AT258476B - Verfahren zur Herstellung antimikrobieller Mittel - Google Patents

Verfahren zur Herstellung antimikrobieller Mittel

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Publication number
AT258476B
AT258476B AT1012665A AT1012665A AT258476B AT 258476 B AT258476 B AT 258476B AT 1012665 A AT1012665 A AT 1012665A AT 1012665 A AT1012665 A AT 1012665A AT 258476 B AT258476 B AT 258476B
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AT
Austria
Prior art keywords
antimicrobial agents
parts
making antimicrobial
antimicrobial
preparation
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AT1012665A
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English (en)
Inventor
Herbert Klesper
Fritz Dr Steinfatt
Walter Dr Lorenz
Klaus Dr Langheinrich
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Bayer Ag
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Publication of AT258476B publication Critical patent/AT258476B/de

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    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07DHETEROCYCLIC COMPOUNDS
    • C07D275/00Heterocyclic compounds containing 1,2-thiazole or hydrogenated 1,2-thiazole rings
    • C07D275/04Heterocyclic compounds containing 1,2-thiazole or hydrogenated 1,2-thiazole rings condensed with carbocyclic rings or ring systems
    • AHUMAN NECESSITIES
    • A01AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01NPRESERVATION OF BODIES OF HUMANS OR ANIMALS OR PLANTS OR PARTS THEREOF; BIOCIDES, e.g. AS DISINFECTANTS, AS PESTICIDES OR AS HERBICIDES; PEST REPELLANTS OR ATTRACTANTS; PLANT GROWTH REGULATORS
    • A01N43/00Biocides, pest repellants or attractants, or plant growth regulators containing heterocyclic compounds
    • A01N43/72Biocides, pest repellants or attractants, or plant growth regulators containing heterocyclic compounds having rings with nitrogen atoms and oxygen or sulfur atoms as ring hetero atoms
    • A01N43/80Biocides, pest repellants or attractants, or plant growth regulators containing heterocyclic compounds having rings with nitrogen atoms and oxygen or sulfur atoms as ring hetero atoms five-membered rings with one nitrogen atom and either one oxygen atom or one sulfur atom in positions 1,2
    • DTEXTILES; PAPER
    • D06TREATMENT OF TEXTILES OR THE LIKE; LAUNDERING; FLEXIBLE MATERIALS NOT OTHERWISE PROVIDED FOR
    • D06LDRY-CLEANING, WASHING OR BLEACHING FIBRES, FILAMENTS, THREADS, YARNS, FABRICS, FEATHERS OR MADE-UP FIBROUS GOODS; BLEACHING LEATHER OR FURS
    • D06L1/00Dry-cleaning or washing fibres, filaments, threads, yarns, fabrics, feathers or made-up fibrous goods
    • D06L1/02Dry-cleaning or washing fibres, filaments, threads, yarns, fabrics, feathers or made-up fibrous goods using organic solvents
    • D06L1/04Dry-cleaning or washing fibres, filaments, threads, yarns, fabrics, feathers or made-up fibrous goods using organic solvents combined with specific additives
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76264SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/764Air gaps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • HELECTRICITY
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/53204Conductive materials
    • H01L23/53209Conductive materials based on metals, e.g. alloys, metal silicides
    • H01L23/53242Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being a noble metal, e.g. gold
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/53204Conductive materials
    • H01L23/53209Conductive materials based on metals, e.g. alloys, metal silicides
    • H01L23/53242Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being a noble metal, e.g. gold
    • H01L23/53252Additional layers associated with noble-metal layers, e.g. adhesion, barrier, cladding layers
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    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0611Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
    • H01L27/0641Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region without components of the field effect type
    • H01L27/0647Bipolar transistors in combination with diodes, or capacitors, or resistors, e.g. vertical bipolar transistor and bipolar lateral transistor and resistor
    • H01L27/0652Vertical bipolar transistor in combination with diodes, or capacitors, or resistors
    • H01L27/0658Vertical bipolar transistor in combination with resistors or capacitors
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    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
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    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10MLUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
    • C10M2201/00Inorganic compounds or elements as ingredients in lubricant compositions
    • C10M2201/02Water
    • CCHEMISTRY; METALLURGY
    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10MLUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
    • C10M2219/00Organic non-macromolecular compounds containing sulfur, selenium or tellurium as ingredients in lubricant compositions
    • C10M2219/10Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring
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    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10MLUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
    • C10M2219/00Organic non-macromolecular compounds containing sulfur, selenium or tellurium as ingredients in lubricant compositions
    • C10M2219/10Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring
    • C10M2219/102Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring containing sulfur and carbon only in the ring
    • CCHEMISTRY; METALLURGY
    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10MLUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
    • C10M2219/00Organic non-macromolecular compounds containing sulfur, selenium or tellurium as ingredients in lubricant compositions
    • C10M2219/10Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring
    • C10M2219/104Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring containing sulfur and carbon with nitrogen or oxygen in the ring
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    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10MLUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
    • C10M2219/00Organic non-macromolecular compounds containing sulfur, selenium or tellurium as ingredients in lubricant compositions
    • C10M2219/10Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring
    • C10M2219/104Heterocyclic compounds containing sulfur, selenium or tellurium compounds in the ring containing sulfur and carbon with nitrogen or oxygen in the ring
    • C10M2219/106Thiadiazoles
    • CCHEMISTRY; METALLURGY
    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10NINDEXING SCHEME ASSOCIATED WITH SUBCLASS C10M RELATING TO LUBRICATING COMPOSITIONS
    • C10N2040/00Specified use or application for which the lubricating composition is intended
    • C10N2040/20Metal working
    • C10N2040/22Metal working with essential removal of material, e.g. cutting, grinding or drilling
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76264SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
    • H01L21/76289Lateral isolation by air gap
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pest Control & Pesticides (AREA)
  • Zoology (AREA)
  • Plant Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Dentistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Wood Science & Technology (AREA)
  • Agronomy & Crop Science (AREA)
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  • Textile Engineering (AREA)
  • Ceramic Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Agricultural Chemicals And Associated Chemicals (AREA)
  • Treatments For Attaching Organic Compounds To Fibrous Goods (AREA)
  • Thiazole And Isothizaole Compounds (AREA)

Description


   <Desc/Clms Page number 1> 
 



  Verfahren zur Herstellung antimikrobieller Mittel 
Die Erfindung betrifft ein Verfahren zur Herstellung antimikrobieller Mittel. 



   Erfindungsgemäss wird dabei so vorgegangen, dass man   1, 2-Benzisothiazolone   der allgemeinen Formel 
 EMI1.1 
 
 EMI1.2 
 

 <Desc/Clms Page number 2> 

 Grundlage von anionaktiven und nicht ionogenen Tensiden aufgebauten Reinigungsverstärkers sowie 4 g der nachstehend beschriebenen antimikrobiellen Zubereitung enthält. Die relative Luftfeuchtigkeit im Dampfraum der Reinigungsanlage beträgt dabei   75%. Anschliessend   werden die Gewebe abgeschleudert und getrocknet, Die Gewebe erweisen sich dann als keimfrei ; ausserdem sind sie bakteriostatisch und fungistatisch ausgerüstet. 



   Die verwendete antimikrobielle Zubereitung war in folgender Weise hergestellt :
200 Teile   1, 2-Benzisothiazolon   wurden in 610 Teilen Äthylenglykolmonopropyläther unter Zugabe von 80 Teilen   45% iger   Natronlauge in der Wärme gelöst, dann wurden 60 Teile Paraformaldehyd hinzugegeben und die Mischung wurde 20 min auf 1150C erhitzt. Abschliessend wurden der Lösung noch 5 Teile Cyclohexanon hinzugefügt. 



   Mit den erwähnten Mikroben infizierte Gewebe, die ohne Zusatz der erfindungsgemässen Zubereitung chemisch gereinigt werden, erweisen sich nach der Reinigung noch als unsteril. 



     Beispiel 2 :   Man verfährt wie in Beispiel 1 angegeben, jedoch mit dem Unterschied, dass man an Stelle der dort angegebenen antimikrobiellen Zubereitung eine der beiden Zubereitungen verwendet, die in folgender Weise hergestellt waren : 
 EMI2.1 
 le Paraformaldehyd hinzugefügt, und die Mischung wurde 15 min auf 110 C erhitzt. 



   Die so behandelten Gewebe erweisen sich dann ebenfalls als keimfrei sowie als bakteriostatisch und fungistatisch ausgerüstet. 
 EMI2.2 
 während 30 min behandelt und anschliessend getrocknet. Die Gewebe sind dannhervorragendbakteriostatisch und fungistatisch ausgerüstet. Dieser Ausrüstungseffekt bleibt auch nach mehreren Wäschenerhalten. 



    Beispiel 4 : 2 Teile eines handelsüblichenBohröls, das aus Paraffinöl und einem anionaktiven Emul-    gator besteht, werden mit 98 Teilen Wasser zu einer Emulsion verrührt und anschliessend unter Rühren noch mit 0,2 Teilen einer der in den Beispielen 1 und 2 beschriebenen antimikrobiellen Zubereitungen versetzt. Die Emulsion ist dann hervorragend konserviert. Im Gegensatz hiezu zeigt die Emulsion, die ohne Zusatz einer der antimikrobiellen Zubereitungen hergestellt ist, bei der üblichen Verwendung bereits nach wenigen Tagen einen starken Bakterienbefall. 



    PATENTANSPRÜCHE :    
1. Verfahren zur Herstellung antimikrobieller Mittel, dadurch gekennzeichnet, dass man 1,   2-Benzisothiazolone   der allgemeinen Formel 
 EMI2.3 
 in der
Rl und R2 unabhängig voneinander für Wasserstoff oder Halogen stehen und
R Wasserstoff oder Hydroxyalkyl, beispielsweise Hydroxymethyl und Hydroxyäthyl, bedeu- tet, mit Paraformaldehyd im Molverhältnis von 0, 5 bis 3 Mol Formaldehyd. bezogen auf
1 Mol 1,2-Benzisothiazolon-Verbindung, in mit Wasser   mischbaren organischen Lösungs-   mitteln und in Gegenwart von Alkali auf 90 - 150 C erhitzt.

Claims (1)

  1. 2. Verfahren nach Anspruch 1, dadurch gekennzeichnet, dass als Lösungsmittel Äthy- <Desc/Clms Page number 3> lenglykol, Diäthylenglykol, Propylenglykol sowie die Monoäther aus diesen Glykolen und niederen, einwertigen Alkoholen, wie Äthylalkohol und Propylalkohol, verwendet werden.
AT1012665A 1964-11-10 1965-11-10 Verfahren zur Herstellung antimikrobieller Mittel AT258476B (de)

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Application Number Priority Date Filing Date Title
DE1964F0044402 DE1215304C2 (de) 1964-11-10 1964-11-10 Antimikrobielle Mittel

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AT258476B true AT258476B (de) 1967-11-27

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Application Number Title Priority Date Filing Date
AT1012665A AT258476B (de) 1964-11-10 1965-11-10 Verfahren zur Herstellung antimikrobieller Mittel

Country Status (9)

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US (1) US3522265A (de)
AT (1) AT258476B (de)
BE (1) BE671490A (de)
CH (2) CH435847A (de)
DE (1) DE1215304C2 (de)
FR (1) FR1467066A (de)
GB (1) GB1081318A (de)
NL (1) NL6514605A (de)
SE (1) SE321229B (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE292054A (de) * 1971-08-23 1900-01-01
US4165318A (en) * 1977-09-06 1979-08-21 Rohm And Haas Company Formaldehyde stabilized coating compositions

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2373136A (en) * 1943-11-23 1945-04-10 Du Pont Ethylene urea derivatives
US2767174A (en) * 1954-12-29 1956-10-16 Schenley Ind Inc N-benzylidene and n-quinolylmethylene-substituted 2-aminobenzisothiazolones and processes for their preparation
US2767172A (en) * 1954-12-29 1956-10-16 Schenley Ind Inc Process for the production of n-benzylidene and n-quinolylmethylene-substituted 2-aminobenz-isothiazolones
NL268752A (de) * 1959-06-24
AT219596B (de) * 1960-03-24 1962-02-12 Wander Ag Dr A Verfahren zur Herstellung von neuen Benzisothiazolonderivaten

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FR1467066A (fr) 1967-01-27
US3522265A (en) 1970-07-28
BE671490A (de) 1966-02-14
DE1215304C2 (de) 1966-11-24
NL6514605A (de) 1966-05-11
SE321229B (de) 1970-03-02
DE1215304B (de) 1966-04-28
CH444568A (de) 1968-02-29
GB1081318A (en) 1967-08-31
CH435847A (de) 1967-05-15
CH1437265A4 (de) 1967-06-15

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