BG64999B1 - Метод за контролиране качеството на повърхността на електрода - Google Patents
Метод за контролиране качеството на повърхността на електрода Download PDFInfo
- Publication number
- BG64999B1 BG64999B1 BG106643A BG10664302A BG64999B1 BG 64999 B1 BG64999 B1 BG 64999B1 BG 106643 A BG106643 A BG 106643A BG 10664302 A BG10664302 A BG 10664302A BG 64999 B1 BG64999 B1 BG 64999B1
- Authority
- BG
- Bulgaria
- Prior art keywords
- cathode
- image
- camera
- plane
- light source
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 52
- 239000002184 metal Substances 0.000 claims abstract description 13
- 229910052751 metal Inorganic materials 0.000 claims abstract description 13
- 150000002739 metals Chemical class 0.000 claims abstract description 7
- 239000000463 material Substances 0.000 claims description 18
- 239000003792 electrolyte Substances 0.000 claims description 9
- 229910052736 halogen Inorganic materials 0.000 claims description 3
- 150000002367 halogens Chemical class 0.000 claims description 2
- 230000000704 physical effect Effects 0.000 description 4
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 238000005137 deposition process Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000001154 acute effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Mathematical Physics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Electrolytic Production Of Metals (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI992406A FI107192B (fi) | 1999-11-09 | 1999-11-09 | Menetelmä elektrodin pinnanlaadun tarkistamiseksi |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| BG106643A BG106643A (en) | 2003-04-30 |
| BG64999B1 true BG64999B1 (bg) | 2006-11-30 |
Family
ID=8555574
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BG106643A BG64999B1 (bg) | 1999-11-09 | 2002-04-24 | Метод за контролиране качеството на повърхността на електрода |
Country Status (16)
| Country | Link |
|---|---|
| US (1) | US6646733B1 (enExample) |
| EP (1) | EP1228360A1 (enExample) |
| JP (1) | JP2003514121A (enExample) |
| KR (1) | KR100816703B1 (enExample) |
| CN (1) | CN100409000C (enExample) |
| AU (1) | AU778924B2 (enExample) |
| BG (1) | BG64999B1 (enExample) |
| BR (1) | BR0015345B1 (enExample) |
| CA (1) | CA2390536C (enExample) |
| EA (1) | EA008366B1 (enExample) |
| FI (1) | FI107192B (enExample) |
| MX (1) | MXPA02004567A (enExample) |
| PE (1) | PE20010857A1 (enExample) |
| PL (1) | PL356130A1 (enExample) |
| WO (1) | WO2001035083A1 (enExample) |
| ZA (1) | ZA200203247B (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI112383B (fi) * | 2001-06-25 | 2003-11-28 | Outokumpu Oy | Menetelmä katodin laadun parantamiseksi elektrolyysissä |
| US8594417B2 (en) | 2007-11-27 | 2013-11-26 | Alcoa Inc. | Systems and methods for inspecting anodes and smelting management relating to the same |
| KR101013612B1 (ko) * | 2008-11-21 | 2011-02-10 | 엘에스니꼬동제련 주식회사 | 전해 정련된 금속석출판 표면 검사장치 |
| FI20135688L (fi) * | 2013-06-24 | 2014-12-25 | Outotec Finland Oy | Menetelmä ja järjestely metallien elektrolyyttistä raffinointia varten valettujen anodien valmistamiseksi elektrolyyttistä raffinointivaihetta varten |
| CN109103118A (zh) * | 2017-06-21 | 2018-12-28 | 致茂电子(苏州)有限公司 | 太阳能电池的检测方法与检测系统 |
| TWI639829B (zh) | 2017-06-21 | 2018-11-01 | 致茂電子股份有限公司 | 太陽能電池的檢測方法與檢測系統 |
| JP6876576B2 (ja) * | 2017-08-17 | 2021-05-26 | 日本電子株式会社 | 三次元像構築方法 |
| CN108335296B (zh) * | 2018-02-28 | 2021-10-01 | 中际山河科技有限责任公司 | 一种极板识别装置及方法 |
| CN110205653B (zh) * | 2019-06-14 | 2020-10-16 | 中国环境科学研究院 | 一种铅基阳极表面阳极泥智能识别及无损干除方法及系统 |
| CN112864034B (zh) * | 2019-11-27 | 2023-09-01 | 上海先进半导体制造有限公司 | 铝腐蚀的处理方法及系统 |
| KR20230056313A (ko) * | 2021-10-20 | 2023-04-27 | 주식회사 엘지에너지솔루션 | 전극 표면 검사 장치 |
| CN115165890A (zh) * | 2022-06-06 | 2022-10-11 | 云南铜业股份有限公司西南铜业分公司 | 一种沉积阴极铜表面特征性缺陷检测装置及方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU482658A1 (ru) * | 1972-05-03 | 1975-08-30 | Институт электрохимии АН СССР | Способ определени структурных параметров пористых электродов |
| US4498960A (en) * | 1982-11-01 | 1985-02-12 | General Electric Company | Electrochemical method for visual detection of nonmetallic surface inclusions in metallic substrates |
| DE3431148A1 (de) * | 1984-08-24 | 1986-03-06 | Klöckner-Humboldt-Deutz AG, 5000 Köln | Verfahren und vorrichtung zum entfernen von badmaterialresten an anodenresten |
| DE3837290A1 (de) * | 1988-11-03 | 1990-07-05 | Heraeus Elektroden | Pruefung von elektroden mit aktivierungsschichten |
| BE1003136A3 (nl) | 1990-03-23 | 1991-12-03 | Icos Vision Systems Nv | Werkwijze en inrichting voor het bepalen van een positie van ten minste een aansluitpen van een elektronische component. |
| WO1992019789A1 (fr) * | 1991-04-29 | 1992-11-12 | Nauchno-Proizvodstvennoe Predpriyatie 'novatekh' | Evaporateur a arc electrique de metaux |
| JPH08313544A (ja) * | 1995-05-24 | 1996-11-29 | Hitachi Ltd | 電子顕微鏡及びこれを用いた試料観察方法 |
| US5614722A (en) * | 1995-11-01 | 1997-03-25 | University Of Louisville Research Foundation, Inc. | Radiation detector based on charge amplification in a gaseous medium |
| US5774224A (en) * | 1997-01-24 | 1998-06-30 | International Business Machines Corporation | Linear-scanning, oblique-viewing optical apparatus |
| JPH11148807A (ja) * | 1997-07-29 | 1999-06-02 | Toshiba Corp | バンプ高さ測定方法及びバンプ高さ測定装置 |
| JP3272998B2 (ja) * | 1997-09-30 | 2002-04-08 | イビデン株式会社 | バンプ高さ良否判定装置 |
| JPH11111174A (ja) * | 1997-10-03 | 1999-04-23 | Sony Corp | 電子銃の位置ずれ検出方法及び検出装置 |
| US5951372A (en) * | 1997-11-14 | 1999-09-14 | Lucent Technologies Inc. | Method of roughing a metallic surface of a semiconductor deposition tool |
| JP3724949B2 (ja) * | 1998-05-15 | 2005-12-07 | 株式会社東芝 | 基板検査装置およびこれを備えた基板検査システム並びに基板検査方法 |
-
1999
- 1999-11-09 FI FI992406A patent/FI107192B/fi not_active IP Right Cessation
-
2000
- 2000-10-20 PE PE2000001130A patent/PE20010857A1/es not_active Application Discontinuation
- 2000-10-27 MX MXPA02004567A patent/MXPA02004567A/es active IP Right Grant
- 2000-10-27 CA CA002390536A patent/CA2390536C/en not_active Expired - Lifetime
- 2000-10-27 EP EP00972931A patent/EP1228360A1/en not_active Withdrawn
- 2000-10-27 JP JP2001536564A patent/JP2003514121A/ja not_active Abandoned
- 2000-10-27 US US10/129,869 patent/US6646733B1/en not_active Expired - Fee Related
- 2000-10-27 CN CNB008154767A patent/CN100409000C/zh not_active Expired - Lifetime
- 2000-10-27 WO PCT/FI2000/000932 patent/WO2001035083A1/en not_active Ceased
- 2000-10-27 AU AU11489/01A patent/AU778924B2/en not_active Ceased
- 2000-10-27 EA EA200200543A patent/EA008366B1/ru not_active IP Right Cessation
- 2000-10-27 PL PL00356130A patent/PL356130A1/xx not_active Application Discontinuation
- 2000-10-27 KR KR1020027005949A patent/KR100816703B1/ko not_active Expired - Fee Related
- 2000-10-27 BR BRPI0015345-1A patent/BR0015345B1/pt not_active IP Right Cessation
-
2002
- 2002-04-24 BG BG106643A patent/BG64999B1/bg unknown
- 2002-04-24 ZA ZA200203247A patent/ZA200203247B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| MXPA02004567A (es) | 2002-09-02 |
| JP2003514121A (ja) | 2003-04-15 |
| BR0015345B1 (pt) | 2011-01-25 |
| PL356130A1 (en) | 2004-06-14 |
| EP1228360A1 (en) | 2002-08-07 |
| BR0015345A (pt) | 2002-06-25 |
| EA008366B1 (ru) | 2007-04-27 |
| EA200200543A1 (ru) | 2002-10-31 |
| KR100816703B1 (ko) | 2008-03-27 |
| CN100409000C (zh) | 2008-08-06 |
| CA2390536C (en) | 2009-09-15 |
| CA2390536A1 (en) | 2001-05-17 |
| WO2001035083A1 (en) | 2001-05-17 |
| ZA200203247B (en) | 2002-11-28 |
| KR20020053844A (ko) | 2002-07-05 |
| AU778924B2 (en) | 2004-12-23 |
| PE20010857A1 (es) | 2001-08-21 |
| AU1148901A (en) | 2001-06-06 |
| US6646733B1 (en) | 2003-11-11 |
| FI107192B (fi) | 2001-06-15 |
| BG106643A (en) | 2003-04-30 |
| CN1531648A (zh) | 2004-09-22 |
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