KR960024328U - 전자현미경용 시료받침대 - Google Patents

전자현미경용 시료받침대

Info

Publication number
KR960024328U
KR960024328U KR2019940037964U KR19940037964U KR960024328U KR 960024328 U KR960024328 U KR 960024328U KR 2019940037964 U KR2019940037964 U KR 2019940037964U KR 19940037964 U KR19940037964 U KR 19940037964U KR 960024328 U KR960024328 U KR 960024328U
Authority
KR
South Korea
Prior art keywords
electron microscope
sample stand
stand
sample
microscope
Prior art date
Application number
KR2019940037964U
Other languages
English (en)
Other versions
KR0119027Y1 (ko
Inventor
유길열
Original Assignee
포항종합제철주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 포항종합제철주식회사 filed Critical 포항종합제철주식회사
Priority to KR2019940037964U priority Critical patent/KR0119027Y1/ko
Publication of KR960024328U publication Critical patent/KR960024328U/ko
Application granted granted Critical
Publication of KR0119027Y1 publication Critical patent/KR0119027Y1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2007Holding mechanisms

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
KR2019940037964U 1994-12-29 1994-12-29 전자현미경용 시료받침대 KR0119027Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940037964U KR0119027Y1 (ko) 1994-12-29 1994-12-29 전자현미경용 시료받침대

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940037964U KR0119027Y1 (ko) 1994-12-29 1994-12-29 전자현미경용 시료받침대

Publications (2)

Publication Number Publication Date
KR960024328U true KR960024328U (ko) 1996-07-22
KR0119027Y1 KR0119027Y1 (ko) 1998-07-01

Family

ID=19404323

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940037964U KR0119027Y1 (ko) 1994-12-29 1994-12-29 전자현미경용 시료받침대

Country Status (1)

Country Link
KR (1) KR0119027Y1 (ko)

Also Published As

Publication number Publication date
KR0119027Y1 (ko) 1998-07-01

Similar Documents

Publication Publication Date Title
DE69229432T2 (de) Probenhalter für Elektronenmikroskop
DE69638126D1 (de) Rasterelektronenmikroskop
DE59609547D1 (de) Mikroskop
DE69611739T2 (de) Rasterelektronenmikroskop
DE69519623T2 (de) Operations-mikroskope
DE69621540D1 (de) Elektronenmikroskop
DE69624192T2 (de) Rasterelektronenmikroskop
GB2304982B (en) Electron microscope specimen supports
DE69628367D1 (de) Rasterelektronenmikroskop
DE69634461D1 (de) Elektronenmikroskop
DE59710481D1 (de) Mikroskop
DE69608067D1 (de) Elektronenvervielfacher für Rasterelektronenmikroskope
DE69623841D1 (de) Rasterelektronenmikroskop
DE69620986T2 (de) Rasterelektronenmikroskop
DE69417423D1 (de) Sondenmikroskopie
DE69427376D1 (de) Antistatisches mikroskop
KR960024328U (ko) 전자현미경용 시료받침대
KR960024324U (ko) 주사전자현미경의 시편고정장치
KR960024326U (ko) 전자현미경용 다기능 시료받침대
KR960011977U (ko) 현미경
KR970046571U (ko) 전자현미경용 시료 홀더 장치
KR950012583U (ko) 주사전자현미경의 시편 고정장치
DE69704828T2 (de) Parfümprobenständer
KR970045285U (ko) 현미경
KR960011978U (ko) 숍 마이크로스코프

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20010228

Year of fee payment: 4

LAPS Lapse due to unpaid annual fee