WO2024005014A1 - 滑り止め部材 - Google Patents
滑り止め部材 Download PDFInfo
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- WO2024005014A1 WO2024005014A1 PCT/JP2023/023805 JP2023023805W WO2024005014A1 WO 2024005014 A1 WO2024005014 A1 WO 2024005014A1 JP 2023023805 W JP2023023805 W JP 2023023805W WO 2024005014 A1 WO2024005014 A1 WO 2024005014A1
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- protrusions
- slip member
- base material
- member according
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7602—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q7/00—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting
- B23Q7/04—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting by means of grippers
- B23Q7/043—Construction of the grippers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q7/00—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting
- B23Q7/04—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting by means of grippers
- B23Q7/045—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting by means of grippers using a tool holder as a work-transporting gripper
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/0033—Gripping heads and other end effectors with gripping surfaces having special shapes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/08—Gripping heads and other end effectors having finger members
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/02—Local etching
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F3/00—Electrolytic etching or polishing
- C25F3/02—Etching
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7616—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating, a hardness or a material
Definitions
- the present invention relates to an anti-slip member.
- This application claims priority based on Japanese Patent Application No. 2022-104569 filed in Japan on June 29, 2022 and Japanese Patent Application No. 2022-104578 filed in Japan on June 29, 2022. The contents are incorporated herein.
- Patent Documents 1 and 2 for example, in a gripping member that grips an object and a conveyance member that transports an object, a portion that comes into contact with the object is provided with a sliding surface in order to stably fix the object. A stop member is provided. Furthermore, when handling an object, an anti-slip member is used to temporarily fix the object and prevent it from shifting, as shown in Patent Document 3, for example.
- the anti-slip member since the anti-slip member is required to have sufficient frictional force with the object, it is usually made of an organic material such as a viscoelastic material such as rubber.
- organic materials such as rubber have a problem in that they cannot be stably used in high-temperature environments due to insufficient heat resistance. Additionally, there is a problem that it cannot be used in a clean environment due to the risk of contamination with organic materials. Therefore, for example, anti-slip members made of organic materials cannot be used in semiconductor manufacturing process applications, aerospace applications, and robot applications.
- the industrial materials constituting various members are broadly classified into organic materials such as resins and rubbers, and inorganic materials such as ceramics and metals.
- organic materials have excellent flexibility but poor heat resistance.
- inorganic materials have excellent heat resistance but poor flexibility. In this way, in industrial materials, a trade-off in properties occurs depending on the material selected.
- the anti-slip member is made of inorganic material, it will have excellent heat resistance and reduce the problem of contamination, but it will not be able to obtain sufficient frictional force and will not be able to secure the object sufficiently. There was a risk.
- the present invention has been made in view of the above-mentioned circumstances, and provides an anti-slip member that can be used stably even in high-temperature environments and clean environments, and that can sufficiently fix objects.
- the purpose is to
- the inventors conducted extensive research and found that by forming fine irregularities on the surface of a base material made of inorganic materials such as ceramics and metals, sufficient frictional force can be imparted to the surface. It was found that the material can be used as a non-slip member.
- the anti-slip member according to aspect 1 of the present invention has a plurality of protrusions erected on at least a part of the surface of a base material made of an inorganic material.
- the projection region has a first direction and a second direction intersecting the first direction, and the plurality of projections are arranged in the first direction and the second direction. are arranged periodically in at least one direction, and the average pitch of the plurality of protrusions in the first direction and/or the second direction is within a range of 20 nm or more and 1000 nm or less, It is characterized in that the coefficient of static friction on the surface is 0.20 or more.
- the anti-slip member is made of an inorganic material such as ceramics or metal, so it has excellent heat resistance and can sufficiently suppress the problem of contamination.
- At least a part of the surface of the base material has a protrusion area in which a plurality of protrusions are erected, and the protrusion area is arranged in a first direction and in a second direction intersecting the first direction.
- the plurality of protrusions are arranged periodically in at least one direction of the first direction and the second direction, and the plurality of protrusions are arranged in the first direction and/or in the second direction.
- the object can be sufficiently fixed by the frictional force of this surface. Therefore, it can be stably used even in high-temperature environments and clean environments, and it is also possible to sufficiently fix objects.
- Aspect 2 of the present invention is the anti-slip member of aspect 1, wherein the plurality of protrusions form a striped structure consisting of a plurality of protrusions extending in the first direction or the second direction, It is characterized in that the average pitch of the protrusions is within a range of 20 nm or more and 1000 nm or less.
- a stripe structure consisting of a plurality of protrusions extending in the first direction or the second direction is formed on at least a part of the surface of the base material, and Since the average pitch of the protrusions is within the range of 20 nm or more and 1000 nm or less, and the static friction coefficient on the surface is 0.20 or more, the object can be sufficiently fixed by the frictional force of this surface. can. Therefore, it can be stably used even in high-temperature environments and clean environments, and it is also possible to sufficiently fix objects.
- a third aspect of the present invention is characterized in that, in the anti-slip member of the first aspect, an area ratio occupied by the stripe structure on the surface is 30% or more. According to the anti-slip member according to aspect 3 of the present invention, since the area ratio occupied by the stripe structure on the surface is 30% or more, a sufficient frictional force is applied to the surface by the stripe structure, Furthermore, it becomes possible to securely fix the object.
- Aspect 4 of the present invention is characterized in that in the anti-slip member of Aspect 1 or Aspect 2, the average pitch of the protrusions is 500 nm or less. According to the anti-slip member according to aspect 4 of the present invention, since the protrusions have a finer structure with an average pitch of 500 nm or less, it is possible to apply even more sufficient frictional force to the surface. It becomes possible to securely fix the object.
- a fifth aspect of the present invention is characterized in that, in the anti-slip member according to any one of aspects 2 to 4, the average height of the protrusions is within a range of 20 nm or more and 1000 nm or less. According to the anti-slip member according to aspect 5 of the present invention, since the average height of the protrusions is within the range of 20 nm or more and 1000 nm or less, it is possible to apply a further sufficient frictional force to the surface, Furthermore, it becomes possible to securely fix the object.
- a sixth aspect of the present invention is characterized in that, in the anti-slip member according to any one of aspects 2 to 5, a cross section perpendicular to the extending direction of the protruding portion has a triangular shape.
- the tip of the protrusion deforms along the outer shape of the object. This makes it easier to fix the object more reliably.
- the plurality of protrusions are composed of protrusions periodically arranged in the first direction and the second direction.
- the average pitch of the protrusions in the first direction and the average pitch in the second direction are within a range of 20 nm or more and 1000 nm or less.
- the plurality of protrusions provided on at least a portion of the surface of the base material are arranged periodically in the first direction and the second direction.
- the average pitch of the projections in the first direction and the average pitch in the second direction are in the range of 20 nm or more and 1000 nm or less, and the coefficient of static friction on the surface is is set to be 0.20 or more, so the object can be sufficiently fixed by the frictional force of this surface. Therefore, it can be stably used even in high-temperature environments and clean environments, and it is also possible to sufficiently fix objects.
- Aspect 8 of the present invention is characterized in that, in the anti-slip member of aspect 7, an area ratio occupied by the protrusions on the surface is 30% or more. According to the anti-slip member according to aspect 8 of the present invention, since the occupied area ratio of the protrusions on the surface is 30% or more, a sufficient frictional force is applied to the surface by the protrusions. , it becomes possible to fix the object more reliably.
- a ninth aspect of the present invention is characterized in that in the eighth aspect or the anti-slip member of the eighth aspect, an average pitch of the projections in the first direction and an average pitch in the second direction are 500 nm or less.
- the average pitch of the protrusions in the first direction and the average pitch in the second direction are each 500 nm or less, which is a finer structure. Further, sufficient frictional force can be applied, and the object can be fixed more reliably.
- Aspect 10 of the present invention is characterized in that in the anti-slip member according to any one of aspects 7 to 9, the average height of the projections is within a range of 20 nm or more and 1000 nm or less. According to the anti-slip member according to aspect 10 of the present invention, since the average height of the protrusions is within the range of 20 nm or more and 1000 nm or less, it is possible to apply more sufficient frictional force to the surface, and It becomes possible to securely fix the object.
- Aspect 11 of the present invention is the anti-slip member according to any one of aspects 7 to 10, characterized in that the protrusion has a pointed tip.
- the tip (point) of the protrusion deforms along the outer shape of the object. This makes it easier to fix the object, and it becomes possible to fix the object more reliably.
- a twelfth aspect of the present invention is the anti-slip member of the eleventh aspect, characterized in that the tip portion has an inclined surface inclined in opposite directions through the top portion.
- the tip portion has an inclined surface inclined in opposite directions through the top portion, a contact area between the surface and the object is ensured, and the object is can be fixed even more securely.
- a thirteenth aspect of the present invention is the anti-slip member of the eleventh aspect, characterized in that the tip portion has a quadrangular pyramid shape. According to the anti-slip member according to aspect 13 of the present invention, since the pointed end has a quadrangular pyramid shape, a contact area between the surface and the object is ensured, and the object can be more securely fixed. It becomes possible.
- Aspect 14 of the present invention is the anti-slip member according to any one of aspects 1 to 13, in which the surface of the base material is made of aluminum, aluminum alloy, nickel, nickel alloy, copper, copper alloy, titanium, titanium alloy, tungsten. , tungsten alloy, magnesium, magnesium alloy, quartz, glass, silicon, aluminum oxide, and titanium oxide.
- the surface of the base material is aluminum, aluminum alloy, nickel, nickel alloy, copper, copper alloy, titanium, titanium alloy, tungsten, tungsten alloy, magnesium, magnesium alloy, Since it is composed of at least one of quartz, glass, silicon, aluminum oxide, and titanium oxide, it has particularly excellent heat resistance and can be used stably even in high-temperature environments and clean environments. .
- an anti-slip member that can be used stably even in high-temperature environments and clean environments, and that can sufficiently fix objects.
- FIG. 2 is a plan view of the anti-slip member according to the first embodiment of the present invention. It is a perspective view of the protrusion area (stripe structure) in the anti-slip member of the first embodiment of the present invention.
- FIG. 3 is an explanatory cross-sectional view taken along line AA in FIG. 2;
- FIG. 3 is an explanatory diagram showing a method of calculating a static friction coefficient. It is a flow diagram showing the manufacturing method of the anti-slip member of the first embodiment of the present invention.
- FIG. 7 is a plan view of a non-slip member according to a second embodiment of the present invention. 7 is a perspective view of a protrusion region (protrusion) of the anti-slip member shown in FIG. 6.
- FIG. 6 is a plan view of the anti-slip member according to the first embodiment of the present invention. It is a perspective view of the protrusion area (stripe structure) in the anti-slip member of the first embodiment of the present invention.
- FIG. 8 is an explanatory diagram of the AA cross section (ZY plane) in FIG. 7.
- FIG. 8 is an explanatory diagram of the BB cross section (ZX plane) in FIG. 7.
- FIG. 7 is a perspective view of a protrusion in the anti-slip member shown in FIG. 6.
- FIG. It is a flowchart which shows the manufacturing method of the anti-slip member of 2nd embodiment of this invention. It is a top view which shows the modification of the anti-slip member of 2nd embodiment of this invention.
- 13 is a perspective view of a protrusion in the anti-slip member shown in FIG. 12.
- FIG. 14 is an explanatory diagram of the AA cross section (ZX plane) in FIG. 13.
- FIG. 13 is a perspective view of a protrusion in the anti-slip member shown in FIG. 12.
- FIG. 13 is a perspective view of a protrusion in the anti-slip member shown in FIG. 12.
- FIG. FIG. 2 is an explanatory diagram showing a method of measuring a static friction coefficient in an example. Specifically, it is a plan view showing that three anti-slip members 10 (110 or 210) are arranged at 120° intervals in the circumferential direction of the silicon wafer S and placed on the fixing plate Q.
- FIG. 16B is a side view of FIG. 16A.
- FIG. 6 is a side view illustrating that in an example, the fixing plate Q is tilted to measure the angle ⁇ at which the silicon wafer S slides.
- the anti-slip member of this embodiment can be used, for example, in gripping devices, conveyance devices, manufacturing devices, etc. used in high-temperature environments or clean environments such as in the aerospace field, semiconductor manufacturing process field, and medical field. It is used for fixing.
- the anti-slip member 10 of the first embodiment has a base material 11 made of an inorganic material such as ceramics or metal, and a plurality of protrusions are provided on at least a part of the surface of the base material 11. It has a region 20.
- the protrusion region 20 has a first direction and a second direction intersecting the first direction.
- the plurality of protrusions form a plurality of protrusions 21 extending in one of the first direction and the second direction, and protrude in the protrusion region 20.
- a striped structure consisting of the striped portions 21 is formed. Note that there is no particular restriction on the shape or size of the base material 11, but in the first embodiment, as shown in FIG. has been done.
- examples of the inorganic material constituting the base material 11 include metals, ceramics, silicon, and glass.
- the inorganic material constituting the base material 11 preferably has a melting point of 100°C or higher and a decomposition temperature of 100°C or higher, preferably has a melting point of 300°C or higher and a decomposition temperature of 300°C or higher, and has a melting point of 500°C or higher.
- the decomposition temperature is preferably 500°C or higher.
- the metal constituting the base material 11 may be a single metal or an alloy. Alloys include those made of a plurality of metal elements and those made of a metal element and a non-metal element. Examples of simple metals include aluminum, nickel, iron, copper, titanium, tungsten, and magnesium. Examples of alloys include aluminum alloys, NiP, stainless steel, and copper alloys. As the ceramics constituting the base material 11, oxides, nitrides, and carbides can be used. Examples of ceramics include aluminum oxide (alumina), titanium oxide, and quartz.
- the inorganic material constituting the base material 11 is preferably a metal, and more preferably contains any one of copper, copper alloy, aluminum, aluminum alloy, and NiP alloy.
- the stripe structure formed on the surface of the base material 11 is composed of a plurality of protrusions 21 extending in one direction, as shown in FIGS. 2 and 3. That is, for example, a plurality of protrusions 21 extending in the first direction are arranged in a second direction intersecting the first direction, forming a striped structure in which the plurality of protrusions 21 are arranged in parallel.
- the average pitch P of the parallel protrusions 21, 21 is within the range of 20 nm or more and 1000 nm or less.
- the average pitch P of the protrusions 21 is the average value of the distance between the tops 21a, 21a of the adjacent protrusions 21, 21.
- the average pitch P of the protrusions 21 can be measured from a cross-sectional SEM photograph of the stripe structure taken with a SEM (scanning electron microscope). In addition, it is preferable that the average pitch P of the protrusion part 21 is 1000 nm or less, and it is preferable that it is 500 nm or less. Moreover, it is preferable that the average pitch P of the protrusion part 21 is 20 nm or more, and it is preferable that it is 50 nm or more.
- the average pitch P of the protrusions 21 is defined as the distance between the tops 21a, 21a of the adjacent protrusions 21, 21 in a planar photograph of a striped structure taken with an SEM (scanning electron microscope). Measurements were taken at different locations and the average value was calculated.
- the average height H of the protruding stripes 21 is within a range of 20 nm or more and 1000 nm or less.
- the average height H of the protrusions 21 can be measured from a cross-sectional SEM photograph of the striped structure taken with a SEM (scanning electron microscope).
- the average height H of the protrusion part 21 is 800 nm or less, and it is preferable that it is 500 nm or less.
- the average height H of the protrusion part 21 is 20 nm or more, and it is preferable that it is 50 nm or more.
- the average height H of the protrusion 21 is determined by measuring the height from the top 21a of the protrusion 21 at 10 locations in a cross-sectional photograph of the striped structure taken with an SEM (scanning electron microscope). The average value is calculated.
- the cross section of the protrusion 21 perpendicular to the extending direction has a triangular shape.
- the cross-sectional shape of the protrusion portion 21 is an isosceles triangle.
- the base angle ( ⁇ in FIG. 3) of the protruding portion 21 is preferably 60 degrees or more, and preferably within the range of 60 degrees or more and 80 degrees or less.
- the base angle ( ⁇ in FIG. 3) of the protrusion 21 is measured using a cross-sectional photograph of the striped structure taken with a SEM (scanning electron microscope).
- the ratio of the average height H to the average pitch P of the protrusion portions 21 is within the range of 0.8 or more and 2.0 or less. is preferable, and more preferably within the range of 1.0 or more and 1.5 or less.
- the average height H/average pitch P is 0.8 or more, the protrusions 21 are easily deformed along the outer shape of the object, and the object can be fixed more reliably.
- the average height H/average pitch P is 2.0 or less, the restoring force of the shape of the protrusion portion 21 becomes high, and it becomes possible to use it repeatedly.
- the area ratio (occupied area ratio) occupied by the stripe structure (projection region 20) on the surface of the base material 11 that contacts the object is 30% or more. is preferred.
- a stripe structure is formed on about 70% of the surface of the base material 11. Note that the area ratio occupied by the stripe structure on the surface of the base material 11 is preferably 50% or more, and preferably 70% or more. Further, the area ratio occupied by the stripe structure on the surface of the base material 11 is 100% or less.
- the "occupied area ratio of the stripe structure” means that in a plurality of protrusions 21 extending in a certain direction, the pitch from protrusion 21 to protrusion 21 is -10% to +10% from the average pitch. %, and is the value obtained by dividing the area of the range in which three or more protrusions 21 are repeated in succession by the area of the surface of the base material.
- the static friction coefficient ⁇ on the surface of the base material 11 on which the striped structure is formed is 0.20 or more.
- the static friction coefficient ⁇ on the surface of the base material 11 is preferably 0.30 or more, and preferably 0.40 or more.
- the static friction coefficient ⁇ is 10 or less.
- the static friction coefficient ⁇ on the surface of the base material 11 can be calculated using the formula shown in FIG. The equations in FIG. 4 are shown below as equations (1) to (4).
- the anti-slip member 10 of the first embodiment has a polishing step S01 and a cutting step S02, as shown in the flowchart of FIG.
- the polishing step S01 the surface of the base material 11 made of an inorganic material is polished.
- the base material 11 can be polished by, for example, grinding with a grinder, polishing with waterproof paper, or buffing.
- the surface of the base material 11 after polishing preferably has a surface roughness Ra of 0.02 ⁇ m or less, for example.
- the surface roughness Ra refers to the arithmetic mean roughness (Ra) shown in JISB0601.
- the surface of the base material 11 polished in the polishing step S01 is cut to form the protrusions 21.
- the cutting method is not particularly limited, and various methods can be selected. Cutting methods include, for example, a method in which a groove is formed by periodically moving the cutting tool up and down while moving the cutting tool in a direction perpendicular to the blade surface (NP method: nanopecking method); A method (conventional method) in which grooves are formed by linear movement without movement can be used.
- a processing device that includes a cutting tool and an ultrasonic vibration device that causes the cutting tool to vibrate ultrasonically can be used as the processing device.
- the shape of the blade surface of the cutting tool is not particularly limited, and may be triangular or square, for example.
- a cutting tool is pushed diagonally into the surface of the base material 11 while being ultrasonically vibrated, and then the cutting tool is moved in a direction perpendicular to the blade surface while periodically moving up and down.
- a protrusion 21 is formed on the surface of the base material 11, extending in a direction perpendicular to the moving direction of the cutting tool.
- a processing device having a cutting tool and an ultrasonic vibrating device that causes the cutting tool to vibrate ultrasonically can be used as the processing device.
- the shape of the blade surface of the cutting tool shall be triangular.
- the cutting tool is pushed perpendicularly into the surface of the base material 11 while being vibrated ultrasonically, and then the cutting tool is moved in a direction perpendicular to the blade surface while being fixed so that it does not move up and down. let As a result, protrusions 21 extending parallel to the direction of movement of the cutting tool are formed on the surface of the base material 11.
- the anti-slip member 10 of the first embodiment is manufactured through the steps described above.
- the anti-slip member 10 of the first embodiment since it is made of inorganic material such as ceramics and metal, it has excellent heat resistance and can sufficiently suppress the problem of contamination. Can be done.
- a stripe structure consisting of a plurality of protrusions 21 extending in either the first direction or the second direction is formed on at least a part of the surface of the base material 11, and the average of the protrusions 21 is Since the pitch P is within the range of 20 nm or more and 1000 nm or less, and the static friction coefficient ⁇ on the surface of the base material 11 is 0.20 or more, the object can be sufficiently fixed. Therefore, it can be stably used even in high-temperature environments and clean environments, and it is also possible to sufficiently fix objects.
- the stripe structure when the area ratio occupied by the stripe structure on the surface of the base material 11 is 30% or more, the stripe structure provides a further sufficient frictional force to the surface of the base material 11 in contact with the object. It is possible to fix the object even more reliably.
- the average pitch P of the protrusions 21 is 500 nm or less, it is possible to apply a more sufficient frictional force to the surface of the base material 11 that comes into contact with the object, and it is possible to provide more reliable It becomes possible to fix the object.
- the average height H of the protrusions 21 when the average height H of the protrusions 21 is within the range of 20 nm or more and 1000 nm or less, more sufficient frictional force is applied to the surface of the base material 11 that comes into contact with the object. This makes it possible to securely fix the object.
- the tip of the protrusion 21 when the cross section perpendicular to the extending direction of the protrusion 21 has a triangular shape, the tip of the protrusion 21 easily deforms along the outer shape of the object. can be fixed even more securely.
- the present invention is not limited thereto and can be modified as appropriate without departing from the technical idea of the invention.
- the stripe structure is formed by cutting, but the invention is not limited to this, and the stripe structure may be formed by other methods.
- the cross-sectional shape of the protruding portion is described as having a triangular shape, but the cross-sectional shape is not limited to this, and may be other cross-sectional shapes such as a trapezoidal shape.
- the anti-slip member 110 of the second embodiment has a base material 111 made of an inorganic material such as ceramics or metal, and has a protrusion portion having a plurality of protrusions erected on at least a part of the surface of the base material 111. It has a region 120. As shown in FIG. 6, the plurality of protrusions are each composed of a plurality of protrusions 121 arranged periodically in a first direction and a second direction intersecting the first direction. Note that there is no particular restriction on the shape or size of the base material 111, but in the second embodiment, as shown in FIG. has been done.
- examples of the inorganic material constituting the base material 111 include metals, ceramics, silicon, and glass, as in the first embodiment.
- the protrusion region 120 formed on the surface of the base material 111 is arranged in a first direction (the X direction in FIGS. 7 to 9) and a second direction that intersects with the first direction. It is composed of a plurality of protrusions 121 arranged periodically in the Y direction (in FIGS. 7 to 9).
- the first direction (X direction) and the second direction (Y direction) are orthogonal.
- the average pitch P1 in the first direction (X direction) and the average pitch P2 in the second direction (Y direction) of the projections 121 are each within a range of 20 nm or more and 1000 nm or less. Note that the average pitch P1 in the first direction (X direction) and the average pitch P2 in the second direction (Y direction) of the protrusions 121 are the average values of the distances between the tops 125, 125 of the adjacent protrusions 121, 121. It is.
- the top portion 125 of the protrusion 121 is configured to extend along the second direction (Y direction), so that the average in the second direction (Y direction)
- the pitch P2 is the distance between the centers of the tops 125 of adjacent projections 121.
- the average pitch P1 in the first direction and the average pitch P2 in the second direction can be measured, for example, from a cross-sectional SEM photograph of the protrusion region 120 taken with an SSEM (scanning electron microscope).
- the average pitch P1 of the protrusions 121 is the top portion 125 of the adjacent protrusions 121, 121 in the first direction (X direction) in a planar photograph of the protrusion region 120 taken with an SEM (scanning electron microscope). , 125 distances were measured at 10 locations, and the average value was calculated.
- the average pitch P2 of the protrusions 121 is the average pitch P2 of the tops 125, 125 of the adjacent protrusions 121, 121 in the second direction (Y direction) in a planar photograph of the protrusion region 120 taken with an SEM (scanning electron microscope). The distance between the centers was measured at 10 locations and the average value was calculated.
- the average pitch P1 in the first direction (X direction) and the average pitch P2 in the second direction (Y direction) of the projections 121 are preferably 1000 nm or less, and preferably 500 nm or less. Further, the average pitch P1 in the first direction (X direction) and the average pitch P2 in the second direction (Y direction) of the projections 121 are preferably 20 nm or more, and preferably 50 nm or more.
- the projection 121 has a pointed end 122 and a body 123 that connects the pointed end 122 and the base material 111.
- the pointed end portion 122 has an apex portion 125 extending along a second direction D (Y direction) at the center in the first direction (X direction), and an inclined portion that is inclined in opposite directions in the first direction via the apex portion 125. It has surfaces 126a and 126b, and inclined surfaces 126c and 126d that are inclined in opposite directions in the second direction through the top portion 125.
- the body portion 123 has a quadrangular column shape.
- the tip portion 122 has a trapezoidal cross section (YZ plane) perpendicular to the first direction (X direction), and a trapezoidal cross section (XZ plane) perpendicular to the second direction (Y direction). is said to be triangular.
- the triangular shape of the pointed end 122 is preferably an isosceles triangle.
- the base angle of the isosceles triangle ( ⁇ in FIG. 9) is preferably 60 degrees or more.
- the base angle ( ⁇ in FIG. 9) of the isosceles triangle of the tip 122 is measured from a cross-sectional photograph of the tip 122 taken with an SEM (scanning electron microscope).
- the length L1 in the first direction (X direction) of the protrusion 121 is within the range of 20 nm or more and 1500 nm or less. is preferred. Further, it is preferable that the length L2 in the second direction (Y direction) of the protrusion 121 (the bottom surface 128 of the tip portion 122 and the body portion 123) is in the range of 20 nm or more and 1500 nm or less. Furthermore, it is preferable that the length L3 of the top portion 125 of the tip portion 122 in the Y direction is within a range of 10 nm or more and 1000 nm or less.
- the length L1 in the first direction (X direction) of the protrusion 121, the length L2 in the second direction (Y direction), and the length L3 in the Y direction of the top 125 of the tip 122 are This figure was obtained by measuring a cross-sectional photograph (ZY plane and ZX plane) of the protrusion 121 taken with an electron microscope.
- the average height H of the protrusions 121 is within a range of 20 nm or more and 1000 nm or less.
- the average height H of the protrusions 121 can be measured from a cross-sectional SEM photograph of the protrusion region 120 taken with a SEM (scanning electron microscope).
- the average height H of the protrusions 121 is preferably 1500 nm or less, and preferably 500 nm or less.
- the average height H of the protrusions 121 is preferably 20 nm or more, and preferably 100 nm or more.
- the protrusion 121 has a body portion 123 and a tip portion 122, and the average height H1 of the tip portion 122 is within a range of 20 nm or more and 1500 nm or less. It is preferable that the average height H2 of the body portion 123 is within a range of 0 nm or more and 1400 nm or less.
- the average height H of the protrusion 121, the average height H1 of the tip portion 122, and the average height H2 of the body portion 123 are the cross-sectional photograph of the protrusion 121 taken with a SEM (scanning electron microscope) The height of the protrusion 121 from the top 125 in the ZY plane was measured at 10 locations, and the average value was calculated.
- the ratios H/L1 and H/L2 of the length L2 and the height H of the protrusion 121 are preferably in the range of 0.7 or more and 10 or less, more preferably 0.85 or more, and 1 It is particularly preferable that it is .00 or more.
- the ratio L3/L2 of the length L2 in the second direction (Y direction) of the bottom surface 128 and body part 123 of the pointed end 122 to the Y direction length L3 of the top 125 of the pointed end 122 is 0.4 or more and 0.9 It is preferably within the following range.
- the area ratio (occupied area ratio) occupied by the protrusions 121 (projection region 120) on the surface of the base material 111 that contacts the object is 30% or more. It is preferable.
- protrusions 121 are formed on about 70% of the surface of the base material 111.
- the area ratio occupied by the projections 121 on the surface of the base material 111 is preferably 33% or more, and preferably 50% or more. Further, the area ratio occupied by the projections 121 on the surface of the base material 111 is 100% or less.
- the static friction coefficient ⁇ on the surface of the base material 111 on which the protrusions 121 are formed is 0.20 or more.
- the static friction coefficient ⁇ on the surface of the base material 111 is preferably 0.30 or more, and preferably 0.40 or more.
- the static friction coefficient ⁇ is 10 or less.
- the static friction coefficient ⁇ on the surface of the base material 111 can be calculated using equations (1) to (4) with reference to FIG. 4, similarly to the first embodiment.
- the anti-slip member 110 of the second embodiment has a polishing process S11, a cutting process S12, and an etching process S13, as shown in the flowchart of FIG.
- the polishing step S11 the surface of the base material 111 made of an inorganic material is polished.
- the base material 111 can be polished by, for example, grinding with a grinder, polishing with waterproof paper, or buffing.
- the surface of the base material 111 after polishing preferably has a surface roughness Ra of 0.02 ⁇ m or less, for example.
- the protrusion 121 is formed by cutting the surface of the base material 111 polished in the polishing step S11.
- the cutting method is not particularly limited, and various methods can be selected. Cutting methods include, for example, a method in which a groove is formed by periodically moving the cutting tool up and down while moving the cutting tool in a direction perpendicular to the blade surface (NP method: nanopecking method); A method (conventional method) in which grooves are formed by linear movement without movement can be used.
- a processing device that includes a cutting tool and an ultrasonic vibration device that causes the cutting tool to vibrate ultrasonically can be used as the processing device.
- the shape of the blade surface of the cutting tool is not particularly limited, and may be triangular or square, for example.
- the cutting tool is pushed diagonally into the surface of the base material 111 while being vibrated ultrasonically, and then the cutting tool is moved in a direction perpendicular to the cutting surface (first direction) while periodically moving up and down. ).
- the cutting tool is moved in a direction (second direction) perpendicular to the blade surface.
- a pointed end 122 is formed on the surface of the base material 111.
- a processing device having a cutting tool and an ultrasonic vibrating device that causes the cutting tool to vibrate ultrasonically can be used as the processing device.
- the shape of the blade surface of the cutting tool shall be triangular.
- the cutting tool is pushed perpendicularly into the surface of the base material 111 while being vibrated ultrasonically, and then, while the cutting tool is fixed so as not to move up and down, the cutting tool is moved in a direction perpendicular to the cutting surface (in the direction perpendicular to the cutting surface). 1 direction).
- the cutting tool is moved in a direction perpendicular to the blade surface (second direction) while fixing the cutting tool so that it does not move up and down.
- a pointed end 122 is formed on the surface of the base material 111.
- the tip portion 122 may be formed on the surface of the base material 111 by using a combination of the NP method and the conventional method.
- the body portion 123 is formed by etching the peripheral edge of the tip portion 122 formed in the cutting step S12. Note that if the body portion 123 is not formed, the etching step S13 may be omitted.
- the etching treatment method various methods used as etching treatment methods for inorganic materials can be used.
- an electrolytic etching method can be used as the etching method.
- Etching by electrolytic etching can be performed as follows. First, a polycarbonate film is attached to the pointed end 122 after being heated at 150° C., and a protective layer is installed on the pointed end 122. Next, the base material 111 is immersed in, for example, a 1N HCl aqueous solution (manufactured by Kanto Kagaku) to perform electrolytic etching (immersion at 100 nm/min). After etching, the polycarbonate film is washed with pure water and dissolved and removed using methylene chloride.
- a 1N HCl aqueous solution manufactured by Kanto Kagaku
- an iron salt method can be used as the etching method.
- a PVA film (Poval, manufactured by Kuraray, 10 ⁇ m thick) is attached to the tip 122, and a protective layer is placed on the tip 122.
- the base material 11 is immersed in a ferric chloride solution (manufactured by Toagosei Co., Ltd.) with a concentration of 40° Be′ to perform etching.
- the PVA film is dissolved and removed by washing with pure water.
- the anti-slip member 110 of the second embodiment is manufactured through the above-mentioned steps.
- the anti-slip member 110 since it is made of an inorganic material such as ceramics or metal, it has excellent heat resistance and sufficiently suppresses the problem of contamination. be able to.
- At least a portion of the surface of the base material 111 has a protrusion region 120 in which a plurality of protrusions are erected.
- the plurality of protrusions are each composed of a plurality of protrusions 121 arranged periodically in a first direction and a second direction intersecting the first direction.
- the average pitch P1 in the second direction and the average pitch P2 in the second direction are within the range of 20 nm or more and 1000 nm or less, and the static friction coefficient ⁇ on the surface is 0.20 or more. Can be fixed sufficiently. Therefore, it can be stably used even in high-temperature environments and clean environments, and it is also possible to sufficiently fix objects.
- the base material 111 that contacts the target object by the protrusions 121 Sufficient frictional force is applied to the surface of the holder, making it possible to securely fix the object.
- the average pitch P1 in the first direction and the average pitch P2 in the second direction of the protrusions 121 are 500 nm or less, fine irregularities are formed on the surface and contact with the object. A more sufficient frictional force can be applied to the surface of the base material 11, and the object can be more securely fixed.
- the average height of the protrusions 121 is within the range of 20 nm or more and 1000 nm or less, it is possible to apply a more sufficient frictional force to the surface of the base material 111 that comes into contact with the object. This makes it possible to securely fix the object.
- the tip of the protrusion 121 (the tip 122) easily deforms along the outer shape of the object, It becomes possible to fix the object more reliably.
- the pointed end 122 has trapezoidal inclined surfaces 126a, 126b of the same shape and isosceles triangular inclined surfaces 126c, 126d of the same shape, which are inclined in opposite directions through the apex 125.
- the contact area between the surface of the anti-slip member 110 and the object is ensured, and the object can be fixed even more reliably.
- FIGS. 12 to 15 modifications of the second embodiment are shown in FIGS. 12 to 15.
- a protrusion region 220 in which a plurality of protrusions 221 are erected is formed on the surface of a base material 211, and each protrusion 221 has a pointed end 222.
- this tip 222 may have a quadrangular pyramid shape.
- the average pitch P1 in the first direction and the average pitch P2 in the second direction of the protrusions 221 are within a range of 20 nm or more and 1000 nm or less.
- the average pitches P1 and P2 are the distances between the vertices 225 of the projections 221.
- the inclined surfaces 226a, 226b, 226c, and 226d forming the tip portion 222 have the same isosceles triangle shape.
- the bottom surface 228 is square. It is preferable that the base angle ( ⁇ in FIG. 14) of the isosceles triangle in the cross section of the tip portion 222 in the first direction or the second direction is 60 degrees or more.
- the protrusion 221 has been described as having the tip portion 222 and the body portion 223, but is not limited to this, and may not have the body portion 223. Further, in the second embodiment, the projections 221 are formed by cutting and etching processes, but the invention is not limited to this, and the projections 221 may be formed by other methods. good.
- a base material (length: 10 mm, width: 10 mm, plate thickness: 1 mm) made of an inorganic material shown in Table 1 was prepared.
- the surface of the prepared base material was polished to provide a smooth surface with a surface roughness Ra of 0.02 ⁇ m or less.
- the surface of the polished base material was cut using the NP method to form a striped structure consisting of a plurality of protrusions extending in one direction.
- the average pitch P, average height H, P/H of the protrusions constituting the stripe structure, and the area ratio occupied by the stripe structure on the surface are shown in Table 1.
- the average pitch P of the protrusions constituting the stripe structure is determined by taking a planar photograph of the stripe structure using a SEM (scanning electron microscope), measuring the distance between the tops of adjacent protrusions at 10 points, and The average values are shown in Table 1.
- the average height H of the protrusions constituting the stripe structure is determined by taking a cross-sectional photograph of the stripe structure using an SEM (scanning electron microscope), measuring the height from the top of the protrusion at 10 points, and calculating the average height H. The values are shown in Table 1.
- the area ratio occupied by the stripe structure is determined by taking a planar photograph of a base material having a stripe structure using an SEM (scanning electron microscope), and determining that the distance (pitch) between the tops of adjacent protrusions is -10 from the average pitch P. % to +10% and the area in which three or more protrusions 21 are continuously repeated was determined and divided by the area of the surface of the base material.
- the processing device used included a cutting tool and an ultrasonic vibration device that causes the cutting tool to undergo ultrasonic elliptical vibration.
- the cutting edge is moved in a period in which it moves vertically.
- a protrusion extending in a direction perpendicular to the moving direction of the cutting tool was formed on the surface of the base material to produce a non-slip member having a striped structure on the surface.
- the static friction coefficient of the surface on which the stripe structure was formed was measured.
- a 300 mm disk-shaped silicon wafer S was prepared. Note that the surface roughness Ra of the silicon wafer S was 0.14 nm.
- three anti-slip members 10 were arranged at 120° intervals in the circumferential direction at radial positions 140 mm from the center of the silicon wafer S, and placed on the fixing plate Q. Note that the anti-slip member 10 was arranged so that the surface on which the striped structure was formed faced the silicon wafer S side. Furthermore, by using a silicon wafer with a mass of 128 g, the load in the stacking direction was set to 43 g/cm 2 .
- Comparative Example 1 the average pitch P of the protrusions of the stripe structure was 1500 nm, and the static friction coefficient was 0.14 (parallel) and 0.15 (perpendicular), resulting in insufficient surface friction. Ta.
- Comparative Example 2 the average pitch P of the protrusions in the stripe structure was 10 nm, and the static friction coefficients were 0.17 (parallel) and 0.17 (perpendicular), resulting in insufficient surface friction. Ta.
- the average pitch P of the protrusions of the stripe structure is within the range of 20 nm or more and 1000 nm or less, and the static friction coefficient is 0.28 (parallel) or more and 0.28 (parallel) or more. 27 (perpendicular) or more, and it was confirmed that the surface friction force was sufficiently high and that the object could be sufficiently fixed.
- the base material was made of quartz, but a stripe structure with an average pitch P of protrusions of 20 nm or more and 1000 nm or less can be formed on the surface. The occupied area ratio was secured at 30% or more, and the static friction coefficient was 0.99 (parallel) or more and 0.76 (orthogonal) or more.
- a base material (length: 10 mm, width: 10 mm, plate thickness: 1 mm) made of an inorganic material shown in Table 2 was prepared.
- the surface of the prepared base material was polished to provide a smooth surface with a surface roughness Ra of 0.02 ⁇ m or less.
- the surface of the polished base material was cut using the NP method to form a plurality of protrusions, thereby forming a protrusion region according to the second embodiment shown in FIGS. 6 to 10.
- the average pitch P1 of the protrusions constituting the protrusion area in the first direction, the average height H of the protrusions, the height H1 of the tip, the average pitch P1 of the protrusions in the first direction, and the average of the protrusions The ratio H/P1 to the height H, the ratio H/P2 between the average pitch P2 of the protrusions in the second direction and the average height H of the protrusions, the length L1 of the bottom surface of the protrusions in the first direction, The length L2 of the bottom in the second direction, the length L3 of the top in the second direction, the ratio L3/L2 of the length L2 of the bottom of the protrusion in the second direction and the length L3 of the top in the second direction, the protrusion on the surface is The
- the average pitch P1 is determined by taking a planar photograph of the protrusion region using a SEM (scanning electron microscope), measuring the distance between the tops of adjacent protrusions in the first direction (X direction) at 10 points, and displaying the average value. 2, and the average pitch P2 was determined by measuring the distance between the tops of adjacent projections in the second direction (Y direction) at 10 locations, and the average value is shown in Table 2.
- the average height H of the protrusion and the height H1 of the tip are determined by taking a cross-sectional photograph (ZY plane) of the protrusion using an SEM (scanning electron microscope), and calculating the height from the top of the protrusion by 10 Measurements were taken at different locations, and the average values are shown in Table 2.
- Photographs of the cross sections (ZY plane and ZX plane) of the protrusions were taken using a SEM (scanning electron microscope), measurements were taken at 10 locations, and the average values are shown in Table 2.
- the area ratio occupied by the protrusions is determined by taking a planar photograph of the base material having the protrusions using an SEM (scanning electron microscope), determining the area of the range in which the protrusions satisfying the structure of the present invention are observed, and using this as a basis. It was obtained by dividing by the area of the material surface.
- the processing device used was a processing device having a cutting tool and an ultrasonic vibrating device that causes the cutting tool to undergo ultrasonic elliptical vibration.
- the cutting tool is pushed in diagonally while being ultrasonically vibrated, and then the cutting tool is moved in a direction perpendicular to the blade surface while being subjected to ultrasonic elliptical vibration, while the cutting edge is moved in a vertical direction.
- a plurality of protrusions were formed on the surface of the base material, and an anti-slip member having a protrusion region (protrusion region) on the surface was produced.
- the static friction coefficient of the surface on which the protrusion region was formed was measured.
- a 300 mm disk-shaped silicon wafer S was prepared.
- three anti-slip members 10 were arranged at 120° intervals in the circumferential direction at radial positions 140 mm from the center of the silicon wafer S, and placed on the fixing plate Q. Note that the anti-slip member 10 was arranged so that the surface on which the protrusion region was formed faced the silicon wafer S side. Furthermore, by using a silicon wafer with a mass of 128 g, the load in the stacking direction was set to 43 g/cm 2 .
- the average pitch P1 of the protrusions in the first direction and the average pitch P2 of the protrusions in the second direction are each in the range of 20 nm or more and 1000 nm or less, and the static friction The coefficient was 0.21 or more, and it was confirmed that the surface frictional force was sufficiently high and the object could be sufficiently fixed.
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Abstract
Description
本願は、2022年6月29日に日本に出願された特願2022-104569号、及び2022年6月29日に日本に出願された特願2022-104578号に基づき優先権を主張し、その内容をここに援用する。
また、対象物を取り扱う際にも、例えば、特許文献3に示すように、対象物を仮固定して位置ずれを防止するために、滑り止め部材が用いられている。
ここで、滑り止め部材においては、対象物との間に十分な摩擦力を有することが要求されることから、通常、粘弾性体であるゴム等の有機材料で構成されている。
よって、例えば、半導体製造プロセス用途、航空宇宙用途、ロボット用途においては、有機材料からなる滑り止め部材を適用することができなかった。
有機材料においては、上述のように、柔軟性に優れるが耐熱性に劣ることになる。これに対して、無機材料においては、耐熱性に優れるが柔軟性に劣ることになる。このように、工業材料においては、選択する材料によって特性のトレードオフが発生してしまうことになる。
よって、高温環境下およびクリーン環境下でも安定して使用することができるとともに、対象物を十分に固定することが可能となる。
よって、高温環境下およびクリーン環境下でも安定して使用することができるとともに、対象物を十分に固定することが可能となる。
本発明の態様3の滑り止め部材によれば、前記表面における前記ストライプ構造の占有面積率が30%以上とされているので、前記表面にストライプ構造によってさらに十分な摩擦力が付与されており、さらに確実に対象物を固定することが可能となる。
本発明の態様4の滑り止め部材によれば、前記突条部の平均ピッチが500nm以下とさらに微細な構造とされているので、前記表面にさらに十分な摩擦力を付与することができ、さらに確実に対象物を固定することが可能となる。
本発明の態様5の滑り止め部材によれば、前記突条部の平均高さが20nm以上1000nm以下の範囲内とされているので、前記表面にさらに十分な摩擦力を付与することができ、さらに確実に対象物を固定することが可能となる。
本発明の態様6の滑り止め部材によれば、前記突条部の延在方向に直交する断面が三角形状をなしていることから、突条部の先端が対象物の外形に沿って変形し易くなり、対象物をさらに確実に固定することが可能となる。
よって、高温環境下およびクリーン環境下でも安定して使用することができるとともに、対象物を十分に固定することが可能となる。
本発明の態様8の滑り止め部材によれば、前記表面における前記突起体の占有面積率が30%以上とされているので、前記表面に前記突起体によってさらに十分な摩擦力が付与されており、さらに確実に対象物を固定することが可能となる。
本発明の態様9の滑り止め部材によれば、前記突起体の前記第1方向における平均ピッチおよび前記第2方向における平均ピッチがそれぞれ500nm以下とさらに微細な構造とされているので、前記表面にさらに十分な摩擦力を付与することができ、さらに確実に対象物を固定することが可能となる。
本発明の態様10の滑り止め部材によれば、前記突起体の平均高さが20nm以上1000nm以下の範囲内とされているので、前記表面にさらに十分な摩擦力を付与することができ、さらに確実に対象物を固定することが可能となる。
本発明の態様11の滑り止め部材によれば、前記突起体が、先端が尖った尖端部を有していることから、前記突起体の先端(尖端部)が対象物の外形に沿って変形し易くなり、対象物をさらに確実に固定することが可能となる。
本発明の態様12の滑り止め部材によれば、前記尖端部が、頂部を介して互いに逆方向に傾斜した傾斜面を有することから、前記表面と対象物との接触面積が確保され、対象物をさらに確実に固定することが可能となる。
本発明の態様13の滑り止め部材によれば、前記尖端部が四角錐形状をなしていることから、前記表面と対象物との接触面積が確保され、対象物をさらに確実に固定することが可能となる。
本発明の態様14の滑り止め部材によれば、前記基材の前記表面がアルミニウム、アルミニウム合金、ニッケル、ニッケル合金、銅、銅合金、チタン、チタン合金、タングステン、タングステン合金、マグネシウム、マグネシウム合金、石英、ガラス、シリコン、酸化アルミニウム、酸化チタンのうち、少なくとも一つ以上で構成されていることから、耐熱性に特に優れており、高温環境下およびクリーン環境下でも安定して使用することができる。
本実施形態の滑り止め部材は、例えば、航空宇宙分野、半導体製造プロセス分野、医療分野等の高温環境下又はクリーン環境下で使用される把持装置、搬送装置、製造装置等において、対象物を仮固定するために用いられるものである。
第一実施形態の滑り止め部材10は、セラミックスや金属等の無機材料からなる基材11を有しており、基材11の表面の少なくとも一部に、複数の突起部が立設した突起部領域20を有している。突起部領域20は、第1方向と、この第1方向と交差する第2方向とを有している。そして、複数の突起部は、図1に示すように、前記第1方向と前記第2方向との何れか一方向に延在する複数の突条部21を形成し、突起部領域20に突条部21からなるストライプ構造が形成されている。
なお、基材11の形状やサイズに特に制限はないが、第一実施形態では、図1に示すように、板状とされており、その厚さが、例えば10μm以上10cm以下の範囲内とされている。
基材11を構成するセラミックスとしては、酸化物、窒化物、炭化物を用いることができる。セラミックスの例としては、酸化アルミニウム(アルミナ)、酸化チタン、石英を挙げることができる。
基材11を構成する無機材料は、金属であることが好ましく、銅、銅合金、アルミニウム、アルミニウム合金、NiP合金のいずれかを含むことがより好ましい。
すなわち、例えば第1方向に延在する突条部21が、第1方向と交差する第2方向において複数配置され、複数の突条部21が並列となるストライプ構造をなしている。
ここで、並列する突条部21,21の平均ピッチPが20nm以上1000nm以下の範囲内とされている。突条部21の平均ピッチPは、隣り合う突条部21,21の頂部21a,21aの間の距離の平均値である。突条部21の平均ピッチPは、SEM(走査型電子顕微鏡)で撮影されたストライプ構造の断面SEM写真から測定することができる。
なお、突条部21の平均ピッチPは、1000nm以下であることが好ましく、500nm以下であることが好ましい。また、突条部21の平均ピッチPは、20nm以上であることが好ましく、50nm以上であることが好ましい。
なお、突条部21の平均高さHは、800nm以下であることが好ましく、500nm以下であることが好ましい。また、突条部21の平均高さHは、20nm以上であることが好ましく、50nm以上であることが好ましい。
ここで、突条部21の断面形状は、二等辺三角形であることがさらに好ましい。突条部21の底角(図3のα)は、60度以上であることが好ましく、60度以上80度以下の範囲内にあることが好ましい。
突条部21の底角(図3のα)は、SEM(走査型電子顕微鏡)で撮影されたストライプ構造の断面写真にて測定される。
平均高さH/平均ピッチPが0.8以上である場合には、突条部21が対象物の外形に沿って変形しやすくなり、対象物をさらに確実に固定することが可能となる。一方、平均高さH/平均ピッチPが2.0以下である場合には、突条部21の形状の復元力が高くなり、繰り返し使用することが可能となる。
図1に示す滑り止め部材10においては、基材11の表面の約70%にストライプ構造が形成されている。
なお、基材11の表面におけるストライプ構造の占める面積率は50%以上であることが好ましく、70%以上であることが好ましい。また、基材11の表面におけるストライプ構造の占める面積率は100%以下となる。
なお、基材11の表面における静摩擦係数μは、0.30以上であることが好ましく、0.40以上であることが好ましい。なお、静摩擦係数μの上限に特に制限はないが、現実的には静摩擦係数μは10以下である。
ここで、基材11の表面における静摩擦係数μは、図4に示す式によって算出することができる。以下に式(1)~(4)として図4の式を示す。
F0=μN (1)
mgsinθ=μmgcosθ (2)
μ=mgsinθ/mgcosθ (3)
μ=sinθ/cosθ=tanθ (4)
式(1)~(4)におけるmは物体の質量、gは重力加速度、F0は最大静止摩擦力、Nは垂直抗力である。具体的には、滑り始める角度をθとしたときに、静摩擦係数μ=tanθで表される。なお、第一実施形態では、突条部21の延在方向に直交する方向、および、突条部21の延在方向に平行する方向のいずれの方法においても、静摩擦係数μが0.20以上とされている。
研磨工程S01においては、無機材料からなる基材11の表面を研磨する。基材11の研磨は、例えば、グラインダー研磨、耐水紙による研磨、バフ研磨を用いることができる。研磨後の基材11の表面は、例えば、表面粗さRaで0.02μm以下であることが好ましい。ここで、表面粗さRaは、JISB0601で示される算術平均粗さ(Ra)を言う。
切削加工方法としては、例えば、刃具を周期的に上下に移動させながら刃具を刃面に対して直交する方向に移動させて溝を形成する方法(NP法:ナノペッキング法)、刃具を上下に移動させずに直線的に移動させて溝を形成する方法(従来法)を用いることができる。
そして、基材11の表面の少なくとも一部に、第1方向と第2方向との何れか一方向に延在する複数の突条部21からなるストライプ構造が形成され、突条部21の平均ピッチPが20nm以上1000nm以下の範囲内とされており、基材11の表面における静摩擦係数μが0.20以上とされているので、対象物を十分に固定することができる。
よって、高温環境下およびクリーン環境下でも安定して使用することができるとともに、対象物を十分に固定することが可能となる。
例えば、上述の実施形態では、切削加工によってストライプ構造を形成するものとして説明したが、これに限定されることはなく、他の方法によってストライプ構造を形成したものであってもよい。
また、第一実施形態では、突条部の断面形状が三角形状をなすものとして説明したがこれに限定されることはなく、台形形状等の他の断面形状をなしていてもよい。
第二実施形態の滑り止め部材110は、セラミックスや金属等の無機材料からなる基材111を有しており、基材111の表面の少なくとも一部に、複数の突起部が立設した突起部領域120を有している。図6に示すように、複数の突起部は、第1方向と、この第1方向と交差する第2方向とに、それぞれ周期的に配置されている複数の突起体121から構成されている。
なお、基材111の形状やサイズに特に制限はないが、第二実施形態では、図6に示すように、板状とされており、その厚さが、例えば10μm以上10cm以下の範囲内とされている。
なお、後述するように、第二実施形態では、突起体121の頂部125は第2方向(Y方向)に沿って延在する構成とされていることから、第2方向(Y方向)の平均ピッチP2は、隣り合う突起体121の頂部125の中心間の距離となる。
ここで、第1方向の平均ピッチP1及び第2方向の平均ピッチP2は、例えば、SSEM(走査型電子顕微鏡)で撮影された突起部領域120の断面SEM写真から測定することができる。
尖端部122の二等辺三角形の底角(図9のα)は、SEM(走査型電子顕微鏡)で撮影された尖端部122の断面写真にて測定される。
また、突起体121(尖端部122の底面128および胴体部123)における第2方向(Y方向)の長さL2が20nm以上1500nm以下の範囲内とされていることが好ましい。
さらに、尖端部122の頂部125のY方向長さL3が10nm以上1000nm以下の範囲内とされていることが好ましい。
ここで、突起体121の第1方向(X方向)の長さL1、第2方向(Y方向)の長さL2、及び尖端部122の頂部125のY方向長さL3は、SEM(走査型電子顕微鏡)で撮影された突起体121の断面写真(ZY面及びZX面)を測定して得たものである。
なお、突起体121の平均高さHは、1500nm以下であることが好ましく、500nm以下であることが好ましい。また、突起体121の平均高さHは、20nm以上であることが好ましく、100nm以上であることが好ましい。
尖端部122の底面128および胴体部123における第2方向(Y方向)の長さL2と尖端部122の頂部125のY方向長さL3との比L3/L2は、0.4以上0.9以下の範囲内であることが好ましい。
図6に示す滑り止め部材110においては、基材111の表面の約70%に突起体121が形成されている。
なお、基材111の表面における突起体121の占める面積率は33%以上であることが好ましく、50%以上であることが好ましい。また、基材111の表面における突起体121の占める面積率は100%以下となる。
なお、基材111の表面における静摩擦係数μは、0.30以上であることが好ましく、0.40以上であることが好ましい。なお、静摩擦係数μの上限に特に制限はないが、現実的には静摩擦係数μは10以下である。
ここで、基材111の表面における静摩擦係数μは、第一実施形態と同様に、図4を参照し、式(1)~(4)を用いて算出することができる。
研磨工程S11においては、無機材料からなる基材111の表面を研磨する。基材111の研磨は、例えば、グラインダー研磨、耐水紙による研磨、バフ研磨を用いることができる。研磨後の基材111の表面は、例えば、表面粗さRaで0.02μm以下であることが好ましい。
切削加工方法としては、例えば、刃具を周期的に上下に移動させながら刃具を刃面に対して直交する方向に移動させて溝を形成する方法(NP法:ナノペッキング法)、刃具を上下に移動させずに直線的に移動させて溝を形成する方法(従来法)を用いることができる。
エッチング処理方法としては、無機材料のエッチング処理方法として利用されている各種の方法を用いることができる。
そして、基材111の表面の少なくとも一部に、複数の突起部が立設した突起部領域120を有している。複数の突起部は、第1方向と、この第1方向と交差する第2方向とに、それぞれ周期的に配置されている複数の突起体121から構成されており、突起体121の第1方向における平均ピッチP1および第2方向における平均ピッチP2が20nm以上1000nm以下の範囲内とされており、表面における静摩擦係数μが0.20以上とされているので、この表面の摩擦力によって対象物を十分に固定することができる。
よって、高温環境下およびクリーン環境下でも安定して使用することができるとともに、対象物を十分に固定することが可能となる。
例えば、第二実施形態の変形例を図12~図15に示す。図12から図15に示す滑り止め部材210のように、基材211の表面に複数の突起体221が立設した突起部領域220が形成されており、突起体221が尖端部222を有し、この尖端部222が四角錐形状をなすものとしてもよい。
ここで、突起体221の第1方向における平均ピッチP1および第2方向における平均ピッチP2が20nm以上1000nm以下の範囲内とされている。なお、平均ピッチP1,P2は、突起体221の頂点225同士の距離となる。
また、尖端部222を構成する傾斜面226a,226b,226c、226dは、それぞれ同じ二等辺三角形であることが好ましい。底面228は正方形であることが好ましい。尖端部222の第1方向又は第2方向の断面における二等辺三角形の底角(図14のα)は60度以上であることが好ましい。
さらに、第二実施形態では、切削加工およびエッチング工程によって突起体221を形成するものとして説明したが、これに限定されることはなく、他の方法によって突起体221を形成したものであってもよい。
まず、表1に示す無機材料からなる基材(縦:10mm、横:10mm、板厚:1mm)を用意した。
用意した基材の表面に対して研磨加工を行い、表面粗さRaが0.02μm以下の平滑面とした。
ここで、ストライプ構造を構成する突条部の平均ピッチP、平均高さH、P/H、表面におけるストライプ構造の占める面積率を、表1に示すものとした。
ストライプ構造の占める面積率は、SEM(走査型電子顕微鏡)でストライプ構造を有する基材の平面写真を撮影し、隣り合う突条部の頂部の間の距離(ピッチ)が平均ピッチPから-10%~+10%の範囲であって、その突条部21が3本以上連続して繰り返される範囲の面積を求め、これを基材表面の面積で除して得た。
300mmの円板状のシリコンウエハSを準備した。なお、シリコンウエハSの表面粗さRaは0.14nmとした。図16A~図16Cに示すように、シリコンウエハSの中心から140mmの径方向位置で周方向に120°間隔で3つの滑り止め部材10を配置し、固定板Qの上に載置した。
なお、ストライプ構造が形成された表面がシリコンウエハS側を向くように、滑り止め部材10を配置した。また、質量128gのシリコンウエハを用いることで、積層方向の荷重を43g/cm2とした。
なお、表1において、シリコンウエハSの径方向とストライプ構造の突条部の延在方向とが平行な場合を「平行」とし、シリコンウエハSの径方向とストライプ構造の突条部の延在方向とが直交する場合を「直交」とした。
比較例2においては、ストライプ構造の突条部の平均ピッチPが10nmとされており、静摩擦係数が0.17(平行)、0.17(直交)となり、表面の摩擦力が不十分となった。
また、本発明例8,9では、基材を石英で構成されたものとしたが、表面に突条部の平均ピッチPが20nm以上1000nm以下のストライプ構造を形成することができ、ストライプ構造の占める面積率が30%以上確保されており、静摩擦係数が0.99(平行)以上、0.76(直交)以上となった。
まず、表2に示す無機材料からなる基材(縦:10mm、横:10mm、板厚:1mm)を用意した。
用意した基材の表面に対して研磨加工を行い、表面粗さRaが0.02μm以下の平滑面とした。
ここで、突起部領域を構成する突起体の第1方向の平均ピッチP1、突起体の平均高さH、尖端部の高さH1、突起体の第1方向の平均ピッチP1と突起体の平均高さHとの比H/P1、突起体の第2方向の平均ピッチP2と突起体の平均高さHとの比H/P2、突起体の底面の第1方向長さL1、突起体の底面の第2方向長さL2、頂部の第2方向長さL3、突起体の底面の第2方向長さL2と頂部の第2方向長さL3との比L3/L2、表面における突起体が占める面積率(占有面積率)を、表2に示すものとした。
突起体の平均高さH、及び尖端部の高さH1は、突起体の断面写真(ZY面)をSEM(走査型電子顕微鏡)で撮影し、突起体の頂部からの高さを、それぞれ10箇所で測定し、その平均値を表2に示した。
突起体の底面の第1方向(X方向)の長さL1、突起体の底面の第2方向(Y方向)の長さL2、突起体の頂部の第2方向(Y方向)の長さL3は、突起体の断面(ZY面及びZX面)の写真をSEM(走査型電子顕微鏡)で撮影し、それぞれ10箇所で測定し、その平均値を表2に示した。
突起体が占める面積率は、SEM(走査型電子顕微鏡)で突起体を有する基材の平面写真を撮影し、本発明の構成を満たす突起体が観察される範囲の面積を求め、これを基材表面の面積で除して得た。
300mmの円板状のシリコンウエハSを準備した。図16A~図16Cに示すように、シリコンウエハSの中心から140mmの径方向位置で周方向に120°間隔で3つの滑り止め部材10を配置し、固定板Qの上に載置した。
なお、突起体領域が形成された表面がシリコンウエハS側を向くように、滑り止め部材10を配置した。また、質量128gのシリコンウエハを用いることで、積層方向の荷重を43g/cm2とした。
11、111,211 基材
20、120,220 突起部領域(突起体領域)
21 突条部
121,221 突起体
122,222 尖端部
123,223 胴体部
Claims (14)
- 無機材料からなる基材の表面の少なくとも一部に、複数の突起部が立設した突起部領域を有しており、
前記突起部領域が、第1方向と、この第1方向と交差する第2方向とを有し、
前記複数の突起部は、前記第1方向と前記第2方向との少なくとも一方向において、周期的に配置されており、
前記複数の突起部の、前記第1方向及び/又は前記第2方向における平均ピッチが20nm以上1000nm以下の範囲内とされており、
前記表面における静摩擦係数が0.20以上とされていることを特徴とする滑り止め部材。 - 前記複数の突起部が、前記第1方向又は前記第2方向に延在する複数の突条部からなるストライプ構造を形成しており、前記突条部の平均ピッチが20nm以上1000nm以下の範囲内とされていることを特徴とする請求項1に記載の滑り止め部材。
- 前記基材の表面における前記ストライプ構造の占有面積率が30%以上であることを特徴とする請求項2に記載の滑り止め部材。
- 前記突条部の平均ピッチが500nm以下とされていることを特徴とする請求項2または請求項3に記載の滑り止め部材。
- 前記突条部の平均高さが20nm以上1000nm以下の範囲内とされていることを特徴とする請求項2または請求項3に記載の滑り止め部材。
- 前記突条部の延在方向に直交する断面が三角形状をなすことを特徴とする請求項2または請求項3に記載の滑り止め部材。
- 前記複数の突起部が、前記第1方向と、前記第2方向とに、それぞれ周期的に配置されている複数の突起体から構成されており、
前記突起体の前記第1方向における平均ピッチおよび前記第2方向における平均ピッチが20nm以上1000nm以下の範囲内とされていることを特徴とする請求項1に記載の滑り止め部材。 - 前記基材の表面における前記突起体の占有面積率が30%以上であることを特徴とする請求項7に記載の滑り止め部材。
- 前記突起体の前記第1方向における平均ピッチおよび前記第2方向における平均ピッチが500nm以下とされていることを特徴とする請求項7または請求項8に記載の滑り止め部材。
- 前記突起体の平均高さが20nm以上1000nm以下の範囲内とされていることを特徴とする請求項7または請求項8に記載の滑り止め部材。
- 前記突起体は、先端が尖った尖端部を有していることを特徴とする請求項7または請求項8に記載の滑り止め部材。
- 前記尖端部は、頂部を介して互いに逆方向に傾斜した傾斜面を有することを特徴とする請求項11に記載の滑り止め部材。
- 前記尖端部は、四角錐形状をなしていることを特徴とする請求項11に記載の滑り止め部材。
- 前記基材の前記表面が、アルミニウム、アルミニウム合金、ニッケル、ニッケル合金、銅、銅合金、チタン、チタン合金、タングステン、タングステン合金、マグネシウム、マグネシウム合金、石英、ガラス、シリコン、酸化アルミニウム、酸化チタンのうち、少なくとも一つ以上で構成されていることを特徴とする請求項1に記載の滑り止め部材。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020247042638A KR20250027667A (ko) | 2022-06-29 | 2023-06-27 | 미끄럼 방지 부재 |
| CN202380049459.8A CN119422238A (zh) | 2022-06-29 | 2023-06-27 | 防滑部件 |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022104569A JP2024004760A (ja) | 2022-06-29 | 2022-06-29 | 滑り止め部材 |
| JP2022104578A JP2024004765A (ja) | 2022-06-29 | 2022-06-29 | 滑り止め部材 |
| JP2022-104569 | 2022-06-29 | ||
| JP2022-104578 | 2022-06-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2024005014A1 true WO2024005014A1 (ja) | 2024-01-04 |
Family
ID=89383077
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2023/023805 Ceased WO2024005014A1 (ja) | 2022-06-29 | 2023-06-27 | 滑り止め部材 |
Country Status (4)
| Country | Link |
|---|---|
| KR (1) | KR20250027667A (ja) |
| CN (1) | CN119422238A (ja) |
| TW (1) | TW202421440A (ja) |
| WO (1) | WO2024005014A1 (ja) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004200436A (ja) * | 2002-12-19 | 2004-07-15 | Toshiba Ceramics Co Ltd | サセプタ及びその製造方法 |
| JP2005015110A (ja) * | 2003-06-24 | 2005-01-20 | Kyocera Corp | セラミックス滑り止め具およびその製造方法 |
| JP2019155457A (ja) * | 2018-03-16 | 2019-09-19 | キヤノンマシナリー株式会社 | 撥水性物品の製造方法およびレーザ加工装置 |
| EP3561193A1 (en) * | 2018-04-24 | 2019-10-30 | Juan Vicente Martinez Sola | Reversible ceramic piece having two sides with different finish for paving |
| WO2020051217A1 (en) * | 2018-09-06 | 2020-03-12 | Heraeus Gmsi Llc | Susceptor and method for manufacturing the same |
| JP2021077033A (ja) * | 2019-11-07 | 2021-05-20 | 日本電気硝子株式会社 | 入力装置用ガラスフィルム |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI456683B (zh) | 2007-06-29 | 2014-10-11 | 愛發科股份有限公司 | 基板搬送機器人 |
| JP2009168860A (ja) | 2008-01-10 | 2009-07-30 | Olympus Corp | 基板用ステージ装置 |
| JP6426685B2 (ja) | 2016-12-16 | 2018-11-21 | ファナック株式会社 | ロボットに取り付けられる把持装置 |
-
2023
- 2023-06-27 WO PCT/JP2023/023805 patent/WO2024005014A1/ja not_active Ceased
- 2023-06-27 KR KR1020247042638A patent/KR20250027667A/ko active Pending
- 2023-06-27 CN CN202380049459.8A patent/CN119422238A/zh active Pending
- 2023-06-28 TW TW112124073A patent/TW202421440A/zh unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004200436A (ja) * | 2002-12-19 | 2004-07-15 | Toshiba Ceramics Co Ltd | サセプタ及びその製造方法 |
| JP2005015110A (ja) * | 2003-06-24 | 2005-01-20 | Kyocera Corp | セラミックス滑り止め具およびその製造方法 |
| JP2019155457A (ja) * | 2018-03-16 | 2019-09-19 | キヤノンマシナリー株式会社 | 撥水性物品の製造方法およびレーザ加工装置 |
| EP3561193A1 (en) * | 2018-04-24 | 2019-10-30 | Juan Vicente Martinez Sola | Reversible ceramic piece having two sides with different finish for paving |
| WO2020051217A1 (en) * | 2018-09-06 | 2020-03-12 | Heraeus Gmsi Llc | Susceptor and method for manufacturing the same |
| JP2021077033A (ja) * | 2019-11-07 | 2021-05-20 | 日本電気硝子株式会社 | 入力装置用ガラスフィルム |
Also Published As
| Publication number | Publication date |
|---|---|
| CN119422238A (zh) | 2025-02-11 |
| KR20250027667A (ko) | 2025-02-27 |
| TW202421440A (zh) | 2024-06-01 |
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