DE69427376D1 - Antistatisches mikroskop - Google Patents

Antistatisches mikroskop

Info

Publication number
DE69427376D1
DE69427376D1 DE69427376T DE69427376T DE69427376D1 DE 69427376 D1 DE69427376 D1 DE 69427376D1 DE 69427376 T DE69427376 T DE 69427376T DE 69427376 T DE69427376 T DE 69427376T DE 69427376 D1 DE69427376 D1 DE 69427376D1
Authority
DE
Germany
Prior art keywords
antistatic
microscope
antistatic microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69427376T
Other languages
English (en)
Other versions
DE69427376T2 (de
Inventor
A Meier
Vincent Vaccarelli
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Instruments Singapore Pte Ltd
Original Assignee
Leica Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Inc filed Critical Leica Inc
Application granted granted Critical
Publication of DE69427376D1 publication Critical patent/DE69427376D1/de
Publication of DE69427376T2 publication Critical patent/DE69427376T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/16Anti-static materials
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/0016Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05FSTATIC ELECTRICITY; NATURALLY-OCCURRING ELECTRICITY
    • H05F3/00Carrying-off electrostatic charges
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/13Hollow or container type article [e.g., tube, vase, etc.]
    • Y10T428/1334Nonself-supporting tubular film or bag [e.g., pouch, envelope, packet, etc.]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Elimination Of Static Electricity (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
DE69427376T 1994-01-12 1994-12-05 Antistatisches mikroskop Expired - Lifetime DE69427376T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/180,320 US5521756A (en) 1994-01-12 1994-01-12 Antistatic microscope
PCT/US1994/013906 WO1995019583A1 (en) 1994-01-12 1994-12-05 Antistatic microscope

Publications (2)

Publication Number Publication Date
DE69427376D1 true DE69427376D1 (de) 2001-07-05
DE69427376T2 DE69427376T2 (de) 2001-09-13

Family

ID=22660013

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69427376T Expired - Lifetime DE69427376T2 (de) 1994-01-12 1994-12-05 Antistatisches mikroskop

Country Status (10)

Country Link
US (1) US5521756A (de)
EP (1) EP0766840B1 (de)
JP (1) JP3359035B2 (de)
KR (1) KR100288024B1 (de)
CN (1) CN1058087C (de)
CA (1) CA2171321C (de)
DE (1) DE69427376T2 (de)
MY (1) MY112717A (de)
SG (1) SG80534A1 (de)
WO (1) WO1995019583A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10104692A (ja) * 1996-09-30 1998-04-24 Minolta Co Ltd 帯電防止ファインダ
DE59915029D1 (de) 1998-08-07 2009-07-09 Leica Microsystems Schweiz Ag Medizinisches gerät
DE10352575B3 (de) * 2003-11-11 2005-05-04 Leica Microsystems Nussloch Gmbh Kryostat mit einem Innenbehälter zur Aufnahme eines Mikrotoms
JP2005215183A (ja) * 2004-01-28 2005-08-11 Olympus Corp 顕微鏡および顕微鏡の静電気放電対策方法
US20080166523A1 (en) * 2007-01-04 2008-07-10 Asahi Kasei Chemicals Corporation Tab leader tape made of polyphenylene ether-based resin
DE202006008329U1 (de) * 2006-03-30 2006-08-10 Leica Microsystems Nussloch Gmbh Mikrotom
KR102167328B1 (ko) * 2017-04-27 2020-10-19 엘지전자 주식회사 전기집진장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3572499A (en) * 1967-01-19 1971-03-30 Custom Materials Inc Conductive packaging material and container for explosives
US4573771A (en) * 1984-07-02 1986-03-04 Warner-Lambert Technologies, Inc. Microscope adjustment apparatus
US4618222A (en) * 1984-08-27 1986-10-21 Northrop Corporation Protective structure and method for working on sensitive electronic devices
US4690519A (en) * 1985-05-17 1987-09-01 Bausch & Lomb Incorporated Zoom microscope having a crank and linkage mechanism
US4729646A (en) * 1986-05-15 1988-03-08 Bausch & Lomb Incorporated Multi-use microscope having modular construction of extruded parts
US4774272A (en) * 1986-08-08 1988-09-27 Minnesota Mining And Manufacturing Company Composite sheet material for storage envelopes for magnetic recording media
US5091229A (en) * 1989-10-13 1992-02-25 E. I. Du Pont De Nemours And Company Electronics protective packaging film
JPH03265644A (ja) * 1990-03-16 1991-11-26 Yazaki Corp 帯電防止性熱可塑性組成物

Also Published As

Publication number Publication date
WO1995019583A1 (en) 1995-07-20
EP0766840B1 (de) 2001-05-30
CA2171321A1 (en) 1995-07-20
CA2171321C (en) 1997-11-18
EP0766840A1 (de) 1997-04-09
DE69427376T2 (de) 2001-09-13
CN1141085A (zh) 1997-01-22
EP0766840A4 (de) 1997-11-05
JP3359035B2 (ja) 2002-12-24
CN1058087C (zh) 2000-11-01
MY112717A (en) 2001-08-30
SG80534A1 (en) 2001-05-22
KR960706095A (ko) 1996-11-08
JPH09506719A (ja) 1997-06-30
US5521756A (en) 1996-05-28
KR100288024B1 (ko) 2001-05-02

Similar Documents

Publication Publication Date Title
DE59609547D1 (de) Mikroskop
FR2725532B1 (fr) Microscope autofocus
DE69518609T2 (de) Mikroskop mit Ausrichtungsfunktion
DE59303355D1 (de) Mikroskop
DE59405322D1 (de) Akustisches mikroskop
DE69609336D1 (de) Nahfeld-leitfähigkeits-mikroskop
DE69519623T2 (de) Operations-mikroskope
DE69621540T2 (de) Elektronenmikroskop
DE59710481D1 (de) Mikroskop
DE69634461D1 (de) Elektronenmikroskop
DE69427376D1 (de) Antistatisches mikroskop
DE69417423D1 (de) Sondenmikroskopie
KR960011977U (ko) 현미경
DE69726299D1 (de) Antistatische zusammensetzung
FI943131A0 (fi) Siirtovaunu
KR970045285U (ko) 현미경
DE9409253U1 (de) Mikroskop
DE9419426U1 (de) Stereomikroskop
DE9321413U1 (de) Mikroskop
KR950021195U (ko) 샾 마이크로스코프
KR950024266U (ko) 정전기 방지용 운동화
KR970057865U (ko) 정전기방지구
KR960039036U (ko) 정전기 방지기
KR960011978U (ko) 숍 마이크로스코프
KR950027307U (ko) 자동차용 정전기 방지 장치

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: LEICA MICROSYSTEMS (SCHWEIZ) AG, HEERBRUGG, CH

8327 Change in the person/name/address of the patent owner

Owner name: LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., SINGA, SG