ATE315271T1 - Linsensystem für röntgenstrahlen - Google Patents
Linsensystem für röntgenstrahlenInfo
- Publication number
- ATE315271T1 ATE315271T1 AT00920188T AT00920188T ATE315271T1 AT E315271 T1 ATE315271 T1 AT E315271T1 AT 00920188 T AT00920188 T AT 00920188T AT 00920188 T AT00920188 T AT 00920188T AT E315271 T1 ATE315271 T1 AT E315271T1
- Authority
- AT
- Austria
- Prior art keywords
- rays
- lens system
- focal point
- ray lens
- directs
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
- A61N5/00—Radiation therapy
- A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
- A61N2005/1085—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy characterised by the type of particles applied to the patient
- A61N2005/1091—Kilovoltage or orthovoltage range photons
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
- A61N5/00—Radiation therapy
- A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
- A61N2005/1092—Details
- A61N2005/1095—Elements inserted into the radiation path within the system, e.g. filters or wedges
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
- Radiation-Therapy Devices (AREA)
- Prostheses (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/289,493 US6389100B1 (en) | 1999-04-09 | 1999-04-09 | X-ray lens system |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE315271T1 true ATE315271T1 (de) | 2006-02-15 |
Family
ID=23111775
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT00920188T ATE315271T1 (de) | 1999-04-09 | 2000-04-07 | Linsensystem für röntgenstrahlen |
Country Status (9)
Country | Link |
---|---|
US (2) | US6389100B1 (de) |
EP (1) | EP1169713B1 (de) |
JP (1) | JP2002541496A (de) |
AT (1) | ATE315271T1 (de) |
AU (1) | AU4076600A (de) |
CA (1) | CA2366801A1 (de) |
CZ (1) | CZ20013642A3 (de) |
DE (1) | DE60025341T2 (de) |
WO (1) | WO2000062306A2 (de) |
Families Citing this family (80)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6580940B2 (en) * | 2000-02-02 | 2003-06-17 | George Gutman | X-ray system with implantable needle for treatment of cancer |
DE10011882A1 (de) * | 2000-03-07 | 2001-09-13 | Ifg Inst Fuer Geraetebau Gmbh | Verfahren und Vorrichtung zum Fokussieren von Röntgenstrahlen zur Realisierung von Röntgen-Zoom-Optiken |
US6870896B2 (en) | 2000-12-28 | 2005-03-22 | Osmic, Inc. | Dark-field phase contrast imaging |
US6804324B2 (en) * | 2001-03-01 | 2004-10-12 | Osmo, Inc. | X-ray phase contrast imaging using a fabry-perot interferometer concept |
US20030012336A1 (en) * | 2001-06-20 | 2003-01-16 | Cash Webster C. | X-ray concentrator for therapy |
US6510200B1 (en) | 2001-06-29 | 2003-01-21 | Osmic, Inc. | Multi-layer structure with variable bandpass for monochromatization and spectroscopy |
FR2828933A1 (fr) * | 2001-08-27 | 2003-02-28 | Corning Inc | Procede de determination de la qualite optique d'un monocristal de fluorure et element optique |
CN1299781C (zh) * | 2001-09-19 | 2007-02-14 | 姆拉丁·阿布比奇罗维奇·库马科夫 | 放射治疗设备 |
US6643353B2 (en) | 2002-01-10 | 2003-11-04 | Osmic, Inc. | Protective layer for multilayers exposed to x-rays |
JP3699998B2 (ja) * | 2002-03-20 | 2005-09-28 | 国立大学法人東北大学 | 蛍光x線ホログラフィー装置、蛍光x線ホログラフィーおよび局所構造解析方法 |
US20030206610A1 (en) * | 2002-05-01 | 2003-11-06 | Collins William F. | Patient positioning system |
US7070327B2 (en) * | 2002-05-01 | 2006-07-04 | Siemens Medical Solutions Usa, Inc. | Focused radiation visualization |
US6782073B2 (en) * | 2002-05-01 | 2004-08-24 | Siemens Medical Solutions Usa, Inc. | Planning system for convergent radiation treatment |
DE10254026C5 (de) * | 2002-11-20 | 2009-01-29 | Incoatec Gmbh | Reflektor für Röntgenstrahlung |
US7110490B2 (en) * | 2002-12-10 | 2006-09-19 | General Electric Company | Full field digital tomosynthesis method and apparatus |
US7280634B2 (en) | 2003-06-13 | 2007-10-09 | Osmic, Inc. | Beam conditioning system with sequential optic |
EP1642304B1 (de) * | 2003-06-13 | 2008-03-19 | Osmic, Inc. | Strahlaufbereitungssystem |
US20060039533A1 (en) | 2003-12-12 | 2006-02-23 | Weil Michael D | Management system for combination treatment |
US20070280421A1 (en) * | 2004-06-02 | 2007-12-06 | Cho Yong M | Narrow band x-ray system and fabrication method thereof |
US7403593B1 (en) * | 2004-09-28 | 2008-07-22 | Bruker Axs, Inc. | Hybrid x-ray mirrors |
JP2006292682A (ja) * | 2005-04-14 | 2006-10-26 | Mitsubishi Electric Corp | Cad/cam装置及び電子ビーム照射装置 |
US7415096B2 (en) * | 2005-07-26 | 2008-08-19 | Jordan Valley Semiconductors Ltd. | Curved X-ray reflector |
US7634052B2 (en) * | 2006-10-24 | 2009-12-15 | Thermo Niton Analyzers Llc | Two-stage x-ray concentrator |
US7791033B2 (en) * | 2006-12-01 | 2010-09-07 | Mats Danielsson | System and method for imaging using radio-labeled substances, especially suitable for studying of biological processes |
GB2444962B (en) * | 2006-12-22 | 2010-01-27 | Univ Muenster Wilhelms | Adaptive crystalline X-ray reflecting device |
US8068582B2 (en) * | 2007-02-23 | 2011-11-29 | Passport Systems, Inc. | Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection |
CZ2007494A3 (cs) * | 2007-07-20 | 2008-11-12 | Ceské vysoké ucení technické v Praze | Optický clen pro rentgenovou mikroskopii |
US7651270B2 (en) * | 2007-08-31 | 2010-01-26 | Rigaku Innovative Technologies, Inc. | Automated x-ray optic alignment with four-sector sensor |
US20090088625A1 (en) * | 2007-10-01 | 2009-04-02 | Kenneth Oosting | Photonic Based Non-Invasive Surgery System That Includes Automated Cell Control and Eradication Via Pre-Calculated Feed-Forward Control Plus Image Feedback Control For Targeted Energy Delivery |
US7706503B2 (en) * | 2007-11-20 | 2010-04-27 | Rigaku Innovative Technologies, Inc. | X-ray optic with varying focal points |
US7742566B2 (en) * | 2007-12-07 | 2010-06-22 | General Electric Company | Multi-energy imaging system and method using optic devices |
US7848483B2 (en) * | 2008-03-07 | 2010-12-07 | Rigaku Innovative Technologies | Magnesium silicide-based multilayer x-ray fluorescence analyzers |
US8602648B1 (en) * | 2008-09-12 | 2013-12-10 | Carl Zeiss X-ray Microscopy, Inc. | X-ray microscope system with cryogenic handling system and method |
US20100175854A1 (en) * | 2009-01-15 | 2010-07-15 | Luca Joseph Gratton | Method and apparatus for multi-functional capillary-tube interface unit for evaporation, humidification, heat exchange, pressure or thrust generation, beam diffraction or collimation using multi-phase fluid |
US8369674B2 (en) * | 2009-05-20 | 2013-02-05 | General Electric Company | Optimizing total internal reflection multilayer optics through material selection |
CN102460135A (zh) * | 2009-06-03 | 2012-05-16 | 特莫尼托恩分析仪器股份有限公司 | 检测器位于聚焦元件内部的x射线系统和方法 |
US8537967B2 (en) * | 2009-09-10 | 2013-09-17 | University Of Washington | Short working distance spectrometer and associated devices, systems, and methods |
US9082522B2 (en) * | 2009-12-14 | 2015-07-14 | Brookhaven Science Associates, Llc | Zone compensated multilayer laue lens and apparatus and method of fabricating the same |
DK2606490T3 (en) | 2010-08-19 | 2018-10-15 | Convergent R N R Ltd | X-ray irradiation of the target volume |
KR101239765B1 (ko) * | 2011-02-09 | 2013-03-06 | 삼성전자주식회사 | 엑스레이 발생장치 및 이를 포함하는 엑스레이 촬영 시스템 |
US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
EP2814573B1 (de) | 2012-02-13 | 2018-03-21 | Convergent R.N.R Ltd | Bildgebungsgeführte abgabe von röntgenstrahlung |
EP2898361A4 (de) | 2012-09-24 | 2016-06-01 | Convergent R N R Ltd | Röntgenstrahlenreflektierende linsenanordnung |
US9449781B2 (en) | 2013-12-05 | 2016-09-20 | Sigray, Inc. | X-ray illuminators with high flux and high flux density |
US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
US9570265B1 (en) | 2013-12-05 | 2017-02-14 | Sigray, Inc. | X-ray fluorescence system with high flux and high flux density |
US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
WO2015140796A1 (en) * | 2014-03-17 | 2015-09-24 | Convergent R.N.R Ltd | Using focused converging x-rays for imaging |
US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
JP6422050B2 (ja) * | 2014-07-30 | 2018-11-14 | 公立大学法人首都大学東京 | X線光学系基材、及びその製造方法 |
WO2016108235A1 (en) * | 2014-12-30 | 2016-07-07 | Convergent R.N.R Ltd | New constructions of x-ray lenses for converging x-rays |
US11250968B2 (en) | 2014-12-30 | 2022-02-15 | Convergent R.N.R. Ltd. | Constructions of x-ray lenses for converging x-rays |
US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
WO2017094802A1 (ja) * | 2015-11-30 | 2017-06-08 | 株式会社カネカ | エネルギーデグレーダ、及びそれを備えた荷電粒子線照射システム、並びにグラファイト膜の製造方法 |
US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
JP6937380B2 (ja) | 2017-03-22 | 2021-09-22 | シグレイ、インコーポレイテッド | X線分光を実施するための方法およびx線吸収分光システム |
US10816486B2 (en) | 2018-03-28 | 2020-10-27 | Kla-Tencor Corporation | Multilayer targets for calibration and alignment of X-ray based measurement systems |
US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
CN112424591B (zh) * | 2018-06-04 | 2024-05-24 | 斯格瑞公司 | 波长色散x射线光谱仪 |
CN112470245A (zh) | 2018-07-26 | 2021-03-09 | 斯格瑞公司 | 高亮度x射线反射源 |
US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
CN112638261A (zh) | 2018-09-04 | 2021-04-09 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
CN114424054B (zh) * | 2019-06-24 | 2024-03-22 | Sms集团有限公司 | 用于确定多晶产品的材料特性的设备和方法 |
CN114729907B (zh) | 2019-09-03 | 2023-05-23 | 斯格瑞公司 | 用于计算机层析x射线荧光成像的系统和方法 |
EP4035186A4 (de) * | 2019-09-24 | 2022-12-07 | Convergent R.N.R Ltd | Röntgenoptische anordnung |
CN112683937B (zh) * | 2019-10-18 | 2024-05-10 | 北航(四川)西部国际创新港科技有限公司 | 一种多源射线整合装置 |
US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
US11549895B2 (en) | 2020-09-17 | 2023-01-10 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
DE112021006348T5 (de) | 2020-12-07 | 2023-09-21 | Sigray, Inc. | 3d-röntgenbildgebungssystem mit hohem durchsatz, das eine transmissionsröntgenquelle verwendet |
US11992350B2 (en) | 2022-03-15 | 2024-05-28 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
US11885755B2 (en) | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
Family Cites Families (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2853617A (en) | 1955-01-27 | 1958-09-23 | California Inst Res Found | Focusing crystal for x-rays and method of manufacture |
US3032656A (en) | 1957-08-15 | 1962-05-01 | Licentia Gmbh | X-ray refracting optical element |
DE1800879C3 (de) * | 1968-10-03 | 1974-01-10 | Siemens Ag, 1000 Berlin U. 8000 Muenchen | Primärstrahlenblende für Röntgenuntersuchungsgeräte |
US3898455A (en) * | 1973-11-12 | 1975-08-05 | Jr Thomas C Furnas | X-ray monochromatic and focusing system |
US3927319A (en) | 1974-06-28 | 1975-12-16 | Univ Southern California | Crystal for X-ray crystal spectrometer |
US4028547A (en) * | 1975-06-30 | 1977-06-07 | Bell Telephone Laboratories, Incorporated | X-ray photolithography |
US4203034A (en) * | 1978-06-01 | 1980-05-13 | University Of Florida Board Of Regents | Diffraction camera for imaging penetrating radiation |
US4461018A (en) | 1982-06-07 | 1984-07-17 | The United States Of America As Represented By The United States Department Of Energy | Diffraction crystal for sagittally focusing x-rays |
US4693933A (en) | 1983-06-06 | 1987-09-15 | Ovonic Synthetic Materials Company, Inc. | X-ray dispersive and reflective structures and method of making the structures |
US4727000A (en) | 1983-06-06 | 1988-02-23 | Ovonic Synthetic Materials Co., Inc. | X-ray dispersive and reflective structures |
US4717632A (en) | 1983-08-22 | 1988-01-05 | Ovonic Synthetic-Materials Company, Inc. | Adhesion and composite wear resistant coating and method |
US4716083A (en) | 1983-09-23 | 1987-12-29 | Ovonic Synthetic Materials Company | Disordered coating |
US4525853A (en) | 1983-10-17 | 1985-06-25 | Energy Conversion Devices, Inc. | Point source X-ray focusing device |
US4785470A (en) | 1983-10-31 | 1988-11-15 | Ovonic Synthetic Materials Company, Inc. | Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis |
US4599741A (en) | 1983-11-04 | 1986-07-08 | USC--Dept. of Materials Science | System for local X-ray excitation by monochromatic X-rays |
US4643951A (en) | 1984-07-02 | 1987-02-17 | Ovonic Synthetic Materials Company, Inc. | Multilayer protective coating and method |
US4724169A (en) | 1984-10-09 | 1988-02-09 | Ovonic Synthetic Materials Company, Inc. | Method of producing multilayer coatings on a substrate |
US4675889A (en) | 1985-07-08 | 1987-06-23 | Ovonic Synthetic Materials Company, Inc. | Multiple wavelength X-ray dispersive devices and method of making the devices |
US4958363A (en) | 1986-08-15 | 1990-09-18 | Nelson Robert S | Apparatus for narrow bandwidth and multiple energy x-ray imaging |
US4777090A (en) | 1986-11-03 | 1988-10-11 | Ovonic Synthetic Materials Company | Coated article and method of manufacturing the article |
US4783374A (en) | 1987-11-16 | 1988-11-08 | Ovonic Synthetic Materials Company | Coated article and method of manufacturing the article |
JPH0631887B2 (ja) * | 1988-04-28 | 1994-04-27 | 株式会社東芝 | X線ミラー及びその製造方法 |
US4867785A (en) | 1988-05-09 | 1989-09-19 | Ovonic Synthetic Materials Company, Inc. | Method of forming alloy particulates having controlled submicron crystallite size distributions |
US5001737A (en) * | 1988-10-24 | 1991-03-19 | Aaron Lewis | Focusing and guiding X-rays with tapered capillaries |
US5027377A (en) | 1990-01-09 | 1991-06-25 | The United States Of America As Represented By The United States Department Of Energy | Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere |
FR2665261A1 (fr) * | 1990-07-24 | 1992-01-31 | Philips Electronique Lab | Dispositif de diffractometrie a rayons x et utilisation de ce dispositif. |
US5167912A (en) | 1990-07-31 | 1992-12-01 | Ovonic Synthetic Materials Company, Inc. | Neutron reflecting supermirror structure |
US5082621A (en) | 1990-07-31 | 1992-01-21 | Ovonic Synthetic Materials Company, Inc. | Neutron reflecting supermirror structure |
US5210779A (en) * | 1991-07-26 | 1993-05-11 | Hughes Aircraft Company | Apparatus and method for focusing hard x-rays |
US5384817A (en) | 1993-07-12 | 1995-01-24 | Ovonic Synthetic Materials Company | X-ray optical element and method for its manufacture |
JP2526409B2 (ja) | 1994-02-18 | 1996-08-21 | 工業技術院長 | X線レンズ |
IT1270022B (it) | 1994-03-04 | 1997-04-28 | Oberto Citterio | Specchi ad incidenza radente per telescopi a raggi x |
WO1995031815A1 (en) | 1994-05-11 | 1995-11-23 | The Regents Of The University Of Colorado | Spherical mirror grazing incidence x-ray optics |
AUPM597794A0 (en) * | 1994-05-31 | 1994-06-23 | Australian National University, The | Lenses formed by arrays of reflectors |
US5646976A (en) | 1994-08-01 | 1997-07-08 | Osmic, Inc. | Optical element of multilayered thin film for X-rays and neutrons |
US5745547A (en) * | 1995-08-04 | 1998-04-28 | X-Ray Optical Systems, Inc. | Multiple channel optic |
US5757882A (en) | 1995-12-18 | 1998-05-26 | Osmic, Inc. | Steerable x-ray optical system |
US5787146A (en) * | 1996-10-18 | 1998-07-28 | Spad Technologies, Inc. | X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue |
US5761256A (en) * | 1997-02-07 | 1998-06-02 | Matsushita Electric Industrial Co., Ltd. | Curved pyrolytic graphite monochromator and its manufacturing method |
US5880467A (en) * | 1997-03-05 | 1999-03-09 | The United States Of America As Represented By The Secretary Of Commerce | Microcalorimeter x-ray detectors with x-ray lens |
US6041099A (en) | 1998-02-19 | 2000-03-21 | Osmic, Inc. | Single corner kirkpatrick-baez beam conditioning optic assembly |
US6014423A (en) | 1998-02-19 | 2000-01-11 | Osmic, Inc. | Multiple corner Kirkpatrick-Baez beam conditioning optic assembly |
US6069934A (en) | 1998-04-07 | 2000-05-30 | Osmic, Inc. | X-ray diffractometer with adjustable image distance |
-
1999
- 1999-04-09 US US09/289,493 patent/US6389100B1/en not_active Expired - Lifetime
-
2000
- 2000-04-07 EP EP00920188A patent/EP1169713B1/de not_active Revoked
- 2000-04-07 AT AT00920188T patent/ATE315271T1/de not_active IP Right Cessation
- 2000-04-07 DE DE60025341T patent/DE60025341T2/de not_active Revoked
- 2000-04-07 AU AU40766/00A patent/AU4076600A/en not_active Abandoned
- 2000-04-07 CZ CZ20013642A patent/CZ20013642A3/cs unknown
- 2000-04-07 JP JP2000611288A patent/JP2002541496A/ja active Pending
- 2000-04-07 WO PCT/US2000/009170 patent/WO2000062306A2/en not_active Application Discontinuation
- 2000-04-07 CA CA002366801A patent/CA2366801A1/en not_active Abandoned
-
2002
- 2002-05-14 US US10/146,712 patent/US20030128811A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2000062306A3 (en) | 2001-07-26 |
US6389100B1 (en) | 2002-05-14 |
AU4076600A (en) | 2000-11-14 |
DE60025341D1 (de) | 2006-03-30 |
WO2000062306A2 (en) | 2000-10-19 |
EP1169713B1 (de) | 2006-01-04 |
EP1169713A2 (de) | 2002-01-09 |
DE60025341T2 (de) | 2006-08-17 |
CZ20013642A3 (cs) | 2002-10-16 |
CA2366801A1 (en) | 2000-10-19 |
US20020044626A1 (en) | 2002-04-18 |
JP2002541496A (ja) | 2002-12-03 |
US20030128811A1 (en) | 2003-07-10 |
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