ATE417279T1 - Integrierte mehrkanalige analoge testinstrumentanordnung - Google Patents

Integrierte mehrkanalige analoge testinstrumentanordnung

Info

Publication number
ATE417279T1
ATE417279T1 AT99953171T AT99953171T ATE417279T1 AT E417279 T1 ATE417279 T1 AT E417279T1 AT 99953171 T AT99953171 T AT 99953171T AT 99953171 T AT99953171 T AT 99953171T AT E417279 T1 ATE417279 T1 AT E417279T1
Authority
AT
Austria
Prior art keywords
channel
test instrument
analog test
circuitry
driver
Prior art date
Application number
AT99953171T
Other languages
English (en)
Inventor
Eric Truebenbach
Jiann-Neng Chen
Richard Davis
John Arena
Teresa Lopes
David Lind
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of ATE417279T1 publication Critical patent/ATE417279T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
AT99953171T 1998-10-19 1999-10-14 Integrierte mehrkanalige analoge testinstrumentanordnung ATE417279T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/174,866 US6363507B1 (en) 1998-10-19 1998-10-19 Integrated multi-channel analog test instrument architecture providing flexible triggering

Publications (1)

Publication Number Publication Date
ATE417279T1 true ATE417279T1 (de) 2008-12-15

Family

ID=22637858

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99953171T ATE417279T1 (de) 1998-10-19 1999-10-14 Integrierte mehrkanalige analoge testinstrumentanordnung

Country Status (9)

Country Link
US (1) US6363507B1 (de)
EP (1) EP1123513B1 (de)
JP (1) JP4828700B2 (de)
KR (1) KR100684120B1 (de)
AT (1) ATE417279T1 (de)
CA (1) CA2347236C (de)
DE (1) DE69940069D1 (de)
TW (1) TW571107B (de)
WO (1) WO2000023809A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10050546B4 (de) * 2000-10-12 2008-07-24 Rohde & Schwarz Gmbh & Co. Kg Verfahren zum Verteilen eines Messgeräte-Firmware Programmcodes auf mehrere Meßgeräte
US6590644B1 (en) * 2001-01-12 2003-07-08 Ciena Corporation Optical module calibration system
DE60105787D1 (de) * 2001-06-21 2004-10-28 St Microelectronics Srl Prüfungsverfahren für integrierte Schaltungen
EP1331487A1 (de) * 2002-01-29 2003-07-30 AMI Semiconductor Belgium BVBA Vorrichtung und Verfahren zur Erzeugung von Testprogrammen für integrierte Schaltungen
AU2003222702A1 (en) 2002-05-03 2003-11-17 Mcgill University Method and device for use in dc parametric tests
US7111199B2 (en) * 2002-07-08 2006-09-19 Lsi Logic Corporation Built-in debug feature for complex VLSI chip
KR20060127390A (ko) 2003-11-26 2006-12-12 주식회사 아도반테스토 시험 장치
US7237167B2 (en) 2004-02-06 2007-06-26 Advantest Corporation Testing apparatus
US7177777B2 (en) * 2004-10-01 2007-02-13 Credence Systems Corporation Synchronization of multiple test instruments
DE102004052246B3 (de) * 2004-10-27 2006-06-14 Infineon Technologies Ag Halbleiterbauelement, Anordnung und Verfahren zur Charakterisierung eines Prüfgerätes für Halbleiterbauelemente
US7319936B2 (en) * 2004-11-22 2008-01-15 Teradyne, Inc. Instrument with interface for synchronization in automatic test equipment
US7454681B2 (en) * 2004-11-22 2008-11-18 Teradyne, Inc. Automatic test system with synchronized instruments
US7322001B2 (en) * 2005-10-04 2008-01-22 International Business Machines Corporation Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance
RU2316732C1 (ru) * 2006-07-05 2008-02-10 Федеральное государственное унитарное предприятие "Научно-исследовательский и конструкторский институт энерготехники им. Н.А. Доллежаля" Устройство для измерения переменных скалярных величин, распределенных в пространстве
US7417480B2 (en) * 2006-07-14 2008-08-26 International Business Machines Corporation Duty cycle correction circuit whose operation is largely independent of operating voltage and process
US7913199B2 (en) * 2006-07-14 2011-03-22 International Business Machines Corporation Structure for a duty cycle correction circuit
US8131387B2 (en) 2007-08-09 2012-03-06 Teradyne, Inc. Integrated high-efficiency microwave sourcing control process
US20090128206A1 (en) * 2007-11-20 2009-05-21 Boerstler David W Apparatus and Method for Obtaining Desired Phase Locked Loop Duty Cycle without Pre-Scaler
US8108813B2 (en) * 2007-11-20 2012-01-31 International Business Machines Corporation Structure for a circuit obtaining desired phase locked loop duty cycle without pre-scaler
US8745337B2 (en) * 2007-12-31 2014-06-03 Teradyne, Inc. Apparatus and method for controlling memory overrun
US8381143B2 (en) * 2008-05-29 2013-02-19 International Business Machines Corporation Structure for a duty cycle correction circuit
CN101303384B (zh) * 2008-06-30 2010-11-10 清华大学 一种快速响应电子器件响应速度的测试装置及其测试方法
US7906981B1 (en) * 2009-09-10 2011-03-15 Advantest Corporation Test apparatus and test method
US20120242357A1 (en) * 2011-03-23 2012-09-27 Hamilton Sundstrand Corporation Automatic fault insertion, calibration and test system
US8521463B2 (en) * 2011-04-26 2013-08-27 Freescale Semiconductor, Inc. System for performing electrical characterization of asynchronous integrated circuit interfaces
CN104280638A (zh) * 2014-10-14 2015-01-14 成都天奥测控技术有限公司 一种多功能同步测试装置
KR102386205B1 (ko) * 2015-08-05 2022-04-13 삼성디스플레이 주식회사 어레이 테스트 장치 및 어레이 테스트 방법
WO2022017591A1 (en) 2020-07-21 2022-01-27 Advantest Corporation Automated test equipment and method using a trigger generation
CN112098746B (zh) * 2020-08-21 2023-07-04 立讯智造(浙江)有限公司 触控屏检测机构
CN120295948A (zh) * 2025-02-28 2025-07-11 锐泰微(北京)电子科技有限公司 高速接口、芯片及高速接口的多通道数据同步方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4044244A (en) * 1976-08-06 1977-08-23 International Business Machines Corporation Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof
US4066882A (en) * 1976-08-16 1978-01-03 Grumman Aerospace Corporation Digital stimulus generating and response measuring means
US4620304A (en) 1982-09-13 1986-10-28 Gen Rad, Inc. Method of and apparatus for multiplexed automatic testing of electronic circuits and the like
CA1251575A (en) * 1985-12-18 1989-03-21 A. Keith Jeffrey Automatic test system having a "true tester-per-pin" architecture
JPS62145171A (ja) * 1985-12-19 1987-06-29 Toshiba Corp ボ−ドテスト装置
US5081297A (en) * 1986-05-06 1992-01-14 Grumman Aerospace Corporation Software reconfigurable instrument with programmable counter modules reconfigurable as a counter/timer, function generator and digitizer
US4816750A (en) * 1987-01-16 1989-03-28 Teradyne, Inc. Automatic circuit tester control system
US4848702A (en) * 1987-05-04 1989-07-18 Riggins James W Aero marine vehicle
JPS6447973A (en) * 1987-08-18 1989-02-22 Yokogawa Electric Corp Device tester
JPH03152485A (ja) * 1989-11-08 1991-06-28 Mitsubishi Electric Corp 半導体評価装置
DE3938520A1 (de) 1989-11-21 1991-05-29 Teves Gmbh Alfred Verfahren und system zur messdatenerfassung und -auswertung
JPH0436673A (ja) * 1990-05-31 1992-02-06 Yokogawa Hewlett Packard Ltd 電子部品試験装置
EP0468553A3 (en) 1990-06-08 1992-10-21 N.V. Philips' Gloeilampenfabrieken Instrumentation system and instrumentation devices adapted for use in such a system
JP3269060B2 (ja) * 1992-01-27 2002-03-25 横河電機株式会社 Ｌｓｉテスタ
US5414365A (en) 1992-09-25 1995-05-09 Martin Marietta Corporation Diagnostic apparatus for testing an analog circuit
JPH06230077A (ja) * 1993-02-03 1994-08-19 Sharp Corp 半導体集積回路の試験装置
US5532944A (en) * 1994-07-28 1996-07-02 Sorrento Electronics, Inc. Multi-channel analysis system and method using digital signal processing
JPH08241185A (ja) 1994-11-03 1996-09-17 Motorola Inc 統合型試験および測定手段ならびにグラフィカル・ユーザ・インタフェースを採用する方法
US5572160A (en) * 1994-12-01 1996-11-05 Teradyne, Inc. Architecture for RF signal automatic test equipment
US5748642A (en) * 1995-09-25 1998-05-05 Credence Systems Corporation Parallel processing integrated circuit tester
JPH1083697A (ja) * 1996-09-04 1998-03-31 Hitachi Electron Eng Co Ltd Ｉｃ試験装置の試験信号発生装置
US5745003A (en) * 1996-09-11 1998-04-28 Schlumberger Technologies Inc. Driver circuits for IC tester
US6073259A (en) * 1997-08-05 2000-06-06 Teradyne, Inc. Low cost CMOS tester with high channel density
US6101622A (en) * 1998-04-27 2000-08-08 Credence Systems Corporation Asynchronous integrated circuit tester

Also Published As

Publication number Publication date
EP1123513B1 (de) 2008-12-10
DE69940069D1 (de) 2009-01-22
CA2347236A1 (en) 2000-04-27
KR20010080220A (ko) 2001-08-22
TW571107B (en) 2004-01-11
US6363507B1 (en) 2002-03-26
JP4828700B2 (ja) 2011-11-30
CA2347236C (en) 2009-12-15
KR100684120B1 (ko) 2007-02-16
WO2000023809A1 (en) 2000-04-27
EP1123513A1 (de) 2001-08-16
JP2002528706A (ja) 2002-09-03

Similar Documents

Publication Publication Date Title
ATE417279T1 (de) Integrierte mehrkanalige analoge testinstrumentanordnung
US5418452A (en) Apparatus for testing integrated circuits using time division multiplexing
US5768159A (en) Method of simulating AC timing characteristics of integrated circuits
EP0388790A3 (de) Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen mit zahlreichen Anschlüssen
ATE348340T1 (de) Verfahren und system zur prüfung von rf chips
EP0856961A3 (de) Testen von Nachrichtenübertragungsgerät
EP1306998A3 (de) Verfahren und Gerät zur Augenmustermessung
GB0213882D0 (en) A digital system & method for testing analogue & mixed-signal circuits or systems
US5341091A (en) Apparatus and method for generating synchronized control signals in a system for testing electronic parts
KR100356725B1 (ko) 반도체 시험 장치
ES8609738A1 (es) Una instalacion para comprobar circuitos electronicos fun- cionales
ATE531131T1 (de) Verfahren und vorrichtung zum verteilen mehrerer signaleingänge an mehrere integrierte schaltungen
US6892338B2 (en) Analog/digital characteristics testing device and IC testing apparatus
DE60001520D1 (de) Verfahren zum Prüfen von elektronischen Komponenten
EP0943925A3 (de) Elektro-optisches Abtast-Oszilloskop
KR20050113609A (ko) 디바이스 광전자 방출을 사용하여 테스팅 장비의 교정을위한 시스템 및 방법
US20030063693A1 (en) Time correlation of data acquisition samples from independent systems in a logic analyzer
US20040093544A1 (en) Method and apparatus for testing a device in an electronic component
JPH0926468A (ja) 半導体試験装置における周波数／周期測定装置
JP3819593B2 (ja) Ｉｃ試験装置
JPH0980118A (ja) Ｉｃテスタ
TW359749B (en) Circuit and method for determining propagation delay times of testing signals
TW363130B (en) Method and apparatus for generating split timing test signals for integrated circuit testing
JPH11352196A (ja) サンプリング・デジタイザ
JP2003315417A (ja) エッジ変換回路及びエッジ変換回路を備えた半導体試験装置

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties