EA200200543A1 - Способ контроля качества поверхности электрода - Google Patents
Способ контроля качества поверхности электродаInfo
- Publication number
- EA200200543A1 EA200200543A1 EA200200543A EA200200543A EA200200543A1 EA 200200543 A1 EA200200543 A1 EA 200200543A1 EA 200200543 A EA200200543 A EA 200200543A EA 200200543 A EA200200543 A EA 200200543A EA 200200543 A1 EA200200543 A1 EA 200200543A1
- Authority
- EA
- Eurasian Patent Office
- Prior art keywords
- image
- cathode
- quality
- illuminated
- monitoring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Mathematical Physics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Electrolytic Production Of Metals (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Настоящее изобретение относится к способу контроля качества поверхности отложений, образованных на поверхности электрода при электролитическом осаждении металлов. Согласно данному изобретению катод (1), используемый в электролитическом процессе, освещают с помощью, по меньшей мере, одного светового источника (3), установленного под углом к плоской поверхности (12), образующей поверхность катода, и изображение освещенной поверхности (12) получают с помощью, по меньшей мере, одного съемочного аппарата (8); указанное изображение затем передают в устройство для обработки и анализа изображения (9) и на основе полученного изображения определяют возможные неоднородности на контролируемой поверхности для того, чтобы классифицировать полученный на катоде осадок (11) для проведения дальнейшей стадии обработки.Международная заявка была опубликована вместе с отчетом о международном поиске.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI992406A FI107192B (fi) | 1999-11-09 | 1999-11-09 | Menetelmä elektrodin pinnanlaadun tarkistamiseksi |
PCT/FI2000/000932 WO2001035083A1 (en) | 1999-11-09 | 2000-10-27 | Method for inspecting electrode surface quality |
Publications (2)
Publication Number | Publication Date |
---|---|
EA200200543A1 true EA200200543A1 (ru) | 2002-10-31 |
EA008366B1 EA008366B1 (ru) | 2007-04-27 |
Family
ID=8555574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EA200200543A EA008366B1 (ru) | 1999-11-09 | 2000-10-27 | Способ контроля качества поверхности электрода |
Country Status (16)
Country | Link |
---|---|
US (1) | US6646733B1 (ru) |
EP (1) | EP1228360A1 (ru) |
JP (1) | JP2003514121A (ru) |
KR (1) | KR100816703B1 (ru) |
CN (1) | CN100409000C (ru) |
AU (1) | AU778924B2 (ru) |
BG (1) | BG64999B1 (ru) |
BR (1) | BR0015345B1 (ru) |
CA (1) | CA2390536C (ru) |
EA (1) | EA008366B1 (ru) |
FI (1) | FI107192B (ru) |
MX (1) | MXPA02004567A (ru) |
PE (1) | PE20010857A1 (ru) |
PL (1) | PL356130A1 (ru) |
WO (1) | WO2001035083A1 (ru) |
ZA (1) | ZA200203247B (ru) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI112383B (fi) * | 2001-06-25 | 2003-11-28 | Outokumpu Oy | Menetelmä katodin laadun parantamiseksi elektrolyysissä |
US8594417B2 (en) | 2007-11-27 | 2013-11-26 | Alcoa Inc. | Systems and methods for inspecting anodes and smelting management relating to the same |
KR101013612B1 (ko) * | 2008-11-21 | 2011-02-10 | 엘에스니꼬동제련 주식회사 | 전해 정련된 금속석출판 표면 검사장치 |
FI20135688L (fi) * | 2013-06-24 | 2014-12-25 | Outotec Finland Oy | Menetelmä ja järjestely metallien elektrolyyttistä raffinointia varten valettujen anodien valmistamiseksi elektrolyyttistä raffinointivaihetta varten |
CN109103118A (zh) * | 2017-06-21 | 2018-12-28 | 致茂电子(苏州)有限公司 | 太阳能电池的检测方法与检测系统 |
TWI639829B (zh) * | 2017-06-21 | 2018-11-01 | 致茂電子股份有限公司 | 太陽能電池的檢測方法與檢測系統 |
JP6876576B2 (ja) * | 2017-08-17 | 2021-05-26 | 日本電子株式会社 | 三次元像構築方法 |
CN108335296B (zh) * | 2018-02-28 | 2021-10-01 | 中际山河科技有限责任公司 | 一种极板识别装置及方法 |
CN110205653B (zh) * | 2019-06-14 | 2020-10-16 | 中国环境科学研究院 | 一种铅基阳极表面阳极泥智能识别及无损干除方法及系统 |
CN112864034B (zh) * | 2019-11-27 | 2023-09-01 | 上海先进半导体制造有限公司 | 铝腐蚀的处理方法及系统 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU482658A1 (ru) * | 1972-05-03 | 1975-08-30 | Институт электрохимии АН СССР | Способ определени структурных параметров пористых электродов |
US4498960A (en) * | 1982-11-01 | 1985-02-12 | General Electric Company | Electrochemical method for visual detection of nonmetallic surface inclusions in metallic substrates |
DE3431148A1 (de) | 1984-08-24 | 1986-03-06 | Klöckner-Humboldt-Deutz AG, 5000 Köln | Verfahren und vorrichtung zum entfernen von badmaterialresten an anodenresten |
DE3837290A1 (de) * | 1988-11-03 | 1990-07-05 | Heraeus Elektroden | Pruefung von elektroden mit aktivierungsschichten |
BE1003136A3 (nl) * | 1990-03-23 | 1991-12-03 | Icos Vision Systems Nv | Werkwijze en inrichting voor het bepalen van een positie van ten minste een aansluitpen van een elektronische component. |
WO1992019789A1 (en) * | 1991-04-29 | 1992-11-12 | Nauchno-Proizvodstvennoe Predpriyatie 'novatekh' | Electric arc evaporator of metals |
JPH08313544A (ja) * | 1995-05-24 | 1996-11-29 | Hitachi Ltd | 電子顕微鏡及びこれを用いた試料観察方法 |
US5614722A (en) * | 1995-11-01 | 1997-03-25 | University Of Louisville Research Foundation, Inc. | Radiation detector based on charge amplification in a gaseous medium |
US5774224A (en) * | 1997-01-24 | 1998-06-30 | International Business Machines Corporation | Linear-scanning, oblique-viewing optical apparatus |
JPH11148807A (ja) * | 1997-07-29 | 1999-06-02 | Toshiba Corp | バンプ高さ測定方法及びバンプ高さ測定装置 |
JP3272998B2 (ja) * | 1997-09-30 | 2002-04-08 | イビデン株式会社 | バンプ高さ良否判定装置 |
JPH11111174A (ja) * | 1997-10-03 | 1999-04-23 | Sony Corp | 電子銃の位置ずれ検出方法及び検出装置 |
US5951372A (en) * | 1997-11-14 | 1999-09-14 | Lucent Technologies Inc. | Method of roughing a metallic surface of a semiconductor deposition tool |
JP3724949B2 (ja) * | 1998-05-15 | 2005-12-07 | 株式会社東芝 | 基板検査装置およびこれを備えた基板検査システム並びに基板検査方法 |
-
1999
- 1999-11-09 FI FI992406A patent/FI107192B/fi not_active IP Right Cessation
-
2000
- 2000-10-20 PE PE2000001130A patent/PE20010857A1/es not_active Application Discontinuation
- 2000-10-27 CA CA002390536A patent/CA2390536C/en not_active Expired - Lifetime
- 2000-10-27 BR BRPI0015345-1A patent/BR0015345B1/pt not_active IP Right Cessation
- 2000-10-27 AU AU11489/01A patent/AU778924B2/en not_active Ceased
- 2000-10-27 EP EP00972931A patent/EP1228360A1/en not_active Withdrawn
- 2000-10-27 JP JP2001536564A patent/JP2003514121A/ja not_active Abandoned
- 2000-10-27 KR KR1020027005949A patent/KR100816703B1/ko not_active IP Right Cessation
- 2000-10-27 US US10/129,869 patent/US6646733B1/en not_active Expired - Fee Related
- 2000-10-27 PL PL00356130A patent/PL356130A1/xx not_active Application Discontinuation
- 2000-10-27 EA EA200200543A patent/EA008366B1/ru not_active IP Right Cessation
- 2000-10-27 WO PCT/FI2000/000932 patent/WO2001035083A1/en active IP Right Grant
- 2000-10-27 MX MXPA02004567A patent/MXPA02004567A/es active IP Right Grant
- 2000-10-27 CN CNB008154767A patent/CN100409000C/zh not_active Expired - Lifetime
-
2002
- 2002-04-24 ZA ZA200203247A patent/ZA200203247B/en unknown
- 2002-04-24 BG BG106643A patent/BG64999B1/bg unknown
Also Published As
Publication number | Publication date |
---|---|
KR20020053844A (ko) | 2002-07-05 |
EP1228360A1 (en) | 2002-08-07 |
PE20010857A1 (es) | 2001-08-21 |
BG106643A (en) | 2003-04-30 |
CN1531648A (zh) | 2004-09-22 |
BG64999B1 (bg) | 2006-11-30 |
CA2390536C (en) | 2009-09-15 |
PL356130A1 (en) | 2004-06-14 |
ZA200203247B (en) | 2002-11-28 |
WO2001035083A1 (en) | 2001-05-17 |
CA2390536A1 (en) | 2001-05-17 |
MXPA02004567A (es) | 2002-09-02 |
AU778924B2 (en) | 2004-12-23 |
US6646733B1 (en) | 2003-11-11 |
KR100816703B1 (ko) | 2008-03-27 |
CN100409000C (zh) | 2008-08-06 |
BR0015345A (pt) | 2002-06-25 |
BR0015345B1 (pt) | 2011-01-25 |
FI107192B (fi) | 2001-06-15 |
EA008366B1 (ru) | 2007-04-27 |
AU1148901A (en) | 2001-06-06 |
JP2003514121A (ja) | 2003-04-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s) |
Designated state(s): KZ RU |