (ko)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5556212B2 (ja) * 2010-02-08 2014-07-23 住友化学株式会社 偏光板を貼合した液晶パネルの欠陥検査方法
TW201132963A (en) * 2010-02-08 2011-10-01 Sumitomo Chemical Co An inspection method for defect in a liquid crystal panel laminated with polarizing plates
CN102252610A (zh) * 2011-05-04 2011-11-23 宋慧英 一种面板的检测方法及其流水线设备
JP6104745B2 (ja) * 2013-07-23 2017-03-29 株式会社東芝 穴検査装置
CN105301379B (zh) * 2014-07-11 2018-04-06 汕头市百川智能科技有限公司 一种自动点亮装置
CN105116572B (zh) * 2015-09-18 2019-03-29 信利（惠州）智能显示有限公司 液晶基板检测装置
CN105738381B (zh) * 2016-02-17 2018-05-04 苏州禾弘电子科技有限公司 柔性线路板用柔性基材的检测装置
CN106526917A (zh) * 2016-12-07 2017-03-22 北京工业大学 一种采用线阵相机扫描的液晶屏点阵检测装置
CN106773158A (zh) * 2016-12-07 2017-05-31 北京工业大学 一种移动式自寻位液晶屏像素质量分析装置和方法
JP2018136201A (ja) * 2017-02-22 2018-08-30 日本電産サンキョー株式会社 エッジ検知装置およびアライメント装置
CN109116599A (zh) * 2018-10-25 2019-01-01 深圳晶华显示器材有限公司 液晶显示模组产品测试方法
CN112304969A (zh) * 2019-07-15 2021-02-02 西安诺瓦星云科技股份有限公司 显示模块检测设备、方法、装置及系统和存储介质
CN110987804A (zh) * 2019-12-13 2020-04-10 苏州精濑光电有限公司 一种显示面板宏观检查设备及其照明控制装置、方法
CN111304898A (zh) * 2020-04-02 2020-06-19 徐州远大包装有限公司 一种在线自动检测编织布疵点的装置
CN111929317A (zh) * 2020-07-08 2020-11-13 昆山之奇美材料科技有限公司 一种偏光膜缺陷检测系统及方法
CN111928792B (zh) * 2020-07-15 2022-04-29 大族激光科技产业集团股份有限公司 一种lcd面板表面偏光片内切切割精度的检测方法及系统
CN112964727B (zh) * 2021-02-07 2022-08-16 厦门威芯泰科技有限公司 表面缺陷显像装置和表面缺陷检测设备
CN113176271B (zh) * 2021-04-27 2022-05-03 凯多智能科技(上海)有限公司 一种纠偏、瑕疵、尺寸检测传感器
KR102628118B1 (ko) * 2021-07-28 2024-01-25 주식회사 나노프로텍 내부 이물 검출장치
CN113934027A (zh) * 2021-09-29 2022-01-14 福建晟哲自动化科技有限公司 一种液晶面板传输检测装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6583812B1 (en) * 1997-12-26 2003-06-24 Kabushiki Kaisha Toshiba Method and apparatus for inspecting phosphor screen of cathode ray tube

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08220014A (ja) * 1995-02-14 1996-08-30 Advantest Corp Ｌｃｄパネル検査装置及びこの装置を用いたｌｃｄパネル検査方法
JP3674301B2 (ja) * 1998-03-31 2005-07-20 富士電機リテイルシステムズ株式会社 搬送媒体の画像処理方法
JP2000275596A (ja) * 1999-03-26 2000-10-06 Ricoh Co Ltd セル検査装置及びセル検査方法
JP2001083474A (ja) * 2000-08-11 2001-03-30 Sony Corp 液晶表示パネルの検査方法
KR100689850B1 (ko) * 2006-02-13 2007-03-08 삼성전자주식회사 기판검사장치
JP2008151707A (ja) * 2006-12-19 2008-07-03 Sharp Corp 表示パネル用検査装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6583812B1 (en) * 1997-12-26 2003-06-24 Kabushiki Kaisha Toshiba Method and apparatus for inspecting phosphor screen of cathode ray tube

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开2001-83474A 2001.03.30

Also Published As

Publication number Publication date
KR20100122851A (ko) 2010-11-23
KR101118192B1 (ko) 2012-03-20
CN101887026A (zh) 2010-11-17
JP2010266284A (ja) 2010-11-25
TW201107739A (en) 2011-03-01
TWI432720B (zh) 2014-04-01

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Granted publication date: 20121024

Termination date: 20190513