AU2001247815A1 - System and method for testing signal interconnections using built-in self test - Google Patents

System and method for testing signal interconnections using built-in self test

Info

Publication number
AU2001247815A1
AU2001247815A1 AU2001247815A AU4781501A AU2001247815A1 AU 2001247815 A1 AU2001247815 A1 AU 2001247815A1 AU 2001247815 A AU2001247815 A AU 2001247815A AU 4781501 A AU4781501 A AU 4781501A AU 2001247815 A1 AU2001247815 A1 AU 2001247815A1
Authority
AU
Australia
Prior art keywords
chip
master
unit
logic unit
computer system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001247815A
Other languages
English (en)
Inventor
David Broniarczyk
James C. Lewis
Brian L. Smith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sun Microsystems Inc
Original Assignee
Sun Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc filed Critical Sun Microsystems Inc
Publication of AU2001247815A1 publication Critical patent/AU2001247815A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
AU2001247815A 2000-03-24 2001-03-26 System and method for testing signal interconnections using built-in self test Abandoned AU2001247815A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/534,839 US6505317B1 (en) 2000-03-24 2000-03-24 System and method for testing signal interconnections using built-in self test
US09534839 2000-03-24
PCT/US2001/009720 WO2001073459A2 (en) 2000-03-24 2001-03-26 System and method for testing signal interconnections using built-in self test

Publications (1)

Publication Number Publication Date
AU2001247815A1 true AU2001247815A1 (en) 2001-10-08

Family

ID=24131747

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001247815A Abandoned AU2001247815A1 (en) 2000-03-24 2001-03-26 System and method for testing signal interconnections using built-in self test

Country Status (8)

Country Link
US (1) US6505317B1 (de)
EP (1) EP1266236B1 (de)
JP (1) JP2003529145A (de)
KR (1) KR20030022780A (de)
AT (1) ATE249632T1 (de)
AU (1) AU2001247815A1 (de)
DE (1) DE60100754T2 (de)
WO (1) WO2001073459A2 (de)

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KR100510502B1 (ko) * 2002-12-06 2005-08-26 삼성전자주식회사 반도체 장치 및 상기 반도체 장치를 테스트하는 방법
US20040117708A1 (en) * 2002-12-16 2004-06-17 Ellis David G. Pre-announce signaling for interconnect built-in self test
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US7155370B2 (en) * 2003-03-20 2006-12-26 Intel Corporation Reusable, built-in self-test methodology for computer systems
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US20040193976A1 (en) * 2003-03-31 2004-09-30 Slaight Thomas M. Method and apparatus for interconnect built-in self test based system management failure monitoring
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US7366952B2 (en) * 2003-06-16 2008-04-29 Intel Corporation Interconnect condition detection using test pattern in idle packets
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US7031868B2 (en) * 2003-09-15 2006-04-18 Rambus, Inc. Method and apparatus for performing testing of interconnections
US20050080581A1 (en) * 2003-09-22 2005-04-14 David Zimmerman Built-in self test for memory interconnect testing
US7447953B2 (en) * 2003-11-14 2008-11-04 Intel Corporation Lane testing with variable mapping
US7072788B2 (en) * 2003-12-04 2006-07-04 Hewlett-Packard Development Company System and method for testing an interconnect in a computer system
US7360129B2 (en) * 2003-12-30 2008-04-15 Broadcom Corporation Simultaneous switch test mode
US7378853B2 (en) * 2004-02-27 2008-05-27 International Business Machines Corporation System and method for detecting cable faults for high-speed transmission link
JP4222248B2 (ja) * 2004-04-13 2009-02-12 沖電気工業株式会社 試験方法
US7178076B1 (en) 2004-06-16 2007-02-13 Sun Microsystems, Inc. Architecture of an efficient at-speed programmable memory built-in self test
US7260759B1 (en) 2004-06-16 2007-08-21 Sun Microsystems, Inc. Method and apparatus for an efficient memory built-in self test architecture for high performance microprocessors
US7293199B1 (en) 2004-06-22 2007-11-06 Sun Microsystems, Inc. Method and apparatus for testing memories with different read/write protocols using the same programmable memory bist controller
US7206979B1 (en) 2004-06-28 2007-04-17 Sun Microsystems, Inc. Method and apparatus for at-speed diagnostics of embedded memories
JP2006038988A (ja) * 2004-07-23 2006-02-09 Seiko Epson Corp 電気光学装置、電子機器、および実装構造体
GB0419868D0 (en) * 2004-09-08 2004-10-13 Koninkl Philips Electronics Nv Testing of a system-on-chip integrated circuit
US8621304B2 (en) * 2004-10-07 2013-12-31 Hewlett-Packard Development Company, L.P. Built-in self-test system and method for an integrated circuit
JP4558519B2 (ja) 2005-01-18 2010-10-06 富士通株式会社 情報処理装置およびシステムバス制御方法
JP2006252267A (ja) * 2005-03-11 2006-09-21 Oki Electric Ind Co Ltd システム検証用回路
US7478005B2 (en) 2005-04-28 2009-01-13 Rambus Inc. Technique for testing interconnections between electronic components
US7437643B2 (en) * 2005-06-21 2008-10-14 Intel Corporation Automated BIST execution scheme for a link
JP5261874B2 (ja) * 2005-12-22 2013-08-14 富士ゼロックス株式会社 電子回路および接続診断回路
US7394272B2 (en) * 2006-01-11 2008-07-01 Faraday Technology Corp. Built-in self test for system in package
US20070186131A1 (en) * 2006-02-06 2007-08-09 Texas Instruments Incorporated Low cost imbedded load board diagnostic test fixture
US7448008B2 (en) * 2006-08-29 2008-11-04 International Business Machines Corporation Method, system, and program product for automated verification of gating logic using formal verification
US7954028B2 (en) * 2006-12-19 2011-05-31 International Business Machines Corporation Structure for redundancy programming of a memory device
US7549098B2 (en) * 2006-12-19 2009-06-16 International Business Machines Corporation Redundancy programming for a memory device
US7855563B2 (en) * 2007-06-21 2010-12-21 International Business Machines Corporation Robust cable connectivity test receiver for high-speed data receiver
US7873922B2 (en) * 2007-11-19 2011-01-18 International Business Machines Corporation Structure for robust cable connectivity test receiver for high-speed data receiver
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US8533543B2 (en) * 2009-03-30 2013-09-10 Infineon Technologies Ag System for testing connections between chips
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US8255183B1 (en) * 2009-06-30 2012-08-28 Qualcomm Atheros, Inc Communication unit with analog test unit
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CN102377593A (zh) * 2010-08-25 2012-03-14 鸿富锦精密工业（深圳）有限公司 网络管理卡测试装置及方法
US8423846B2 (en) * 2010-09-16 2013-04-16 Advanced Micro Devices, Inc. Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methods
US8595678B2 (en) 2012-02-03 2013-11-26 International Business Machines Corporation Validating interconnections between logic blocks in a circuit description
US8853847B2 (en) 2012-10-22 2014-10-07 International Business Machines Corporation Stacked chip module with integrated circuit chips having integratable and reconfigurable built-in self-maintenance blocks
US8872322B2 (en) 2012-10-22 2014-10-28 International Business Machines Corporation Stacked chip module with integrated circuit chips having integratable built-in self-maintenance blocks
US9194912B2 (en) 2012-11-29 2015-11-24 International Business Machines Corporation Circuits for self-reconfiguration or intrinsic functional changes of chips before vs. after stacking
KR20150097074A (ko) * 2014-02-18 2015-08-26 에스케이하이닉스 주식회사 테스트 회로 및 이를 포함하는 반도체 장치
KR102147916B1 (ko) * 2014-04-14 2020-08-26 삼성전자주식회사 불휘발성 메모리 시스템 및 그것의 동작 방법
US9672094B1 (en) * 2014-10-24 2017-06-06 Xilinx, Inc. Interconnect circuitry fault detection
JP6869660B2 (ja) * 2016-08-01 2021-05-12 キヤノン株式会社 情報処理装置、及び情報処理装置の制御方法
CN112505520B (zh) * 2019-08-26 2023-02-21 比亚迪半导体股份有限公司 一种芯片测试方法、设备及系统
CN117280417A (zh) * 2021-08-20 2023-12-22 华为技术有限公司 芯片和装置

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Also Published As

Publication number Publication date
WO2001073459A3 (en) 2002-01-03
US6505317B1 (en) 2003-01-07
WO2001073459A2 (en) 2001-10-04
EP1266236B1 (de) 2003-09-10
KR20030022780A (ko) 2003-03-17
ATE249632T1 (de) 2003-09-15
JP2003529145A (ja) 2003-09-30
EP1266236A2 (de) 2002-12-18
DE60100754D1 (de) 2003-10-16
DE60100754T2 (de) 2004-07-15

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