DE69518609T2 - Mikroskop mit Ausrichtungsfunktion - Google Patents
Mikroskop mit AusrichtungsfunktionInfo
- Publication number
- DE69518609T2 DE69518609T2 DE69518609T DE69518609T DE69518609T2 DE 69518609 T2 DE69518609 T2 DE 69518609T2 DE 69518609 T DE69518609 T DE 69518609T DE 69518609 T DE69518609 T DE 69518609T DE 69518609 T2 DE69518609 T2 DE 69518609T2
- Authority
- DE
- Germany
- Prior art keywords
- alignment microscope
- microscope
- alignment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
- G01Q30/025—Optical microscopes coupled with SPM
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/868—Scanning probe structure with optical means
- Y10S977/869—Optical microscope
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6295113A JPH08152430A (ja) | 1994-11-29 | 1994-11-29 | 位置合わせ機能付き顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69518609D1 DE69518609D1 (de) | 2000-10-05 |
DE69518609T2 true DE69518609T2 (de) | 2001-01-11 |
Family
ID=17816467
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69518609T Expired - Lifetime DE69518609T2 (de) | 1994-11-29 | 1995-11-29 | Mikroskop mit Ausrichtungsfunktion |
Country Status (4)
Country | Link |
---|---|
US (1) | US5650614A (de) |
EP (1) | EP0715147B1 (de) |
JP (1) | JPH08152430A (de) |
DE (1) | DE69518609T2 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6271916B1 (en) | 1994-03-24 | 2001-08-07 | Kla-Tencor Corporation | Process and assembly for non-destructive surface inspections |
US5952562A (en) * | 1995-11-22 | 1999-09-14 | Olympus Optical Co., Ltd. | Scanning probe microscope incorporating an optical microscope |
US5955661A (en) * | 1997-01-06 | 1999-09-21 | Kla-Tencor Corporation | Optical profilometer combined with stylus probe measurement device |
US6201601B1 (en) | 1997-09-19 | 2001-03-13 | Kla-Tencor Corporation | Sample inspection system |
US20040057045A1 (en) * | 2000-12-21 | 2004-03-25 | Mehdi Vaez-Iravani | Sample inspection system |
US6956644B2 (en) | 1997-09-19 | 2005-10-18 | Kla-Tencor Technologies Corporation | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination |
US6185030B1 (en) | 1998-03-20 | 2001-02-06 | James W. Overbeck | Wide field of view and high speed scanning microscopy |
US20050134841A1 (en) * | 1998-09-18 | 2005-06-23 | Mehdi Vacz-Iravani | Sample inspection system |
US6455838B2 (en) | 1998-10-06 | 2002-09-24 | The Regents Of The University Of California | High sensitivity deflection sensing device |
US6085581A (en) * | 1998-11-18 | 2000-07-11 | Sandia Corporation | Method for accurately positioning a device at a desired area of interest |
US7292261B1 (en) * | 1999-08-20 | 2007-11-06 | Patrick Teo | Virtual reality camera |
US6552337B1 (en) * | 1999-11-02 | 2003-04-22 | Samsung Electronics Co., Ltd. | Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements |
US6479817B1 (en) | 2000-03-28 | 2002-11-12 | Advanced Micro Devices, Inc. | Cantilever assembly and scanning tip therefor with associated optical sensor |
US6452161B1 (en) | 2000-03-28 | 2002-09-17 | Advanced Micro Devices, Inc. | Scanning probe microscope having optical fiber spaced from point of hp |
US6538730B2 (en) | 2001-04-06 | 2003-03-25 | Kla-Tencor Technologies Corporation | Defect detection system |
JP2002350128A (ja) * | 2001-05-30 | 2002-12-04 | Canon Inc | 立体形状計測装置並びに立体形状計測方法および位置合わせ方法 |
US7116413B2 (en) * | 2002-09-13 | 2006-10-03 | Kla-Tencor Corporation | Inspection system for integrated applications |
AU2003265989A1 (en) * | 2002-09-30 | 2004-04-23 | Applied Materials Israel, Ltd. | Illumination system for optical inspection |
JP4068525B2 (ja) * | 2003-08-19 | 2008-03-26 | エスアイアイ・ナノテクノロジー株式会社 | 防音ボックスおよびそれを用いたプローブ顕微鏡 |
US7430898B1 (en) * | 2003-09-04 | 2008-10-07 | Kla-Tencor Technologies Corp. | Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique |
DE10346349B4 (de) * | 2003-09-30 | 2005-11-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Sondenanordnung für ein Rastersondeninstrument |
JP4563117B2 (ja) * | 2004-09-03 | 2010-10-13 | エスアイアイ・ナノテクノロジー株式会社 | 顕微鏡システム及び顕微鏡システムの走査法ならびに顕微鏡システムの画像合成法 |
US7554656B2 (en) * | 2005-10-06 | 2009-06-30 | Kla-Tencor Technologies Corp. | Methods and systems for inspection of a wafer |
US7697128B2 (en) * | 2007-03-23 | 2010-04-13 | Asml Netherlands B.V. | Method of imaging radiation from an object on a detection device and an inspection device for inspecting an object |
JP5123630B2 (ja) * | 2007-09-27 | 2013-01-23 | 株式会社ニューフレアテクノロジー | パターン検査装置及びパターン検査方法 |
KR100941980B1 (ko) * | 2007-11-14 | 2010-02-11 | 한국표준과학연구원 | 고속 대면적 정밀측정 장치 및 방법 |
RS52165B (en) * | 2009-08-26 | 2012-08-31 | Indaffil Holding Ag | PROCEDURE FOR THE DESIGN OF A SURFACE STRUCTURE OF A METAL PRESSURE PLATE, ENDLESS BAND OR ENGRAVING ROLLER |
JP6009862B2 (ja) * | 2012-08-24 | 2016-10-19 | 株式会社日立ハイテクサイエンス | 走査型プローブ顕微鏡 |
JP6229218B2 (ja) * | 2014-03-13 | 2017-11-15 | 国立研究開発法人産業技術総合研究所 | 走査型プローブ顕微鏡 |
JP6723633B2 (ja) * | 2015-12-10 | 2020-07-15 | 株式会社ディスコ | 検査装置 |
CN111289778A (zh) * | 2020-03-12 | 2020-06-16 | 中国石油化工股份有限公司 | 一种页岩样品扫描电镜和原子力显微镜原位观察的方法 |
US11619649B1 (en) * | 2021-11-26 | 2023-04-04 | Park Systems Corp. | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4595289A (en) * | 1984-01-25 | 1986-06-17 | At&T Bell Laboratories | Inspection system utilizing dark-field illumination |
JPS62130202A (ja) | 1985-12-02 | 1987-06-12 | Honda Motor Co Ltd | 含浸における洗浄方法及び装置 |
JP2909829B2 (ja) * | 1989-07-05 | 1999-06-23 | セイコーインスツルメンツ株式会社 | 位置合わせ機能付複合走査型トンネル顕微鏡 |
US5394741A (en) * | 1990-07-11 | 1995-03-07 | Olympus Optical Co., Ltd. | Atomic probe microscope |
US5177559A (en) * | 1991-05-17 | 1993-01-05 | International Business Machines Corporation | Dark field imaging defect inspection system for repetitive pattern integrated circuits |
JPH0540034A (ja) * | 1991-08-08 | 1993-02-19 | Nikon Corp | 複合型顕微鏡 |
US5376790A (en) * | 1992-03-13 | 1994-12-27 | Park Scientific Instruments | Scanning probe microscope |
JP2840801B2 (ja) | 1992-12-01 | 1998-12-24 | セイコーインスツルメンツ株式会社 | 座標変換係数の自動設定方法 |
US5426302A (en) * | 1993-04-28 | 1995-06-20 | Board Of Regents, University Of Texas | Optically guided macroscopic-scan-range/nanometer resolution probing system |
US5517027A (en) * | 1993-06-08 | 1996-05-14 | Mitsubishi Denki Kabushiki Kaisha | Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these |
-
1994
- 1994-11-29 JP JP6295113A patent/JPH08152430A/ja active Pending
-
1995
- 1995-11-29 EP EP95308578A patent/EP0715147B1/de not_active Expired - Lifetime
- 1995-11-29 DE DE69518609T patent/DE69518609T2/de not_active Expired - Lifetime
- 1995-11-29 US US08/564,747 patent/US5650614A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0715147B1 (de) | 2000-08-30 |
DE69518609D1 (de) | 2000-10-05 |
EP0715147A3 (de) | 1996-08-21 |
US5650614A (en) | 1997-07-22 |
EP0715147A2 (de) | 1996-06-05 |
JPH08152430A (ja) | 1996-06-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: MITSUBISHI ELECTRIC CORP., AMAGASAKI, HYOGO, JP Owner name: SII NANOTECHNOLOGY INC., CHIBA, JP |