TWI347446B - Survey circuit and survey instrument - Google Patents
Survey circuit and survey instrumentInfo
- Publication number
- TWI347446B TWI347446B TW096143248A TW96143248A TWI347446B TW I347446 B TWI347446 B TW I347446B TW 096143248 A TW096143248 A TW 096143248A TW 96143248 A TW96143248 A TW 96143248A TW I347446 B TWI347446 B TW I347446B
- Authority
- TW
- Taiwan
- Prior art keywords
- survey
- circuit
- instrument
- survey instrument
- survey circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006310358 | 2006-11-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200834100A TW200834100A (en) | 2008-08-16 |
TWI347446B true TWI347446B (en) | 2011-08-21 |
Family
ID=39401573
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096143248A TWI347446B (en) | 2006-11-16 | 2007-11-15 | Survey circuit and survey instrument |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5022377B2 (en) |
KR (1) | KR101026128B1 (en) |
CN (1) | CN101542304B (en) |
TW (1) | TWI347446B (en) |
WO (1) | WO2008059766A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5461379B2 (en) * | 2010-12-15 | 2014-04-02 | 株式会社アドバンテスト | Test equipment |
CN102288899B (en) * | 2011-07-18 | 2013-06-12 | 电子科技大学 | Precise constant-current constant-voltage applying test circuit |
CN103926499B (en) * | 2013-12-27 | 2017-01-18 | 武汉天马微电子有限公司 | Device and method for detecting multiple-time programming circuit automatically |
JP7337723B2 (en) | 2020-02-07 | 2023-09-04 | 日置電機株式会社 | Current supply circuit and resistance measuring device |
US11940496B2 (en) | 2020-02-24 | 2024-03-26 | Analog Devices, Inc. | Output voltage glitch reduction in ate systems |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2136473Y (en) * | 1992-07-30 | 1993-06-16 | 蔡冰 | Clamp-on tester |
JPH1082837A (en) | 1996-09-06 | 1998-03-31 | Advantest Corp | Lsi test device |
JP2002277505A (en) | 2001-03-21 | 2002-09-25 | Advantest Corp | Power unit for dc characteristic measurement and semiconductor tester |
-
2007
- 2007-11-09 KR KR1020097012304A patent/KR101026128B1/en not_active IP Right Cessation
- 2007-11-09 CN CN2007800426619A patent/CN101542304B/en not_active Expired - Fee Related
- 2007-11-09 JP JP2008544121A patent/JP5022377B2/en active Active
- 2007-11-09 WO PCT/JP2007/071839 patent/WO2008059766A1/en active Application Filing
- 2007-11-15 TW TW096143248A patent/TWI347446B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR20090084936A (en) | 2009-08-05 |
KR101026128B1 (en) | 2011-04-05 |
CN101542304B (en) | 2011-11-16 |
TW200834100A (en) | 2008-08-16 |
WO2008059766A1 (en) | 2008-05-22 |
JP5022377B2 (en) | 2012-09-12 |
JPWO2008059766A1 (en) | 2010-03-04 |
CN101542304A (en) | 2009-09-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |