SE338103B - - Google Patents

Info

Publication number
SE338103B
SE338103B SE89116/66*A SE891166A SE338103B SE 338103 B SE338103 B SE 338103B SE 891166 A SE891166 A SE 891166A SE 338103 B SE338103 B SE 338103B
Authority
SE
Sweden
Application number
SE89116/66*A
Inventor
J Broderick
R Pierson
M Kozar
H Lineman
R Dawley
R Fiorenza
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE338103B publication Critical patent/SE338103B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/005—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles during manufacturing process
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/905—Feeder conveyor holding item by suction

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SE89116/66*A 1965-06-29 1966-06-29 SE338103B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US468395A US3392830A (en) 1965-06-29 1965-06-29 Electrical component tester with test multiplexing

Publications (1)

Publication Number Publication Date
SE338103B true SE338103B (xx) 1971-08-30

Family

ID=23859635

Family Applications (1)

Application Number Title Priority Date Filing Date
SE89116/66*A SE338103B (xx) 1965-06-29 1966-06-29

Country Status (8)

Country Link
US (1) US3392830A (xx)
JP (2) JPS447097B1 (xx)
CH (1) CH441503A (xx)
DE (1) DE1516941B2 (xx)
FR (1) FR1483576A (xx)
GB (1) GB1125229A (xx)
NL (1) NL151513B (xx)
SE (1) SE338103B (xx)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3576494A (en) * 1967-07-13 1971-04-27 Rca Corp Digital computer controlled test system
US3716134A (en) * 1971-03-08 1973-02-13 San Fernando Electic Mfg Co Apparatus for automatically testing and sorting electrical elements
US3759383A (en) * 1971-08-02 1973-09-18 K Inoue Apparatus for making abrasive articles
JPS5444691U (xx) * 1977-09-02 1979-03-27
EP1801602B1 (de) * 2005-12-21 2011-04-06 Rasco GmbH Vorrichtung und Verfahren zum Positionieren von elektronischen Mikrochips zum elektrischen Testen
KR102007600B1 (ko) 2015-06-04 2019-08-05 썬 케미칼 코포레이션 염화된 구리 프탈로시아닌 안료
CN116899918B (zh) * 2023-07-19 2024-05-03 明光市永鸿木制品厂 一种元器连接件自检装置及自动插针机

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2567741A (en) * 1948-08-20 1951-09-11 Western Electric Co Article testing and sorting apparatus
US2885076A (en) * 1955-08-30 1959-05-05 Western Electric Co Handling apparatus for electrical articles
US2962655A (en) * 1955-11-04 1960-11-29 Sylvania Electric Prod Quality control apparatus
US2999587A (en) * 1957-08-12 1961-09-12 Pacific Semiconductors Inc Automatic diode sorter
US3039604A (en) * 1959-09-10 1962-06-19 Texas Instruments Inc Centralized automatic tester for semiconductor units
US3094212A (en) * 1961-12-14 1963-06-18 Gen Precision Inc Automatic component tester
US3209908A (en) * 1963-03-21 1965-10-05 Western Electric Co High speed apparatus for measuring and sorting electrical components

Also Published As

Publication number Publication date
CH441503A (de) 1967-07-31
DE1516941B2 (de) 1973-10-31
DE1516941A1 (de) 1969-06-26
JPS5124872B1 (xx) 1976-07-27
NL6608140A (xx) 1967-01-02
JPS447097B1 (xx) 1969-03-28
NL151513B (nl) 1976-11-15
FR1483576A (fr) 1967-06-02
US3392830A (en) 1968-07-16
GB1125229A (xx) 1968-08-28

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