CN101208454A - 晶片处理系统及制造晶片的方法 - Google Patents

晶片处理系统及制造晶片的方法 Download PDF

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Publication number
CN101208454A
CN101208454A CNA2005800395984A CN200580039598A CN101208454A CN 101208454 A CN101208454 A CN 101208454A CN A2005800395984 A CNA2005800395984 A CN A2005800395984A CN 200580039598 A CN200580039598 A CN 200580039598A CN 101208454 A CN101208454 A CN 101208454A
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CN
China
Prior art keywords
chamber
wafer
row
treatment
process according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2005800395984A
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English (en)
Chinese (zh)
Inventor
凯文·P·费尔贝恩
哈里·蓬内坎蒂
克里斯托弗·莱恩
罗伯特·爱德华·韦斯
伊恩·拉奇福特
特里·布卢克
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Intevac Inc
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Intevac Inc
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Filing date
Publication date
Application filed by Intevac Inc filed Critical Intevac Inc
Publication of CN101208454A publication Critical patent/CN101208454A/zh
Pending legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0451Apparatus for manufacturing or treating in a plurality of work-stations
    • H10P72/0466Apparatus for manufacturing or treating in a plurality of work-stations characterised by the construction of the load-lock chamber
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0451Apparatus for manufacturing or treating in a plurality of work-stations
    • H10P72/0452Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0451Apparatus for manufacturing or treating in a plurality of work-stations
    • H10P72/0452Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
    • H10P72/0456Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers in-line arrangement
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0451Apparatus for manufacturing or treating in a plurality of work-stations
    • H10P72/0462Apparatus for manufacturing or treating in a plurality of work-stations characterised by the construction of the processing chambers, e.g. modular processing chambers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3304Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
CNA2005800395984A 2004-11-18 2005-10-31 晶片处理系统及制造晶片的方法 Pending CN101208454A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/991,722 US20060102078A1 (en) 2004-11-18 2004-11-18 Wafer fab
US10/991,722 2004-11-18

Publications (1)

Publication Number Publication Date
CN101208454A true CN101208454A (zh) 2008-06-25

Family

ID=36384826

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2005800395984A Pending CN101208454A (zh) 2004-11-18 2005-10-31 晶片处理系统及制造晶片的方法

Country Status (6)

Country Link
US (1) US20060102078A1 (https=)
EP (1) EP1815041A4 (https=)
JP (1) JP2008520837A (https=)
CN (1) CN101208454A (https=)
TW (1) TWI300964B (https=)
WO (1) WO2006055236A2 (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102422390A (zh) * 2009-03-16 2012-04-18 奥塔装置公司 气相沉积反应器系统及其方法
CN103531508A (zh) * 2013-10-17 2014-01-22 深圳市华星光电技术有限公司 基板运输设备及运输方法
CN103681363A (zh) * 2012-09-17 2014-03-26 Psk有限公司 串行线性热处理器排列
CN106784394A (zh) * 2013-12-30 2017-05-31 Sfa工程股份有限公司 用于附着玻璃与掩模的设备及方法、以及用于装载基板的系统及方法
CN112048698A (zh) * 2017-02-09 2020-12-08 应用材料公司 用于真空处理设在基板上的薄膜晶体管沟道的方法、薄膜晶体管和用于真空处理基板的设备
CN117230423A (zh) * 2022-06-08 2023-12-15 凌嘉科技股份有限公司 并列式镀膜设备及多层膜的镀膜方法

Families Citing this family (74)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130175323A1 (en) * 2002-07-01 2013-07-11 Jian Zhang Serial thermal linear processor arrangement
US20060033678A1 (en) * 2004-01-26 2006-02-16 Applied Materials, Inc. Integrated electroless deposition system
US20060240187A1 (en) * 2005-01-27 2006-10-26 Applied Materials, Inc. Deposition of an intermediate catalytic layer on a barrier layer for copper metallization
US20060162658A1 (en) * 2005-01-27 2006-07-27 Applied Materials, Inc. Ruthenium layer deposition apparatus and method
US7438949B2 (en) * 2005-01-27 2008-10-21 Applied Materials, Inc. Ruthenium containing layer deposition method
US9524896B2 (en) * 2006-09-19 2016-12-20 Brooks Automation Inc. Apparatus and methods for transporting and processing substrates
US7901539B2 (en) * 2006-09-19 2011-03-08 Intevac, Inc. Apparatus and methods for transporting and processing substrates
US8419341B2 (en) 2006-09-19 2013-04-16 Brooks Automation, Inc. Linear vacuum robot with Z motion and articulated arm
US8293066B2 (en) * 2006-09-19 2012-10-23 Brooks Automation, Inc. Apparatus and methods for transporting and processing substrates
KR20100061731A (ko) * 2007-09-14 2010-06-08 퀄컴 엠이엠스 테크놀로지스, 인크. Mems 제조에 이용되는 에칭 방법
JP4473343B2 (ja) * 2007-11-09 2010-06-02 キヤノンアネルバ株式会社 インライン型ウェハ搬送装置
CN101849285B (zh) * 2007-11-09 2012-05-30 佳能安内华股份有限公司 在线型晶圆输送装置
JP4494523B2 (ja) * 2007-11-09 2010-06-30 キヤノンアネルバ株式会社 インライン型ウェハ搬送装置および基板搬送方法
US8349196B2 (en) * 2007-12-06 2013-01-08 Intevac, Inc. System and method for commercial fabrication of patterned media
US8475591B2 (en) * 2008-08-15 2013-07-02 Varian Semiconductor Equipment Associates, Inc. Method of controlling a thickness of a sheet formed from a melt
JP5388279B2 (ja) * 2009-02-27 2014-01-15 インテバック・インコーポレイテッド 基板搬送処理装置及び方法
JP2010280943A (ja) * 2009-06-04 2010-12-16 Sony Corp 蒸着装置及び蒸着方法
JP5328726B2 (ja) 2009-08-25 2013-10-30 三星ディスプレイ株式會社 薄膜蒸着装置及びこれを利用した有機発光ディスプレイ装置の製造方法
JP5611718B2 (ja) * 2009-08-27 2014-10-22 三星ディスプレイ株式會社Samsung Display Co.,Ltd. 薄膜蒸着装置及びこれを利用した有機発光表示装置の製造方法
JP5677785B2 (ja) * 2009-08-27 2015-02-25 三星ディスプレイ株式會社Samsung Display Co.,Ltd. 薄膜蒸着装置及びこれを利用した有機発光表示装置の製造方法
US8876975B2 (en) 2009-10-19 2014-11-04 Samsung Display Co., Ltd. Thin film deposition apparatus
KR101084184B1 (ko) 2010-01-11 2011-11-17 삼성모바일디스플레이주식회사 박막 증착 장치
KR101174875B1 (ko) 2010-01-14 2012-08-17 삼성디스플레이 주식회사 박막 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
KR101193186B1 (ko) 2010-02-01 2012-10-19 삼성디스플레이 주식회사 박막 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
US10808319B1 (en) 2010-02-26 2020-10-20 Quantum Innovations, Inc. System and method for vapor deposition of substrates with circular substrate frame that rotates in a planetary motion and curved lens support arms
US10550474B1 (en) 2010-02-26 2020-02-04 Quantum Innovations, Inc. Vapor deposition system
KR101156441B1 (ko) 2010-03-11 2012-06-18 삼성모바일디스플레이주식회사 박막 증착 장치
KR101202348B1 (ko) * 2010-04-06 2012-11-16 삼성디스플레이 주식회사 박막 증착 장치 및 이를 이용한 유기 발광 표시 장치의 제조 방법
US8894458B2 (en) 2010-04-28 2014-11-25 Samsung Display Co., Ltd. Thin film deposition apparatus, method of manufacturing organic light-emitting display device by using the apparatus, and organic light-emitting display device manufactured by using the method
TW201137143A (en) * 2010-04-28 2011-11-01 Hon Hai Prec Ind Co Ltd Sputtering system
KR101223723B1 (ko) 2010-07-07 2013-01-18 삼성디스플레이 주식회사 박막 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
US20120058630A1 (en) * 2010-09-08 2012-03-08 Veeco Instruments Inc. Linear Cluster Deposition System
KR101678056B1 (ko) 2010-09-16 2016-11-22 삼성디스플레이 주식회사 박막 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
KR101723506B1 (ko) 2010-10-22 2017-04-19 삼성디스플레이 주식회사 유기층 증착 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법
KR101738531B1 (ko) 2010-10-22 2017-05-23 삼성디스플레이 주식회사 유기 발광 디스플레이 장치의 제조 방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
KR20120045865A (ko) 2010-11-01 2012-05-09 삼성모바일디스플레이주식회사 유기층 증착 장치
KR20120065789A (ko) 2010-12-13 2012-06-21 삼성모바일디스플레이주식회사 유기층 증착 장치
KR101760897B1 (ko) 2011-01-12 2017-07-25 삼성디스플레이 주식회사 증착원 및 이를 구비하는 유기막 증착 장치
KR101923174B1 (ko) 2011-05-11 2018-11-29 삼성디스플레이 주식회사 정전 척, 상기 정전 척을 포함하는 박막 증착 장치 및 이를 이용한 유기 발광 표시 장치의 제조 방법
KR101840654B1 (ko) 2011-05-25 2018-03-22 삼성디스플레이 주식회사 유기층 증착 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법
KR101852517B1 (ko) 2011-05-25 2018-04-27 삼성디스플레이 주식회사 유기층 증착 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법
KR101857249B1 (ko) 2011-05-27 2018-05-14 삼성디스플레이 주식회사 패터닝 슬릿 시트 어셈블리, 유기막 증착 장치, 유기 발광 표시장치제조 방법 및 유기 발광 표시 장치
KR20130004830A (ko) 2011-07-04 2013-01-14 삼성디스플레이 주식회사 유기층 증착 장치 및 이를 이용한 유기 발광 표시 장치의 제조 방법
KR101826068B1 (ko) 2011-07-04 2018-02-07 삼성디스플레이 주식회사 유기층 증착 장치
KR20130069037A (ko) * 2011-12-16 2013-06-26 삼성디스플레이 주식회사 유기층 증착 장치, 이를 이용한 유기 발광 표시 장치의 제조 방법 및 유기 발광 표시 장치
DE102012100927A1 (de) * 2012-02-06 2013-08-08 Roth & Rau Ag Prozessmodul
MX373826B (es) * 2012-03-20 2020-03-24 Quantum Innovations Inc Sistema y método de deposición en fase de vapor.
CN103545460B (zh) 2012-07-10 2017-04-12 三星显示有限公司 有机发光显示装置、有机发光显示设备及其制造方法
KR101959974B1 (ko) 2012-07-10 2019-07-16 삼성디스플레이 주식회사 유기층 증착 장치, 이를 이용한 유기 발광 디스플레이 장치의 제조 방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
KR102064391B1 (ko) * 2012-08-31 2020-01-10 삼성디스플레이 주식회사 기판 처리 장치
KR102013318B1 (ko) 2012-09-20 2019-08-23 삼성디스플레이 주식회사 유기층 증착 장치, 이를 이용한 유기 발광 표시 장치의 제조 방법 및 유기 발광 표시 장치
JP6188051B2 (ja) * 2012-12-25 2017-08-30 国立研究開発法人産業技術総合研究所 部品製造方法、接合剥離装置、および複合キャリア
KR102081284B1 (ko) 2013-04-18 2020-02-26 삼성디스플레이 주식회사 증착장치, 이를 이용한 유기발광 디스플레이 장치 제조 방법 및 유기발광 디스플레이 장치
KR102108361B1 (ko) 2013-06-24 2020-05-11 삼성디스플레이 주식회사 증착률 모니터링 장치, 이를 구비하는 유기층 증착 장치, 증착률 모니터링 방법, 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법
JP6908999B2 (ja) * 2013-08-12 2021-07-28 アプライド マテリアルズ イスラエル リミテッド 密封されたチャンバを形成するためのシステムおよび方法
US10348172B2 (en) 2013-11-13 2019-07-09 Brooks Automation, Inc. Sealed switched reluctance motor
KR20230116962A (ko) 2013-11-13 2023-08-04 브룩스 오토메이션 인코퍼레이티드 브러쉬리스 전기 기계 제어 방법 및 장치
TWI695447B (zh) 2013-11-13 2020-06-01 布魯克斯自動機械公司 運送設備
WO2015073647A1 (en) 2013-11-13 2015-05-21 Brooks Automation, Inc. Sealed robot drive
KR102162797B1 (ko) 2013-12-23 2020-10-08 삼성디스플레이 주식회사 유기 발광 디스플레이 장치의 제조 방법
US10236197B2 (en) * 2014-11-06 2019-03-19 Applied Materials, Inc. Processing system containing an isolation region separating a deposition chamber from a treatment chamber
US9812344B2 (en) 2015-02-03 2017-11-07 Applied Materials, Inc. Wafer processing system with chuck assembly maintenance module
DE102016101003A1 (de) 2016-01-21 2017-07-27 Aixtron Se CVD-Vorrichtung mit einem als Baugruppe aus dem Reaktorgehäuse entnehmbaren Prozesskammergehäuse
JP6731793B2 (ja) * 2016-06-08 2020-07-29 株式会社ディスコ ウェーハ加工システム
JP7163764B2 (ja) * 2018-12-27 2022-11-01 株式会社Sumco 気相成長装置
GB201913356D0 (en) * 2019-09-16 2019-10-30 Spts Technologies Ltd Wafer processing system
KR20250162936A (ko) * 2020-03-02 2025-11-19 램 리써치 코포레이션 기판 프로세싱 시스템들을 위한 칠러 (chiller) 메이크-브레이크 커넥터
US12381101B2 (en) 2022-11-07 2025-08-05 Applied Materials, Inc. Semiconductor process equipment
US12273051B2 (en) 2022-12-14 2025-04-08 Applied Materials, Inc. Apparatus and method for contactless transportation of a carrier
TWI883497B (zh) * 2023-08-02 2025-05-11 友威科技股份有限公司 雙效電漿蝕刻的連續式製程機構
US12548743B2 (en) 2023-09-01 2026-02-10 Applied Materials, Inc. Passive lift pin assembly
USD1122216S1 (en) 2023-10-02 2026-04-14 Applied Materials, Inc. Substrate carrier
USD1118552S1 (en) 2023-10-24 2026-03-17 Applied Materials, Inc. Substrate carrier
CN117626209B (zh) * 2023-11-21 2025-07-01 中南大学 便于连续改性的等离子体浸没离子注入装置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3717119A (en) * 1971-07-30 1973-02-20 Gen Motors Corp Vacuum processing machine for aluminizing headlamp reflectors
US4756815A (en) * 1979-12-21 1988-07-12 Varian Associates, Inc. Wafer coating system
JPS6411320A (en) * 1987-07-06 1989-01-13 Toshiba Corp Photo-cvd device
JPS6431971A (en) * 1987-07-28 1989-02-02 Tokuda Seisakusho Vacuum treatment device
JP2859632B2 (ja) * 1988-04-14 1999-02-17 キヤノン株式会社 成膜装置及び成膜方法
US5186718A (en) * 1989-05-19 1993-02-16 Applied Materials, Inc. Staged-vacuum wafer processing system and method
US4981408A (en) * 1989-12-18 1991-01-01 Varian Associates, Inc. Dual track handling and processing system
US5275709A (en) * 1991-11-07 1994-01-04 Leybold Aktiengesellschaft Apparatus for coating substrates, preferably flat, more or less plate-like substrates
US5803977A (en) * 1992-09-30 1998-09-08 Applied Materials, Inc. Apparatus for full wafer deposition
KR100310249B1 (ko) * 1995-08-05 2001-12-17 엔도 마코토 기판처리장치
TW317644B (https=) * 1996-01-26 1997-10-11 Tokyo Electron Co Ltd
US6176667B1 (en) * 1996-04-30 2001-01-23 Applied Materials, Inc. Multideck wafer processing system
JP3249395B2 (ja) * 1996-06-21 2002-01-21 東京応化工業株式会社 処理ユニット構築体
US6114216A (en) * 1996-11-13 2000-09-05 Applied Materials, Inc. Methods for shallow trench isolation
US5855681A (en) * 1996-11-18 1999-01-05 Applied Materials, Inc. Ultra high throughput wafer vacuum processing system
JP3582330B2 (ja) * 1997-11-14 2004-10-27 東京エレクトロン株式会社 処理装置及びこれを用いた処理システム
JPH11293459A (ja) * 1998-04-07 1999-10-26 Murata Mfg Co Ltd 多層成膜装置
KR100265287B1 (ko) * 1998-04-21 2000-10-02 윤종용 반도체소자 제조용 식각설비의 멀티챔버 시스템
US6206176B1 (en) * 1998-05-20 2001-03-27 Applied Komatsu Technology, Inc. Substrate transfer shuttle having a magnetic drive
US6083566A (en) * 1998-05-26 2000-07-04 Whitesell; Andrew B. Substrate handling and processing system and method
WO2001006030A1 (en) * 1999-07-19 2001-01-25 Young Park High throughput thin film deposition for optical disk processing
US6336999B1 (en) * 2000-10-11 2002-01-08 Centre Luxembourgeois De Recherches Pour Le Verre Et Al Ceramique S.A. (C.R.V.C.) Apparatus for sputter-coating glass and corresponding method
JP4531247B2 (ja) * 2000-12-19 2010-08-25 株式会社アルバック 真空処理装置
NL1020633C2 (nl) * 2002-05-21 2003-11-24 Otb Group Bv Samenstel voor het behandelen van substraten.

Cited By (12)

* Cited by examiner, † Cited by third party
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CN102422390A (zh) * 2009-03-16 2012-04-18 奥塔装置公司 气相沉积反应器系统及其方法
CN102422390B (zh) * 2009-03-16 2015-05-13 奥塔装置公司 气相沉积反应器系统及其方法
CN103681363A (zh) * 2012-09-17 2014-03-26 Psk有限公司 串行线性热处理器排列
CN103681363B (zh) * 2012-09-17 2016-12-07 Psk有限公司 串行线性热处理器排列
CN103531508A (zh) * 2013-10-17 2014-01-22 深圳市华星光电技术有限公司 基板运输设备及运输方法
WO2015054952A1 (zh) * 2013-10-17 2015-04-23 深圳市华星光电技术有限公司 基板运输设备及运输方法
CN103531508B (zh) * 2013-10-17 2016-05-18 深圳市华星光电技术有限公司 基板运输设备及运输方法
CN106784394A (zh) * 2013-12-30 2017-05-31 Sfa工程股份有限公司 用于附着玻璃与掩模的设备及方法、以及用于装载基板的系统及方法
CN106784394B (zh) * 2013-12-30 2018-10-09 Sfa工程股份有限公司 用于附着玻璃与掩模的设备及方法、以及用于装载基板的系统及方法
CN112048698A (zh) * 2017-02-09 2020-12-08 应用材料公司 用于真空处理设在基板上的薄膜晶体管沟道的方法、薄膜晶体管和用于真空处理基板的设备
CN112048698B (zh) * 2017-02-09 2023-07-28 应用材料公司 用于真空处理设在基板上的薄膜晶体管沟道的方法、薄膜晶体管和用于真空处理基板的设备
CN117230423A (zh) * 2022-06-08 2023-12-15 凌嘉科技股份有限公司 并列式镀膜设备及多层膜的镀膜方法

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JP2008520837A (ja) 2008-06-19
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