ATE408154T1 - Funktionssteuerbare prüfnadel zur messung von halbleiterwafern und benutzungsverfahren - Google Patents

Funktionssteuerbare prüfnadel zur messung von halbleiterwafern und benutzungsverfahren

Info

Publication number
ATE408154T1
ATE408154T1 AT05104011T AT05104011T ATE408154T1 AT E408154 T1 ATE408154 T1 AT E408154T1 AT 05104011 T AT05104011 T AT 05104011T AT 05104011 T AT05104011 T AT 05104011T AT E408154 T1 ATE408154 T1 AT E408154T1
Authority
AT
Austria
Prior art keywords
semiconductor wafer
electrical
semiconductor wafers
test needle
controller test
Prior art date
Application number
AT05104011T
Other languages
German (de)
English (en)
Inventor
Howland, Jr
Robert J Hillard
Hung Steven Chi-Shin
Original Assignee
Solid State Measurements Inc
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solid State Measurements Inc, Applied Materials Inc filed Critical Solid State Measurements Inc
Application granted granted Critical
Publication of ATE408154T1 publication Critical patent/ATE408154T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2648—Characterising semiconductor materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AT05104011T 2004-05-14 2005-05-13 Funktionssteuerbare prüfnadel zur messung von halbleiterwafern und benutzungsverfahren ATE408154T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/845,815 US7023231B2 (en) 2004-05-14 2004-05-14 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof

Publications (1)

Publication Number Publication Date
ATE408154T1 true ATE408154T1 (de) 2008-09-15

Family

ID=34939824

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05104011T ATE408154T1 (de) 2004-05-14 2005-05-13 Funktionssteuerbare prüfnadel zur messung von halbleiterwafern und benutzungsverfahren

Country Status (6)

Country Link
US (1) US7023231B2 (OSRAM)
EP (1) EP1596212B1 (OSRAM)
JP (1) JP2005333148A (OSRAM)
AT (1) ATE408154T1 (OSRAM)
DE (1) DE602005009603D1 (OSRAM)
TW (1) TWI391686B (OSRAM)

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US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
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JP6301680B2 (ja) * 2014-02-25 2018-03-28 エイブリック株式会社 弾性プローブ
US20200233033A1 (en) * 2019-01-17 2020-07-23 Intel Corporation Test probe for wafer-level and panel-level testing
US12411155B2 (en) 2019-01-29 2025-09-09 Yokowo Co., Ltd. Plunger and contact probe

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Also Published As

Publication number Publication date
EP1596212B1 (en) 2008-09-10
EP1596212A1 (en) 2005-11-16
DE602005009603D1 (de) 2008-10-23
JP2005333148A (ja) 2005-12-02
US20050253618A1 (en) 2005-11-17
US7023231B2 (en) 2006-04-04
TW200538748A (en) 2005-12-01
TWI391686B (zh) 2013-04-01

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