ATE553408T1 - Probenpositionierungsbühne und betriebsverfahren dafür - Google Patents

Probenpositionierungsbühne und betriebsverfahren dafür

Info

Publication number
ATE553408T1
ATE553408T1 AT08701772T AT08701772T ATE553408T1 AT E553408 T1 ATE553408 T1 AT E553408T1 AT 08701772 T AT08701772 T AT 08701772T AT 08701772 T AT08701772 T AT 08701772T AT E553408 T1 ATE553408 T1 AT E553408T1
Authority
AT
Austria
Prior art keywords
sample
positioning stage
sample positioning
operational methods
plane
Prior art date
Application number
AT08701772T
Other languages
English (en)
Inventor
David Mcmurtry
Ian Bennell
Original Assignee
Renishaw Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0700507A external-priority patent/GB0700507D0/en
Priority claimed from GB0700506A external-priority patent/GB0700506D0/en
Priority claimed from GB0700519A external-priority patent/GB0700519D0/en
Application filed by Renishaw Plc filed Critical Renishaw Plc
Application granted granted Critical
Publication of ATE553408T1 publication Critical patent/ATE553408T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
AT08701772T 2007-01-11 2008-01-11 Probenpositionierungsbühne und betriebsverfahren dafür ATE553408T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB0700507A GB0700507D0 (en) 2007-01-11 2007-01-11 A Movement Apparatus
GB0700506A GB0700506D0 (en) 2007-01-11 2007-01-11 A stage kit
GB0700519A GB0700519D0 (en) 2007-01-11 2007-01-11 A stage apparatus and method of operation
PCT/GB2008/000089 WO2008084242A1 (en) 2007-01-11 2008-01-11 A sample positioning stage and method of operation

Publications (1)

Publication Number Publication Date
ATE553408T1 true ATE553408T1 (de) 2012-04-15

Family

ID=39259547

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08701772T ATE553408T1 (de) 2007-01-11 2008-01-11 Probenpositionierungsbühne und betriebsverfahren dafür

Country Status (5)

Country Link
US (2) US20090310215A1 (de)
EP (2) EP2115517A1 (de)
JP (2) JP2010515943A (de)
AT (1) ATE553408T1 (de)
WO (2) WO2008084246A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090310215A1 (en) * 2007-01-11 2009-12-17 Renishaw Plc Sample positioning apparatus
CN102520508B (zh) * 2011-11-21 2014-01-15 宁波市教学仪器有限公司 显微镜的快速移动平台
JP2013137393A (ja) 2011-12-28 2013-07-11 Canon Inc 顕微鏡
WO2013126928A1 (en) * 2012-02-26 2013-08-29 Caliber Imaging & Diagnostics, Inc. Tissue specimen stage for an optical sectioning microscope
CN103674841B (zh) * 2013-12-09 2016-04-27 中国电子科技集团公司第十一研究所 承载碲锌镉样品的装置和测试碲锌镉中Zn组分的方法
US9604757B2 (en) * 2014-02-28 2017-03-28 My Smart Products, LLC Reusable bag holder and system and method of using the same
FI126404B (en) 2014-06-06 2016-11-15 Johan Lundin Optical microscope slide holder
EP3289308B1 (de) * 2015-05-01 2020-12-30 C/o Canon Kabushiki Kaisha Tischvorrichtung, verfahren zur steuerung einer tischvorrichtung und mikrokopsystem
JP2019114503A (ja) * 2017-12-26 2019-07-11 オリンパス株式会社 照明装置、顕微鏡装置
CN110361858A (zh) * 2018-08-21 2019-10-22 上海北昂医药科技股份有限公司 三维扫描平台
CN113916781A (zh) * 2021-10-09 2022-01-11 塔里木大学 微塑料定性与定量检测装置

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1098575A (en) * 1965-07-07 1968-01-10 Ti Group Services Ltd Apparatus for use in studying the surface of a specimen
US4189953A (en) * 1977-04-15 1980-02-26 Semprex Corporation Drive system for mensuration stages or the like
DE2751207A1 (de) * 1977-11-16 1979-05-17 Zeiss Carl Fa Kreuztisch fuer mikroskope
GB2034913A (en) 1978-11-21 1980-06-11 Coal Industry Patents Ltd Microscope stage
US4378709A (en) * 1980-10-08 1983-04-05 Anorad Corp. Friction drive for positioning table
DE3410201A1 (de) * 1983-03-22 1984-10-04 Olympus Optical Co., Ltd., Tokio/Tokyo Mikroskop
JPS6138215A (ja) 1984-07-31 1986-02-24 Matsushita Electric Ind Co Ltd 直進送り装置
GB8432574D0 (en) 1984-12-22 1985-02-06 Renishaw Plc Opto-electronic scale-reading apparatus
US4652095A (en) * 1985-09-26 1987-03-24 George Mauro Optical component positioning stage
US4772109A (en) * 1986-09-26 1988-09-20 The United States Of America As Represented By The United States Department Of Energy Precision adjustable stage
JPS63152293A (ja) * 1986-12-09 1988-06-24 マイクロワ−ルド　オブ　インナ−　スペ−ス　リミテイド 表示装置
JPH03139609A (ja) 1989-10-26 1991-06-13 Olympus Optical Co Ltd 顕微鏡または類似装置のステージの駆動装置
JP2921703B2 (ja) * 1990-05-28 1999-07-19 オリンパス光学工業株式会社 ステージ駆動装置
US5103338A (en) * 1990-10-04 1992-04-07 Crowley Kevin D Apparatus for positioning objects for microscopic examination
JP2559730Y2 (ja) 1991-02-20 1998-01-19 オリンパス光学工業株式会社 移動ステージ
GB9117089D0 (en) * 1991-08-08 1991-09-25 Renishaw Metrology Ltd Improvements in bearings
US5672816A (en) * 1992-03-13 1997-09-30 Park Scientific Instruments Large stage system for scanning probe microscopes and other instruments
US5497060A (en) 1993-06-21 1996-03-05 Juergens, Iii; Albert M. Positioning stage
US5623853A (en) * 1994-10-19 1997-04-29 Nikon Precision Inc. Precision motion stage with single guide beam and follower stage
DE19601018A1 (de) 1995-01-27 1996-08-01 Zeiss Carl Fa Linear verstellbarer Präzisionstisch
US5684628A (en) * 1995-02-15 1997-11-04 Applied Precision, Inc. Orthogonal motion microscope stage
DE69530367T2 (de) * 1995-03-06 2004-02-19 Perkin-Elmer Ltd., Beaconsfield Kontrolle eines Mikroskopprobenträgers
JP3576291B2 (ja) * 1995-10-23 2004-10-13 オリンパス株式会社 顕微鏡ステージ
JPH10197802A (ja) 1997-01-10 1998-07-31 Nikon Corp ステ−ジ
JPH10227981A (ja) * 1997-02-14 1998-08-25 Olympus Optical Co Ltd 顕微鏡用ｘｙステージ装置
JPH11109246A (ja) 1997-09-30 1999-04-23 Nikon Corp 電動式顕微鏡
KR100261222B1 (ko) * 1998-02-20 2000-07-01 윤종용 파티클 오염을 방지할 수 있는 마이크로스코프의 스테이지 블록어셈블리 및 이를 이용한 웨이퍼 검사방법
JPH11287957A (ja) * 1998-04-01 1999-10-19 Olympus Optical Co Ltd 粗微動駆動装置
US6193199B1 (en) 1998-07-15 2001-02-27 Nanomotion, Inc. Sample stage including a slider assembly
JP2001166216A (ja) * 1998-11-16 2001-06-22 Olympus Optical Co Ltd 顕微鏡用ステージ
US6252705B1 (en) * 1999-05-25 2001-06-26 Schlumberger Technologies, Inc. Stage for charged particle microscopy system
JP3389537B2 (ja) * 1999-08-24 2003-03-24 株式会社ミツトヨ 位置決めステージ
US6400395B1 (en) * 1999-09-08 2002-06-04 Rex A. Hoover Computerized video microscopy system
US6266184B1 (en) 2000-09-21 2001-07-24 George Mauro Compensation mechanism for component and assembly deviation in an component precision positioning stage
GB0109057D0 (en) 2001-04-11 2001-05-30 Renishaw Plc Absolute postition measurement
US6788457B2 (en) 2002-05-30 2004-09-07 George Mauro Microscope stage
DE10236239B4 (de) * 2002-08-07 2012-05-16 Vistec Semiconductor Systems Gmbh Koordinaten-Messtisch
JP2004179581A (ja) * 2002-11-29 2004-06-24 Nidek Co Ltd 半導体ウエハ検査装置
JP4551071B2 (ja) * 2003-09-19 2010-09-22 オリンパス株式会社 顕微鏡用電動ステージ制御システム、該制御装置、及び該制御方法
DE102004022484B4 (de) * 2004-05-07 2007-12-20 P.A.L.M. Microlaser Technologies Ag Mikroskoptisch
GB0413710D0 (en) 2004-06-21 2004-07-21 Renishaw Plc Scale reading apparatus
JP2006323075A (ja) * 2005-05-18 2006-11-30 Olympus Corp 顕微鏡システム
US20090310215A1 (en) * 2007-01-11 2009-12-17 Renishaw Plc Sample positioning apparatus

Also Published As

Publication number Publication date
WO2008084242A1 (en) 2008-07-17
WO2008084246A1 (en) 2008-07-17
EP2115517A1 (de) 2009-11-11
US20100073672A1 (en) 2010-03-25
US8254022B2 (en) 2012-08-28
EP2115516B1 (de) 2012-04-11
JP5244819B2 (ja) 2013-07-24
EP2115516A1 (de) 2009-11-11
US20090310215A1 (en) 2009-12-17
JP2010515942A (ja) 2010-05-13
JP2010515943A (ja) 2010-05-13

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