ATE249632T1 - System und verfahren zum testen von signalverbindungen unter verwendung einer eingebauten selbsttestfunktion - Google Patents

System und verfahren zum testen von signalverbindungen unter verwendung einer eingebauten selbsttestfunktion

Info

Publication number
ATE249632T1
ATE249632T1 AT01920796T AT01920796T ATE249632T1 AT E249632 T1 ATE249632 T1 AT E249632T1 AT 01920796 T AT01920796 T AT 01920796T AT 01920796 T AT01920796 T AT 01920796T AT E249632 T1 ATE249632 T1 AT E249632T1
Authority
AT
Austria
Prior art keywords
chip
master
unit
logic unit
computer system
Prior art date
Application number
AT01920796T
Other languages
English (en)
Inventor
Brian L Smith
James C Lewis
David Broniarczyk
Original Assignee
Sun Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc filed Critical Sun Microsystems Inc
Application granted granted Critical
Publication of ATE249632T1 publication Critical patent/ATE249632T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
AT01920796T 2000-03-24 2001-03-26 System und verfahren zum testen von signalverbindungen unter verwendung einer eingebauten selbsttestfunktion ATE249632T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/534,839 US6505317B1 (en) 2000-03-24 2000-03-24 System and method for testing signal interconnections using built-in self test
PCT/US2001/009720 WO2001073459A2 (en) 2000-03-24 2001-03-26 System and method for testing signal interconnections using built-in self test

Publications (1)

Publication Number Publication Date
ATE249632T1 true ATE249632T1 (de) 2003-09-15

Family

ID=24131747

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01920796T ATE249632T1 (de) 2000-03-24 2001-03-26 System und verfahren zum testen von signalverbindungen unter verwendung einer eingebauten selbsttestfunktion

Country Status (8)

Country Link
US (1) US6505317B1 (de)
EP (1) EP1266236B1 (de)
JP (1) JP2003529145A (de)
KR (1) KR20030022780A (de)
AT (1) ATE249632T1 (de)
AU (1) AU2001247815A1 (de)
DE (1) DE60100754T2 (de)
WO (1) WO2001073459A2 (de)

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Also Published As

Publication number Publication date
WO2001073459A3 (en) 2002-01-03
US6505317B1 (en) 2003-01-07
AU2001247815A1 (en) 2001-10-08
WO2001073459A2 (en) 2001-10-04
EP1266236B1 (de) 2003-09-10
KR20030022780A (ko) 2003-03-17
JP2003529145A (ja) 2003-09-30
EP1266236A2 (de) 2002-12-18
DE60100754D1 (de) 2003-10-16
DE60100754T2 (de) 2004-07-15

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