DE69229432D1 - Probenhalter für Elektronenmikroskop - Google Patents
Probenhalter für ElektronenmikroskopInfo
- Publication number
- DE69229432D1 DE69229432D1 DE69229432T DE69229432T DE69229432D1 DE 69229432 D1 DE69229432 D1 DE 69229432D1 DE 69229432 T DE69229432 T DE 69229432T DE 69229432 T DE69229432 T DE 69229432T DE 69229432 D1 DE69229432 D1 DE 69229432D1
- Authority
- DE
- Germany
- Prior art keywords
- electron microscope
- sample holder
- holder
- sample
- microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27745091 | 1991-10-24 | ||
JP15913392 | 1992-06-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69229432D1 true DE69229432D1 (de) | 1999-07-22 |
DE69229432T2 DE69229432T2 (de) | 2000-02-17 |
Family
ID=26486021
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69229432T Expired - Lifetime DE69229432T2 (de) | 1991-10-24 | 1992-10-22 | Probenhalter für Elektronenmikroskop |
Country Status (3)
Country | Link |
---|---|
US (1) | US5367171A (de) |
EP (1) | EP0538861B1 (de) |
DE (1) | DE69229432T2 (de) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5698856A (en) * | 1996-08-05 | 1997-12-16 | Frasca; Peter | Specimen holder for electron microscope |
US5898177A (en) * | 1996-08-08 | 1999-04-27 | Hitachi, Ltd. | Electron microscope |
US5753924A (en) * | 1997-03-12 | 1998-05-19 | Gatan, Inc. | Ultra-high tilt specimen cryotransfer holder for electron microscope |
JP3663056B2 (ja) * | 1998-07-23 | 2005-06-22 | 株式会社日立製作所 | 電子顕微鏡用試料加熱ホルダ及び試料観察方法 |
WO2000010191A1 (en) | 1998-08-12 | 2000-02-24 | Gatan, Inc. | Double tilt and rotate specimen holder for a transmission electron microscope |
US6198299B1 (en) | 1998-08-27 | 2001-03-06 | The Micromanipulator Company, Inc. | High Resolution analytical probe station |
US6744268B2 (en) | 1998-08-27 | 2004-06-01 | The Micromanipulator Company, Inc. | High resolution analytical probe station |
US6140652A (en) * | 1998-09-09 | 2000-10-31 | Intersil Corporation | Device containing sample preparation sites for transmission electron microscopic analysis and processes of formation and use |
JP2001015056A (ja) * | 1999-04-28 | 2001-01-19 | Canon Inc | 試料ホルダーおよび該試料ホルダーに用いるスペーサー |
JP3383842B2 (ja) * | 2000-04-28 | 2003-03-10 | 北海道大学長 | 散乱ターゲット保持機構及び電子スピン分析器 |
DE10212807A1 (de) * | 2002-03-22 | 2003-10-02 | Leo Elektronenmikroskopie Gmbh | Manipulator für ein optisches oder teilchenoptisches Gerät |
NL1020936C2 (nl) | 2002-06-25 | 2003-12-30 | Univ Delft Tech | Preparaathouder voor een elektronenmicroscoop, samenstel van een preparaathouder en een elektronenmicroscoop en werkwijze voor het reduceren van thermische drift in een elektronenmicroscoop. |
GB0318134D0 (en) * | 2003-08-01 | 2003-09-03 | Gatan Uk | Specimen tip and tip holder assembly |
WO2005093485A1 (ja) * | 2004-03-29 | 2005-10-06 | Research Organization Of Information And Systems | 試料温度調節装置 |
US20060025002A1 (en) * | 2004-07-28 | 2006-02-02 | The Board Of Trustees Of The University Of Illinois | TEM MEMS device holder and method of fabrication |
US7759656B1 (en) | 2006-03-01 | 2010-07-20 | South Bay Technology, Inc. | Dual air particle sample cassette and methods for using same |
US8288737B1 (en) | 2007-04-23 | 2012-10-16 | South Bay Technology, Inc. | Ion sputter removal from thin microscopy samples with ions extracted from an RF generated plasma |
US9312097B2 (en) * | 2007-05-09 | 2016-04-12 | Protochips, Inc. | Specimen holder used for mounting samples in electron microscopes |
DK2153461T3 (en) | 2007-05-09 | 2015-07-13 | Protochips Inc | Microscopy Support structures |
JP4991390B2 (ja) * | 2007-05-21 | 2012-08-01 | 株式会社日立ハイテクノロジーズ | マイクロサンプル加熱用試料台 |
US8513621B2 (en) * | 2008-03-17 | 2013-08-20 | Protochips, Inc. | Specimen holder used for mounting |
WO2009116696A1 (en) * | 2008-03-21 | 2009-09-24 | Korea Basic Science Institute | An apparatus for measuring the temperature of cyro em-holder specimen cradle and a method using it |
US8058627B2 (en) * | 2008-08-13 | 2011-11-15 | Wisys Technology Foundation | Addressable transmission electron microscope grid |
WO2010116809A1 (ja) * | 2009-04-07 | 2010-10-14 | Anbe Yoshinobu | X線検査用加熱装置 |
WO2011038062A2 (en) * | 2009-09-24 | 2011-03-31 | Protochips, Inc. | Methods of using temperature control devices in electron microscopy |
EP2504671B1 (de) | 2009-11-27 | 2020-04-08 | Bruker Nano, Inc. | Mikro-elektromechanischer erhitzer |
US8631687B2 (en) | 2010-04-19 | 2014-01-21 | Hysitron, Inc. | Indenter assembly |
JP6014036B2 (ja) | 2010-08-02 | 2016-10-25 | プロトチップス,インコーポレイテッド | 2つの半導体デバイスでガスまたは液体セルを形成するための電子顕微鏡サンプルホルダ |
JP5532425B2 (ja) * | 2010-08-27 | 2014-06-25 | 株式会社日立ハイテクノロジーズ | 荷電粒子装置用試料ホルダ |
US9476816B2 (en) | 2011-11-14 | 2016-10-25 | Hysitron, Inc. | Probe tip heating assembly |
WO2013082145A1 (en) | 2011-11-28 | 2013-06-06 | Yunje Oh | High temperature heating system |
JP6108674B2 (ja) * | 2012-03-16 | 2017-04-05 | 株式会社日立ハイテクサイエンス | 荷電粒子ビーム装置及び試料搬送装置 |
JP5963955B2 (ja) | 2012-06-13 | 2016-08-03 | ハイジトロン, インク.Hysitron, Inc. | ミクロンまたはナノスケールでの機械的試験用環境コンディショニングアセンブリ |
NL2009469C2 (en) * | 2012-09-14 | 2014-03-18 | Denssolutions B V | Double tilt holder and multicontact device. |
JP2016501428A (ja) | 2012-11-16 | 2016-01-18 | プロトチップス,インコーポレイテッド | 電子顕微鏡ホルダにおいて試料支持体への電気的接続を形成する方法 |
USD794816S1 (en) * | 2013-10-24 | 2017-08-15 | Hitachi High-Technologies Corporation | Sample holder for an electron microscope |
WO2015145706A1 (ja) * | 2014-03-28 | 2015-10-01 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置用試料ホルダおよび荷電粒子線装置 |
US9466459B2 (en) | 2014-06-03 | 2016-10-11 | Protochips, Inc. | Method for optimizing fluid flow across a sample within an electron microscope sample holder |
USD806892S1 (en) * | 2014-06-18 | 2018-01-02 | Protochips, Inc. | Tip of a sample holder |
CN107835943B (zh) | 2015-03-23 | 2021-02-12 | 纳米力学有限公司 | 实现温度变化期间的尺寸稳定性的结构 |
EP4276879A3 (de) | 2015-08-31 | 2024-02-14 | Protochips, Inc. | Mems-rahmenheizplattform für elektronenverschädigbare flüssigkeitsreservoirs oder grössere leitfähige proben |
WO2019010390A1 (en) * | 2017-07-06 | 2019-01-10 | Protochips, Inc. | ELECTRONIC MICROSCOPE SAMPLE HOLDER FLUID MANAGEMENT WITH INDEPENDENT PRESSURE AND FLOW CONTROL |
JP6471254B1 (ja) * | 2018-04-10 | 2019-02-13 | 株式会社メルビル | 試料ホルダー |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2126625A1 (de) * | 1971-05-25 | 1972-12-07 | Siemens Ag | Korpuskularstrahlgerät, insbesondere Elektronenmikroskop |
US3896314A (en) * | 1972-12-14 | 1975-07-22 | Jeol Ltd | Specimen heating and positioning device for an electron microscope |
DE3374490D1 (en) * | 1982-04-20 | 1987-12-17 | Univ Glasgow | Low temperature stage for microanalysis |
US4703181A (en) * | 1986-04-07 | 1987-10-27 | Gatan Inc. | Anti-drift device for side entry electron microscope specimen holders |
JPS63193447A (ja) * | 1987-02-03 | 1988-08-10 | Nissin Electric Co Ltd | 試料保持装置 |
US4797261A (en) * | 1987-11-03 | 1989-01-10 | Gatan Inc. | Multiple specimen cryotransfer holder for electron microscopes |
KR0152969B1 (ko) * | 1989-05-18 | 1998-10-15 | 브루스 이. 버딕 | 개선된 차아염소산칼슘 생성물 |
US4950901A (en) * | 1989-11-06 | 1990-08-21 | Gatan, Incorporated | Specimen cooling holder for side entry transmission electron microscopes |
US4996433A (en) * | 1989-11-06 | 1991-02-26 | Gatan, Inc. | Specimen heating holder for electron microscopes |
NL8902727A (nl) * | 1989-11-06 | 1991-06-03 | Philips Nv | Objecthouder voor ondersteuning van een object in een geladen deeltjesbundelsysteem. |
-
1992
- 1992-10-22 DE DE69229432T patent/DE69229432T2/de not_active Expired - Lifetime
- 1992-10-22 EP EP92118098A patent/EP0538861B1/de not_active Expired - Lifetime
- 1992-10-23 US US07/965,423 patent/US5367171A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5367171A (en) | 1994-11-22 |
DE69229432T2 (de) | 2000-02-17 |
EP0538861A1 (de) | 1993-04-28 |
EP0538861B1 (de) | 1999-06-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
R071 | Expiry of right |
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