CN101621019A - 焊球检查修理装置以及焊球检查修理方法 - Google Patents
焊球检查修理装置以及焊球检查修理方法 Download PDFInfo
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- CN101621019A CN101621019A CN200910150523A CN200910150523A CN101621019A CN 101621019 A CN101621019 A CN 101621019A CN 200910150523 A CN200910150523 A CN 200910150523A CN 200910150523 A CN200910150523 A CN 200910150523A CN 101621019 A CN101621019 A CN 101621019A
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/08—Auxiliary devices therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/11001—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate
- H01L2224/11003—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate for holding or transferring the bump preform
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/11001—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate
- H01L2224/11005—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate for aligning the bump connector, e.g. marks, spacers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L2224/742—Apparatus for manufacturing bump connectors
Abstract
Description
Claims (7)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008170563A JP4983737B2 (ja) | 2008-06-30 | 2008-06-30 | ハンダボール検査リペア装置およびハンダボール検査リペア方法 |
JP2008-170563 | 2008-06-30 | ||
JP2008170563 | 2008-06-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101621019A true CN101621019A (zh) | 2010-01-06 |
CN101621019B CN101621019B (zh) | 2012-01-04 |
Family
ID=41514175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2009101505233A Expired - Fee Related CN101621019B (zh) | 2008-06-30 | 2009-06-18 | 焊球检查修理装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4983737B2 (zh) |
KR (1) | KR101095931B1 (zh) |
CN (1) | CN101621019B (zh) |
TW (1) | TWI480965B (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102332507A (zh) * | 2011-07-22 | 2012-01-25 | 东莞市万丰纳米材料有限公司 | 一种固晶方法 |
CN102332506A (zh) * | 2011-07-22 | 2012-01-25 | 东莞市万丰纳米材料有限公司 | 一种固晶方法 |
CN102554482A (zh) * | 2010-12-30 | 2012-07-11 | 苏州世鼎电子有限公司 | 凹槽内组件的焊接方法 |
CN106486400A (zh) * | 2015-08-31 | 2017-03-08 | 贝思瑞士股份公司 | 用于在基板的基板定位上安装设有凸块的半导体的方法 |
CN106896046A (zh) * | 2017-01-25 | 2017-06-27 | 杭州电子科技大学 | 跨尺度运动狭缝的液滴渗流特性监测方法及装置 |
CN109392254A (zh) * | 2017-08-04 | 2019-02-26 | 普罗科技有限公司 | 焊球或焊膏搭载装置 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5018062B2 (ja) * | 2006-12-15 | 2012-09-05 | 株式会社日立プラントテクノロジー | ハンダボール印刷装置 |
KR101938812B1 (ko) * | 2016-11-29 | 2019-01-15 | 주식회사 알이디테크놀로지 | 자동 공급 및 포커싱 기능을 갖는 레이저 조각기 |
CN108161162A (zh) * | 2018-03-09 | 2018-06-15 | 深圳市维特机器人科技有限公司 | Smt产线在线维修系统 |
JP7107601B1 (ja) | 2021-01-27 | 2022-07-27 | Aiメカテック株式会社 | バンプ形成装置、バンプ形成方法、ハンダボールリペア装置、及び、ハンダボールリペア方法 |
CN116918048A (zh) * | 2021-03-09 | 2023-10-20 | 株式会社富士 | 良好与否判定装置及良好与否判定方法 |
TWI772011B (zh) * | 2021-05-04 | 2022-07-21 | 特豪科技股份有限公司 | 真空式回焊方法及裝置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5928986Y2 (ja) * | 1979-06-28 | 1984-08-21 | 日本電気ホームエレクトロニクス株式会社 | 粒状体の供給装置 |
JPH0425132A (ja) * | 1990-05-18 | 1992-01-28 | Fujitsu Ltd | はんだバンプの修正方法とはんだ吸引器およびはんだボール供給器 |
CN2107343U (zh) * | 1991-11-21 | 1992-06-17 | 渠敬真 | 新型吸锡器 |
JP3254459B2 (ja) * | 1994-03-04 | 2002-02-04 | 株式会社日立製作所 | 微小ハンダ供給方法及び微小ハンダ供給装置 |
JP3360435B2 (ja) * | 1994-10-14 | 2002-12-24 | 株式会社日立製作所 | 電子回路装置の製造方法 |
JP3405175B2 (ja) * | 1998-03-10 | 2003-05-12 | 松下電器産業株式会社 | 導電ボールの実装装置および実装方法 |
JP3822834B2 (ja) * | 2002-04-12 | 2006-09-20 | 新日本製鐵株式会社 | リペア方法及び装置 |
KR100505239B1 (ko) * | 2002-12-18 | 2005-08-03 | 엘지전자 주식회사 | 비지에이 패키지용 솔더볼 장착 장치 및 방법 |
KR20070053452A (ko) * | 2005-11-21 | 2007-05-25 | 김병성 | 볼 그리드 어레이 및 웨이퍼레벨 반도체 패키지용 솔더볼범핑 툴 및 그 제조 방법 |
JP4995508B2 (ja) * | 2006-03-30 | 2012-08-08 | アスリートFa株式会社 | 微小ボールをピックアップするための装置およびその制御方法 |
JP4814756B2 (ja) * | 2006-11-01 | 2011-11-16 | 新光電気工業株式会社 | はんだボール搭載方法 |
-
2008
- 2008-06-30 JP JP2008170563A patent/JP4983737B2/ja active Active
-
2009
- 2009-06-18 CN CN2009101505233A patent/CN101621019B/zh not_active Expired - Fee Related
- 2009-06-19 KR KR1020090054799A patent/KR101095931B1/ko active IP Right Grant
- 2009-06-24 TW TW098121198A patent/TWI480965B/zh active
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102554482A (zh) * | 2010-12-30 | 2012-07-11 | 苏州世鼎电子有限公司 | 凹槽内组件的焊接方法 |
CN102332507A (zh) * | 2011-07-22 | 2012-01-25 | 东莞市万丰纳米材料有限公司 | 一种固晶方法 |
CN102332506A (zh) * | 2011-07-22 | 2012-01-25 | 东莞市万丰纳米材料有限公司 | 一种固晶方法 |
CN106486400A (zh) * | 2015-08-31 | 2017-03-08 | 贝思瑞士股份公司 | 用于在基板的基板定位上安装设有凸块的半导体的方法 |
CN106486400B (zh) * | 2015-08-31 | 2021-10-29 | 贝思瑞士股份公司 | 用于在基板的基板定位上安装设有凸块的半导体的方法 |
CN106896046A (zh) * | 2017-01-25 | 2017-06-27 | 杭州电子科技大学 | 跨尺度运动狭缝的液滴渗流特性监测方法及装置 |
CN106896046B (zh) * | 2017-01-25 | 2019-07-09 | 杭州电子科技大学 | 跨尺度运动狭缝的液滴渗流特性监测方法及装置 |
CN109392254A (zh) * | 2017-08-04 | 2019-02-26 | 普罗科技有限公司 | 焊球或焊膏搭载装置 |
Also Published As
Publication number | Publication date |
---|---|
CN101621019B (zh) | 2012-01-04 |
TWI480965B (zh) | 2015-04-11 |
JP4983737B2 (ja) | 2012-07-25 |
KR20100003204A (ko) | 2010-01-07 |
TW201017786A (en) | 2010-05-01 |
KR101095931B1 (ko) | 2011-12-19 |
JP2010010565A (ja) | 2010-01-14 |
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