ATE511102T1 - Prüfung von elektronischen anordnungen auf kapselungsebene unter verwendung von testleiterplatten ohne sockel - Google Patents

Prüfung von elektronischen anordnungen auf kapselungsebene unter verwendung von testleiterplatten ohne sockel

Info

Publication number
ATE511102T1
ATE511102T1 AT08708989T AT08708989T ATE511102T1 AT E511102 T1 ATE511102 T1 AT E511102T1 AT 08708989 T AT08708989 T AT 08708989T AT 08708989 T AT08708989 T AT 08708989T AT E511102 T1 ATE511102 T1 AT E511102T1
Authority
AT
Austria
Prior art keywords
test
electronic devices
boards
test system
conditioning fluid
Prior art date
Application number
AT08708989T
Other languages
English (en)
Inventor
Fabrizio Scocchetti
Original Assignee
Eles Semiconductor Equipment S P A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP07102650A external-priority patent/EP1959262A1/de
Application filed by Eles Semiconductor Equipment S P A filed Critical Eles Semiconductor Equipment S P A
Application granted granted Critical
Publication of ATE511102T1 publication Critical patent/ATE511102T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
AT08708989T 2007-02-14 2008-02-14 Prüfung von elektronischen anordnungen auf kapselungsebene unter verwendung von testleiterplatten ohne sockel ATE511102T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP07102397 2007-02-14
EP07102650A EP1959262A1 (de) 2007-02-19 2007-02-19 Testen elektronischer Vorrichtungen unter Verwendung sockelloser Platinen
PCT/EP2008/051791 WO2008098987A1 (en) 2007-02-14 2008-02-14 Test of electronic devices at package level using test boards without sockets

Publications (1)

Publication Number Publication Date
ATE511102T1 true ATE511102T1 (de) 2011-06-15

Family

ID=39537440

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08708989T ATE511102T1 (de) 2007-02-14 2008-02-14 Prüfung von elektronischen anordnungen auf kapselungsebene unter verwendung von testleiterplatten ohne sockel

Country Status (6)

Country Link
US (1) US8330482B2 (de)
EP (1) EP2115480B1 (de)
CN (1) CN101675350A (de)
AT (1) ATE511102T1 (de)
MY (1) MY152599A (de)
WO (1) WO2008098987A1 (de)

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US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
ITMI20081023A1 (it) * 2008-06-04 2009-12-05 Eles Semiconductor Equipment Spa Test di dispositivi elettronici con schede senza zoccoli basate su bloccaggio magnetico
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US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
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US9459280B2 (en) * 2012-08-27 2016-10-04 Intel Corporation Using fluid to position a device in a socket for testing
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US10446728B2 (en) * 2014-10-31 2019-10-15 eLux, Inc. Pick-and remove system and method for emissive display repair
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WO2017210108A1 (en) * 2016-06-02 2017-12-07 Kes Systems, Inc. System and methods for semiconductor burn-in test
CN110383092B (zh) * 2017-03-03 2022-04-01 雅赫测试系统公司 电子测试器
CN107364641B (zh) * 2017-09-01 2023-06-09 佛山市富乐喜电子信息技术有限公司 一种直插端子磁性开关的包装测试装置
KR102447833B1 (ko) * 2018-02-09 2022-09-27 주성엔지니어링(주) 전력 인터페이스
JP6961632B2 (ja) 2019-01-21 2021-11-05 株式会社アドバンテスト バーンインボード及びバーンイン装置
IT201900006974A1 (it) * 2019-05-17 2020-11-17 Eles Semiconductor Equipment S P A Condizionamento termico di dispositivi elettronici sotto test basato su elementi estensibili
KR20210071486A (ko) * 2019-12-06 2021-06-16 삼성전자주식회사 검사보드와 이를 구비하는 전자기기 검사장치
KR20220014403A (ko) 2020-07-24 2022-02-07 삼성전자주식회사 반도체 패키지 테스트 시스템 및 이를 이용한 반도체 패키지 제조방법
CN113030697A (zh) * 2021-02-25 2021-06-25 长鑫存储技术有限公司 复合测试机及其使用方法
TWI822371B (zh) * 2022-09-30 2023-11-11 鴻勁精密股份有限公司 接合機構、測試裝置及作業機

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Also Published As

Publication number Publication date
US20100141287A1 (en) 2010-06-10
CN101675350A (zh) 2010-03-17
US8330482B2 (en) 2012-12-11
WO2008098987A1 (en) 2008-08-21
EP2115480A1 (de) 2009-11-11
EP2115480B1 (de) 2011-05-25
MY152599A (en) 2014-10-31

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