ATE315271T1 - Linsensystem für röntgenstrahlen - Google Patents

Linsensystem für röntgenstrahlen

Info

Publication number
ATE315271T1
ATE315271T1 AT00920188T AT00920188T ATE315271T1 AT E315271 T1 ATE315271 T1 AT E315271T1 AT 00920188 T AT00920188 T AT 00920188T AT 00920188 T AT00920188 T AT 00920188T AT E315271 T1 ATE315271 T1 AT E315271T1
Authority
AT
Austria
Prior art keywords
rays
lens system
focal point
ray lens
directs
Prior art date
Application number
AT00920188T
Other languages
English (en)
Inventor
Boris Verman
Licai Jiang
Kim Bonglea
Karsten Dan Joensen
Original Assignee
Osmic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23111775&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE315271(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Osmic Inc filed Critical Osmic Inc
Application granted granted Critical
Publication of ATE315271T1 publication Critical patent/ATE315271T1/de

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61NELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N5/00Radiation therapy
    • A61N5/10X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
    • A61N2005/1085X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy characterised by the type of particles applied to the patient
    • A61N2005/1091Kilovoltage or orthovoltage range photons
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61NELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N5/00Radiation therapy
    • A61N5/10X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
    • A61N2005/1092Details
    • A61N2005/1095Elements inserted into the radiation path within the system, e.g. filters or wedges

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Radiation-Therapy Devices (AREA)
  • Prostheses (AREA)
AT00920188T 1999-04-09 2000-04-07 Linsensystem für röntgenstrahlen ATE315271T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/289,493 US6389100B1 (en) 1999-04-09 1999-04-09 X-ray lens system

Publications (1)

Publication Number Publication Date
ATE315271T1 true ATE315271T1 (de) 2006-02-15

Family

ID=23111775

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00920188T ATE315271T1 (de) 1999-04-09 2000-04-07 Linsensystem für röntgenstrahlen

Country Status (9)

Country Link
US (2) US6389100B1 (de)
EP (1) EP1169713B1 (de)
JP (1) JP2002541496A (de)
AT (1) ATE315271T1 (de)
AU (1) AU4076600A (de)
CA (1) CA2366801A1 (de)
CZ (1) CZ20013642A3 (de)
DE (1) DE60025341T2 (de)
WO (1) WO2000062306A2 (de)

Families Citing this family (80)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6580940B2 (en) * 2000-02-02 2003-06-17 George Gutman X-ray system with implantable needle for treatment of cancer
DE10011882A1 (de) * 2000-03-07 2001-09-13 Ifg Inst Fuer Geraetebau Gmbh Verfahren und Vorrichtung zum Fokussieren von Röntgenstrahlen zur Realisierung von Röntgen-Zoom-Optiken
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
US20030012336A1 (en) * 2001-06-20 2003-01-16 Cash Webster C. X-ray concentrator for therapy
US6510200B1 (en) 2001-06-29 2003-01-21 Osmic, Inc. Multi-layer structure with variable bandpass for monochromatization and spectroscopy
FR2828933A1 (fr) * 2001-08-27 2003-02-28 Corning Inc Procede de determination de la qualite optique d'un monocristal de fluorure et element optique
CN1299781C (zh) * 2001-09-19 2007-02-14 姆拉丁·阿布比奇罗维奇·库马科夫 放射治疗设备
US6643353B2 (en) 2002-01-10 2003-11-04 Osmic, Inc. Protective layer for multilayers exposed to x-rays
JP3699998B2 (ja) * 2002-03-20 2005-09-28 国立大学法人東北大学 蛍光x線ホログラフィー装置、蛍光x線ホログラフィーおよび局所構造解析方法
US20030206610A1 (en) * 2002-05-01 2003-11-06 Collins William F. Patient positioning system
US7070327B2 (en) * 2002-05-01 2006-07-04 Siemens Medical Solutions Usa, Inc. Focused radiation visualization
US6782073B2 (en) * 2002-05-01 2004-08-24 Siemens Medical Solutions Usa, Inc. Planning system for convergent radiation treatment
DE10254026C5 (de) * 2002-11-20 2009-01-29 Incoatec Gmbh Reflektor für Röntgenstrahlung
US7110490B2 (en) * 2002-12-10 2006-09-19 General Electric Company Full field digital tomosynthesis method and apparatus
US7280634B2 (en) 2003-06-13 2007-10-09 Osmic, Inc. Beam conditioning system with sequential optic
EP1642304B1 (de) * 2003-06-13 2008-03-19 Osmic, Inc. Strahlaufbereitungssystem
US20060039533A1 (en) 2003-12-12 2006-02-23 Weil Michael D Management system for combination treatment
US20070280421A1 (en) * 2004-06-02 2007-12-06 Cho Yong M Narrow band x-ray system and fabrication method thereof
US7403593B1 (en) * 2004-09-28 2008-07-22 Bruker Axs, Inc. Hybrid x-ray mirrors
JP2006292682A (ja) * 2005-04-14 2006-10-26 Mitsubishi Electric Corp Cad/cam装置及び電子ビーム照射装置
US7415096B2 (en) * 2005-07-26 2008-08-19 Jordan Valley Semiconductors Ltd. Curved X-ray reflector
US7634052B2 (en) * 2006-10-24 2009-12-15 Thermo Niton Analyzers Llc Two-stage x-ray concentrator
US7791033B2 (en) * 2006-12-01 2010-09-07 Mats Danielsson System and method for imaging using radio-labeled substances, especially suitable for studying of biological processes
GB2444962B (en) * 2006-12-22 2010-01-27 Univ Muenster Wilhelms Adaptive crystalline X-ray reflecting device
US8068582B2 (en) * 2007-02-23 2011-11-29 Passport Systems, Inc. Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection
CZ2007494A3 (cs) * 2007-07-20 2008-11-12 Ceské vysoké ucení technické v Praze Optický clen pro rentgenovou mikroskopii
US7651270B2 (en) * 2007-08-31 2010-01-26 Rigaku Innovative Technologies, Inc. Automated x-ray optic alignment with four-sector sensor
US20090088625A1 (en) * 2007-10-01 2009-04-02 Kenneth Oosting Photonic Based Non-Invasive Surgery System That Includes Automated Cell Control and Eradication Via Pre-Calculated Feed-Forward Control Plus Image Feedback Control For Targeted Energy Delivery
US7706503B2 (en) * 2007-11-20 2010-04-27 Rigaku Innovative Technologies, Inc. X-ray optic with varying focal points
US7742566B2 (en) * 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
US7848483B2 (en) * 2008-03-07 2010-12-07 Rigaku Innovative Technologies Magnesium silicide-based multilayer x-ray fluorescence analyzers
US8602648B1 (en) * 2008-09-12 2013-12-10 Carl Zeiss X-ray Microscopy, Inc. X-ray microscope system with cryogenic handling system and method
US20100175854A1 (en) * 2009-01-15 2010-07-15 Luca Joseph Gratton Method and apparatus for multi-functional capillary-tube interface unit for evaporation, humidification, heat exchange, pressure or thrust generation, beam diffraction or collimation using multi-phase fluid
US8369674B2 (en) * 2009-05-20 2013-02-05 General Electric Company Optimizing total internal reflection multilayer optics through material selection
CN102460135A (zh) * 2009-06-03 2012-05-16 特莫尼托恩分析仪器股份有限公司 检测器位于聚焦元件内部的x射线系统和方法
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US9082522B2 (en) * 2009-12-14 2015-07-14 Brookhaven Science Associates, Llc Zone compensated multilayer laue lens and apparatus and method of fabricating the same
DK2606490T3 (en) 2010-08-19 2018-10-15 Convergent R N R Ltd X-ray irradiation of the target volume
KR101239765B1 (ko) * 2011-02-09 2013-03-06 삼성전자주식회사 엑스레이 발생장치 및 이를 포함하는 엑스레이 촬영 시스템
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
EP2814573B1 (de) 2012-02-13 2018-03-21 Convergent R.N.R Ltd Bildgebungsgeführte abgabe von röntgenstrahlung
EP2898361A4 (de) 2012-09-24 2016-06-01 Convergent R N R Ltd Röntgenstrahlenreflektierende linsenanordnung
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
WO2015140796A1 (en) * 2014-03-17 2015-09-24 Convergent R.N.R Ltd Using focused converging x-rays for imaging
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
JP6422050B2 (ja) * 2014-07-30 2018-11-14 公立大学法人首都大学東京 X線光学系基材、及びその製造方法
WO2016108235A1 (en) * 2014-12-30 2016-07-07 Convergent R.N.R Ltd New constructions of x-ray lenses for converging x-rays
US11250968B2 (en) 2014-12-30 2022-02-15 Convergent R.N.R. Ltd. Constructions of x-ray lenses for converging x-rays
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
WO2017094802A1 (ja) * 2015-11-30 2017-06-08 株式会社カネカ エネルギーデグレーダ、及びそれを備えた荷電粒子線照射システム、並びにグラファイト膜の製造方法
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
JP6937380B2 (ja) 2017-03-22 2021-09-22 シグレイ、インコーポレイテッド X線分光を実施するための方法およびx線吸収分光システム
US10816486B2 (en) 2018-03-28 2020-10-27 Kla-Tencor Corporation Multilayer targets for calibration and alignment of X-ray based measurement systems
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
CN112424591B (zh) * 2018-06-04 2024-05-24 斯格瑞公司 波长色散x射线光谱仪
CN112470245A (zh) 2018-07-26 2021-03-09 斯格瑞公司 高亮度x射线反射源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN112638261A (zh) 2018-09-04 2021-04-09 斯格瑞公司 利用滤波的x射线荧光的系统和方法
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
CN114424054B (zh) * 2019-06-24 2024-03-22 Sms集团有限公司 用于确定多晶产品的材料特性的设备和方法
CN114729907B (zh) 2019-09-03 2023-05-23 斯格瑞公司 用于计算机层析x射线荧光成像的系统和方法
EP4035186A4 (de) * 2019-09-24 2022-12-07 Convergent R.N.R Ltd Röntgenoptische anordnung
CN112683937B (zh) * 2019-10-18 2024-05-10 北航(四川)西部国际创新港科技有限公司 一种多源射线整合装置
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
US11549895B2 (en) 2020-09-17 2023-01-10 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
DE112021006348T5 (de) 2020-12-07 2023-09-21 Sigray, Inc. 3d-röntgenbildgebungssystem mit hohem durchsatz, das eine transmissionsröntgenquelle verwendet
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
US11885755B2 (en) 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture
US3032656A (en) 1957-08-15 1962-05-01 Licentia Gmbh X-ray refracting optical element
DE1800879C3 (de) * 1968-10-03 1974-01-10 Siemens Ag, 1000 Berlin U. 8000 Muenchen Primärstrahlenblende für Röntgenuntersuchungsgeräte
US3898455A (en) * 1973-11-12 1975-08-05 Jr Thomas C Furnas X-ray monochromatic and focusing system
US3927319A (en) 1974-06-28 1975-12-16 Univ Southern California Crystal for X-ray crystal spectrometer
US4028547A (en) * 1975-06-30 1977-06-07 Bell Telephone Laboratories, Incorporated X-ray photolithography
US4203034A (en) * 1978-06-01 1980-05-13 University Of Florida Board Of Regents Diffraction camera for imaging penetrating radiation
US4461018A (en) 1982-06-07 1984-07-17 The United States Of America As Represented By The United States Department Of Energy Diffraction crystal for sagittally focusing x-rays
US4693933A (en) 1983-06-06 1987-09-15 Ovonic Synthetic Materials Company, Inc. X-ray dispersive and reflective structures and method of making the structures
US4727000A (en) 1983-06-06 1988-02-23 Ovonic Synthetic Materials Co., Inc. X-ray dispersive and reflective structures
US4717632A (en) 1983-08-22 1988-01-05 Ovonic Synthetic-Materials Company, Inc. Adhesion and composite wear resistant coating and method
US4716083A (en) 1983-09-23 1987-12-29 Ovonic Synthetic Materials Company Disordered coating
US4525853A (en) 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
US4785470A (en) 1983-10-31 1988-11-15 Ovonic Synthetic Materials Company, Inc. Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
US4599741A (en) 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4643951A (en) 1984-07-02 1987-02-17 Ovonic Synthetic Materials Company, Inc. Multilayer protective coating and method
US4724169A (en) 1984-10-09 1988-02-09 Ovonic Synthetic Materials Company, Inc. Method of producing multilayer coatings on a substrate
US4675889A (en) 1985-07-08 1987-06-23 Ovonic Synthetic Materials Company, Inc. Multiple wavelength X-ray dispersive devices and method of making the devices
US4958363A (en) 1986-08-15 1990-09-18 Nelson Robert S Apparatus for narrow bandwidth and multiple energy x-ray imaging
US4777090A (en) 1986-11-03 1988-10-11 Ovonic Synthetic Materials Company Coated article and method of manufacturing the article
US4783374A (en) 1987-11-16 1988-11-08 Ovonic Synthetic Materials Company Coated article and method of manufacturing the article
JPH0631887B2 (ja) * 1988-04-28 1994-04-27 株式会社東芝 X線ミラー及びその製造方法
US4867785A (en) 1988-05-09 1989-09-19 Ovonic Synthetic Materials Company, Inc. Method of forming alloy particulates having controlled submicron crystallite size distributions
US5001737A (en) * 1988-10-24 1991-03-19 Aaron Lewis Focusing and guiding X-rays with tapered capillaries
US5027377A (en) 1990-01-09 1991-06-25 The United States Of America As Represented By The United States Department Of Energy Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere
FR2665261A1 (fr) * 1990-07-24 1992-01-31 Philips Electronique Lab Dispositif de diffractometrie a rayons x et utilisation de ce dispositif.
US5167912A (en) 1990-07-31 1992-12-01 Ovonic Synthetic Materials Company, Inc. Neutron reflecting supermirror structure
US5082621A (en) 1990-07-31 1992-01-21 Ovonic Synthetic Materials Company, Inc. Neutron reflecting supermirror structure
US5210779A (en) * 1991-07-26 1993-05-11 Hughes Aircraft Company Apparatus and method for focusing hard x-rays
US5384817A (en) 1993-07-12 1995-01-24 Ovonic Synthetic Materials Company X-ray optical element and method for its manufacture
JP2526409B2 (ja) 1994-02-18 1996-08-21 工業技術院長 X線レンズ
IT1270022B (it) 1994-03-04 1997-04-28 Oberto Citterio Specchi ad incidenza radente per telescopi a raggi x
WO1995031815A1 (en) 1994-05-11 1995-11-23 The Regents Of The University Of Colorado Spherical mirror grazing incidence x-ray optics
AUPM597794A0 (en) * 1994-05-31 1994-06-23 Australian National University, The Lenses formed by arrays of reflectors
US5646976A (en) 1994-08-01 1997-07-08 Osmic, Inc. Optical element of multilayered thin film for X-rays and neutrons
US5745547A (en) * 1995-08-04 1998-04-28 X-Ray Optical Systems, Inc. Multiple channel optic
US5757882A (en) 1995-12-18 1998-05-26 Osmic, Inc. Steerable x-ray optical system
US5787146A (en) * 1996-10-18 1998-07-28 Spad Technologies, Inc. X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue
US5761256A (en) * 1997-02-07 1998-06-02 Matsushita Electric Industrial Co., Ltd. Curved pyrolytic graphite monochromator and its manufacturing method
US5880467A (en) * 1997-03-05 1999-03-09 The United States Of America As Represented By The Secretary Of Commerce Microcalorimeter x-ray detectors with x-ray lens
US6041099A (en) 1998-02-19 2000-03-21 Osmic, Inc. Single corner kirkpatrick-baez beam conditioning optic assembly
US6014423A (en) 1998-02-19 2000-01-11 Osmic, Inc. Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
US6069934A (en) 1998-04-07 2000-05-30 Osmic, Inc. X-ray diffractometer with adjustable image distance

Also Published As

Publication number Publication date
WO2000062306A3 (en) 2001-07-26
US6389100B1 (en) 2002-05-14
AU4076600A (en) 2000-11-14
DE60025341D1 (de) 2006-03-30
WO2000062306A2 (en) 2000-10-19
EP1169713B1 (de) 2006-01-04
EP1169713A2 (de) 2002-01-09
DE60025341T2 (de) 2006-08-17
CZ20013642A3 (cs) 2002-10-16
CA2366801A1 (en) 2000-10-19
US20020044626A1 (en) 2002-04-18
JP2002541496A (ja) 2002-12-03
US20030128811A1 (en) 2003-07-10

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