ATE550676T1 - Prüfung elektronischer anordnungen mit leiterplatten ohne sockel auf der basis magnetischer verriegelung - Google Patents

Prüfung elektronischer anordnungen mit leiterplatten ohne sockel auf der basis magnetischer verriegelung

Info

Publication number
ATE550676T1
ATE550676T1 AT09757871T AT09757871T ATE550676T1 AT E550676 T1 ATE550676 T1 AT E550676T1 AT 09757871 T AT09757871 T AT 09757871T AT 09757871 T AT09757871 T AT 09757871T AT E550676 T1 ATE550676 T1 AT E550676T1
Authority
AT
Austria
Prior art keywords
electronic device
electronic devices
test
circuit boards
testing electronic
Prior art date
Application number
AT09757871T
Other languages
English (en)
Inventor
Fabrizio Scocchetti
Original Assignee
Eles Semiconductor Equipment S P A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eles Semiconductor Equipment S P A filed Critical Eles Semiconductor Equipment S P A
Application granted granted Critical
Publication of ATE550676T1 publication Critical patent/ATE550676T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT09757871T 2008-06-04 2009-06-03 Prüfung elektronischer anordnungen mit leiterplatten ohne sockel auf der basis magnetischer verriegelung ATE550676T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT001023A ITMI20081023A1 (it) 2008-06-04 2008-06-04 Test di dispositivi elettronici con schede senza zoccoli basate su bloccaggio magnetico
PCT/IB2009/005875 WO2009147517A2 (en) 2008-06-04 2009-06-03 Test of electronic devices with boards without sockets based on magnetic locking

Publications (1)

Publication Number Publication Date
ATE550676T1 true ATE550676T1 (de) 2012-04-15

Family

ID=40301741

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09757871T ATE550676T1 (de) 2008-06-04 2009-06-03 Prüfung elektronischer anordnungen mit leiterplatten ohne sockel auf der basis magnetischer verriegelung

Country Status (6)

Country Link
US (1) US20110156741A1 (de)
EP (1) EP2297590B1 (de)
CN (1) CN102089668A (de)
AT (1) ATE550676T1 (de)
IT (1) ITMI20081023A1 (de)
WO (1) WO2009147517A2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103825117B (zh) * 2014-03-04 2016-01-27 中山市中大电力自动化有限公司 一种供仪表老化试验用的快速连接装置
US10446728B2 (en) * 2014-10-31 2019-10-15 eLux, Inc. Pick-and remove system and method for emissive display repair
US9478250B1 (en) * 2015-04-24 2016-10-25 Seagate Technology Llc Data storage component testing system
US9412411B1 (en) * 2015-04-24 2016-08-09 Seagate Technology Llc Modular data storage device testing system
CN107364641B (zh) * 2017-09-01 2023-06-09 佛山市富乐喜电子信息技术有限公司 一种直插端子磁性开关的包装测试装置
CN107991517A (zh) * 2017-12-05 2018-05-04 广东万濠精密仪器股份有限公司 电子器件邦定后的检测治具装置及使用方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596228A (en) * 1969-05-29 1971-07-27 Ibm Fluid actuated contactor
US6529027B1 (en) * 2000-03-23 2003-03-04 Micron Technology, Inc. Interposer and methods for fabricating same
US6933738B2 (en) * 2001-07-16 2005-08-23 Formfactor, Inc. Fiducial alignment marks on microelectronic spring contacts
WO2004066449A1 (ja) * 2003-01-17 2004-08-05 Jsr Corporation 異方導電性コネクターおよびその製造方法並びに回路装置の検査装置
JP2005055330A (ja) * 2003-08-06 2005-03-03 Elpida Memory Inc 半導体装置への加圧装置
DE20317436U1 (de) * 2003-11-10 2004-01-22 Magcode Ag Elektrische Verbindungsvorrichtung
CN101156284B (zh) * 2004-12-21 2011-02-02 Eles半导体设备股份公司 用于接触电子设备的系统及其生产方法
US7311526B2 (en) * 2005-09-26 2007-12-25 Apple Inc. Magnetic connector for electronic device
US20080018353A1 (en) * 2006-07-24 2008-01-24 Francis Rapheal Thamarayoor Methods and apparatus for releasably mounting a semiconductor device to a printed circuit board
EP1959262A1 (de) * 2007-02-19 2008-08-20 Eles Semiconductor Equipment S.P.A. Testen elektronischer Vorrichtungen unter Verwendung sockelloser Platinen
MY152599A (en) * 2007-02-14 2014-10-31 Eles Semiconductor Equipment S P A Test of electronic devices at package level using test boards without sockets

Also Published As

Publication number Publication date
US20110156741A1 (en) 2011-06-30
WO2009147517A2 (en) 2009-12-10
ITMI20081023A1 (it) 2009-12-05
EP2297590A2 (de) 2011-03-23
EP2297590B1 (de) 2012-03-21
CN102089668A (zh) 2011-06-08
WO2009147517A3 (en) 2010-01-28

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