ATE533159T1 - Verfahren zur aktualisierung von inhalten eines multibit-flash-speicher - Google Patents

Verfahren zur aktualisierung von inhalten eines multibit-flash-speicher

Info

Publication number
ATE533159T1
ATE533159T1 AT09011429T AT09011429T ATE533159T1 AT E533159 T1 ATE533159 T1 AT E533159T1 AT 09011429 T AT09011429 T AT 09011429T AT 09011429 T AT09011429 T AT 09011429T AT E533159 T1 ATE533159 T1 AT E533159T1
Authority
AT
Austria
Prior art keywords
data
blocks
multibit
flash memory
unit
Prior art date
Application number
AT09011429T
Other languages
English (en)
Inventor
Shinichi Kanno
Shigehiro Asano
Kazuya Kitsunai
Hirokuni Yano
Toshikatsu Hida
Original Assignee
Toshiba Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Kk filed Critical Toshiba Kk
Application granted granted Critical
Publication of ATE533159T1 publication Critical patent/ATE533159T1/de

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02Addressing or allocation; Relocation
    • G06F12/06Addressing a physical block of locations, e.g. base addressing, module addressing, memory dedication
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00Arrangements for program control, e.g. control units
    • G06F9/06Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/102External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators
    • G11C16/105Circuits or methods for updating contents of nonvolatile memory, especially with 'security' features to ensure reliable replacement, i.e. preventing that old data is lost before new data is reliably written
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2216/00Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/14Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Computer Security & Cryptography (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System (AREA)
AT09011429T 2008-12-22 2009-09-07 Verfahren zur aktualisierung von inhalten eines multibit-flash-speicher ATE533159T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008325632A JP4551958B2 (ja) 2008-12-22 2008-12-22 半導体記憶装置および半導体記憶装置の制御方法

Publications (1)

Publication Number Publication Date
ATE533159T1 true ATE533159T1 (de) 2011-11-15

Family

ID=41343350

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09011429T ATE533159T1 (de) 2008-12-22 2009-09-07 Verfahren zur aktualisierung von inhalten eines multibit-flash-speicher

Country Status (7)

Country Link
US (1) US20100161885A1 (de)
EP (2) EP2309517A1 (de)
JP (1) JP4551958B2 (de)
KR (1) KR101121698B1 (de)
CN (2) CN103151073A (de)
AT (1) ATE533159T1 (de)
TW (1) TWI440042B (de)

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US8266503B2 (en) 2009-03-13 2012-09-11 Fusion-Io Apparatus, system, and method for using multi-level cell storage in a single-level cell mode
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US9245653B2 (en) 2010-03-15 2016-01-26 Intelligent Intellectual Property Holdings 2 Llc Reduced level cell mode for non-volatile memory
JP5404483B2 (ja) 2010-03-17 2014-01-29 株式会社東芝 メモリシステム
JP5066209B2 (ja) 2010-03-18 2012-11-07 株式会社東芝 コントローラ、データ記憶装置、及びプログラム
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JP5651457B2 (ja) * 2010-12-15 2015-01-14 株式会社東芝 半導体記憶装置
JP2012128644A (ja) 2010-12-15 2012-07-05 Toshiba Corp メモリシステム
JP5535128B2 (ja) 2010-12-16 2014-07-02 株式会社東芝 メモリシステム
JP2012128816A (ja) * 2010-12-17 2012-07-05 Toshiba Corp メモリシステム
JP2012221251A (ja) 2011-04-08 2012-11-12 Toshiba Corp メモリシステムの制御方法、情報処理装置、及びプログラム
US8924636B2 (en) 2012-02-23 2014-12-30 Kabushiki Kaisha Toshiba Management information generating method, logical block constructing method, and semiconductor memory device
US9251055B2 (en) 2012-02-23 2016-02-02 Kabushiki Kaisha Toshiba Memory system and control method of memory system
JP5687648B2 (ja) 2012-03-15 2015-03-18 株式会社東芝 半導体記憶装置およびプログラム
JP5813589B2 (ja) * 2012-07-13 2015-11-17 株式会社東芝 メモリシステムおよびその制御方法
US9117530B2 (en) 2013-03-14 2015-08-25 Sandisk Technologies Inc. Preserving data from adjacent word lines while programming binary non-volatile storage elements
US9009568B2 (en) 2013-08-09 2015-04-14 Sandisk Technologies Inc. Sensing parameter management in non-volatile memory storage system to compensate for broken word lines
JP6121857B2 (ja) 2013-09-20 2017-04-26 株式会社東芝 メモリシステム
JP6517549B2 (ja) * 2015-03-13 2019-05-22 東芝メモリ株式会社 メモリコントローラ、記憶装置、データ転送システム、データ転送方法、及びデータ転送プログラム
JP2018041204A (ja) 2016-09-06 2018-03-15 東芝メモリ株式会社 メモリ装置及び情報処理システム
JP7030463B2 (ja) 2017-09-22 2022-03-07 キオクシア株式会社 メモリシステム
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JP2008217857A (ja) * 2007-02-28 2008-09-18 Toshiba Corp メモリコントローラ及び半導体装置
JP4564520B2 (ja) * 2007-08-31 2010-10-20 株式会社東芝 半導体記憶装置およびその制御方法
JP4538034B2 (ja) * 2007-09-26 2010-09-08 株式会社東芝 半導体記憶装置、及びその制御方法
JP4653817B2 (ja) * 2008-03-01 2011-03-16 株式会社東芝 メモリシステム

Also Published As

Publication number Publication date
KR20100073971A (ko) 2010-07-01
KR101121698B1 (ko) 2012-02-28
EP2309517A1 (de) 2011-04-13
TW201027555A (en) 2010-07-16
CN101763894B (zh) 2013-05-01
CN101763894A (zh) 2010-06-30
US20100161885A1 (en) 2010-06-24
TWI440042B (zh) 2014-06-01
JP2010146469A (ja) 2010-07-01
EP2200045B1 (de) 2011-11-09
EP2200045A1 (de) 2010-06-23
JP4551958B2 (ja) 2010-09-29
CN103151073A (zh) 2013-06-12

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