DE3884337D1 - Gerät zur automatischen Kontrolle des Vergrösserungsfaktors in einem Rasterelektronenmikroskop. - Google Patents

Gerät zur automatischen Kontrolle des Vergrösserungsfaktors in einem Rasterelektronenmikroskop.

Info

Publication number
DE3884337D1
DE3884337D1 DE88310211T DE3884337T DE3884337D1 DE 3884337 D1 DE3884337 D1 DE 3884337D1 DE 88310211 T DE88310211 T DE 88310211T DE 3884337 T DE3884337 T DE 3884337T DE 3884337 D1 DE3884337 D1 DE 3884337D1
Authority
DE
Germany
Prior art keywords
electron microscope
scanning electron
automatic control
magnification factor
magnification
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE88310211T
Other languages
English (en)
Other versions
DE3884337T2 (de
Inventor
Glen A Herriot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BIO-RAD MICROMEASUREMENTS (CANADA) INC., NEPEAN, O
Original Assignee
Vickers Instruments (Canada) Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vickers Instruments (Canada) Inc filed Critical Vickers Instruments (Canada) Inc
Publication of DE3884337D1 publication Critical patent/DE3884337D1/de
Application granted granted Critical
Publication of DE3884337T2 publication Critical patent/DE3884337T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DE88310211T 1987-10-30 1988-10-31 Gerät zur automatischen Kontrolle des Vergrösserungsfaktors in einem Rasterelektronenmikroskop. Expired - Fee Related DE3884337T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/114,741 US4818873A (en) 1987-10-30 1987-10-30 Apparatus for automatically controlling the magnification factor of a scanning electron microscope

Publications (2)

Publication Number Publication Date
DE3884337D1 true DE3884337D1 (de) 1993-10-28
DE3884337T2 DE3884337T2 (de) 1994-04-28

Family

ID=22357148

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88310211T Expired - Fee Related DE3884337T2 (de) 1987-10-30 1988-10-31 Gerät zur automatischen Kontrolle des Vergrösserungsfaktors in einem Rasterelektronenmikroskop.

Country Status (5)

Country Link
US (1) US4818873A (de)
EP (1) EP0314520B1 (de)
JP (1) JPH0638328B2 (de)
CA (1) CA1282191C (de)
DE (1) DE3884337T2 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8702874A (nl) * 1987-12-01 1989-07-03 Philips Nv Inspectie apparaat met gedigitaliseerde elektronen detectie.
CA1308203C (en) * 1989-06-01 1992-09-29 Nanoquest (Canada) Inc. Magnification compensation apparatus
JPH03194839A (ja) * 1989-12-25 1991-08-26 Hitachi Ltd 電子顕微鏡における焦点調整方法及び非点収差補正方法
JP2676120B2 (ja) * 1991-06-17 1997-11-12 シャープ株式会社 荷電粒子ビーム分析装置のビーム調整方法
JP3345060B2 (ja) * 1992-11-09 2002-11-18 日本テキサス・インスツルメンツ株式会社 走査形電子顕微鏡における画像信号処理方法およびその装置
JP3402868B2 (ja) * 1995-09-14 2003-05-06 株式会社東芝 荷電粒子光学鏡筒における非点収差の補正及び焦点合わせ方法
KR100191347B1 (ko) * 1996-08-09 1999-06-15 윤종용 반도체 공정의 주사전자현미경 관리용 미세선폭 관리시료
JP4727777B2 (ja) * 1999-05-24 2011-07-20 株式会社日立製作所 走査形電子顕微鏡による測長方法
US6429425B1 (en) * 1999-06-28 2002-08-06 United Microelectronics Corp. Method for forming a calibation standard to adjust a micro-bar of an electron microscope
US6807314B1 (en) * 1999-07-02 2004-10-19 General Phosphorix, Llc Method of precision calibration of a microscope and the like
US7209596B2 (en) * 1999-07-02 2007-04-24 General Phosphorix, Llc Method of precision calibration of a microscope and the like
US6384408B1 (en) * 1999-08-11 2002-05-07 Kla-Tencor Corporation Calibration of a scanning electron microscope
US6570157B1 (en) 2000-06-09 2003-05-27 Advanced Micro Devices, Inc. Multi-pitch and line calibration for mask and wafer CD-SEM system
US6573498B1 (en) 2000-06-30 2003-06-03 Advanced Micro Devices, Inc. Electric measurement of reference sample in a CD-SEM and method for calibration
US6573497B1 (en) 2000-06-30 2003-06-03 Advanced Micro Devices, Inc. Calibration of CD-SEM by e-beam induced current measurement
US6873747B2 (en) * 2000-07-25 2005-03-29 Farid Askary Method for measurement of pitch in metrology and imaging systems
US6661007B1 (en) * 2000-10-26 2003-12-09 General Phosphorix Llc Method of diagnosing magnification, linearity and stability of scanning electron microscope
US6573500B2 (en) * 2001-08-08 2003-06-03 General Phosphorix Llc Method of precision calibration of magnification of a scanning microscope with the use of test diffraction grating
US20040234106A1 (en) * 2003-05-23 2004-11-25 Luu Victor Van Method and apparatus for providing nanoscale dimensions to SEM (Scanning Electron Microscopy) or other nanoscopic images
JP4231798B2 (ja) * 2004-01-23 2009-03-04 株式会社日立ハイテクノロジーズ 荷電粒子線装置および倍率計測法
JP4587742B2 (ja) * 2004-08-23 2010-11-24 株式会社日立ハイテクノロジーズ 荷電粒子線顕微方法及び荷電粒子線応用装置
JP4504946B2 (ja) * 2006-05-16 2010-07-14 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP5206620B2 (ja) * 2009-08-05 2013-06-12 三菱電機株式会社 部材の位置認識装置、位置決め装置、接合装置および部材の接合方法
CN103217275B (zh) * 2013-05-14 2015-04-15 清华大学 一种显微镜放大倍数标定方法
JP7106353B2 (ja) * 2018-05-22 2022-07-26 株式会社ニューフレアテクノロジー マルチ荷電粒子ビーム検査装置及びマルチ荷電粒子ビーム検査方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3156820A (en) * 1962-03-22 1964-11-10 Lilly Co Eli Method and apparatus for calibrating electron-microscope magnification
DE2149108C3 (de) * 1971-09-28 1975-05-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Einrichtung zur VergröBerungseinstellung eines Elektronenmikroskops
US4068381A (en) * 1976-10-29 1978-01-17 The United States Of America As Represented By The Secretary Of Commerce Scanning electron microscope micrometer scale and method for fabricating same
JPS54107254A (en) * 1978-02-10 1979-08-22 Hitachi Ltd Scanning-type electron microscope
JPS594298Y2 (ja) * 1978-12-28 1984-02-07 日本電子株式会社 走査電子顕微鏡等の試料装置
JPS55130055A (en) * 1979-03-30 1980-10-08 Jeol Ltd Scanning electron microscope
US4677296A (en) * 1984-09-24 1987-06-30 Siemens Aktiengesellschaft Apparatus and method for measuring lengths in a scanning particle microscope
JPS6261256A (ja) * 1985-09-12 1987-03-17 Agency Of Ind Science & Technol イオンビ−ムにおける偏向歪の修正方法とこの方法に使用する偏向歪検出素子

Also Published As

Publication number Publication date
CA1282191C (en) 1991-03-26
US4818873A (en) 1989-04-04
JPH0249340A (ja) 1990-02-19
EP0314520B1 (de) 1993-09-22
EP0314520A2 (de) 1989-05-03
DE3884337T2 (de) 1994-04-28
EP0314520A3 (en) 1990-02-07
JPH0638328B2 (ja) 1994-05-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: BIO-RAD MICROMEASUREMENTS (CANADA) INC., NEPEAN, O

8328 Change in the person/name/address of the agent

Free format text: WASMEIER, A., DIPL.-ING. GRAF, H., DIPL.-ING., PAT.-ANWAELTE, 93055 REGENSBURG

8339 Ceased/non-payment of the annual fee