CN100557428C - 偏振光膜检查装置及方法 - Google Patents

偏振光膜检查装置及方法 Download PDF

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Publication number
CN100557428C
CN100557428C CNB2006100033636A CN200610003363A CN100557428C CN 100557428 C CN100557428 C CN 100557428C CN B2006100033636 A CNB2006100033636 A CN B2006100033636A CN 200610003363 A CN200610003363 A CN 200610003363A CN 100557428 C CN100557428 C CN 100557428C
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CN
China
Prior art keywords
polarization film
carrier
film
polarization
evacuated panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2006100033636A
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English (en)
Chinese (zh)
Other versions
CN1841052A (zh
Inventor
张珉硕
金镇雨
金亨珍
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EUN BU TECHNOLOGY Co Ltd
Original Assignee
EUN BU TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Publication of CN1841052A publication Critical patent/CN1841052A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
CNB2006100033636A 2005-03-31 2006-01-26 偏振光膜检查装置及方法 Expired - Fee Related CN100557428C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020050027002 2005-03-31
KR1020050027002A KR100789659B1 (ko) 2005-03-31 2005-03-31 편광필름 검사장치 및 방법

Publications (2)

Publication Number Publication Date
CN1841052A CN1841052A (zh) 2006-10-04
CN100557428C true CN100557428C (zh) 2009-11-04

Family

ID=37030159

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2006100033636A Expired - Fee Related CN100557428C (zh) 2005-03-31 2006-01-26 偏振光膜检查装置及方法

Country Status (4)

Country Link
JP (1) JP4226608B2 (ja)
KR (1) KR100789659B1 (ja)
CN (1) CN100557428C (ja)
TW (1) TWI275836B (ja)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100853247B1 (ko) * 2006-12-08 2008-08-21 주식회사 에스에프에이 편광필름 제조장치 및 편광필름 제조방법
KR100903585B1 (ko) * 2007-07-13 2009-06-23 충북대학교 산학협력단 편광필름 검사장치의 진공척
KR100804033B1 (ko) * 2007-10-04 2008-02-18 주식회사 쓰리비 시스템 광학 필름 검사장치
KR100922616B1 (ko) 2007-10-24 2009-10-21 주식회사 아바코 필름 검사장치
KR100920221B1 (ko) * 2007-11-28 2009-10-05 주식회사 아바코 필름 검사장치
KR101052883B1 (ko) * 2009-02-10 2011-07-29 엘아이지에이디피 주식회사 편광판 이송장치 및 편광판 이송방법
KR101042885B1 (ko) * 2011-03-04 2011-06-20 오승훈 시트 필름 검사용 정렬장치
KR102025704B1 (ko) * 2012-09-14 2019-09-27 삼성디스플레이 주식회사 필름 검사 장치
KR101452214B1 (ko) * 2012-12-11 2014-10-22 주식회사 에스에프에이 패널 검사장치
CN104748856A (zh) * 2013-12-31 2015-07-01 致茂电子股份有限公司 光学检测装置
CN106353332B (zh) * 2015-07-15 2019-05-28 明眼有限公司 利用图案透光板的偏光膜检查装置
KR101677016B1 (ko) * 2015-07-17 2016-11-18 디아이티 주식회사 글래스 및 필름 혼용 표면검사장치
KR20180016757A (ko) * 2016-08-08 2018-02-20 동우 화인켐 주식회사 광학 필름의 결함 검사 방법 및 장치
KR20190036007A (ko) 2017-09-26 2019-04-04 삼성전자주식회사 그립 장치 및 이를 포함하는 기판 검사 시스템
CN108088857A (zh) * 2017-11-27 2018-05-29 江西合力泰科技有限公司 一种透光膜的检测方法
KR101996346B1 (ko) * 2018-11-22 2019-07-03 (주)제이티에스 슬리터 일체형 분리막 외관 검사장치 및 이를 이용하는 분리막 검사시스템
JP2023031371A (ja) * 2021-08-25 2023-03-09 日東電工株式会社 光透過性積層体の検査方法および検査装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2677981B2 (ja) * 1996-01-26 1997-11-17 株式会社日立製作所 露光装置
JPH09329774A (ja) * 1996-06-11 1997-12-22 Hitachi Ltd 液晶表示基板外観検査装置
JP3977503B2 (ja) 1998-02-05 2007-09-19 住友化学株式会社 フィルム検査方法およびそれを用いたフィルム検査装置
KR100799208B1 (ko) * 2002-02-26 2008-01-29 삼성테크윈 주식회사 반도체 팩키지의 검사 및, 분류 방법과 장치
KR100420244B1 (ko) * 2002-05-11 2004-03-02 주식회사 이오테크닉스 필름 마커 시스템 및 이의 제어 방법
KR100625689B1 (ko) * 2003-12-12 2006-09-20 에버테크노 주식회사 편광필름 검사장치

Also Published As

Publication number Publication date
JP4226608B2 (ja) 2009-02-18
KR100789659B1 (ko) 2007-12-31
TWI275836B (en) 2007-03-11
TW200634357A (en) 2006-10-01
CN1841052A (zh) 2006-10-04
KR20060104666A (ko) 2006-10-09
JP2006284559A (ja) 2006-10-19

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