ATE445167T1 - Halbzeug für einen sensor zum messen eines magnetischen feldes - Google Patents

Halbzeug für einen sensor zum messen eines magnetischen feldes

Info

Publication number
ATE445167T1
ATE445167T1 AT02733067T AT02733067T ATE445167T1 AT E445167 T1 ATE445167 T1 AT E445167T1 AT 02733067 T AT02733067 T AT 02733067T AT 02733067 T AT02733067 T AT 02733067T AT E445167 T1 ATE445167 T1 AT E445167T1
Authority
AT
Austria
Prior art keywords
magnetic
magnetic field
semi
measuring
magnetization
Prior art date
Application number
AT02733067T
Other languages
English (en)
Inventor
Zon Joannes Van
Jacobus Ruigrok
Carsten Giebeler
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE445167T1 publication Critical patent/ATE445167T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Thin Magnetic Films (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
AT02733067T 2001-06-01 2002-05-29 Halbzeug für einen sensor zum messen eines magnetischen feldes ATE445167T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01202136 2001-06-01
PCT/IB2002/001916 WO2002099451A2 (en) 2001-06-01 2002-05-29 Semimanufacture for a sensor for measuring a magnetic field

Publications (1)

Publication Number Publication Date
ATE445167T1 true ATE445167T1 (de) 2009-10-15

Family

ID=8180421

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02733067T ATE445167T1 (de) 2001-06-01 2002-05-29 Halbzeug für einen sensor zum messen eines magnetischen feldes

Country Status (8)

Country Link
US (1) US6946834B2 (de)
EP (1) EP1399748B1 (de)
JP (1) JP4630544B2 (de)
KR (1) KR20030018065A (de)
CN (1) CN1322333C (de)
AT (1) ATE445167T1 (de)
DE (1) DE60233940D1 (de)
WO (1) WO2002099451A2 (de)

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US8890266B2 (en) * 2011-01-31 2014-11-18 Everspin Technologies, Inc. Fabrication process and layout for magnetic sensor arrays
CN102226835A (zh) * 2011-04-06 2011-10-26 江苏多维科技有限公司 单一芯片双轴磁场传感器及其制备方法
JP5809478B2 (ja) * 2011-08-02 2015-11-11 アルプス電気株式会社 磁気センサ
JP5802565B2 (ja) * 2012-01-18 2015-10-28 アルプス電気株式会社 磁気センサ
JP5899012B2 (ja) * 2012-03-14 2016-04-06 アルプス電気株式会社 磁気センサ
US9164155B2 (en) 2013-01-29 2015-10-20 Infineon Technologies Ag Systems and methods for offset reduction in sensor devices and systems
US9341684B2 (en) 2013-03-13 2016-05-17 Plures Technologies, Inc. Magnetic field sensing apparatus and methods
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JP7097228B2 (ja) * 2017-05-19 2022-07-07 旭化成エレクトロニクス株式会社 磁気センサ
JP6699635B2 (ja) * 2017-08-18 2020-05-27 Tdk株式会社 磁気センサ
US10794968B2 (en) * 2017-08-24 2020-10-06 Everspin Technologies, Inc. Magnetic field sensor and method of manufacture
KR101965510B1 (ko) * 2017-11-16 2019-08-07 재단법인대구경북과학기술원 거대자기저항 센서
US10935612B2 (en) 2018-08-20 2021-03-02 Allegro Microsystems, Llc Current sensor having multiple sensitivity ranges
CN109556539B (zh) * 2018-12-29 2021-07-02 上海山南勘测设计有限公司 一种基于盾构管片测定的大坡度隧道轴线检测方法
JP7279834B2 (ja) * 2019-10-01 2023-05-23 Tdk株式会社 磁気センサ装置
JP7058630B2 (ja) * 2019-10-01 2022-04-22 Tdk株式会社 磁気センサ装置
US11187764B2 (en) 2020-03-20 2021-11-30 Allegro Microsystems, Llc Layout of magnetoresistance element
WO2021245785A1 (ja) * 2020-06-02 2021-12-09 三菱電機株式会社 磁気センサおよびその製造方法
JP7421462B2 (ja) * 2020-10-16 2024-01-24 株式会社東芝 磁気センサ及び検査装置
JP7414703B2 (ja) * 2020-12-14 2024-01-16 株式会社東芝 磁気センサ及び検査装置
US11567108B2 (en) 2021-03-31 2023-01-31 Allegro Microsystems, Llc Multi-gain channels for multi-range sensor
EP4130772B1 (de) 2021-08-05 2025-07-23 Allegro MicroSystems, LLC Magnetoresistives element mit kompensiertem temperaturkoeffizienten von tmr
JP7795776B2 (ja) * 2022-03-04 2026-01-08 スピンセンシングファクトリー株式会社 磁気センサおよび磁気センサの製造方法
CN114778917B (zh) * 2022-03-25 2025-06-24 桐乡市伟达电子有限公司 抗磁场分流器、其电力仪表及其抗磁场分流器制造方法
US11994541B2 (en) 2022-04-15 2024-05-28 Allegro Microsystems, Llc Current sensor assemblies for low currents
US12248039B2 (en) 2023-08-08 2025-03-11 Allegro Microsystems, Llc Interleaving sub-arrays of magnetoresistance elements based on reference directions to compensate for bridge offset

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Also Published As

Publication number Publication date
WO2002099451A2 (en) 2002-12-12
DE60233940D1 (de) 2009-11-19
KR20030018065A (ko) 2003-03-04
CN1322333C (zh) 2007-06-20
EP1399748B1 (de) 2009-10-07
EP1399748A2 (de) 2004-03-24
US20020180433A1 (en) 2002-12-05
WO2002099451A3 (en) 2003-04-17
CN1513120A (zh) 2004-07-14
JP4630544B2 (ja) 2011-02-09
US6946834B2 (en) 2005-09-20
JP2004533120A (ja) 2004-10-28

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