CA2034702A1 - Method for packaging semiconductor device - Google Patents

Method for packaging semiconductor device

Info

Publication number
CA2034702A1
CA2034702A1 CA002034702A CA2034702A CA2034702A1 CA 2034702 A1 CA2034702 A1 CA 2034702A1 CA 002034702 A CA002034702 A CA 002034702A CA 2034702 A CA2034702 A CA 2034702A CA 2034702 A1 CA2034702 A1 CA 2034702A1
Authority
CA
Canada
Prior art keywords
semiconductor device
packaging substrate
packaging
bumps
electrode terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002034702A
Other languages
English (en)
French (fr)
Inventor
Masanori Nishiguchi
Atsushi Miki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2013419A external-priority patent/JPH03218041A/ja
Priority claimed from JP2013418A external-priority patent/JPH03218040A/ja
Application filed by Individual filed Critical Individual
Publication of CA2034702A1 publication Critical patent/CA2034702A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H10P72/74—
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303—Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • H10P72/0446—
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621—Components characterised by their electrical contacts
    • H05K2201/10674—Flip chip
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/166—Alignment or registration; Control of registration
    • H10W70/655—
    • H10W72/07236—
    • H10W72/07251—
    • H10W72/20—
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
    • Y10T29/49133—Assembling to base an electrical component, e.g., capacitor, etc. with component orienting
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
    • Y10T29/49144—Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CA002034702A 1990-01-23 1991-01-22 Method for packaging semiconductor device Abandoned CA2034702A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2013419A JPH03218041A (ja) 1990-01-23 1990-01-23 半導体素子の実装方法
JP13418/1990 1990-01-23
JP2013418A JPH03218040A (ja) 1990-01-23 1990-01-23 半導体素子の実装方法
JP13419/1990 1990-01-23

Publications (1)

Publication Number Publication Date
CA2034702A1 true CA2034702A1 (en) 1991-07-24

Family

ID=26349223

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002034702A Abandoned CA2034702A1 (en) 1990-01-23 1991-01-22 Method for packaging semiconductor device

Country Status (5)

Country Link
US (2) US5092033A (enExample)
EP (1) EP0439136A2 (enExample)
KR (1) KR950002744B1 (enExample)
AU (1) AU634334B2 (enExample)
CA (1) CA2034702A1 (enExample)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU645283B2 (en) * 1990-01-23 1994-01-13 Sumitomo Electric Industries, Ltd. Substrate for packaging a semiconductor device
US5152055A (en) * 1991-04-26 1992-10-06 At&T Bell Laboratories Article alignment method
US5456018A (en) * 1994-02-28 1995-10-10 The Whitaker Corporation Alignment system for planar electronic devices arranged in parallel fashion
TW312079B (enExample) * 1994-06-06 1997-08-01 Ibm
FR2725560B1 (fr) * 1994-10-06 1996-12-20 Commissariat Energie Atomique Procede d'echange d'un composant hybride par des billes de soudure
KR0137826B1 (ko) * 1994-11-15 1998-04-28 문정환 반도체 디바이스 패키지 방법 및 디바이스 패키지
JPH08201432A (ja) * 1995-01-25 1996-08-09 Matsushita Electric Ind Co Ltd プローブシート及びその製造方法
US5637835A (en) * 1995-05-26 1997-06-10 The Foxboro Company Automatic test detection of unsoldered thru-hole connector leads
US5661042A (en) * 1995-08-28 1997-08-26 Motorola, Inc. Process for electrically connecting electrical devices using a conductive anisotropic material
KR100201383B1 (ko) * 1995-10-19 1999-06-15 구본준 인터페이스 조립체를 구비한 유에프비지에이 패키지
JP3593833B2 (ja) * 1997-02-10 2004-11-24 富士通株式会社 半導体装置
JPH10284535A (ja) * 1997-04-11 1998-10-23 Toshiba Corp 半導体装置の製造方法及び半導体部品
US6389688B1 (en) 1997-06-18 2002-05-21 Micro Robotics Systems, Inc. Method and apparatus for chip placement
DE19738548A1 (de) * 1997-09-03 1999-03-11 Siemens Ag Chipkarte mit einer ersten und mit einer zweiten elektrischen Baugruppe
JPH11163047A (ja) * 1997-11-27 1999-06-18 Toshiba Corp 半導体装置の製造方法及びその装置
US6046910A (en) * 1998-03-18 2000-04-04 Motorola, Inc. Microelectronic assembly having slidable contacts and method for manufacturing the assembly
JP2000294771A (ja) * 1999-04-02 2000-10-20 Fuji Electric Co Ltd プレーナ型半導体装置
JP3756348B2 (ja) * 1999-06-15 2006-03-15 沖電気工業株式会社 合わせズレ検出パターン
US6142361A (en) * 1999-12-09 2000-11-07 International Business Machines Corporation Chip C4 assembly improvement using magnetic force and adhesive
US6376263B1 (en) * 2000-01-24 2002-04-23 International Business Machines Corporation Non-destructive module placement verification
EP1136960A1 (de) * 2000-03-24 2001-09-26 Infineon Technologies AG Individualanordnung
US7057292B1 (en) * 2000-05-19 2006-06-06 Flipchip International, Llc Solder bar for high power flip chips
KR100429856B1 (ko) * 2001-11-15 2004-05-03 페어차일드코리아반도체 주식회사 스터드 범프가 있는 웨이퍼 레벨 칩 스케일 패키지 및 그 제조 방법
US20050176233A1 (en) * 2002-11-15 2005-08-11 Rajeev Joshi Wafer-level chip scale package and method for fabricating and using the same
US20050012225A1 (en) * 2002-11-15 2005-01-20 Choi Seung-Yong Wafer-level chip scale package and method for fabricating and using the same
US20040191955A1 (en) * 2002-11-15 2004-09-30 Rajeev Joshi Wafer-level chip scale package and method for fabricating and using the same
US7109583B2 (en) * 2004-05-06 2006-09-19 Endwave Corporation Mounting with auxiliary bumps
US20060028228A1 (en) * 2004-08-05 2006-02-09 Bor-Doou Rong Test pads for IC chip
JP4570446B2 (ja) * 2004-11-16 2010-10-27 パナソニック株式会社 半導体ウェハーおよびその検査方法
US20070187844A1 (en) 2006-02-10 2007-08-16 Wintec Industries, Inc. Electronic assembly with detachable components
US7928591B2 (en) * 2005-02-11 2011-04-19 Wintec Industries, Inc. Apparatus and method for predetermined component placement to a target platform
US7728437B2 (en) * 2005-11-23 2010-06-01 Fairchild Korea Semiconductor, Ltd. Semiconductor package form within an encapsulation
US20110223695A1 (en) * 2006-02-10 2011-09-15 Kong-Chen Chen Electronic assembly with detachable components
US20110222252A1 (en) * 2006-02-10 2011-09-15 Kong-Chen Chen Electronic assembly with detachable components
US20110222253A1 (en) * 2006-02-10 2011-09-15 Kong-Chen Chen Electronic assembly with detachable components
US20110228506A1 (en) * 2006-02-10 2011-09-22 Kong-Chen Chen Electronic assembly with detachable components
TWI307406B (en) 2006-07-06 2009-03-11 Au Optronics Corp Misalignment detection devices
FR2928030B1 (fr) * 2008-02-22 2010-03-26 Commissariat Energie Atomique Procede d'alignement de deux substrats par des microbobines.
CN104779238B (zh) * 2014-01-10 2018-08-21 中芯国际集成电路制造(上海)有限公司 一种晶圆接合质量的检测结构及检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3984860A (en) * 1973-06-04 1976-10-05 International Business Machines Corporation Multi-function LSI wafers
GB1487945A (en) * 1974-11-20 1977-10-05 Ibm Semiconductor integrated circuit devices
JPS61123868A (ja) * 1984-11-21 1986-06-11 キヤノン株式会社 パネル基板の位置合せ保証方法
JPH0746747B2 (ja) * 1986-09-09 1995-05-17 松下電器産業株式会社 半導体レーザのボンディング方法
JPS63150930A (ja) * 1986-12-15 1988-06-23 Shin Etsu Polymer Co Ltd 半導体装置
DD266208A1 (de) * 1987-10-30 1989-03-22 Elektromat Veb Verfahren zur ermittlung von fehlkontaktierungen bei der herstellung von halbleiteranordnungen
US4776088A (en) * 1987-11-12 1988-10-11 The United States Of America As Represented By The United States Department Of Energy Placement accuracy gauge for electrical components and method of using same
JP2758053B2 (ja) * 1988-02-05 1998-05-25 レイケム・リミテッド 単一軸状電気伝導部品の使用
US4924589A (en) * 1988-05-16 1990-05-15 Leedy Glenn J Method of making and testing an integrated circuit

Also Published As

Publication number Publication date
US5302854A (en) 1994-04-12
KR950002744B1 (ko) 1995-03-24
AU634334B2 (en) 1993-02-18
AU6982491A (en) 1991-07-25
US5092033A (en) 1992-03-03
EP0439136A2 (en) 1991-07-31
EP0439136A3 (enExample) 1994-01-05

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Legal Events

Date Code Title Description
EEER Examination request
FZDE Discontinued