ATE517420T1 - Vorrichtung zur bündelung von röntgenstrahlen und röntgendiagnostikanlage - Google Patents

Vorrichtung zur bündelung von röntgenstrahlen und röntgendiagnostikanlage

Info

Publication number
ATE517420T1
ATE517420T1 AT99917580T AT99917580T ATE517420T1 AT E517420 T1 ATE517420 T1 AT E517420T1 AT 99917580 T AT99917580 T AT 99917580T AT 99917580 T AT99917580 T AT 99917580T AT E517420 T1 ATE517420 T1 AT E517420T1
Authority
AT
Austria
Prior art keywords
rays
concentrator
ray
source
diagnostic system
Prior art date
Application number
AT99917580T
Other languages
English (en)
Inventor
Eric Silver
Herbert Schnopper
Russell Ingram
Original Assignee
Smithsonian Astrophysical Observatory
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smithsonian Astrophysical Observatory filed Critical Smithsonian Astrophysical Observatory
Application granted granted Critical
Publication of ATE517420T1 publication Critical patent/ATE517420T1/de

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/7015—Details of optical elements
    • G03F7/70166—Capillary or channel elements, e.g. nested extreme ultraviolet [EUV] mirrors or shells, optical fibers or light guides
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
AT99917580T 1998-04-22 1999-04-16 Vorrichtung zur bündelung von röntgenstrahlen und röntgendiagnostikanlage ATE517420T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/064,476 US6094471A (en) 1998-04-22 1998-04-22 X-ray diagnostic system
PCT/US1999/008394 WO1999053823A2 (en) 1998-04-22 1999-04-16 X-ray diagnostic system

Publications (1)

Publication Number Publication Date
ATE517420T1 true ATE517420T1 (de) 2011-08-15

Family

ID=22056253

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99917580T ATE517420T1 (de) 1998-04-22 1999-04-16 Vorrichtung zur bündelung von röntgenstrahlen und röntgendiagnostikanlage

Country Status (7)

Country Link
US (2) US6094471A (de)
EP (1) EP1074025B1 (de)
JP (1) JP2002512357A (de)
AT (1) ATE517420T1 (de)
AU (1) AU3566799A (de)
TW (1) TW445488B (de)
WO (1) WO1999053823A2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6094471A (en) * 1998-04-22 2000-07-25 Smithsonian Astrophysical Observatory X-ray diagnostic system
WO2000031523A2 (en) * 1998-11-25 2000-06-02 Koninklijke Philips Electronics N.V. X-ray analysis apparatus including a parabolic x-ray mirror and a crystal monochromator
GB0027759D0 (en) * 2000-11-14 2000-12-27 Univ Leicester X-ray generator
US6781134B1 (en) 2001-08-14 2004-08-24 The Regents Of The University Of California Handheld CZT radiation detector
US6949748B2 (en) * 2002-04-16 2005-09-27 The Regents Of The University Of California Biomedical nuclear and X-ray imager using high-energy grazing incidence mirrors
US6968035B2 (en) * 2002-05-01 2005-11-22 Siemens Medical Solutions Usa, Inc. System to present focused radiation treatment area
WO2004003142A2 (en) 2002-06-28 2004-01-08 Xcyte Therapies, Inc. Compositions and methods for restoring immune repertoire in patients with immunological defects related to autoimmunity and organ or hematopoietic stem cell transplantation
US6980625B2 (en) * 2002-08-26 2005-12-27 Jean-Claude Kieffer System and method for generating microfocused laser-based x-rays for mammography
US7431500B2 (en) * 2003-04-01 2008-10-07 Analogic Corporation Dynamic exposure control in radiography
US7134786B2 (en) * 2003-04-10 2006-11-14 Ge Medical Systems Global Technology Examination table providing x-ray densitometry
JP2005257349A (ja) * 2004-03-10 2005-09-22 Sii Nanotechnology Inc 超伝導ｘ線分析装置
WO2006048882A2 (en) * 2004-11-08 2006-05-11 Zvi Kalman System and method for an interleaved spiral cone shaping collimation
US20090252294A1 (en) * 2008-04-02 2009-10-08 O'hara David Scanning von hamos type x-ray spectrometer
CA2742313A1 (en) * 2008-10-30 2010-05-06 Inspired Surgical Technologies, Inc. X-ray beam processor
DE102009031476B4 (de) * 2009-07-01 2017-06-01 Baden-Württemberg Stiftung Ggmbh Röntgenrolllinse
EP2284524B1 (de) 2009-08-10 2014-01-15 FEI Company Mikrokalometrie für die Röntgenstrahlspektroskopie
JP2013528804A (ja) * 2010-05-19 2013-07-11 シルヴァー，エリック，エイチ ハイブリッドｘ線光学機器および方法
FR2967887B1 (fr) 2010-11-26 2018-01-19 General Electric Company Mammographe compact, et procede de mammographie associe
DE102011102446A1 (de) 2011-05-25 2012-11-29 Karlsruher Institut für Technologie Vorrichtung zur Konzentration und/oder Kollimation eines Röntgenstrahls, Verfahren zu ihrer Herstellung und Spiralspiegeloptik für Röntgenstrahlen
US10914694B2 (en) * 2017-08-23 2021-02-09 Government Of The United States Of America, As Represented By The Secretary Of Commerce X-ray spectrometer
CN108627530A (zh) * 2018-05-24 2018-10-09 北京师范大学 一种波长色散x射线荧光分析仪
DE102019125374A1 (de) * 2019-09-20 2021-03-25 Hochschule Rhein-Waal Gradientenindexlinse und Verfahren zum Herstellen einer Gradientenindexlinse

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5963599A (ja) * 1982-10-02 1984-04-11 坂柳　義巳 対数らせん反射面の形成機構
US4525853A (en) * 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
JPS60262338A (ja) * 1984-06-07 1985-12-25 Fujitsu Ltd Ｘ線露光方法
JPH0740080B2 (ja) * 1986-06-19 1995-05-01 株式会社島津製作所 Ｘ線ビ−ム収束装置
JPH01219163A (ja) * 1988-02-29 1989-09-01 Mitsubishi Electric Corp フレキシブルミラーの製造方法
JPH0711600B2 (ja) * 1988-07-08 1995-02-08 株式会社島津製作所 Ｘ線集中装置
JP2884583B2 (ja) * 1989-02-16 1999-04-19 株式会社島津製作所 Ｘ線集光器
US5497008A (en) * 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
CA2095222C (en) * 1990-10-31 2002-09-10 Muradin A. Kumakhov Device for controlling beams of particles, x-ray and gamma quanta and uses thereof
US5192869A (en) * 1990-10-31 1993-03-09 X-Ray Optical Systems, Inc. Device for controlling beams of particles, X-ray and gamma quanta
JPH05142396A (ja) * 1991-11-25 1993-06-08 Nitto Denko Corp Ｘ線反射鏡、ｘ線結像装置及びｘ線集光装置
JPH05180993A (ja) * 1991-12-27 1993-07-23 Nitto Denko Corp Ｘ線反射鏡
JP3141660B2 (ja) * 1993-12-15 2001-03-05 株式会社ニコン Ｘ線照射装置
EP0723272B1 (de) * 1994-07-08 2001-04-25 Muradin Abubekirovich Kumakhov Verfahren zur führung von neutral- und ladungsträgerstrahlen und eine vorrichtung zur durchführung des verfahrens
US5570408A (en) * 1995-02-28 1996-10-29 X-Ray Optical Systems, Inc. High intensity, small diameter x-ray beam, capillary optic system
US5682415A (en) * 1995-10-13 1997-10-28 O'hara; David B. Collimator for x-ray spectroscopy
CN1069136C (zh) * 1996-02-17 2001-08-01 北京师范大学 整体x光透镜及其制造方法及使用整体x光透镜的设备
US5912940A (en) * 1996-06-10 1999-06-15 O'hara; David Combination wavelength and energy dispersive x-ray spectrometer
US5816999A (en) 1997-07-24 1998-10-06 Bischoff; Jeffrey Flexible catheter for the delivery of ionizing radiation to the interior of a living body
US6442231B1 (en) * 1997-08-15 2002-08-27 O'hara David B. Apparatus and method for improved energy dispersive X-ray spectrometer
US6094471A (en) * 1998-04-22 2000-07-25 Smithsonian Astrophysical Observatory X-ray diagnostic system
JP2001133421A (ja) * 1999-11-01 2001-05-18 Ours Tex Kk Ｘ線分光装置およびｘ線分析装置

Also Published As

Publication number Publication date
JP2002512357A (ja) 2002-04-23
AU3566799A (en) 1999-11-08
US6594337B1 (en) 2003-07-15
TW445488B (en) 2001-07-11
EP1074025B1 (de) 2011-07-20
EP1074025A2 (de) 2001-02-07
WO1999053823A3 (en) 2000-08-24
WO1999053823A2 (en) 1999-10-28
US6094471A (en) 2000-07-25

Similar Documents

Publication Publication Date Title
ATE517420T1 (de) Vorrichtung zur bündelung von röntgenstrahlen und röntgendiagnostikanlage
WO1999047963A8 (en) Confocal microscopy imaging system
CA2285296A1 (en) High resolution x-ray imaging of very small objects
DE69703574D1 (de) Vorrichtung zur Prüfpunkterfassungsbeschleunigung
EP2267506A3 (de) Konfokale Mikroskopie mit multispektraler Kodierung
HK1032261A1 (en) A method of producing high density arrays of target substance and the high density array
DE69923182D1 (de) Röntgendiffraktometer mit einstellbarem bildabstand
DE69229432D1 (de) Probenhalter für Elektronenmikroskop
DE3884337D1 (de) Gerät zur automatischen Kontrolle des Vergrösserungsfaktors in einem Rasterelektronenmikroskop.
DE69821467D1 (de) Rasterelektronenmikroskop unter kontrollierter umgebung mit mehrpolfelder zur erhöhter sekundärelektronenerfassung
DE3576096D1 (de) Elektronenstrahlvorrichtung und halbleitervorrichtung zur verwendung in solch einer elektronenstrahlvorrichtung.
DE69016492D1 (de) Anordnung zur Elektronenerzeugung und Wiedergabeanordnung.
ATE87742T1 (de) Traegervlies fuer abloesbar impraegnierte reagenzien.
DE69409100D1 (de) Elektronenmikroskop mit im referenzsystem des bildes gesteuertem goniometer
ZA967260B (en) Electron microscope specimen supports
ATE199288T1 (de) Stereomikroskop mit einem probenwechsler
DE59704742D1 (de) Röntgenuntersuchungsgerät mit einem Röntgenstrahler und einer damit verbundenen Blendeneinheit
RU2003108334A (ru) Микроскоп с термолинзой
DE3764776D1 (de) Vorrichtung zur abschirmung von kathodestrahlroehren mit masken gegenueber dem endmagnetfeld.
NL176620B (nl) Weergeefinrichting met een elektronenstraalbuis voorzien van een elektronenbundelafbuigvergrotingsstelsel, alsmede elektronenstraalbuis als onderdeel daarvan.
DE68924451D1 (de) Elektronenstrahl-Erzeuger und Elektronenröhre mit einem derartigen Elektronenstrahl-Erzeuger.
EP1439384A3 (de) System für Screening biologischer Zellen
DE69303510D1 (de) Vorrichtung zur Detektierung von Hochenergiestrahlung
ATE333702T1 (de) Vorrichtung zur führung von röntgenstrahlen
ATA186488A (de) Vorrichtung zur aufnahme und abgabe von zellmaterial, insbesondere fuer gynaekologischen krebsabstrich

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties