CN101325169B - 载置台和使用该载置台的等离子体处理装置 - Google Patents
载置台和使用该载置台的等离子体处理装置 Download PDFInfo
- Publication number
- CN101325169B CN101325169B CN2008101256363A CN200810125636A CN101325169B CN 101325169 B CN101325169 B CN 101325169B CN 2008101256363 A CN2008101256363 A CN 2008101256363A CN 200810125636 A CN200810125636 A CN 200810125636A CN 101325169 B CN101325169 B CN 101325169B
- Authority
- CN
- China
- Prior art keywords
- cutting plate
- base material
- force application
- mounting table
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-155444 | 2007-06-12 | ||
JP2007155444A JP4782733B2 (ja) | 2007-06-12 | 2007-06-12 | 載置台およびそれを用いたプラズマ処理装置 |
JP2007155444 | 2007-06-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101325169A CN101325169A (zh) | 2008-12-17 |
CN101325169B true CN101325169B (zh) | 2010-09-22 |
Family
ID=40188624
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101256363A Expired - Fee Related CN101325169B (zh) | 2007-06-12 | 2008-06-12 | 载置台和使用该载置台的等离子体处理装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4782733B2 (ja) |
KR (1) | KR101019880B1 (ja) |
CN (1) | CN101325169B (ja) |
TW (1) | TW200919622A (ja) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5586878B2 (ja) * | 2009-06-08 | 2014-09-10 | キヤノン株式会社 | X線画像撮影装置 |
KR101582474B1 (ko) * | 2009-12-21 | 2016-01-05 | 주식회사 원익아이피에스 | 기판처리장치 및 그에 사용되는 복개부재 |
JP6104157B2 (ja) * | 2010-05-21 | 2017-03-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 大面積電極にぴったりと嵌合されたセラミックス絶縁体 |
CN102337511B (zh) * | 2010-07-20 | 2014-02-26 | 东京毅力科创株式会社 | 屏蔽部件、其构成零件以及具有屏蔽部件的基板载置台 |
JP5885939B2 (ja) * | 2010-07-20 | 2016-03-16 | 東京エレクトロン株式会社 | シールド部材及びシールド部材を備えた基板載置台 |
KR101892911B1 (ko) * | 2010-08-06 | 2018-08-29 | 어플라이드 머티어리얼스, 인코포레이티드 | 정전 척 및 정전 척의 사용 방법들 |
JP2012109446A (ja) * | 2010-11-18 | 2012-06-07 | Tokyo Electron Ltd | 絶縁部材及び絶縁部材を備えた基板処理装置 |
KR101796475B1 (ko) * | 2011-07-15 | 2017-11-14 | (주)코미코 | 기판 적재용 트레이 |
JP5667012B2 (ja) * | 2011-08-26 | 2015-02-12 | 東京エレクトロン株式会社 | リング状シールド部材、その構成部品及びリング状シールド部材を備えた基板載置台 |
JP5893516B2 (ja) * | 2012-06-22 | 2016-03-23 | 東京エレクトロン株式会社 | 被処理体の処理装置及び被処理体の載置台 |
JP5992288B2 (ja) * | 2012-10-15 | 2016-09-14 | 東京エレクトロン株式会社 | ガス導入装置及び誘導結合プラズマ処理装置 |
CN103887136B (zh) * | 2012-12-20 | 2016-03-09 | 上海华虹宏力半导体制造有限公司 | 一种适用于金属干法刻蚀半导体设备的刻蚀腔室 |
JP5941971B2 (ja) * | 2014-12-10 | 2016-06-29 | 東京エレクトロン株式会社 | リング状シールド部材及びリング状シールド部材を備えた基板載置台 |
JP6380094B2 (ja) * | 2014-12-26 | 2018-08-29 | 東京エレクトロン株式会社 | 載置台及びプラズマ処理装置 |
CN105789094B (zh) * | 2016-03-30 | 2018-08-14 | 武汉华星光电技术有限公司 | 干蚀刻装置及降低其内屏蔽环与吸附平台间缝隙的方法 |
CN106206385A (zh) * | 2016-09-27 | 2016-12-07 | 上海华力微电子有限公司 | 一种降低腔体内金属污染含量的多晶硅刻蚀腔及方法 |
KR102006435B1 (ko) * | 2017-09-01 | 2019-08-01 | 주식회사 한화 | 보트 장치 |
US10867829B2 (en) * | 2018-07-17 | 2020-12-15 | Applied Materials, Inc. | Ceramic hybrid insulator plate |
CN112117209A (zh) * | 2019-06-21 | 2020-12-22 | 上海微电子装备(集团)股份有限公司 | 硅片吸附装置及激光退火设备 |
KR102633111B1 (ko) * | 2019-11-07 | 2024-02-02 | 주식회사 원익아이피에스 | 기판지지대, 기판처리장치, 및 기판처리시스템 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0880534A (ja) * | 1994-09-13 | 1996-03-26 | Yokohama Rubber Co Ltd:The | 無端ベルト用加硫プレス装置 |
JP3424903B2 (ja) * | 1997-01-23 | 2003-07-07 | 東京エレクトロン株式会社 | プラズマ処理装置 |
JP3294175B2 (ja) * | 1997-11-05 | 2002-06-24 | 東京エレクトロン株式会社 | 信頼性試験用ウエハ収納室 |
JP3924721B2 (ja) * | 1999-12-22 | 2007-06-06 | 東京エレクトロン株式会社 | シールドリングの分割部材、シールドリング及びプラズマ処理装置 |
JP2003324053A (ja) * | 2002-04-30 | 2003-11-14 | Nikon Corp | ステージ装置および露光装置 |
JPWO2005074015A1 (ja) * | 2004-01-29 | 2007-09-13 | 株式会社ニコン | 板部材の支持方法、板部材支持装置、ステージ装置、露光装置、及びデバイスの製造方法 |
-
2007
- 2007-06-12 JP JP2007155444A patent/JP4782733B2/ja not_active Expired - Fee Related
-
2008
- 2008-06-11 TW TW097121736A patent/TW200919622A/zh unknown
- 2008-06-11 KR KR1020080054848A patent/KR101019880B1/ko not_active IP Right Cessation
- 2008-06-12 CN CN2008101256363A patent/CN101325169B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP4782733B2 (ja) | 2011-09-28 |
JP2008311298A (ja) | 2008-12-25 |
CN101325169A (zh) | 2008-12-17 |
KR20080109646A (ko) | 2008-12-17 |
TW200919622A (en) | 2009-05-01 |
KR101019880B1 (ko) | 2011-03-04 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100922 Termination date: 20160612 |