CN100462887C - 半导体制造装置和半导体制造方法 - Google Patents

半导体制造装置和半导体制造方法 Download PDF

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Publication number
CN100462887C
CN100462887C CNB2004800043393A CN200480004339A CN100462887C CN 100462887 C CN100462887 C CN 100462887C CN B2004800043393 A CNB2004800043393 A CN B2004800043393A CN 200480004339 A CN200480004339 A CN 200480004339A CN 100462887 C CN100462887 C CN 100462887C
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CN
China
Prior art keywords
fluid
set voltage
voltage
mass flow
flow rate
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Expired - Fee Related
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CNB2004800043393A
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English (en)
Chinese (zh)
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CN1751280A (zh
Inventor
冈部庸之
金子健吾
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Publication of CN1751280A publication Critical patent/CN1751280A/zh
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Publication of CN100462887C publication Critical patent/CN100462887C/zh
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D7/00—Control of flow
    • G05D7/06—Control of flow characterised by the use of electric means
    • G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
    • G05D7/0629—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means
    • G05D7/0635—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F15/00—Details of, or accessories for, apparatus of groups G01F1/00 - G01F13/00 insofar as such details or appliances are not adapted to particular types of such apparatus
    • G01F15/02—Compensating or correcting for variations in pressure, density or temperature
    • G01F15/022—Compensating or correcting for variations in pressure, density or temperature using electrical means
    • G01F15/024—Compensating or correcting for variations in pressure, density or temperature using electrical means involving digital counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F25/00—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume
    • G01F25/10—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67253—Process monitoring, e.g. flow or thickness monitoring

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Flow Control (AREA)
  • Measuring Volume Flow (AREA)
  • Chemical Vapour Deposition (AREA)
  • Semiconductor Integrated Circuits (AREA)
CNB2004800043393A 2003-07-16 2004-07-14 半导体制造装置和半导体制造方法 Expired - Fee Related CN100462887C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003197936A JP3872776B2 (ja) 2003-07-16 2003-07-16 半導体製造装置及び半導体製造方法
JP197936/2003 2003-07-16

Publications (2)

Publication Number Publication Date
CN1751280A CN1751280A (zh) 2006-03-22
CN100462887C true CN100462887C (zh) 2009-02-18

Family

ID=34074361

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2004800043393A Expired - Fee Related CN100462887C (zh) 2003-07-16 2004-07-14 半导体制造装置和半导体制造方法

Country Status (7)

Country Link
US (1) US7510884B2 (enExample)
EP (1) EP1653312A4 (enExample)
JP (1) JP3872776B2 (enExample)
KR (1) KR101116979B1 (enExample)
CN (1) CN100462887C (enExample)
TW (1) TW200504822A (enExample)
WO (1) WO2005008350A1 (enExample)

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JP4718274B2 (ja) 2005-08-25 2011-07-06 東京エレクトロン株式会社 半導体製造装置，半導体製造装置の流量補正方法，プログラム
JP2007214406A (ja) * 2006-02-10 2007-08-23 Hitachi Metals Ltd 流量検定機能付質量流量制御装置を搭載した半導体製造装置
US7869888B2 (en) * 2006-05-31 2011-01-11 Tokyo Electron Limited Information processing apparatus, semiconductor manufacturing system, information processing method, and storage medium
JP5134841B2 (ja) * 2007-03-16 2013-01-30 Ｃｋｄ株式会社 ガス供給ユニット
JP2009004479A (ja) * 2007-06-20 2009-01-08 Panasonic Corp 装置状態監視方法および装置状態監視装置
JP5459895B2 (ja) * 2007-10-15 2014-04-02 Ｃｋｄ株式会社 ガス分流供給ユニット
DE102007062977B4 (de) * 2007-12-21 2018-07-19 Schott Ag Verfahren zur Herstellung von Prozessgasen für die Dampfphasenabscheidung
JP2010169657A (ja) * 2008-12-25 2010-08-05 Horiba Stec Co Ltd 質量流量計及びマスフローコントローラ
JP5558871B2 (ja) * 2010-03-15 2014-07-23 株式会社ダイヘン アーク溶接装置
JP2012033150A (ja) * 2010-06-30 2012-02-16 Toshiba Corp マスフローコントローラ、マスフローコントローラシステム、基板処理装置およびガス流量調整方法
JP6047308B2 (ja) * 2012-05-28 2016-12-21 日精エー・エス・ビー機械株式会社 樹脂容器用コーティング装置
AU2014281351B2 (en) * 2013-06-19 2020-03-12 Fontem Holdings 4 B.V. Device and method for sensing mass airflow
JP6216601B2 (ja) * 2013-10-09 2017-10-18 旭有機材株式会社 流量制御装置
JP6246606B2 (ja) * 2014-01-31 2017-12-13 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
KR20160012302A (ko) * 2014-07-23 2016-02-03 삼성전자주식회사 기판 제조 방법 및 그에 사용되는 기판 제조 장치
KR102628015B1 (ko) * 2017-12-01 2024-01-23 삼성전자주식회사 질량 유량 제어기, 반도체 소자의 제조장치 및 그의 관리방법
KR102066776B1 (ko) * 2017-12-11 2020-01-15 임용일 통합 분석 제어기에 의한 질량 유량 제어기 최적화 통합 시스템
KR102101068B1 (ko) * 2017-12-11 2020-04-14 조북룡 통합 분석기에 의한 질량 유량 최적화 제어 시스템
JP7130524B2 (ja) * 2018-10-26 2022-09-05 東京エレクトロン株式会社 基板処理装置の制御装置および基板処理装置の制御方法
SG11202110276WA (en) * 2019-03-25 2021-10-28 Kokusai Electric Corp Substrate processing apparatus, method of manufacturing semiconductor device, and program
JP7270489B2 (ja) * 2019-07-10 2023-05-10 東京エレクトロン株式会社 性能算出方法および処理装置
CN113552909A (zh) * 2020-04-26 2021-10-26 长鑫存储技术有限公司 阀控制系统及阀控制方法
CN115454153A (zh) * 2022-10-26 2022-12-09 北京七星华创流量计有限公司 质量流量控制器及其流量控制方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07281760A (ja) * 1994-04-12 1995-10-27 Ckd Corp マスフローコントローラ絶対流量検定システム
JPH0916268A (ja) * 1995-06-29 1997-01-17 Hisashi Takahashi 遅れ補償機能付流量制御弁
CN1166199A (zh) * 1994-08-12 1997-11-26 微动公司 用于科里奥利效应质量流量计中的故障检测和校正的方法和装置
JP2000122725A (ja) * 1998-10-19 2000-04-28 Ckd Corp ガス供給制御装置
WO2000073868A1 (en) * 1999-05-26 2000-12-07 Cyber Instrument Technology Llc Wide range gas flow system with real time flow measurement and correction

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US4335605A (en) * 1980-05-14 1982-06-22 Thermal Instrument Company Mass flow meter
GB2077434B (en) * 1980-05-30 1984-04-26 Millar John Ascertaining flow rate through valves or pumps
US4655089A (en) * 1985-06-07 1987-04-07 Smith Meter Inc. Mass flow meter and signal processing system
US5062446A (en) * 1991-01-07 1991-11-05 Sematech, Inc. Intelligent mass flow controller
EP0547617B1 (en) * 1991-12-18 1996-07-10 Pierre Delajoud Mass flow meter and method
JPH05289751A (ja) 1992-04-15 1993-11-05 Hitachi Metals Ltd マスフローコントローラのゼロ点シフト及びスパンシフトを自動補正する方法及びその自動補正機能付きマスフローコントローラ
EP0711430A1 (en) 1992-06-12 1996-05-15 Unit Instruments, Inc. Mass flow controller
JP2982003B2 (ja) * 1992-07-28 1999-11-22 コマツ電子金属株式会社 気相成長装置および気相成長装置におけるマスフローコントローラの校正方法
JP2692770B2 (ja) * 1992-09-30 1997-12-17 シーケーディ株式会社 マスフローコントローラ流量検定システム
JPH07263350A (ja) 1994-03-18 1995-10-13 Fujitsu Ltd 半導体製造方法
JP3367811B2 (ja) 1996-01-05 2003-01-20 シーケーディ株式会社 ガス配管系の検定システム
US6185469B1 (en) * 1997-05-28 2001-02-06 Board Of Regents, The University Of Texas System Method and apparatus for testing and controlling a flexible manufacturing system
JP3932389B2 (ja) * 1998-01-19 2007-06-20 Ｓｍｃ株式会社 マスフローコントローラの自己診断方法
US6339727B1 (en) * 1998-12-21 2002-01-15 Recot, Inc. Apparatus and method for controlling distribution of product in manufacturing process
JP3513437B2 (ja) * 1999-09-01 2004-03-31 キヤノン株式会社 基板管理方法及び半導体露光装置
JP2001077267A (ja) * 1999-09-08 2001-03-23 Mitsubishi Electric Corp 半導体製造装置及び半導体装置の製造方法
JP2001197936A (ja) 2000-01-19 2001-07-24 Fuairudo Kk ヘア−スタイリングの改良された方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07281760A (ja) * 1994-04-12 1995-10-27 Ckd Corp マスフローコントローラ絶対流量検定システム
CN1166199A (zh) * 1994-08-12 1997-11-26 微动公司 用于科里奥利效应质量流量计中的故障检测和校正的方法和装置
JPH0916268A (ja) * 1995-06-29 1997-01-17 Hisashi Takahashi 遅れ補償機能付流量制御弁
JP2000122725A (ja) * 1998-10-19 2000-04-28 Ckd Corp ガス供給制御装置
WO2000073868A1 (en) * 1999-05-26 2000-12-07 Cyber Instrument Technology Llc Wide range gas flow system with real time flow measurement and correction

Also Published As

Publication number Publication date
US7510884B2 (en) 2009-03-31
JP3872776B2 (ja) 2007-01-24
WO2005008350A1 (ja) 2005-01-27
TW200504822A (en) 2005-02-01
US20060172442A1 (en) 2006-08-03
EP1653312A1 (en) 2006-05-03
JP2005038058A (ja) 2005-02-10
EP1653312A4 (en) 2009-05-27
CN1751280A (zh) 2006-03-22
TWI305372B (enExample) 2009-01-11
KR101116979B1 (ko) 2012-03-15
KR20060035575A (ko) 2006-04-26

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Granted publication date: 20090218