Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Techonogies IncfiledCriticalSchlumberger Techonogies Inc
Application grantedgrantedCritical
Publication of TW363130BpublicationCriticalpatent/TW363130B/en
A system for generating test signals for application to a device under test, includes: (a) a timing unit which outputs a clock signal; (b) a primary sequence controller which generates primary timing test period signals; (c) a secondary sequence controller which generates secondary timing test period signals; (d) a sequence buffer which takes as inputs primary and secondary timing test period signals and outputs primary and secondary timing test signal data; (e) first and second sets of pin slice circuits which apply test signals to the device under test; and (f) a sequence select buffer which takes as inputs the primary and secondary timing test signal data and applies primary timing period test signal data to the first set of pin slice circuits and secondary timing period test signal data to the second set of pin slice circuits.
TW087100722A1997-01-281998-01-20Method and apparatus for generating split timing test signals for integrated circuit testing
TW363130B
(en)
A semiconductor device capable of holding signals independent of the pulse width of an external clock and a computer system including the semiconductor