CN100485816C - 非易失性存储器及其ic卡、id卡和id标签 - Google Patents

非易失性存储器及其ic卡、id卡和id标签 Download PDF

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Publication number
CN100485816C
CN100485816C CNB2005800042200A CN200580004220A CN100485816C CN 100485816 C CN100485816 C CN 100485816C CN B2005800042200 A CNB2005800042200 A CN B2005800042200A CN 200580004220 A CN200580004220 A CN 200580004220A CN 100485816 C CN100485816 C CN 100485816C
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China
Prior art keywords
memory
state
data
states
memory cell
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Expired - Fee Related
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CNB2005800042200A
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English (en)
Chinese (zh)
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CN1918663A (zh
Inventor
加藤清
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Publication of CN1918663A publication Critical patent/CN1918663A/zh
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Publication of CN100485816C publication Critical patent/CN100485816C/zh
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/702—Masking faults in memories by using spares or by reconfiguring by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones

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  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Thin Film Transistor (AREA)
  • Mram Or Spin Memory Techniques (AREA)
CNB2005800042200A 2004-02-10 2005-02-04 非易失性存储器及其ic卡、id卡和id标签 Expired - Fee Related CN100485816C (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP033081/2004 2004-02-10
JP2004033075 2004-02-10
JP033075/2004 2004-02-10
JP2004033081 2004-02-10

Publications (2)

Publication Number Publication Date
CN1918663A CN1918663A (zh) 2007-02-21
CN100485816C true CN100485816C (zh) 2009-05-06

Family

ID=34840175

Family Applications (1)

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CNB2005800042200A Expired - Fee Related CN100485816C (zh) 2004-02-10 2005-02-04 非易失性存储器及其ic卡、id卡和id标签

Country Status (6)

Country Link
US (1) US7663915B2 (https=)
EP (1) EP1714294B1 (https=)
JP (1) JP4860160B2 (https=)
KR (2) KR101157409B1 (https=)
CN (1) CN100485816C (https=)
WO (1) WO2005076281A1 (https=)

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KR101157409B1 (ko) * 2004-02-10 2012-06-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 비휘발성 메모리와 그것을 내장하는 ic 카드, id 카드 및 id 태그
EP1886261B1 (en) 2005-05-31 2011-11-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP4939804B2 (ja) * 2005-12-21 2012-05-30 三星電子株式会社 不揮発性半導体記憶装置
US7554854B2 (en) * 2006-03-31 2009-06-30 Semiconductor Energy Laboratory Co., Ltd. Method for deleting data from NAND type nonvolatile memory
JP2007294082A (ja) * 2006-03-31 2007-11-08 Semiconductor Energy Lab Co Ltd Ｎａｎｄ型不揮発性メモリのデータ消去方法
JP4852400B2 (ja) * 2006-11-27 2012-01-11 シャープ株式会社 半導体記憶装置及び半導体装置並びに表示装置、液晶表示装置及び受像機
CN102522430B (zh) * 2007-03-23 2014-10-22 株式会社半导体能源研究所 半导体装置及其制造方法
US7897482B2 (en) * 2007-05-31 2011-03-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
WO2009001733A1 (en) * 2007-06-25 2008-12-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101404439B1 (ko) * 2007-06-29 2014-06-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 메모리 장치 및 전자 기기
JP5408930B2 (ja) 2007-08-31 2014-02-05 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP5371400B2 (ja) * 2007-12-14 2013-12-18 株式会社半導体エネルギー研究所 メモリ及び半導体装置
US20110068332A1 (en) * 2008-08-04 2011-03-24 The Trustees Of Princeton University Hybrid Dielectric Material for Thin Film Transistors
WO2010026865A1 (en) * 2008-09-05 2010-03-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device and semiconductor device
WO2010032599A1 (en) 2008-09-19 2010-03-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
CN102150268B (zh) * 2008-09-30 2013-07-31 株式会社半导体能源研究所 半导体存储器件
US8780660B2 (en) * 2010-06-08 2014-07-15 Chengdu Kiloway Electronics Inc. Spurious induced charge cleanup for one time programmable (OTP) memory
JP5686698B2 (ja) * 2011-08-05 2015-03-18 ルネサスエレクトロニクス株式会社 半導体装置
US9355026B1 (en) 2012-04-17 2016-05-31 Micron Technology, Inc. Searching using multilevel cells and programming multilevel cells for searching
CN103092315B (zh) * 2013-01-09 2015-11-25 惠州Tcl移动通信有限公司 可重启后恢复应用程序的移动终端
KR102465966B1 (ko) 2016-01-27 2022-11-10 삼성전자주식회사 메모리 소자, 및 그 메모리 소자를 포함한 전자 장치
TWI762894B (zh) * 2019-11-05 2022-05-01 友達光電股份有限公司 電路裝置

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US20010036105A1 (en) * 2000-03-29 2001-11-01 Hidekazu Takata Nonvolatile semiconductor memory device
US6490197B1 (en) * 2001-08-02 2002-12-03 Stmicroelectronics, Inc. Sector protection circuit and method for flash memory devices
CN1392564A (zh) * 2001-06-05 2003-01-22 惠普公司 非易失性存储器

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US6076149A (en) * 1997-02-14 2000-06-13 Motorola, Inc. Programmable logic device using a two bit security scheme to prevent unauthorized access
US20010036105A1 (en) * 2000-03-29 2001-11-01 Hidekazu Takata Nonvolatile semiconductor memory device
CN1392564A (zh) * 2001-06-05 2003-01-22 惠普公司 非易失性存储器
US6490197B1 (en) * 2001-08-02 2002-12-03 Stmicroelectronics, Inc. Sector protection circuit and method for flash memory devices

Also Published As

Publication number Publication date
EP1714294B1 (en) 2016-04-20
JP2005259334A (ja) 2005-09-22
KR101157409B1 (ko) 2012-06-21
WO2005076281A8 (en) 2006-10-19
EP1714294A4 (en) 2007-10-03
EP1714294A1 (en) 2006-10-25
CN1918663A (zh) 2007-02-21
US20080144374A1 (en) 2008-06-19
KR20070022654A (ko) 2007-02-27
JP4860160B2 (ja) 2012-01-25
KR20120030572A (ko) 2012-03-28
US7663915B2 (en) 2010-02-16
KR101264761B1 (ko) 2013-05-15
WO2005076281A1 (en) 2005-08-18

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Granted publication date: 20090506

Termination date: 20180204