ATE315271T1 - Linsensystem für röntgenstrahlen - Google Patents

Linsensystem für röntgenstrahlen

Info

Publication number
ATE315271T1
ATE315271T1 AT00920188T AT00920188T ATE315271T1 AT E315271 T1 ATE315271 T1 AT E315271T1 AT 00920188 T AT00920188 T AT 00920188T AT 00920188 T AT00920188 T AT 00920188T AT E315271 T1 ATE315271 T1 AT E315271T1
Authority
AT
Austria
Prior art keywords
rays
lens system
focal point
ray lens
directs
Prior art date
Application number
AT00920188T
Other languages
English (en)
Inventor
Boris Verman
Licai Jiang
Kim Bonglea
Karsten Dan Joensen
Original Assignee
Osmic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23111775&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE315271(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Osmic Inc filed Critical Osmic Inc
Application granted granted Critical
Publication of ATE315271T1 publication Critical patent/ATE315271T1/de

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N5/00—Radiation therapy
    • A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
    • A61N2005/1085—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy characterised by the type of particles applied to the patient
    • A61N2005/1091—Kilovoltage or orthovoltage range photons
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N5/00—Radiation therapy
    • A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
    • A61N2005/1092—Details
    • A61N2005/1095—Elements inserted into the radiation path within the system, e.g. filters or wedges

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Radiation-Therapy Devices (AREA)
  • Prostheses (AREA)
AT00920188T 1999-04-09 2000-04-07 Linsensystem für röntgenstrahlen ATE315271T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/289,493 US6389100B1 (en) 1999-04-09 1999-04-09 X-ray lens system

Publications (1)

Publication Number Publication Date
ATE315271T1 true ATE315271T1 (de) 2006-02-15

Family

ID=23111775

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00920188T ATE315271T1 (de) 1999-04-09 2000-04-07 Linsensystem für röntgenstrahlen

Country Status (9)

Country Link
US (2) US6389100B1 (de)
EP (1) EP1169713B1 (de)
JP (1) JP2002541496A (de)
AT (1) ATE315271T1 (de)
AU (1) AU4076600A (de)
CA (1) CA2366801A1 (de)
CZ (1) CZ20013642A3 (de)
DE (1) DE60025341T2 (de)
WO (1) WO2000062306A2 (de)

Families Citing this family (90)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6580940B2 (en) * 2000-02-02 2003-06-17 George Gutman X-ray system with implantable needle for treatment of cancer
DE10011882A1 (de) * 2000-03-07 2001-09-13 Ifg Inst Fuer Geraetebau Gmbh Verfahren und Vorrichtung zum Fokussieren von Röntgenstrahlen zur Realisierung von Röntgen-Zoom-Optiken
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
US20030012336A1 (en) * 2001-06-20 2003-01-16 Cash Webster C. X-ray concentrator for therapy
US6510200B1 (en) 2001-06-29 2003-01-21 Osmic, Inc. Multi-layer structure with variable bandpass for monochromatization and spectroscopy
FR2828933A1 (fr) * 2001-08-27 2003-02-28 Corning Inc Procede de determination de la qualite optique d'un monocristal de fluorure et element optique
WO2003024527A1 (en) * 2001-09-19 2003-03-27 Muradin Abubekirovich Kumakhov Device for x-ray therapy
US6643353B2 (en) 2002-01-10 2003-11-04 Osmic, Inc. Protective layer for multilayers exposed to x-rays
JP3699998B2 (ja) * 2002-03-20 2005-09-28 国立大学法人東北大学 蛍光ｘ線ホログラフィー装置、蛍光ｘ線ホログラフィーおよび局所構造解析方法
US6782073B2 (en) * 2002-05-01 2004-08-24 Siemens Medical Solutions Usa, Inc. Planning system for convergent radiation treatment
US20030206610A1 (en) * 2002-05-01 2003-11-06 Collins William F. Patient positioning system
US7070327B2 (en) * 2002-05-01 2006-07-04 Siemens Medical Solutions Usa, Inc. Focused radiation visualization
RU2210126C1 (ru) * 2002-07-23 2003-08-10 Общество с ограниченной ответственностью "Институт рентгеновской оптики" Устройство для получения рентгеновского излучения повышенной яркости
DE10254026C5 (de) * 2002-11-20 2009-01-29 Incoatec Gmbh Reflektor für Röntgenstrahlung
US7110490B2 (en) * 2002-12-10 2006-09-19 General Electric Company Full field digital tomosynthesis method and apparatus
US7280634B2 (en) 2003-06-13 2007-10-09 Osmic, Inc. Beam conditioning system with sequential optic
JP5392982B2 (ja) * 2003-06-13 2014-01-22 オスミック、インコーポレイテッド ビーム調整システム
US20060039533A1 (en) 2003-12-12 2006-02-23 Weil Michael D Management system for combination treatment
US20070280421A1 (en) * 2004-06-02 2007-12-06 Cho Yong M Narrow band x-ray system and fabrication method thereof
US7403593B1 (en) * 2004-09-28 2008-07-22 Bruker Axs, Inc. Hybrid x-ray mirrors
JP2006292682A (ja) * 2005-04-14 2006-10-26 Mitsubishi Electric Corp Ｃａｄ／ｃａｍ装置及び電子ビーム照射装置
US7415096B2 (en) * 2005-07-26 2008-08-19 Jordan Valley Semiconductors Ltd. Curved X-ray reflector
US7634052B2 (en) * 2006-10-24 2009-12-15 Thermo Niton Analyzers Llc Two-stage x-ray concentrator
EP1947478A3 (de) * 2006-12-01 2015-01-07 Mats Danielsson Neues System und Verfahren zur Abbildung und Verwendung funketikettierter Substanzen, insbesondere zur Untersuchung biologischer Prozesse
GB2444962B (en) * 2006-12-22 2010-01-27 Univ Muenster Wilhelms Adaptive crystalline X-ray reflecting device
US8068582B2 (en) * 2007-02-23 2011-11-29 Passport Systems, Inc. Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection
CZ299759B6 (cs) * 2007-07-20 2008-11-12 Ceské vysoké ucení technické v Praze Optický clen pro rentgenovou mikroskopii
US7651270B2 (en) * 2007-08-31 2010-01-26 Rigaku Innovative Technologies, Inc. Automated x-ray optic alignment with four-sector sensor
US20090088625A1 (en) * 2007-10-01 2009-04-02 Kenneth Oosting Photonic Based Non-Invasive Surgery System That Includes Automated Cell Control and Eradication Via Pre-Calculated Feed-Forward Control Plus Image Feedback Control For Targeted Energy Delivery
US7706503B2 (en) * 2007-11-20 2010-04-27 Rigaku Innovative Technologies, Inc. X-ray optic with varying focal points
US7742566B2 (en) * 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
US7848483B2 (en) * 2008-03-07 2010-12-07 Rigaku Innovative Technologies Magnesium silicide-based multilayer x-ray fluorescence analyzers
US8602648B1 (en) * 2008-09-12 2013-12-10 Carl Zeiss X-ray Microscopy, Inc. X-ray microscope system with cryogenic handling system and method
US20100175854A1 (en) * 2009-01-15 2010-07-15 Luca Joseph Gratton Method and apparatus for multi-functional capillary-tube interface unit for evaporation, humidification, heat exchange, pressure or thrust generation, beam diffraction or collimation using multi-phase fluid
US8369674B2 (en) * 2009-05-20 2013-02-05 General Electric Company Optimizing total internal reflection multilayer optics through material selection
CN102460135A (zh) * 2009-06-03 2012-05-16 特莫尼托恩分析仪器股份有限公司 检测器位于聚焦元件内部的x射线系统和方法
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US9082522B2 (en) * 2009-12-14 2015-07-14 Brookhaven Science Associates, Llc Zone compensated multilayer laue lens and apparatus and method of fabricating the same
ES2688542T3 (es) 2010-08-19 2018-11-05 Convergent R.N.R Ltd Sistema de irradiación con rayos X de un volumen seleccionado
KR101239765B1 (ko) * 2011-02-09 2013-03-06 삼성전자주식회사 엑스레이 발생장치 및 이를 포함하는 엑스레이 촬영 시스템
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
EP2814573B1 (de) * 2012-02-13 2018-03-21 Convergent R.N.R Ltd Bildgebungsgeführte abgabe von röntgenstrahlung
KR20150090048A (ko) * 2012-09-24 2015-08-05 컨버젠트 알.엔.알 리미티드 X-ray 반사 렌즈 배열체
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
WO2015140796A1 (en) * 2014-03-17 2015-09-24 Convergent R.N.R Ltd Using focused converging x-rays for imaging
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
JP6422050B2 (ja) * 2014-07-30 2018-11-14 公立大学法人首都大学東京 Ｘ線光学系基材、及びその製造方法
US11250968B2 (en) 2014-12-30 2022-02-15 Convergent R.N.R. Ltd. Constructions of x-ray lenses for converging x-rays
WO2016108235A1 (en) * 2014-12-30 2016-07-07 Convergent R.N.R Ltd New constructions of x-ray lenses for converging x-rays
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
JP6748110B2 (ja) * 2015-11-30 2020-08-26 株式会社カネカ エネルギーデグレーダ、及びそれを備えた荷電粒子線照射システム
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
US10816486B2 (en) 2018-03-28 2020-10-27 Kla-Tencor Corporation Multilayer targets for calibration and alignment of X-ray based measurement systems
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
JP7195341B2 (ja) * 2018-06-04 2022-12-23 シグレイ、インコーポレイテッド 波長分散型ｘ線分光計
DE112019003777B4 (de) 2018-07-26 2025-09-11 Sigray, Inc. Röntgenreflexionsquelle mit hoher helligkeit
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN112638261B (zh) 2018-09-04 2025-06-27 斯格瑞公司 利用滤波的x射线荧光的系统和方法
CN112823280B (zh) 2018-09-07 2024-11-05 斯格瑞公司 用于深度可选x射线分析的系统和方法
CN114424054B (zh) 2019-06-24 2024-03-22 Sms集团有限公司 用于确定多晶产品的材料特性的设备和方法
WO2021046059A1 (en) 2019-09-03 2021-03-11 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
WO2021059271A1 (en) * 2019-09-24 2021-04-01 Convergent R.N.R Ltd X-ray optical arrangement
CN112683937B (zh) * 2019-10-18 2024-05-10 北航（四川）西部国际创新港科技有限公司 一种多源射线整合装置
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US11686692B2 (en) 2020-12-07 2023-06-27 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
US12133318B2 (en) 2022-06-10 2024-10-29 Kla Corporation Rotating target for extreme ultraviolet source with liquid metal
CN121013975A (zh) 2023-02-16 2025-11-25 斯格瑞公司 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025101530A1 (en) 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
US12431256B2 (en) 2024-02-15 2025-09-30 Sigray, Inc. System and method for generating a focused x-ray beam

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture
US3032656A (en) 1957-08-15 1962-05-01 Licentia Gmbh X-ray refracting optical element
DE1800879C3 (de) * 1968-10-03 1974-01-10 Siemens Ag, 1000 Berlin U. 8000 Muenchen Primärstrahlenblende für Röntgenuntersuchungsgeräte
US3898455A (en) * 1973-11-12 1975-08-05 Jr Thomas C Furnas X-ray monochromatic and focusing system
US3927319A (en) 1974-06-28 1975-12-16 Univ Southern California Crystal for X-ray crystal spectrometer
US4028547A (en) * 1975-06-30 1977-06-07 Bell Telephone Laboratories, Incorporated X-ray photolithography
US4203034A (en) * 1978-06-01 1980-05-13 University Of Florida Board Of Regents Diffraction camera for imaging penetrating radiation
US4461018A (en) 1982-06-07 1984-07-17 The United States Of America As Represented By The United States Department Of Energy Diffraction crystal for sagittally focusing x-rays
US4693933A (en) 1983-06-06 1987-09-15 Ovonic Synthetic Materials Company, Inc. X-ray dispersive and reflective structures and method of making the structures
US4727000A (en) 1983-06-06 1988-02-23 Ovonic Synthetic Materials Co., Inc. X-ray dispersive and reflective structures
US4717632A (en) 1983-08-22 1988-01-05 Ovonic Synthetic-Materials Company, Inc. Adhesion and composite wear resistant coating and method
US4716083A (en) 1983-09-23 1987-12-29 Ovonic Synthetic Materials Company Disordered coating
US4525853A (en) 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
US4785470A (en) 1983-10-31 1988-11-15 Ovonic Synthetic Materials Company, Inc. Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
US4599741A (en) 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4643951A (en) 1984-07-02 1987-02-17 Ovonic Synthetic Materials Company, Inc. Multilayer protective coating and method
US4724169A (en) 1984-10-09 1988-02-09 Ovonic Synthetic Materials Company, Inc. Method of producing multilayer coatings on a substrate
US4675889A (en) 1985-07-08 1987-06-23 Ovonic Synthetic Materials Company, Inc. Multiple wavelength X-ray dispersive devices and method of making the devices
US4958363A (en) 1986-08-15 1990-09-18 Nelson Robert S Apparatus for narrow bandwidth and multiple energy x-ray imaging
US4777090A (en) 1986-11-03 1988-10-11 Ovonic Synthetic Materials Company Coated article and method of manufacturing the article
US4783374A (en) 1987-11-16 1988-11-08 Ovonic Synthetic Materials Company Coated article and method of manufacturing the article
JPH0631887B2 (ja) * 1988-04-28 1994-04-27 株式会社東芝 Ｘ線ミラー及びその製造方法
US4867785A (en) 1988-05-09 1989-09-19 Ovonic Synthetic Materials Company, Inc. Method of forming alloy particulates having controlled submicron crystallite size distributions
US5001737A (en) * 1988-10-24 1991-03-19 Aaron Lewis Focusing and guiding X-rays with tapered capillaries
US5027377A (en) 1990-01-09 1991-06-25 The United States Of America As Represented By The United States Department Of Energy Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere
FR2665261A1 (fr) * 1990-07-24 1992-01-31 Philips Electronique Lab Dispositif de diffractometrie a rayons x et utilisation de ce dispositif.
US5082621A (en) 1990-07-31 1992-01-21 Ovonic Synthetic Materials Company, Inc. Neutron reflecting supermirror structure
US5167912A (en) 1990-07-31 1992-12-01 Ovonic Synthetic Materials Company, Inc. Neutron reflecting supermirror structure
US5210779A (en) * 1991-07-26 1993-05-11 Hughes Aircraft Company Apparatus and method for focusing hard x-rays
US5384817A (en) 1993-07-12 1995-01-24 Ovonic Synthetic Materials Company X-ray optical element and method for its manufacture
JP2526409B2 (ja) * 1994-02-18 1996-08-21 工業技術院長 Ｘ線レンズ
IT1270022B (it) 1994-03-04 1997-04-28 Oberto Citterio Specchi ad incidenza radente per telescopi a raggi x
WO1995031815A1 (en) 1994-05-11 1995-11-23 The Regents Of The University Of Colorado Spherical mirror grazing incidence x-ray optics
AUPM597794A0 (en) * 1994-05-31 1994-06-23 Australian National University, The Lenses formed by arrays of reflectors
US5646976A (en) 1994-08-01 1997-07-08 Osmic, Inc. Optical element of multilayered thin film for X-rays and neutrons
US5745547A (en) * 1995-08-04 1998-04-28 X-Ray Optical Systems, Inc. Multiple channel optic
US5757882A (en) 1995-12-18 1998-05-26 Osmic, Inc. Steerable x-ray optical system
US5787146A (en) * 1996-10-18 1998-07-28 Spad Technologies, Inc. X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue
US5761256A (en) * 1997-02-07 1998-06-02 Matsushita Electric Industrial Co., Ltd. Curved pyrolytic graphite monochromator and its manufacturing method
US5880467A (en) * 1997-03-05 1999-03-09 The United States Of America As Represented By The Secretary Of Commerce Microcalorimeter x-ray detectors with x-ray lens
US6014423A (en) 1998-02-19 2000-01-11 Osmic, Inc. Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
US6041099A (en) 1998-02-19 2000-03-21 Osmic, Inc. Single corner kirkpatrick-baez beam conditioning optic assembly
US6069934A (en) 1998-04-07 2000-05-30 Osmic, Inc. X-ray diffractometer with adjustable image distance

Also Published As

Publication number Publication date
JP2002541496A (ja) 2002-12-03
DE60025341T2 (de) 2006-08-17
WO2000062306A3 (en) 2001-07-26
CA2366801A1 (en) 2000-10-19
EP1169713A2 (de) 2002-01-09
US6389100B1 (en) 2002-05-14
WO2000062306A2 (en) 2000-10-19
AU4076600A (en) 2000-11-14
US20030128811A1 (en) 2003-07-10
US20020044626A1 (en) 2002-04-18
DE60025341D1 (de) 2006-03-30
CZ20013642A3 (cs) 2002-10-16
EP1169713B1 (de) 2006-01-04

Similar Documents

Publication Publication Date Title
ATE315271T1 (de) Linsensystem für röntgenstrahlen
MXPA01012183A (es) Dispositivo para la concentracion de la radiacion optica.
DE10391780D2 (de) Röntgenstrahlquelle mit einer kleinen Brennfleckgrösse
DE60040635D1 (de) Strahlungsdetektor
DE69828178D1 (de) Miniaturisierte strahlungsquelle
DK0975369T3 (da) Polyethylen glycol-interferon alpha konjugater til behandling af infektion
DE60045653D1 (de) Laserbestrahlungsgerät
DE60041830D1 (de) Strahlungsquellenanordnung
DE69110843D1 (de) Schaltenergiequelle.
DE60026090D1 (de) Strahlungsdetektor
DE69638208D1 (de) Glasfaser-Mikrolinse und damit aufgebaute optische Strahlungsquelle sowie Fertigungsverfahren
EP1220272A4 (de) Strahlenquelle
EP1413897A4 (de) Strahlungsdetektor
EP1445626A4 (de) Strahlungsdetektor
DE69616994D1 (de) Lithographisches abtastsystem mit wynne-dyson optik mit zweifältigem strahldurchgang
AU7137500A (en) High collection angle short wavelength radiation collimator and focusing optic
EP1258736A4 (de) Strahlungsdetektor
DE60033894D1 (de) Strahlungsdetektor
DE60024724D1 (de) Reflektoren für eine ultraviolette Strahlungsquelle
DE69711282D1 (de) Fokusdetektor
DE69911332D1 (de) Mehrstrahllichtquelle, Mehrstrahlabtaster und Bilderzeugungsgerät
DE69110918D1 (de) Elektronenstrahlbestrahlungsapparat.
ID19478A (id) Elektroda pemfokus dalam senapan elektron untuk tabung sinar katoda berwarna
FR2798221B1 (fr) Transformateur de rayonnement
AU2002364660A1 (en) X-ray generator with focused radiation

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties