CN101542304B - 测量电路及测试设备 - Google Patents

测量电路及测试设备 Download PDF

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Publication number
CN101542304B
CN101542304B CN2007800426619A CN200780042661A CN101542304B CN 101542304 B CN101542304 B CN 101542304B CN 2007800426619 A CN2007800426619 A CN 2007800426619A CN 200780042661 A CN200780042661 A CN 200780042661A CN 101542304 B CN101542304 B CN 101542304B
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CN
China
Prior art keywords
mentioned
voltage
current
resistance
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2007800426619A
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English (en)
Chinese (zh)
Other versions
CN101542304A (zh
Inventor
小原贤二
莲见卓也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of CN101542304A publication Critical patent/CN101542304A/zh
Application granted granted Critical
Publication of CN101542304B publication Critical patent/CN101542304B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN2007800426619A 2006-11-16 2007-11-09 测量电路及测试设备 Expired - Fee Related CN101542304B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006310358 2006-11-16
JP310358/2006 2006-11-16
PCT/JP2007/071839 WO2008059766A1 (fr) 2006-11-16 2007-11-09 Circuit de mesure et dispositif d'essai

Publications (2)

Publication Number Publication Date
CN101542304A CN101542304A (zh) 2009-09-23
CN101542304B true CN101542304B (zh) 2011-11-16

Family

ID=39401573

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2007800426619A Expired - Fee Related CN101542304B (zh) 2006-11-16 2007-11-09 测量电路及测试设备

Country Status (5)

Country Link
JP (1) JP5022377B2 (ja)
KR (1) KR101026128B1 (ja)
CN (1) CN101542304B (ja)
TW (1) TWI347446B (ja)
WO (1) WO2008059766A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5461379B2 (ja) * 2010-12-15 2014-04-02 株式会社アドバンテスト 試験装置
CN102288899B (zh) * 2011-07-18 2013-06-12 电子科技大学 一种精密恒流恒压施加测试电路
CN103926499B (zh) * 2013-12-27 2017-01-18 武汉天马微电子有限公司 一种自动检测多次编程线路的装置以及方法
JP7337723B2 (ja) * 2020-02-07 2023-09-04 日置電機株式会社 電流供給回路および抵抗測定装置
WO2021173635A1 (en) 2020-02-24 2021-09-02 Analog Devices, Inc. Output voltage glitch reduction in test systems

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2136473Y (zh) * 1992-07-30 1993-06-16 蔡冰 钳形测试仪

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1082837A (ja) 1996-09-06 1998-03-31 Advantest Corp Ｌｓｉ試験装置
JP2002277505A (ja) 2001-03-21 2002-09-25 Advantest Corp Ｄｃ特性測定用電源装置及び半導体試験装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2136473Y (zh) * 1992-07-30 1993-06-16 蔡冰 钳形测试仪

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP特开2002-277505A 2002.09.25
JP特开平10-82837A 1998.03.31

Also Published As

Publication number Publication date
KR20090084936A (ko) 2009-08-05
KR101026128B1 (ko) 2011-04-05
TWI347446B (en) 2011-08-21
CN101542304A (zh) 2009-09-23
JP5022377B2 (ja) 2012-09-12
TW200834100A (en) 2008-08-16
WO2008059766A1 (fr) 2008-05-22
JPWO2008059766A1 (ja) 2010-03-04

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20111116

Termination date: 20131109