CH441503A - Verfahren und Anordnung zum Erfassen der Kenndaten von elektrischen Bauelementen - Google Patents

Verfahren und Anordnung zum Erfassen der Kenndaten von elektrischen Bauelementen

Info

Publication number
CH441503A
CH441503A CH944266A CH944266A CH441503A CH 441503 A CH441503 A CH 441503A CH 944266 A CH944266 A CH 944266A CH 944266 A CH944266 A CH 944266A CH 441503 A CH441503 A CH 441503A
Authority
CH
Switzerland
Prior art keywords
test
circuit
line
signal
input
Prior art date
Application number
CH944266A
Other languages
German (de)
English (en)
Inventor
William Broderick John
Elvin Dawley Robert
Mansfield Fiorenza Robert
Kozar Michael
Lee Lineman Harry
Lutzer Pierson Roland
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of CH441503A publication Critical patent/CH441503A/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316Testing of analog circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07CTIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/005Registering or indicating the condition or the working of machines or other apparatus, other than vehicles during manufacturing process
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00Classifying, separating, and assorting solids
    • Y10S209/905Feeder conveyor holding item by suction

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CH944266A 1965-06-29 1966-06-29 Verfahren und Anordnung zum Erfassen der Kenndaten von elektrischen Bauelementen CH441503A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US468395A US3392830A (en) 1965-06-29 1965-06-29 Electrical component tester with test multiplexing

Publications (1)

Publication Number Publication Date
CH441503A true CH441503A (de) 1967-07-31

Family

ID=23859635

Family Applications (1)

Application Number Title Priority Date Filing Date
CH944266A CH441503A (de) 1965-06-29 1966-06-29 Verfahren und Anordnung zum Erfassen der Kenndaten von elektrischen Bauelementen

Country Status (8)

Country Link
US (1) US3392830A (xx)
JP (2) JPS447097B1 (xx)
CH (1) CH441503A (xx)
DE (1) DE1516941B2 (xx)
FR (1) FR1483576A (xx)
GB (1) GB1125229A (xx)
NL (1) NL151513B (xx)
SE (1) SE338103B (xx)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1762580B1 (de) * 1967-07-13 1971-07-08 Rca Corp Pruefeinrichtung fuer massenfertigungserzeugnisse

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3716134A (en) * 1971-03-08 1973-02-13 San Fernando Electic Mfg Co Apparatus for automatically testing and sorting electrical elements
US3759383A (en) * 1971-08-02 1973-09-18 K Inoue Apparatus for making abrasive articles
JPS5444691U (xx) * 1977-09-02 1979-03-27
ATE504844T1 (de) * 2005-12-21 2011-04-15 Rasco Gmbh Vorrichtung und verfahren zum positionieren von elektronischen mikrochips zum elektrischen testen
CN111777870B (zh) 2015-06-04 2022-06-07 太阳化学公司 氯化铜酞菁颜料
CN116899918B (zh) * 2023-07-19 2024-05-03 明光市永鸿木制品厂 一种元器连接件自检装置及自动插针机

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2567741A (en) * 1948-08-20 1951-09-11 Western Electric Co Article testing and sorting apparatus
US2885076A (en) * 1955-08-30 1959-05-05 Western Electric Co Handling apparatus for electrical articles
US2962655A (en) * 1955-11-04 1960-11-29 Sylvania Electric Prod Quality control apparatus
US2999587A (en) * 1957-08-12 1961-09-12 Pacific Semiconductors Inc Automatic diode sorter
US3039604A (en) * 1959-09-10 1962-06-19 Texas Instruments Inc Centralized automatic tester for semiconductor units
US3094212A (en) * 1961-12-14 1963-06-18 Gen Precision Inc Automatic component tester
US3209908A (en) * 1963-03-21 1965-10-05 Western Electric Co High speed apparatus for measuring and sorting electrical components

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1762580B1 (de) * 1967-07-13 1971-07-08 Rca Corp Pruefeinrichtung fuer massenfertigungserzeugnisse

Also Published As

Publication number Publication date
NL151513B (nl) 1976-11-15
SE338103B (xx) 1971-08-30
JPS447097B1 (xx) 1969-03-28
NL6608140A (xx) 1967-01-02
FR1483576A (fr) 1967-06-02
US3392830A (en) 1968-07-16
DE1516941B2 (de) 1973-10-31
DE1516941A1 (de) 1969-06-26
JPS5124872B1 (xx) 1976-07-27
GB1125229A (xx) 1968-08-28

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