ATE216096T1 - Flexible fehlerkorrekturcode/paritätsbit- architektur - Google Patents

Flexible fehlerkorrekturcode/paritätsbit- architektur

Info

Publication number
ATE216096T1
ATE216096T1 AT95101257T AT95101257T ATE216096T1 AT E216096 T1 ATE216096 T1 AT E216096T1 AT 95101257 T AT95101257 T AT 95101257T AT 95101257 T AT95101257 T AT 95101257T AT E216096 T1 ATE216096 T1 AT E216096T1
Authority
AT
Austria
Prior art keywords
memory array
error correcting
internal memory
codeword
error correction
Prior art date
Application number
AT95101257T
Other languages
English (en)
Inventor
Oliver Kiehl
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of ATE216096T1 publication Critical patent/ATE216096T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Detection And Correction Of Errors (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
AT95101257T 1994-02-22 1995-01-30 Flexible fehlerkorrekturcode/paritätsbit- architektur ATE216096T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US20078694A 1994-02-22 1994-02-22

Publications (1)

Publication Number Publication Date
ATE216096T1 true ATE216096T1 (de) 2002-04-15

Family

ID=22743178

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95101257T ATE216096T1 (de) 1994-02-22 1995-01-30 Flexible fehlerkorrekturcode/paritätsbit- architektur

Country Status (7)

Country Link
US (1) US5966389A (de)
EP (1) EP0668561B1 (de)
JP (1) JPH07254300A (de)
KR (1) KR100382255B1 (de)
AT (1) ATE216096T1 (de)
DE (1) DE69526279T2 (de)
TW (1) TW399169B (de)

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JP3945602B2 (ja) * 1998-04-14 2007-07-18 富士通株式会社 訂正検査方法及び訂正検査装置
KR100665442B1 (ko) * 2000-12-29 2007-01-04 엘지전자 주식회사 에러정정용 메모리 제어장치 및 방법
US6981196B2 (en) * 2001-07-25 2005-12-27 Hewlett-Packard Development Company, L.P. Data storage method for use in a magnetoresistive solid-state storage device
US20030023922A1 (en) * 2001-07-25 2003-01-30 Davis James A. Fault tolerant magnetoresistive solid-state storage device
US7036068B2 (en) * 2001-07-25 2006-04-25 Hewlett-Packard Development Company, L.P. Error correction coding and decoding in a solid-state storage device
US20030172339A1 (en) * 2002-03-08 2003-09-11 Davis James Andrew Method for error correction decoding in a magnetoresistive solid-state storage device
US6973604B2 (en) * 2002-03-08 2005-12-06 Hewlett-Packard Development Company, L.P. Allocation of sparing resources in a magnetoresistive solid-state storage device
JP2005327437A (ja) 2004-04-12 2005-11-24 Nec Electronics Corp 半導体記憶装置
US20070061669A1 (en) * 2005-08-30 2007-03-15 Major Karl L Method, device and system for detecting error correction defects
KR20150027849A (ko) * 2007-08-31 2015-03-12 유니프랙스 아이 엘엘씨 배기 가스 처리 장치
US7814300B2 (en) 2008-04-30 2010-10-12 Freescale Semiconductor, Inc. Configurable pipeline to process an operation at alternate pipeline stages depending on ECC/parity protection mode of memory access
US20090276587A1 (en) * 2008-04-30 2009-11-05 Moyer William C Selectively performing a single cycle write operation with ecc in a data processing system
GB201114831D0 (en) * 2011-08-26 2011-10-12 Univ Oxford Brookes Circuit with error correction
US9529547B2 (en) 2011-10-21 2016-12-27 Freescale Semiconductor, Inc. Memory device and method for organizing a homogeneous memory
KR102002925B1 (ko) 2012-11-01 2019-07-23 삼성전자주식회사 메모리 모듈, 그것을 포함하는 메모리 시스템, 그것의 구동 방법
KR101439815B1 (ko) * 2013-03-08 2014-09-11 고려대학교 산학협력단 메모리에서의 에러 정정 처리 회로 및 에러 정정 처리 방법
US9148176B2 (en) * 2013-06-24 2015-09-29 Micron Technology, Inc. Circuits, apparatuses, and methods for correcting data errors
CN103700396B (zh) * 2013-12-03 2016-06-01 中国航天科技集团公司第九研究院第七七一研究所 一种面向sram的抗seu错误累积的控制器及方法
US9852024B2 (en) * 2016-04-19 2017-12-26 Winbond Electronics Corporation Apparatus and method for read time control in ECC-enabled flash memory
US10691533B2 (en) * 2017-12-12 2020-06-23 Micron Technology, Inc. Error correction code scrub scheme
EP4227944B1 (de) 2020-09-18 2025-07-02 Changxin Memory Technologies, Inc. Speicher
CN117079686A (zh) * 2020-09-18 2023-11-17 长鑫存储技术有限公司 存储器
US11750226B2 (en) * 2021-06-09 2023-09-05 Nvidia Corporation Error correction code system with augmented detection features
US12411611B2 (en) * 2022-05-12 2025-09-09 Changxin Memory Technologies, Inc. Method and device for testing memory with instruction signal
KR102779980B1 (ko) * 2023-11-16 2025-03-12 인하대학교 산학협력단 오류정정부호 부호기 및 복호기의 하드웨어 가속기 설계 및 자동 검증 프레임워크

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US4852100A (en) * 1986-10-17 1989-07-25 Amdahl Corporation Error detection and correction scheme for main storage unit
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Also Published As

Publication number Publication date
JPH07254300A (ja) 1995-10-03
TW399169B (en) 2000-07-21
EP0668561A2 (de) 1995-08-23
DE69526279D1 (de) 2002-05-16
US5966389A (en) 1999-10-12
EP0668561B1 (de) 2002-04-10
KR950033822A (ko) 1995-12-26
KR100382255B1 (ko) 2003-08-06
EP0668561A3 (de) 1996-04-10
DE69526279T2 (de) 2002-10-02

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Legal Events

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UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee