TWI347446B - Survey circuit and survey instrument - Google Patents

Survey circuit and survey instrument

Info

Publication number
TWI347446B
TWI347446B TW096143248A TW96143248A TWI347446B TW I347446 B TWI347446 B TW I347446B TW 096143248 A TW096143248 A TW 096143248A TW 96143248 A TW96143248 A TW 96143248A TW I347446 B TWI347446 B TW I347446B
Authority
TW
Taiwan
Prior art keywords
survey
circuit
instrument
survey instrument
survey circuit
Prior art date
Application number
TW096143248A
Other languages
English (en)
Chinese (zh)
Other versions
TW200834100A (en
Inventor
Kenji Obara
Takuya Hasumi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200834100A publication Critical patent/TW200834100A/zh
Application granted granted Critical
Publication of TWI347446B publication Critical patent/TWI347446B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Amplifiers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW096143248A 2006-11-16 2007-11-15 Survey circuit and survey instrument TWI347446B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006310358 2006-11-16

Publications (2)

Publication Number Publication Date
TW200834100A TW200834100A (en) 2008-08-16
TWI347446B true TWI347446B (en) 2011-08-21

Family

ID=39401573

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096143248A TWI347446B (en) 2006-11-16 2007-11-15 Survey circuit and survey instrument

Country Status (5)

Country Link
JP (1) JP5022377B2 (ja)
KR (1) KR101026128B1 (ja)
CN (1) CN101542304B (ja)
TW (1) TWI347446B (ja)
WO (1) WO2008059766A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5461379B2 (ja) * 2010-12-15 2014-04-02 株式会社アドバンテスト 試験装置
CN102288899B (zh) * 2011-07-18 2013-06-12 电子科技大学 一种精密恒流恒压施加测试电路
CN103926499B (zh) * 2013-12-27 2017-01-18 武汉天马微电子有限公司 一种自动检测多次编程线路的装置以及方法
JP7337723B2 (ja) * 2020-02-07 2023-09-04 日置電機株式会社 電流供給回路および抵抗測定装置
WO2021173635A1 (en) 2020-02-24 2021-09-02 Analog Devices, Inc. Output voltage glitch reduction in test systems

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2136473Y (zh) * 1992-07-30 1993-06-16 蔡冰 钳形测试仪
JPH1082837A (ja) 1996-09-06 1998-03-31 Advantest Corp Ｌｓｉ試験装置
JP2002277505A (ja) 2001-03-21 2002-09-25 Advantest Corp Ｄｃ特性測定用電源装置及び半導体試験装置

Also Published As

Publication number Publication date
KR20090084936A (ko) 2009-08-05
KR101026128B1 (ko) 2011-04-05
CN101542304A (zh) 2009-09-23
CN101542304B (zh) 2011-11-16
JP5022377B2 (ja) 2012-09-12
TW200834100A (en) 2008-08-16
WO2008059766A1 (fr) 2008-05-22
JPWO2008059766A1 (ja) 2010-03-04

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees