WO2020170069A1 - エラー検出機能を有する記憶装置、半導体装置、および、電子機器 - Google Patents
エラー検出機能を有する記憶装置、半導体装置、および、電子機器 Download PDFInfo
- Publication number
- WO2020170069A1 WO2020170069A1 PCT/IB2020/051043 IB2020051043W WO2020170069A1 WO 2020170069 A1 WO2020170069 A1 WO 2020170069A1 IB 2020051043 W IB2020051043 W IB 2020051043W WO 2020170069 A1 WO2020170069 A1 WO 2020170069A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- insulator
- oxide
- transistor
- conductor
- layer
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 180
- 238000003860 storage Methods 0.000 title claims abstract description 71
- 230000015654 memory Effects 0.000 claims abstract description 129
- 239000000758 substrate Substances 0.000 claims abstract description 70
- 229910044991 metal oxide Inorganic materials 0.000 claims description 77
- 150000004706 metal oxides Chemical class 0.000 claims description 67
- 238000001514 detection method Methods 0.000 claims description 46
- 230000015572 biosynthetic process Effects 0.000 claims description 38
- 230000006870 function Effects 0.000 abstract description 124
- 230000002093 peripheral effect Effects 0.000 abstract description 13
- 239000010409 thin film Substances 0.000 abstract description 5
- 239000012212 insulator Substances 0.000 description 411
- 239000004020 conductor Substances 0.000 description 323
- 239000010410 layer Substances 0.000 description 259
- 229910052760 oxygen Inorganic materials 0.000 description 92
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 90
- 239000001301 oxygen Substances 0.000 description 90
- 229910052739 hydrogen Inorganic materials 0.000 description 86
- 239000001257 hydrogen Substances 0.000 description 86
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 79
- 239000000463 material Substances 0.000 description 55
- 239000010408 film Substances 0.000 description 53
- 239000003990 capacitor Substances 0.000 description 48
- 239000012535 impurity Substances 0.000 description 48
- 229910052581 Si3N4 Inorganic materials 0.000 description 39
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 39
- 239000011701 zinc Substances 0.000 description 37
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 36
- 239000013078 crystal Substances 0.000 description 34
- 238000010586 diagram Methods 0.000 description 33
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 31
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 29
- 229910052710 silicon Inorganic materials 0.000 description 29
- 239000010703 silicon Substances 0.000 description 29
- 238000009792 diffusion process Methods 0.000 description 27
- 229910052782 aluminium Inorganic materials 0.000 description 26
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical group [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 26
- 239000000203 mixture Substances 0.000 description 24
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical group [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 22
- 125000004429 atom Chemical group 0.000 description 22
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 20
- 229910001868 water Inorganic materials 0.000 description 20
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 18
- 229910052735 hafnium Inorganic materials 0.000 description 17
- 238000010438 heat treatment Methods 0.000 description 17
- 238000004519 manufacturing process Methods 0.000 description 17
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 17
- 229910001928 zirconium oxide Inorganic materials 0.000 description 17
- 229910052757 nitrogen Inorganic materials 0.000 description 16
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 14
- 229910052733 gallium Inorganic materials 0.000 description 14
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 14
- 229910000449 hafnium oxide Inorganic materials 0.000 description 14
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 14
- 229910052738 indium Inorganic materials 0.000 description 14
- 229910052751 metal Inorganic materials 0.000 description 14
- 229910052814 silicon oxide Inorganic materials 0.000 description 14
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical group [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 13
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical group [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 13
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 13
- 239000002184 metal Substances 0.000 description 13
- 229910052719 titanium Inorganic materials 0.000 description 13
- 239000010936 titanium Chemical group 0.000 description 13
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 13
- 229910052721 tungsten Inorganic materials 0.000 description 13
- 239000010937 tungsten Substances 0.000 description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 12
- 229910052715 tantalum Inorganic materials 0.000 description 12
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 12
- 230000007547 defect Effects 0.000 description 11
- 229910052759 nickel Inorganic materials 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 10
- 239000010949 copper Chemical group 0.000 description 10
- 229910052727 yttrium Inorganic materials 0.000 description 9
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical group [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 9
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical group [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 8
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 8
- 230000004888 barrier function Effects 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 8
- 150000002431 hydrogen Chemical class 0.000 description 8
- 229910052746 lanthanum Inorganic materials 0.000 description 8
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical group [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 239000002356 single layer Substances 0.000 description 8
- 229910052718 tin Inorganic materials 0.000 description 8
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 7
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical group [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 7
- 229910052732 germanium Inorganic materials 0.000 description 7
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 7
- -1 hafnium aluminate Chemical class 0.000 description 7
- 229910052742 iron Inorganic materials 0.000 description 7
- 229910052749 magnesium Inorganic materials 0.000 description 7
- 239000011777 magnesium Substances 0.000 description 7
- 229910052707 ruthenium Inorganic materials 0.000 description 7
- 238000007789 sealing Methods 0.000 description 7
- 238000001228 spectrum Methods 0.000 description 7
- 238000004544 sputter deposition Methods 0.000 description 7
- 229910052726 zirconium Inorganic materials 0.000 description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical group [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 6
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 6
- 230000009471 action Effects 0.000 description 6
- 229910052783 alkali metal Inorganic materials 0.000 description 6
- 150000001340 alkali metals Chemical class 0.000 description 6
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 6
- 150000001342 alkaline earth metals Chemical class 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 239000011733 molybdenum Chemical group 0.000 description 6
- 150000004767 nitrides Chemical class 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 229910052720 vanadium Inorganic materials 0.000 description 6
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical group [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 5
- 229910052684 Cerium Inorganic materials 0.000 description 5
- 229910052779 Neodymium Inorganic materials 0.000 description 5
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 5
- 229910052790 beryllium Inorganic materials 0.000 description 5
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical group [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 5
- 229910052796 boron Inorganic materials 0.000 description 5
- 239000000969 carrier Substances 0.000 description 5
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical group [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 239000000470 constituent Substances 0.000 description 5
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 5
- 229910001195 gallium oxide Inorganic materials 0.000 description 5
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 5
- 239000002159 nanocrystal Substances 0.000 description 5
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 5
- 238000007254 oxidation reaction Methods 0.000 description 5
- 125000004430 oxygen atom Chemical group O* 0.000 description 5
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 5
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical group [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 5
- 229910052725 zinc Inorganic materials 0.000 description 5
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 230000005669 field effect Effects 0.000 description 4
- 239000011810 insulating material Substances 0.000 description 4
- 230000035699 permeability Effects 0.000 description 4
- 229910001925 ruthenium oxide Inorganic materials 0.000 description 4
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 4
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000003795 desorption Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 229910003437 indium oxide Inorganic materials 0.000 description 3
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 239000012466 permeate Substances 0.000 description 3
- 230000005236 sound signal Effects 0.000 description 3
- 229910052712 strontium Inorganic materials 0.000 description 3
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 3
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 3
- 229910001930 tungsten oxide Inorganic materials 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000005247 gettering Methods 0.000 description 2
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 125000004433 nitrogen atom Chemical group N* 0.000 description 2
- 230000001151 other effect Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 2
- 229910019311 (Ba,Sr)TiO Inorganic materials 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 206010021143 Hypoxia Diseases 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 229910000416 bismuth oxide Inorganic materials 0.000 description 1
- 229910052800 carbon group element Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000010893 electron trap Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000004868 gas analysis Methods 0.000 description 1
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 239000011156 metal matrix composite Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 229910000484 niobium oxide Inorganic materials 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000011295 pitch Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/12015—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising clock generation or timing circuitry
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/025—Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B99/00—Subject matter not provided for in other groups of this subclass
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4097—Bit-line organisation, e.g. bit-line layout, folded bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0403—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals during or with feedback to manufacture
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0411—Online error correction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/70—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates the floating gate being an electrode shared by two or more components
Definitions
- One embodiment of the present invention relates to a storage device.
- the present invention relates to a memory device that can function by utilizing semiconductor characteristics.
- a semiconductor device refers to a device utilizing semiconductor characteristics, for example, a circuit including a semiconductor element (a transistor, a diode, a photodiode, or the like), a device including the circuit, or the like.
- a semiconductor device refers to all devices that can function by utilizing semiconductor characteristics, such as an integrated circuit, a chip including an integrated circuit, or an electronic device in which a chip is housed in a package. Electronic equipment including components and integrated circuits is an example of a semiconductor device.
- one embodiment of the present invention is not limited to the above technical field.
- the technical field of the invention disclosed in this specification and the like relates to an object, a method, or a manufacturing method.
- one embodiment of the present invention relates to a process, a machine, a manufacture, or a composition (composition of matter).
- a DRAM Dynamic Random Access Memory
- a memory cell of a DRAM is composed of one transistor and one capacitor, and the DRAM is a memory that stores data by accumulating charges in the capacitor.
- a memory device such as a DRAM may have an error in data stored in a memory cell due to the influence of cosmic rays or the like even if there is no abnormality in operation. Therefore, there is a storage device called an ECC (Error Check and Correct) memory having an error detection and correction function.
- ECC Error Check and Correct
- the ECC memory is used, for example, in electronic devices such as computers used in scientific and technological calculations and financial institutions where data errors cannot be tolerated.
- a transistor including a metal oxide also referred to as an oxide semiconductor transistor or an OS transistor
- a metal oxide also referred to as an oxide semiconductor transistor or an OS transistor
- a region where a channel of a transistor is formed also referred to as a channel formation region.
- an In-Ga-Zn oxide also referred to as IGZO or an izou
- an OS transistor has a very small drain current (also referred to as off current) when the transistor is in an off state (see, for example, Non-Patent Documents 1 and 2)
- the OS transistor can be used for a memory cell of a DRAM.
- the charge accumulated in the capacitor can be retained for a long time.
- the OS transistor is a thin film transistor, it can be stacked.
- a peripheral circuit of a DRAM is configured by using transistors formed on a semiconductor substrate, and a plurality of layers having DRAM memory cells configured by using OS transistors are stacked above the peripheral circuit. Is disclosed. By stacking a plurality of layers each having a DRAM memory cell, the chip area of the DRAM can be reduced.
- a DRAM in which an OS transistor is used as a memory cell is referred to as an oxide semiconductor DRAM or DOSRAM (registered trademark, which refers to Dynamic Oxide Semiconductor Random Access Memory, which is read as a doslam).
- DOSRAM registered trademark, which refers to Dynamic Oxide Semiconductor Random Access Memory, which is read as a doslam.
- an ECC memory controls a storage area for storing data, a storage area for storing an error detection code or an error correction code (also referred to as a redundant bit or a check bit), and the two storage areas. And a memory controller. Then, the ECC memory, when storing (also referred to as writing) data, calculates a check bit corresponding to the data to be stored, and stores the check bit together with the data to be stored.
- the check bit is read together with the data when reading the stored data.
- the ECC memory can know whether or not an error has occurred in the stored data by verifying the read data using the check bit. Alternatively, if an error has occurred in the stored data, the ECC memory can correct it using the check bit.
- At least the ECC memory needs a storage area for storing the check bit and a memory controller for controlling the storage area in addition to the memory that is not the ECC memory.
- One embodiment of the present invention provides a storage device having an error detection function (a storage area for storing a check bit and a function of knowing whether or not an error has occurred in data stored by using the check bit). This is one of the challenges.
- Another object of one embodiment of the present invention is to provide a memory device having an error detection function and capable of storing a large amount of data per unit area.
- one embodiment of the present invention does not necessarily need to solve all of the above problems and may be at least one that can be solved. Further, the above description of the problems does not prevent the existence of other problems. Problems other than these are obvious from the description of the specification, claims, drawings, etc., and problems other than these can be extracted from the description of the specification, claims, drawings, etc. It is possible.
- One embodiment of the present invention is a memory device including a first element layer having a memory cell, a second element layer having an error detection circuit, and a semiconductor substrate having a driver circuit.
- the second element layer is provided between the semiconductor substrate and the first element layer.
- one embodiment of the present invention is a memory device including a plurality of first element layers, a second element layer having an error detection circuit, and a semiconductor substrate having a driver circuit.
- the second element layer is provided between the semiconductor substrate and the first element layer, the plurality of first element layers each have a memory cell, and the plurality of first element layers are provided in a stacked manner.
- the transistor included in the memory cell and the transistor included in the error detection circuit each include a metal oxide in the channel formation region.
- the transistor included in the memory cell and the transistor included in the error detection circuit each include a front gate and a back gate.
- the transistor included in the memory cell and the transistor included in the error detection circuit each include a metal oxide in a channel formation region to form a transistor included in the memory cell and an error detection circuit.
- Each of the constituent transistors has a front gate and a back gate.
- one embodiment of the present invention is a memory device including first to N-th first element layers (N is a natural number of 2 or more), a second element layer, and a semiconductor substrate.
- a memory cell is formed in the Kth (K is an integer of 1 or more and N or less) first element layer by using the transistor formed in the Kth first element layer, and the second element layer is formed of the first element layer.
- An error detection circuit is formed using the transistors formed in the two-element layer, and a drive circuit is formed on the semiconductor substrate using the transistors formed in the semiconductor substrate.
- the second element layer is provided so as to be laminated above the semiconductor substrate, the first first element layer is provided so as to be laminated above the second element layer, and the L-th (L is an integer of 2 or more and N or less). ), the first element layer of (1) is laminated and provided above the (L-1)th first element layer.
- the transistor formed in the K-th first element layer and the transistor formed in the second element layer each include a metal oxide in the channel formation region.
- the transistor formed in the Kth first element layer and the transistor formed in the second element layer each have a front gate and a back gate.
- the transistor formed in the K-th first element layer and the transistor formed in the second element layer each include a metal oxide in a channel formation region
- the transistor formed in the element layer and the transistor formed in the second element layer each have a front gate and a back gate.
- a storage device having an error detection function can be provided.
- a memory device having an error detection function and having a large amount of data that can be stored per unit area can be provided.
- FIG. 1A is a block diagram illustrating a configuration example of a storage device.
- FIG. 1B is a schematic diagram illustrating a configuration example of a storage device.
- FIG. 2 is a schematic diagram showing a configuration example of the storage device.
- FIG. 3 is a circuit diagram showing a configuration example of a memory device.
- FIG. 4 is a schematic diagram showing a configuration example of the storage device.
- 5A and 5B are schematic diagrams showing a configuration example of a storage device.
- FIG. 6A is a circuit diagram showing a configuration example of the check bit generation circuit.
- FIG. 6B is a timing chart.
- FIG. 6C is a truth table.
- FIG. 7A is a circuit diagram showing a configuration example of the error detection circuit.
- FIG. 7B is a timing chart.
- FIG. 9A is a symbol representing an XOR circuit.
- FIG. 9B is a circuit diagram showing a configuration example of the XOR circuit.
- FIG. 9C is a timing chart.
- FIG. 9D is a truth table.
- FIG. 10A is a symbol representing a NAND circuit.
- FIG. 10B is a circuit diagram showing a configuration example of a NAND circuit.
- FIG. 10C is a timing chart.
- FIG. 10D is a truth table.
- FIG. 11A is a symbol representing a delay circuit.
- FIG. 11B is a circuit diagram showing a configuration example of the delay circuit.
- FIG. 11C is a timing chart.
- FIG. 11D is a truth table.
- FIG. 12 is a schematic diagram showing a configuration example of a storage device.
- FIG. 13 is a schematic sectional view showing a configuration example of a storage device.
- 14A and 14B are schematic cross-sectional views each illustrating a structural example of a transistor.
- 15A to 15C are schematic cross-sectional views each illustrating a structural example of a memory device.
- FIG. 16 is a schematic sectional view showing a configuration example of a storage device.
- FIG. 17 is a schematic sectional view showing a configuration example of a storage device.
- FIG. 18A is a top view showing a configuration example of a storage device.
- 18B and 18C are schematic cross-sectional views showing a configuration example of the storage device.
- FIG. 19A is a diagram illustrating classification of crystal structures of IGZO.
- FIG. 19A is a diagram illustrating classification of crystal structures of IGZO.
- 19B is a diagram illustrating an XRD spectrum of quartz glass.
- FIG. 19C is a diagram illustrating an XRD spectrum of crystalline IGZO.
- 20A and 20B are schematic diagrams illustrating an example of an electronic component.
- FIG. 21 is a diagram illustrating an example of an electronic device.
- FIG. 22 is a diagram showing various storage devices layer by layer.
- film and the term “layer” can be interchanged with each other.
- conductive layer to the term “conductive film”.
- insulating film to the term “insulating layer”.
- gate electrode on the gate insulating layer does not exclude one including another component between the gate insulating layer and the gate electrode.
- the reference numerals are “_1”, “_2”, “[n]”, “[m, n]” or the like, and may be attached with a code for identification.
- the second wiring GL is referred to as a wiring GL[2].
- the term “electrically connected” includes the case of being connected through “an object having some electrical action”.
- the “object having some kind of electrical action” is not particularly limited as long as it can transfer an electric signal between the connection targets.
- things having some kind of electrical action include electrodes and wirings, switching elements such as transistors, resistance elements, inductors, capacitance elements, and elements having various other functions.
- switching elements such as transistors, resistance elements, inductors, capacitance elements, and elements having various other functions.
- electrode and “wiring” do not functionally limit these components.
- electrode may be used as part of “wiring” and vice versa.
- a “terminal” in an electric circuit refers to a portion where input or output of current or potential and reception (or transmission) of a signal are performed. Therefore, part of the wiring or the electrode may function as a terminal.
- capacitor has a structure in which two electrodes face each other via an insulator (dielectric).
- the term “capacitance element” includes the above-mentioned “capacitance”. That is, in this specification and the like, the term “capacitance element” means that two electrodes face each other through an insulator, that two wirings face each other through an insulator, or The case where two wires are arranged via an insulator is included.
- the term “voltage” often refers to a potential difference between a certain potential and a reference potential (eg, a ground potential). Therefore, the voltage and the potential difference can be rephrased.
- a transistor is an element having at least three terminals including a gate, a drain, and a source.
- a channel formation region is provided between the drain (drain terminal, drain region, or drain electrode) and the source (source terminal, source region, or source electrode), and the source and drain are connected via the channel formation region. An electric current can flow between them.
- a channel formation region refers to a region in which a current mainly flows.
- the functions of the source and the drain may be switched when a transistor of different polarity is used or when the direction of current changes in circuit operation. Therefore, in this specification and the like, the terms “source” and “drain” can be interchanged.
- off-state current refers to drain current when a transistor is in an off state (also referred to as a non-conducting state or a blocking state).
- the off state is a state in which the gate voltage Vgs with respect to the source is lower than the threshold voltage Vth in the n-channel transistor and the gate voltage Vgs with respect to the source in the p-channel transistor. It is a state higher than the threshold voltage Vth. That is, the off-state current of the n-channel transistor may be a drain current when the gate voltage Vgs with respect to the source is lower than the threshold voltage Vth.
- off-state current may refer to the source current when the transistor is off. Further, it may be called leak current in the same meaning as off current. In this specification and the like, off-state current may refer to current flowing between a source and a drain when a transistor is in an off state.
- the on-state current may refer to a current flowing between a source and a drain when the transistor is in an on state (also referred to as a conductive state).
- a metal oxide is a metal oxide in a broad sense. Metal oxides are classified into oxide insulators, oxide conductors (including transparent oxide conductors), oxide semiconductors, and the like.
- the metal oxide when a metal oxide is used for a channel formation region of a transistor, the metal oxide may be referred to as an oxide semiconductor. That is, when the metal oxide has at least one of an amplifying action, a rectifying action, and a switching action, the metal oxide can be called a metal oxide semiconductor. That is, a transistor including a metal oxide in a channel formation region can be referred to as an “oxide semiconductor transistor” or an “OS transistor”.
- a metal oxide containing nitrogen may also be referred to as a metal oxide. Further, the metal oxide containing nitrogen may be referred to as a metal oxynitride. Details of the metal oxide will be described later.
- a memory device of one embodiment of the present invention is a memory device that can function by utilizing semiconductor characteristics and is also called a memory.
- a memory device has a structure in which a plurality of layers including an OS transistor is stacked over a layer including a transistor formed over a semiconductor substrate.
- the OS transistor has a property that off current is extremely small.
- FIG. 1A is a block diagram showing a configuration example of a storage device 10A, which is an embodiment of the present invention. Note that in the drawings described in this specification and the like, main signal flows are illustrated by arrows or lines, and power supply lines and the like may be omitted.
- the memory device 10A has a peripheral circuit 20 and a memory cell array 30.
- the peripheral circuit 20 has an element layer 26 in which a precharge circuit 24, a sense amplifier 25, a check bit generation circuit 54, an error detection circuit 55, and a switch circuit 23 are provided (FIG. 3). reference).
- the row driver 21 has a function of outputting a signal for driving the memory cell array 30 to the word line WL. Specifically, the row driver 21 has a function of outputting a word signal to the word line WL (WL_1 and WL_N are illustrated in FIG. 1A, N is a natural number of 2 or more).
- the row driver 21 may be called a word line drive circuit.
- the row driver 21 includes a decoder circuit for selecting the word line WL corresponding to the designated address, a buffer circuit, and the like.
- the word line WL may be simply referred to as a wiring.
- the column driver 22 has a function of outputting a signal for driving the memory cell array 30 to the bit line BL. Specifically, the column driver 22 has a function of outputting a data signal to the bit line BL (BL_1 and BL_2 are shown in FIG. 1A).
- the column driver 22 may be called a bit line drive circuit.
- the column driver 22 includes a decoder circuit for selecting a bit line according to a designated address.
- the bit line BL may be simply referred to as a wiring.
- the bit line BL may be illustrated as a thick line or a thick dotted line in order to improve visibility.
- the data signal applied to the bit line BL corresponds to a signal written in the memory cell or a signal read from the memory cell.
- the data signal is described as a binary signal having a high-level potential or a low-level potential corresponding to data 1 or data 0 (also referred to as data High or data Low, data H or data L).
- the high-level potential is the potential VDD
- the low-level potential is the potential VSS or the ground potential (GND). It should be noted that the data signal may be multivalued with three or more values.
- the signal applied to the bit line BL includes a precharge potential for reading data.
- the precharge potential can be VDD/2, for example.
- the memory cell array 30 includes, for example, N layer (N is a natural number of 2 or more) element layers 34_1 to 34_N.
- the element layer 34_1 includes one or more memory cells 31_1.
- the memory cell 31_1 includes the transistor 32_1 and the capacitor 33_1.
- the element layer 34_N includes one or more memory cells 31_N.
- the memory cell 31_N includes a transistor 32_N and a capacitor 33_N.
- a capacitor may be called a capacitance or a capacitive element.
- the element layer is a layer in which elements such as capacitors and transistors are provided, and is a layer including members such as a conductor, a semiconductor, and an insulator.
- the transistors 32_1 to 32_N serve as switches whose conduction state (also referred to as ON or ON state) or non-conduction state (also referred to as OFF or OFF state) is controlled in accordance with a word signal supplied to the word lines WL_1 to WL_N. Function.
- one of a source and a drain is connected to any one of the bit lines BL.
- the transistors 32_1 to 32_N are preferably transistors having a metal oxide in a channel formation region (hereinafter referred to as OS transistors).
- OS transistors transistors having a metal oxide in a channel formation region
- off current leakage current flowing between a source and a drain
- the charge corresponding to a desired potential can be held in the capacitors 33_1 to 33_N which are electrically connected to the other of the sources and the drains of the transistors 32_1 to 32_N.
- the storage device 10A can reduce the frequency of data refresh and achieve low power consumption.
- data can be rewritten and read by charging or discharging electric charge, so that data can be written and read virtually unlimited times.
- the memory cells 31_1 to 31_N using the OS transistors have excellent rewriting resistance because they do not involve structural changes at the atomic level unlike magnetic memories or resistance change type memories. Further, in the memory cells 31_1 to 31_N including the OS transistors, instability due to an increase in electron trap centers due to repeated rewriting operations, which is found in a flash memory, is not recognized.
- the memory cells 31_1 to 31_N each including an OS transistor can be provided over a silicon substrate in which a transistor including silicon (hereinafter referred to as a Si transistor) is formed in a channel formation region. Therefore, integration can be easily performed. Further, the OS transistor can be manufactured at low cost because it can be manufactured using a manufacturing apparatus similar to that of the Si transistor.
- the OS transistor can be a four-terminal semiconductor element including a back gate electrode in addition to a gate electrode, a source electrode, and a drain electrode. It is possible to form an electric circuit network in which input/output of signals flowing between the source and the drain can be independently controlled according to the potential applied to the gate electrode or the back gate electrode. Therefore, it is possible to design a circuit with the same idea as an LSI (Large Scale Integration).
- LSI Large Scale Integration
- the OS transistor has better electrical characteristics than the Si transistor in a high temperature environment. Specifically, even at a high temperature of 125° C. or higher and 150° C. or lower, the ratio of the on-current to the off-current is large, and good switching operation can be performed.
- the storage device 10A shown in FIG. 1A can be called a DOSRAM (Dynamic Oxide Semiconductor Random Access Memory) using an OS transistor as a memory cell. Since the memory cell can be composed of one transistor and one capacitor, a high-density memory that can store a large amount of data can be realized. Further, by using the OS transistor, data retention time can be extended.
- DOSRAM Dynamic Oxide Semiconductor Random Access Memory
- Each of the capacitors 33_1 to 33_N has a structure in which an insulator is sandwiched between conductors serving as electrodes. Note that as a conductor forming the electrode, a metal, a semiconductor having conductivity, or the like can be used. Further, the details of the arrangement of the capacitors 33_1 to 33_N will be described later. In addition to the structure of arranging the capacitors 33_1 to 33_N at an overlapping position above or below the transistors 32_1 to 32_N, a part of a semiconductor layer or electrodes forming the transistors 32_1 to 32_N is , And can be used as one electrode of the capacitors 33_1 to 33_N.
- the element layer 26 provided with the precharge circuit 24, the sense amplifier 25, the check bit generation circuit 54, the error detection circuit 55, and the switch circuit 23 has a function of generating a check bit when writing data to the memory cell, and a memory cell.
- it When reading data from the memory cell, it has a function of precharging the bit line BL, a function of amplifying the potential of the bit line BL, and a function of detecting whether or not there is an error in the data read from the memory cell by using a check bit.
- each circuit included in the element layer 26 (the precharge circuit 24, the sense amplifier 25, the check bit generation circuit 54, the error detection circuit 55, and the switch circuit 23) is configured using an OS transistor. Since each circuit included in the element layer 26 is configured using OS transistors, the element layer 26 can be provided on a silicon substrate on which Si transistors are formed. Therefore, integration can be easily performed. Further, the OS transistor can be manufactured at low cost because it can be manufactured using a manufacturing apparatus similar to that of the Si transistor.
- ⁇ Schematic diagram of storage device> 1B is a schematic diagram showing a structural example of the memory device 10A in order to describe the element layers 34_1 to 34_N and the element layer 26 in each structure described in FIG. 1A.
- the schematic diagram shown in FIG. 1B is a perspective view defining the x-axis, y-axis, and z-axis directions in order to explain the arrangement of the components described in FIG. 1A.
- a layer including OS layers which is a total of (1+N) layers of the element layer 26 and the element layers 34_1 to 34_N, is provided over the semiconductor substrate 11. ..
- the element layer 26 and the memory cells 31_1 to 31_N included in the element layers 34_1 to 34_N each have a region overlapping with the column driver 22 provided in the semiconductor substrate 11.
- the element layer 26 is provided between the semiconductor substrate 11 and the element layer 34_1.
- the semiconductor substrate 11 is not particularly limited as long as it can form a channel region of a transistor.
- a single crystal silicon substrate, a single crystal germanium substrate, a compound semiconductor substrate (SiC substrate, GaN substrate, etc.), an SOI (Silicon on Insulator) substrate, etc. can be used.
- the transistor of the memory cell 31_1 included in the element layer 34_1 and the transistor of the memory cell 31_N included in the element layer 34_N are electrically connected to each other through the bit line BL provided in the vertical direction.
- the bit line BL is electrically connected to the element layer 26, and the element layer 26 is electrically connected to the column driver 22 provided on the semiconductor substrate 11.
- the bit line BL_1 is provided in contact with the semiconductor layer of the transistor included in the memory cell 31_1.
- the bit line BL_1 is provided in contact with a region functioning as a source or a drain of a semiconductor layer of a transistor included in the memory cell 31_1.
- the bit line BL_1 is provided in contact with a conductor provided in contact with a region functioning as a source or a drain of a semiconductor layer of a transistor included in the memory cell 31_1.
- bit line BL is a wiring that electrically connects one of the source and the drain of the transistor included in the memory cell 31_1, the one of the source and the drain of the transistor included in the memory cell 31_N, and the element layer 26. I can say.
- bit line BL is provided so as to extend in the vertical direction or the substantially vertical direction on the surface of the semiconductor substrate 11 on which the column driver 22 is provided. That is, as illustrated in FIG. 1B, the bit line BL is connected to the transistor included in the memory cell 31_1 and the transistor included in the memory cell 31_N, and is perpendicular to the surface (xy plane) of the semiconductor substrate (z direction). Direction) or approximately vertical direction.
- “generally vertical” means a state of being arranged at an angle of 85 degrees or more and 95 degrees or less.
- an OS transistor whose off-state current is extremely low is used as a transistor provided in each element layer. Therefore, the frequency of refreshing the data held in the memory cell can be reduced, and the power consumption of the memory device can be reduced.
- the OS transistors can be stacked and provided in the vertical direction by using the same manufacturing process repeatedly, manufacturing cost can be reduced. Further, in the memory device 10A, the transistors constituting the memory cells are arranged not in the plane direction but in the vertical direction to improve the memory density. Therefore, the storage device 10A can be downsized.
- the OS transistor has less variation in electrical characteristics than the Si transistor even in a high temperature environment, variation in electrical characteristics of the transistor when stacked and integrated is small, and functions as a highly reliable memory device. be able to.
- the memory device 10A can arrange the memory cells above the column driver and the like, the memory device 10A can be a small-sized and high-density memory device capable of storing a large amount of data. Further, it is possible to operate even if the capacitance of the capacitor included in the memory cell is reduced.
- the memory device 10A can shorten the length of the bit line between the memory cell array and the element layer 26 by providing the bit line extending from the memory cell array in a direction substantially perpendicular to the surface of the semiconductor substrate 11. Therefore, the parasitic capacitance of the bit line can be reduced, so that the potential can be read even when the data signal held in the memory cell is multivalued.
- FIG. 2 illustrates a schematic diagram of one cross section parallel to the vertical direction (z-axis direction) of the storage device 10A described with reference to FIGS. 1A and 1B.
- the memory device 10A includes memory cells 31_1 to 31_N provided in each of the element layers, an element layer 26, and a column driver 22 provided in the semiconductor substrate 11 in the vertical direction. Can be connected via the bit line BL. By providing the bit line BL in the vertical direction, the length of the bit line BL can be shortened, so that the load on the bit line BL can be reduced.
- the memory cell array 30 includes the element layers 34_1 to 34_N, the precharge circuit 24, the sense amplifier 25, the check bit generation circuit 54, the error detection circuit 55, the element layer 26 including the switch circuit 23, and the column driver 22.
- the write/read circuit 29 is illustrated.
- transistors 28_a and 28_b for controlling conduction between the bit line BL_A or BL_B, the precharge circuit 24 and the sense amplifier 25, and the switches 23_A to 23_C included in the switch circuit 23 are illustrated.
- the bit line BL_A is connected to one of the source and the drain of the transistor 28_a
- the bit line BL_B is connected to one of the source and the drain of the transistor 28_b.
- the element layers 34_1 to 34_N are provided above the element layer 26 illustrated in FIG. 3, and the bit lines BL_A and the bit lines BL_B are provided in the vertical direction. That is, the element layer 26 which forms part of the peripheral circuit can be stacked and provided similarly to the element layers 34_1 to 34_N. Further, the bit line BL_A and the bit line BL_B are connected to the transistors forming the precharge circuit 24 and the sense amplifier 25 via the transistor 28_a and the transistor 28_b.
- the precharge circuit 24 is composed of n-channel transistors 24_1 to 24_3.
- the precharge circuit 24 sets the bit line BL_A and the bit line BL_B to, for example, an intermediate potential VPC corresponding to the potential VDD/2 between the potential VDD and the potential VSS in accordance with the precharge signal applied to the precharge line PCL. This is a circuit for precharging.
- the sense amplifier 25 includes n-channel transistors 25_1 to 25_4, the transistors 25_1 and 25_2 are connected to a wiring VHH, and the transistors 25_3 and 25_4 are connected to a wiring VLL.
- the wiring VHH has a function of supplying the potential VDD and the wiring VLL has a function of supplying the potential VSS.
- the transistors 25_1 to 25_4 are transistors that form an inverter loop.
- the precharge circuit 24 When reading data from the memory cell, the precharge circuit 24 precharges the bit line, and the row driver 21 sets the word line of the selected memory cell to the high level, so that the potential of the precharged bit line changes. To do.
- the sense amplifier 25 sets the potential of the pair of wirings connected to the sense amplifier 25 to the potential VDD or the potential VSS, and outputs the potential to the write/read circuit 29 via the switch circuit 23.
- the check bit generation circuit 54 has a function of generating a check bit based on the data signal output from the write/read circuit 29 when writing data to the memory cell, and the error detection circuit 55 outputs data from the memory cell. Has a function of detecting whether or not there is an error in the data read from the memory cell using the check bit and outputting the result to the write/read circuit 29. Details of the check bit generation circuit 54 and the error detection circuit 55 will be described later.
- FIG. 4 shows a memory device 10B having a configuration in which the units 39 described in FIG. 2 are stacked in M stages (units 39_1 to 39_M, where M is a natural number of 2 or more).
- FIG. 4 is a schematic view of one cross section parallel to the vertical direction (z-axis direction) of the storage device 10B.
- the memory device 10B includes element layers 34_1 to 34_N and an element layer 26 in the units 39_1 to 39_M, respectively.
- One of the units 39_1 to 39_M is selected by the selection signal MUX, and the selected unit 39 performs signal input or signal output through the wiring BL_U and the element layer 26.
- the wiring BL_U is selected by the switch circuit 41 that can be switched by the selection signal SEL and is connected to the column driver 22 through the wiring GBL.
- the switch circuit 41 may be configured by using an OS transistor that constitutes the element layer 26.
- the number of stacked element layers 34_1 to 34_N in each of the units 39_1 to 39_M can be reduced.
- the length of the bit line BL can be shortened and the load on the bit line BL can be reduced.
- the wiring GBL may be illustrated as a thick line or a thick dotted line in order to improve visibility.
- the wiring GBL may be called a global bit line.
- the wiring GBL illustrated in FIG. 4 can be provided after manufacturing an element layer including an OS transistor.
- an element layer having an OS transistor is formed, an opening is provided in the outer periphery of a sealing layer 40A surrounding each element layer, and the wiring GBL can be provided in the opening. ..
- an element layer having an OS transistor is formed, an opening is provided in the outer periphery of a sealing layer 40B that collectively surrounds each element layer, and a wiring GBL is provided in the opening. be able to.
- the switch circuit 41 and the like are omitted in FIGS. 5A and 5B, and the details of each element layer provided with the wiring GBL will be described in detail in the third embodiment.
- FIG. 6A is a circuit diagram showing a configuration example of the check bit generation circuit 54.
- the check bit generation circuit 54 has XOR circuits 53_1 to XOR circuit 53_3. A configuration example of the XOR circuit 53 will be described later.
- the element layers 34_1 to 34_N included in the memory cell array 30 will be described assuming that N is 5.
- one layer is used to hold a check bit, and the remaining four layers hold data. That is, the check bit generation circuit 54 described in the present embodiment is a circuit that handles 4-bit data and 1-bit check bit.
- the check bit generation circuit 54 has input terminals T_A0 to T_A3, to which 4-bit data represented by bits A0 to A3 are input, respectively, and the check bit generation circuit 54 has input terminals T_CK1 to input. It has a terminal T_CK4, and clock signals CK1 to CK4, which are control signals, are input to the respective terminals. Then, the check bit generation circuit 54 outputs the check bit from the output terminal OUT.
- FIG. 6B is a timing chart showing the relationship between the clock signals CK1 to CK4 input to the check bit generation circuit 54, the 4-bit data input period PDI, and the check bit output period PDO. Since the high level of the clock signals CK1 to CK4 and the 4-bit data is represented by the potential VDD and the low level is represented by the potential VSS, in FIG. 6B, Vdd(H) and Vss(L ).
- FIG. 6C is a truth table in which the output for the 4-bit data input to the check bit generation circuit 54 is represented by a high level (H) or a low level (L).
- H high level
- L low level
- FIG. 7A is a circuit diagram showing a configuration example of the error detection circuit 55.
- the error detection circuit 55 includes XOR circuits 53_4 to XOR circuits 53_7 and delay circuits 52_1 to 52_4. A configuration example of the delay circuit 52 will be described later.
- the error detection circuit 55 described in the present embodiment is a circuit that handles 4-bit data and 1-bit check bit.
- the error detection circuit 55 has input terminals T_A0 to T_A3 and receives 4-bit data represented by bits A0 to A3, respectively.
- the error detection circuit 55 has input terminals T_CK1 to T_CK4.
- the clock signals CK1 to CK4, which are control signals, are input to the error detection circuit 55.
- the error detection circuit 55 has an input terminal T_B0, and the check bit B0 is input.
- the error detection circuit 55 outputs a low level (L) from the output terminal OUT if no error is found in the relationship between the check bit B0 and the bits A0 to A3, and outputs a high level (H) if an error is found. Is output.
- FIG. 7B is a timing chart showing the relationship between the clock signals CK1 to CK4 input to the error detection circuit 55, the 4-bit data and check bit input period PDI, and the output period PDO of the error detection circuit 55. ..
- the high level of the clock signals CK1 to CK4, 4-bit data, and the check bit is represented by the potential VDD, and the low level thereof is represented by the potential VSS. Therefore, in FIG. 7B, Vdd(H), respectively. , Vss(L).
- FIG. 8 is a truth table in which the output with respect to the 4-bit data and the check bit input to the error detection circuit 55 is represented by a high level (H) or a low level (L).
- the error detection circuit 55 when the check bit B0 is low level (L) and the number of high levels (H) among the bits A0 to A3 is an odd number, the error detection circuit 55 is high level (H). ) Is output. This means that when the number of high levels (H) among the bits A0 to A3 is an odd number, the check bit generation circuit 54 outputs the high level (H) as a check bit. This indicates that an error was found in the relationship with bits A0 to A3.
- the error detection circuit 55 when the check bit B0 is at a high level (H) and the number of high levels (H) among the bits A0 to A3 is an even number or 0, the error detection circuit 55. Indicates that a high level (H) is output. This means that when the number of high level (H) is even or 0 among the bits A0 to A3, the check bit generation circuit 54 outputs the low level (L) as the check bit. This indicates that an error was found in the relationship between B0 and bits A0 to A3.
- the storage device 10A can perform parity check inside the storage device as well as writing and reading of data. Further, the output signal of the error detection circuit 55 is output to the column driver 22 via the switch 23_C.
- FIG. 9A is a symbol representing the XOR circuit 53
- FIG. 9B is a circuit diagram showing a configuration example of the XOR circuit 53.
- the XOR circuit 53 includes NAND circuits 51_1 to 51_4, a delay circuit 52_1, and a delay circuit 52_2.
- the XOR circuit 53 has an input terminal D, an input terminal E, and input terminals C5 to C8 to which the control signals S_C5 to S_C8 are input, and outputs a signal from the output terminal Z.
- FIG. 9C shows the relationship between the control signals S_C5 to S_C8 input to the XOR circuit 53, the input period PDI of the signals input to the input terminal D and the input terminal E, and the output period PDO of the XOR circuit 53. It is a timing chart shown. Since the high level of the control signals S_C5 to S_C8 and the input signal is represented by the potential VDD and the low level thereof is represented by the potential VSS, in FIG. 9C, Vdd(H) and Vss, respectively. It is written as (L).
- FIG. 9D is a truth table in which the output corresponding to the signal input to the XOR circuit 53 is represented by high level (H) or low level (L).
- the truth table shown in FIG. 9D shows the relationship between the signals input to the input terminals D and E and the signals output from the output terminal Z.
- FIG. 10A is a symbol showing the NAND circuit 51
- FIG. 10B is a circuit diagram showing a configuration example of the NAND circuit 51.
- the NAND circuit 51 includes transistors 61 to 64 and a capacitor C61.
- the transistors 61 to 64 are n-channel transistors.
- the NAND circuit 51 has an input terminal A, an input terminal B, and input terminals C1 and C2 to which the control signal S_C1 and the control signal S_C2 are input, and outputs a signal from the output terminal X.
- FIG. 10C shows the relationship between the control signal S_C1 and the control signal S_C2 input to the NAND circuit 51, the input period PDI of the signals input to the input terminal A and the input terminal B, and the output period PDO of the NAND circuit 51. It is a timing chart shown. Since the high level of the control signal S_C1, the control signal S_C2, and the input signal is represented by the potential VDD and the low level thereof is represented by the potential VSS, in FIG. 10C, Vdd(H) and Vss, respectively. It is written as (L).
- FIG. 10D is a truth table in which the output corresponding to the signal input to the NAND circuit 51 is represented by high level (H) or low level (L).
- the truth table shown in FIG. 10D shows the relationship between the signals input to the input terminals A and B and the signals output from the output terminal X.
- FIG. 11A is a symbol showing the delay circuit 52
- FIG. 11B is a circuit diagram showing a configuration example of the delay circuit 52.
- the delay circuit 52 has a transistor 71, a transistor 72, and a capacitor C71.
- the transistors 71 and 72 are n-channel transistors.
- the delay circuit 52 has an input terminal C, an input terminal C3 and an input terminal C4 to which the control signal S_C3 and the control signal S_C4 are input, and outputs a signal from the output terminal Y.
- FIG. 11C is a timing chart showing the relationship between the control signal S_C3 and the control signal S_C4 input to the delay circuit 52, the input period PDI of the signal input to the input terminal C, and the output period PDO of the delay circuit 52. is there. Since the high level of the control signal S_C3, the control signal S_C4, and the input signal is represented by the potential VDD and the low level thereof is represented by the potential VSS, in FIG. 11C, Vdd(H) and Vss, respectively. It is written as (L).
- FIG. 11D is a truth table in which the output corresponding to the signal input to the delay circuit 52 is represented by high level (H) or low level (L).
- the truth table shown in FIG. 11D shows the relationship between the signal input to the input terminal C and the signal output from the output terminal Y.
- an OS transistor with extremely low off-state current is used as a transistor provided in each element layer. Since the OS transistor can be provided by being stacked over a silicon substrate provided with a Si transistor, for example, the OS transistor can be manufactured repeatedly by using the same manufacturing process in the vertical direction, and manufacturing cost can be reduced. Further, in the memory device of one embodiment of the present invention, the transistors included in the memory cell are arranged not in the planar direction but in the vertical direction so that the memory density can be improved and the memory device can be downsized. ..
- the memory device of one embodiment of the present invention includes a check bit generation circuit, a check bit, and an error detection circuit. Therefore, the storage device of one embodiment of the present invention can perform parity check inside the storage device as well as writing and reading of data. Further, since the check bit generation circuit and the error detection circuit can also be configured by using the OS transistor, the circuits can be arranged in the vertical direction to reduce the size of the memory device.
- Embodiment 2 In this embodiment mode, a modification example of a circuit which can be applied to the memory device 10A described in Embodiment Mode 1 will be described with reference to FIG.
- a transistor having a top gate structure or a bottom gate structure without a back gate electrode is shown as a transistor included in the memory cells 31_1 to 31_N and the element layer 26; however, the transistor structure is not limited to this.
- a transistor including a back gate electrode connected to the back gate electrode line BGL may be used.
- the threshold voltage of the transistor can be controlled from the outside.
- FIG. 13 illustrates an example of a memory device in which a memory unit 470 (memory unit 470_1 to memory unit 470_m: m is a natural number of 1 or more) is stacked over the element layer 411 including a circuit provided in the semiconductor substrate 311.
- a memory unit 470 memory unit 470_1 to memory unit 470_m: m is a natural number of 1 or more
- FIG. 13 an element layer 411 and a plurality of memory units 470 are stacked over the element layer 411, and one transistor layer 413 (one of the transistor layers 413_1 to 413_m) is included in the plurality of memory units 470.
- An example in which a plurality of memory device layers 415 (memory device layers 415_1 to 415_n: n is a natural number of 2 or more) are provided on each transistor layer 413 is shown.
- each memory unit 470 an example in which the memory device layer 415 is provided over the transistor layer 413 is shown; however, the present embodiment is not limited to this.
- the transistor layer 413 may be provided over the plurality of memory device layers 415, or the memory device layers 415 may be provided above and below the transistor layer 413.
- the element layer 411 includes the transistor 300 provided over the semiconductor substrate 311 and can function as a peripheral circuit of the memory device.
- peripheral circuits include a column driver, a row driver, a column decoder, a row decoder, an amplifier circuit, an input/output circuit, a control logic circuit, and the like.
- the transistor layer 413 includes the transistor 200T and can function as a circuit which controls each memory unit 470.
- the memory device layer 415 has a memory device 420.
- the memory device 420 described in this embodiment includes the transistor 200M and the capacitor 292.
- m is not particularly limited, but is 1 or more and 100 or less, preferably 1 or more and 50 or less, and more preferably 1 or more and 10 or less.
- n is not particularly limited, but is 2 or more and 100 or less, preferably 2 or more and 50 or less, and more preferably 2 or more and 100 or less.
- the product of m and n is 2 or more and 256 or less, preferably 2 or more and 128 or less, and more preferably 2 or more and 64 or less.
- 13 is a cross-sectional view in the channel length direction of the transistor 200T and the transistor 200M included in the memory unit 470.
- the transistor 300 is provided over the semiconductor substrate 311, and the transistor layer 413 and the memory device layer 415 included in the memory unit 470 are provided over the transistor 300.
- the transistor layer 413 is provided in one memory unit 470.
- the transistor 200T included in the memory device layer 415 and the memory device 420 included in the memory device layer 415 are electrically connected to each other by a plurality of conductors 424.
- the transistor 300 and the transistor 200T included in the transistor layer 413 in each memory unit 470 include a conductor 426. Electrically connected by.
- the conductor 426 is preferably electrically connected to the transistor 200T through a conductor 428 which is electrically connected to any one of a source, a drain, and a gate of the transistor 200T.
- the conductor 424 is preferably provided in each layer of the memory device layer 415.
- the conductor 426 is preferably provided in each layer of the transistor layer 413 and the memory device layer 415.
- an insulator that suppresses permeation of impurities such as water or hydrogen and oxygen be provided on the side surface of the conductor 424 and the side surface of the conductor 426.
- an insulator for example, silicon nitride, aluminum oxide, silicon nitride oxide, or the like may be used.
- the memory device 420 includes the transistor 200M and the capacitor 292, and the transistor 200M can have a structure similar to that of the transistor 200T included in the transistor layer 413.
- the transistor 200T and the transistor 200M may be collectively referred to as the transistor 200.
- a metal oxide functioning as an oxide semiconductor (hereinafter also referred to as an oxide semiconductor) is preferably used for a semiconductor including a region where a channel is formed.
- an In-M-Zn oxide (the element M is aluminum, gallium, yttrium, tin, copper, vanadium, beryllium, boron, titanium, iron, nickel, germanium, zirconium, molybdenum, lanthanum, cerium).
- the oxide semiconductor for example, an In-M-Zn oxide (the element M is aluminum, gallium, yttrium, tin, copper, vanadium, beryllium, boron, titanium, iron, nickel, germanium, zirconium, molybdenum, lanthanum, cerium).
- neodymium, hafnium, tantalum, tungsten, magnesium, and the like may be used.
- indium oxide, In—Ga oxide, or In—Zn oxide may be used as the oxide semiconductor. Note that the on-state current, field-effect mobility, or the like of the transistor can be increased by using an oxide semiconductor having a high proportion of indium.
- the transistor 200 including an oxide semiconductor in the channel formation region has an extremely small leak current in a non-conducting state, so that a memory device with low power consumption can be provided. Since the oxide semiconductor can be formed by a sputtering method or the like, it can be used for the transistor 200 included in the highly integrated memory device.
- an oxide semiconductor whose impurity concentration and defect level density are reduced.
- low impurity concentration and low defect level density is referred to as high-purity intrinsic or substantially high-purity intrinsic.
- the impurity concentration in the oxide semiconductor be as low as possible.
- impurities in the oxide semiconductor include hydrogen, nitrogen, alkali metals, alkaline earth metals, iron, nickel, silicon, and the like.
- oxygen vacancies also referred to as V 2 O :oxygenvacancy
- defects containing hydrogen to an oxygen vacancy may generate electrons serving as carriers.
- part of hydrogen may react with oxygen which is bonded to a metal atom to generate an electron serving as a carrier.
- a transistor including an oxide semiconductor which contains a large amount of hydrogen is likely to have normally-on characteristics. Further, hydrogen in the oxide semiconductor is likely to move due to stress such as heat and an electric field; therefore, when a large amount of hydrogen is contained in the oxide semiconductor, reliability of the transistor might be deteriorated.
- the oxide semiconductor used for the transistor 200 a highly purified intrinsic oxide semiconductor in which impurities such as hydrogen and oxygen vacancies are reduced is preferably used.
- the transistor 200 may be sealed with a material that suppresses diffusion of impurities (hereinafter also referred to as a barrier material against impurities).
- the barrier property refers to a function of suppressing diffusion of a corresponding substance (also referred to as low permeability).
- the corresponding substance has a function of capturing and fixing (also referred to as gettering).
- silicon nitride or silicon nitride oxide has a high barrier property against hydrogen, it is preferably used as a sealing material.
- a material having a function of capturing and fixing hydrogen there is a metal oxide such as aluminum oxide, hafnium oxide, gallium oxide, or indium gallium zinc oxide.
- An insulator 211, an insulator 212, and an insulator 214 are preferably provided between the transistors 300 and 200 as a layer having a barrier property. Impurities such as hydrogen and water contained in the semiconductor substrate 311, the transistor 300, and the like are included in at least one of the insulator 211, the insulator 212, and the insulator 214 by using a material that suppresses diffusion or transmission of impurities such as hydrogen. Can be suppressed from diffusing into the transistor 200. By using a material that suppresses oxygen permeation for at least one of the insulator 211, the insulator 212, and the insulator 214, oxygen contained in the channel of the transistor 200 or the transistor layer 413 diffuses into the element layer 411.
- a material that suppresses permeation of impurities such as hydrogen and water as the insulator 211 and the insulator 212 and a material that suppresses permeation of oxygen as the insulator 214. Further, it is more preferable to use a material having a property of absorbing and storing hydrogen as the insulator 214.
- a nitride such as silicon nitride or silicon nitride oxide can be used.
- a metal oxide such as aluminum oxide, hafnium oxide, gallium oxide, or indium gallium zinc oxide can be used, for example. In particular, it is preferable to use aluminum oxide as the insulator 214.
- an insulator 287 is preferably provided on side surfaces of the transistor layer 413 and the memory device layer 415, that is, a side surface of the memory unit 470, and an insulator 282 is preferably provided on an upper surface of the memory unit 470.
- the insulator 282 is preferably in contact with the insulator 287, and the insulator 287 is preferably in contact with at least one of the insulator 211, the insulator 212, and the insulator 214.
- a material that can be used for the insulator 214 is preferably used.
- an insulator 283 and an insulator 284 are preferably provided so as to cover the insulator 282 and the insulator 287, and the insulator 283 is at least one of the insulator 211, the insulator 212, and the insulator 214. It is preferable to contact them.
- the insulator 287 is in contact with the side surface of the insulator 214, the side surface of the insulator 212, and the top surface and side surface of the insulator 211
- the insulator 283 is in contact with the side surface of the insulator 287 and the top surface of the insulator 211.
- the present embodiment is not limited to this.
- the insulator 287 may be in contact with the side surface of the insulator 214 and the top surface and side surface of the insulator 212, and the insulator 283 may be in contact with the side surface of the insulator 287 and the top surface of the insulator 212.
- a material that can be used for the insulator 211 and the insulator 212 is preferably used.
- a material which suppresses permeation of oxygen is preferably used for the insulator 287 and the insulator 282. Further, it is more preferable to use a material having a property of capturing and fixing hydrogen as the insulator 287 and the insulator 282. By using a material having a function of trapping and fixing hydrogen on a side close to the transistor 200, hydrogen in the transistor 200 or the memory unit 470 is transferred to the insulator 214, the insulator 287, and the insulator 282. The hydrogen concentration in the transistor 200 can be reduced due to the trapping, trapping, and fixation. Further, as the insulator 283 and the insulator 284, a material which suppresses permeation of impurities such as hydrogen and water is preferably used.
- the memory unit 470 is surrounded by the insulator 211, the insulator 212, the insulator 214, the insulator 287, the insulator 282, the insulator 283, and the insulator 284. More specifically, the memory unit 470 is surrounded by the insulator 214, the insulator 287, and the insulator 282 (may be referred to as a first structure), and the memory unit 470 and the first structure are enclosed.
- a second structure may be referred to as a second structure.
- a structure in which the memory unit 470 is surrounded by a plurality of structures having two or more layers as described above may be referred to as a nested structure.
- enclosing the memory unit 470 with a plurality of structures may be referred to as enclosing the memory unit 470 with a plurality of insulators.
- the second structure body seals the transistor 200 through the first structure body. Therefore, hydrogen existing outside the second structure is prevented from diffusing into the second structure (on the side of the transistor 200) by the second structure. That is, the first structure body can efficiently capture and fix hydrogen existing in the internal structure of the second structure body.
- a metal oxide such as aluminum oxide can be used for the first structure and a nitride such as silicon nitride can be used for the second structure. More specifically, an aluminum oxide film may be provided between the transistor 200 and the silicon nitride film.
- the material used for the structure can reduce the hydrogen concentration in the film by appropriately setting the film formation conditions.
- a film formed by a CVD method has higher coverage than a film formed by a sputtering method.
- the compound gas used in the CVD method often contains hydrogen, and the film formed by the CVD method has a higher hydrogen content than the film formed by the sputtering method.
- a film in which hydrogen concentration in the film is reduced is preferably used as a film near the transistor 200.
- a film having a high film property but a relatively high hydrogen concentration in the film is used as a film for suppressing diffusion of impurities
- a film having a function of capturing and fixing hydrogen and having a reduced hydrogen concentration may be arranged between the film having a relatively high hydrogen concentration and a high film-forming property.
- a film with a relatively low hydrogen concentration be used as a film provided in the vicinity of the transistor 200.
- a film having a relatively high hydrogen concentration in the film may be placed remotely from the transistor 200.
- the transistor 200 is interposed between the transistor 200 and the silicon nitride film formed by a CVD method.
- An aluminum oxide film formed by a sputtering method may be provided. More preferably, a silicon nitride film formed by a sputtering method may be provided between a silicon nitride film formed by a CVD method and an aluminum oxide film formed by a sputtering method.
- the concentration of hydrogen contained in the formed film is reduced by forming a film using a compound gas which does not contain hydrogen atoms or has a small content of hydrogen atoms. May be.
- the insulator 282 and the insulator 214 are preferably provided between the transistor layers 413 and the memory device layers 415 or between the memory device layers 415.
- an insulator 296 is preferably provided between the insulator 282 and the insulator 214.
- a material similar to that of the insulator 283 and the insulator 284 can be used.
- silicon oxide or silicon oxynitride can be used.
- a known insulating material may be used.
- the insulator 282, the insulator 296, and the insulator 214 may be components included in the transistor 200. It is preferable that the insulator 282, the insulator 296, and the insulator 214 also serve as components of the transistor 200 because the number of steps for manufacturing a memory device can be reduced.
- side surfaces of the insulator 282, the insulator 296, and the insulator 214 provided between the transistor layers 413 and the memory device layers 415 or between the memory device layers 415 are preferably in contact with the insulator 287. ..
- the transistor layer 413 and the memory device layer 415 are surrounded and sealed by the insulator 282, the insulator 296, the insulator 214, the insulator 287, the insulator 283, and the insulator 284, respectively. To be done.
- the insulator 274 may be provided around the insulator 284. Further, the conductor 430 may be provided so as to be embedded in the insulator 274, the insulator 284, the insulator 283, and the insulator 211. The conductor 430 is electrically connected to the transistor 300, that is, a circuit included in the element layer 411.
- the capacitor 292 is formed in the same layer as the transistor 200M; It is possible to prevent the size from becoming excessively large. Accordingly, the number of memory device layers 415 can be increased relatively easily.
- the stack of the transistor layer 413 and the memory device layer 415 may be about 100 layers.
- Transistor 200 A transistor 200T included in the transistor layer 413 and a transistor 200 that can be used as the transistor 200M included in the memory device 420 are described with reference to FIG. 14A.
- the transistor 200 includes an insulator 216, a conductor 205 (a conductor 205a, and a conductor 205b), an insulator 222, an insulator 224, and an oxide 230 (an oxide 230a, an oxide 230a, or Object 230b and oxide 230c), conductor 242 (conductor 242a and conductor 242b), oxide 243 (oxide 243a and oxide 243b), insulator 272, insulator 273, The insulator 250 and the conductor 260 (the conductor 260a and the conductor 260b) are included.
- the insulator 216 and the conductor 205 are provided over the insulator 214, and the insulator 280 and the insulator 282 are provided over the insulator 273.
- the insulator 214, the insulator 280, and the insulator 282 can be regarded as forming part of the transistor 200.
- the memory device of one embodiment of the present invention includes the conductor 240 (the conductor 240a and the conductor 240b) which is electrically connected to the transistor 200 and serves as a plug.
- the insulator 241 (the insulator 241a and the insulator 241b) may be provided in contact with the side surface of the conductor 240 which functions as a plug.
- a conductor 246 (a conductor 246a and a conductor 246b) which is electrically connected to the conductor 240 and serves as a wiring is provided over the insulator 282 and the conductor 240.
- a conductive material containing tungsten, copper, or aluminum as its main component is preferably used.
- the conductor 240a and the conductor 240b may have a stacked structure.
- the conductor 240 has a stacked structure
- a conductive material having a function of suppressing permeation of impurities such as water or hydrogen and oxygen For example, it is preferable to use tantalum, tantalum nitride, titanium, titanium nitride, ruthenium, ruthenium oxide, or the like.
- the conductive material having a function of suppressing permeation of impurities such as water or hydrogen and oxygen may be used as a single layer or a stacked layer.
- impurities such as water or hydrogen diffused from the insulator 280 and the like can be further reduced from entering the oxide 230 through the conductor 240a and the conductor 240b.
- oxygen added to the insulator 280 can be prevented from being absorbed by the conductors 240a and 240b.
- the insulator 241 provided in contact with the side surface of the conductor 240 for example, silicon nitride, aluminum oxide, silicon nitride oxide, or the like may be used. Since the insulator 241 is provided in contact with the insulator 272, the insulator 273, the insulator 280, and the insulator 282, impurities such as water or hydrogen from the insulator 280 and the like are oxidized through the conductor 240a and the conductor 240b. It is possible to prevent the product 230 from being mixed. In particular, silicon nitride is preferable because it has a high blocking property against hydrogen. Further, oxygen contained in the insulator 280 can be prevented from being absorbed by the conductors 240a and 240b.
- the conductor 246 is preferably formed using a conductive material containing tungsten, copper, or aluminum as its main component. Further, the conductor may have a laminated structure, for example, a laminate of titanium or titanium nitride and the above conductive material. Note that the conductor may be formed so as to be embedded in the opening provided in the insulator.
- the conductor 260 functions as a first gate of the transistor and the conductor 205 functions as a second gate of the transistor.
- the conductor 242a and the conductor 242b function as a source electrode or a drain electrode.
- the oxide 230 functions as a semiconductor having a channel formation region.
- the insulator 250 functions as a first gate insulator, and the insulator 222 and the insulator 224 function as a second gate insulator.
- the conductor 260 is inserted into the openings provided in the insulator 280, the insulator 273, the insulator 272, the conductor 242, and the like through the oxide 230c and the insulator 250, It is formed in a self-aligned manner.
- the conductor 260 is formed so as to fill the opening provided in the insulator 280 and the like through the oxide 230c and the insulator 250; therefore, the conductor 260 is formed in a region between the conductor 242a and the conductor 242b.
- the 260 need not be aligned.
- the oxide 230c is preferably provided in the opening provided in the insulator 280 or the like. Therefore, the insulator 250 and the conductor 260 have a region overlapping with the stacked structure of the oxide 230b and the oxide 230a with the oxide 230c interposed therebetween. With this structure, the oxide 230c and the insulator 250 can be formed by continuous film formation, so that the interface between the oxide 230 and the insulator 250 can be kept clean. Therefore, the influence of interface scattering on carrier conduction is reduced, and the transistor 200 can obtain high on-state current and high frequency characteristics.
- the bottom surface and the side surface of the conductor 260 are in contact with the insulator 250. Further, the bottom surface and the side surface of the insulator 250 are in contact with the oxide 230c.
- the transistor 200 has a structure in which the insulator 282 and the oxide 230c are in direct contact with each other as illustrated in FIG. 14A. With such a structure, diffusion of oxygen contained in the insulator 280 into the conductor 260 can be suppressed.
- oxygen contained in the insulator 280 can be efficiently supplied to the oxide 230a and the oxide 230b through the oxide 230c, so that oxygen vacancies in the oxide 230a and the oxide 230b are reduced.
- the electrical characteristics and reliability of the transistor 200 can be improved.
- a detailed structure of a memory device including the transistor 200 according to one embodiment of the present invention is described below.
- an oxide semiconductor is preferably used for the oxide 230 including the channel formation region (the oxide 230a, the oxide 230b, and the oxide 230c).
- the metal oxide which functions as an oxide semiconductor it is preferable to use one having an energy gap of 2 eV or more, preferably 2.5 eV or more.
- an energy gap of 2 eV or more By using a metal oxide having a large energy gap, leakage current (off current) of the transistor 200 in a non-conduction state can be extremely reduced.
- a memory device with low power consumption By using such a transistor, a memory device with low power consumption can be provided.
- an In-M-Zn oxide (the element M is aluminum, gallium, yttrium, tin, copper, vanadium, beryllium, boron, titanium, iron, nickel, germanium, zirconium, molybdenum, A metal oxide such as one or more selected from lanthanum, cerium, neodymium, hafnium, tantalum, tungsten, magnesium, or the like is preferably used.
- the element M is preferably aluminum, gallium, yttrium, or tin.
- an In-M oxide, an In-Zn oxide, or an M-Zn oxide may be used as the oxide 230.
- the oxide 230 is provided over the oxide 230a over the insulator 224, the oxide 230b over the oxide 230a, and the oxide 230b, and at least part of the oxide 230 is over the oxide 230b.
- the oxide 230c in contact therewith is preferable.
- the side surface of the oxide 230c is preferably provided in contact with the oxide 243a, the oxide 243b, the conductor 242a, the conductor 242b, the insulator 272, the insulator 273, and the insulator 280.
- the oxide 230 includes the oxide 230a, the oxide 230b over the oxide 230a, and the oxide 230c over the oxide 230b.
- the oxide 230a below the oxide 230b, diffusion of impurities into the oxide 230b from a structure formed below the oxide 230a can be suppressed.
- the oxide 230c over the oxide 230b, diffusion of impurities into the oxide 230b from a structure formed above the oxide 230c can be suppressed.
- the transistor 200 has a structure in which three layers of the oxide 230a, the oxide 230b, and the oxide 230c are stacked in the channel formation region and the vicinity thereof, the present invention is not limited to this. ..
- a single layer of the oxide 230b, a two-layer structure of the oxide 230b and the oxide 230a, a two-layer structure of the oxide 230b and the oxide 230c, or a stacked structure of four or more layers may be provided.
- the oxide 230c may have a two-layer structure and a four-layer stacked structure may be provided.
- the oxide 230 preferably has a stacked structure of a plurality of oxide layers in which the atomic ratio of each metal atom is different.
- the atomic ratio of the element M in the constituent elements is higher than the atomic ratio of the element M in the constituent elements in the metal oxide used for the oxide 230b. It is preferable.
- the atomic ratio of the element M to In is preferably higher than the atomic ratio of the element M to In in the metal oxide used for the oxide 230b.
- the atomic ratio of In to the element M is preferably higher than the atomic ratio of In to the element M in the metal oxide used for the oxide 230a.
- the oxide 230c a metal oxide that can be used for the oxide 230a or the oxide 230b can be used.
- the metal oxide having the composition of may be used.
- the oxide 230c has a stacked structure
- the oxide 230b may have crystallinity.
- a CAAC-OS c-axis aligned crystalline oxide semiconductor
- An oxide having crystallinity such as CAAC-OS has a dense structure with few impurities and defects (such as oxygen vacancies) and high crystallinity. Therefore, extraction of oxygen from the oxide 230b by the source electrode or the drain electrode can be suppressed. Further, even if heat treatment is performed, oxygen can be reduced from being extracted from the oxide 230b, so that the transistor 200 is stable against a high temperature (so-called thermal budget) in a manufacturing process.
- the conductor 205 is arranged so as to overlap with the oxide 230 and the conductor 260.
- the conductor 205 is preferably embedded in the insulator 216 and provided.
- the conductor 205 When the conductor 205 functions as a gate electrode, the potential applied to the conductor 205 is changed independently without being linked with the potential applied to the conductor 260, so that the threshold voltage (Vth ) Can be controlled.
- Vth threshold voltage
- Vth of the transistor 200 can be further increased and off-state current can be reduced. Therefore, applying a negative potential to the conductor 205 can reduce the drain current when the potential applied to the conductor 260 is 0 V, as compared with the case where no potential is applied.
- the conductor 205 is preferably provided larger than the size of a region of the oxide 230 which does not overlap with the conductor 242a and the conductor 242b.
- the conductor 205 preferably extends to a region outside the oxide 230a and the oxide 230b in the channel width direction of the oxide 230. That is, it is preferable that the conductor 205 and the conductor 260 overlap with each other with the insulator provided outside the side surface of the oxide 230 in the channel width direction.
- charge-up local charging
- the conductor 205 may overlap with at least the oxide 230 located between the conductor 242a and the conductor 242b.
- the height of the bottom surface of the conductor 260 in a region where the oxide 230a and the oxide 230b do not overlap with the conductor 260 is lower than the height of the bottom surface of the oxide 230b.
- the conductor 260 functioning as a gate in the channel width direction has a structure in which the side surface and the top surface of the oxide 230b in the channel formation region are covered with the oxide 230c and the insulator 250. It becomes easy to make the electric field generated by the above act on the entire channel formation region generated in the oxide 230b. Therefore, the on-state current of the transistor 200 can be increased and the frequency characteristics can be improved.
- a structure of a transistor which electrically surrounds a channel formation region by an electric field of the conductor 260 and the conductor 205 is referred to as a surrounded channel (S-channel) structure.
- the conductor 205a is preferably a conductor that suppresses permeation of impurities such as water or hydrogen and oxygen.
- impurities such as water or hydrogen and oxygen.
- titanium, titanium nitride, tantalum, or tantalum nitride can be used.
- the conductor 205b is preferably formed using a conductive material containing tungsten, copper, or aluminum as its main component.
- the conductor 205 is illustrated as having two layers, it may have a multilayer structure of three or more layers.
- the oxide semiconductor, the insulator or the conductor located in the lower layer of the oxide semiconductor, and the insulator or the conductor located in the upper layer of the oxide semiconductor are formed into different films without being exposed to the atmosphere.
- the continuous formation of the seeds is preferable because an oxide semiconductor film with substantially high purity and intrinsic concentration in which impurities (especially hydrogen and water) are reduced can be formed.
- At least one of the insulator 222 and the insulator 272 and the insulator 273 functions as a barrier insulating film which suppresses impurities such as water or hydrogen from entering the transistor 200 from the substrate side or from above. Is preferred. Therefore, at least one of the insulator 222, the insulator 272, and the insulator 273 has at least one of a hydrogen atom, a hydrogen molecule, a water molecule, a nitrogen atom, a nitrogen molecule, a nitric oxide molecule (N 2 O, NO, NO 2, etc.), It is preferable to use an insulating material having a function of suppressing diffusion of impurities such as copper atoms (the above impurities are less likely to permeate). Alternatively, it is preferable to use an insulating material having a function of suppressing diffusion of oxygen (eg, at least one of oxygen atoms and oxygen molecules) (the above oxygen is less likely to permeate).
- oxygen eg, at least one of oxygen atoms
- silicon nitride, silicon nitride oxide, or the like as the insulator 273, and aluminum oxide, hafnium oxide, or the like as the insulator 222 and the insulator 272.
- impurities such as water or hydrogen can be suppressed from diffusing to the transistor 200 side through the insulator 222.
- oxygen contained in the insulator 224 or the like can be suppressed from diffusing to the substrate side through the insulator 222.
- impurities such as water or hydrogen can be suppressed from diffusing to the transistor 200 side from the insulator 280 and the like which are provided through the insulator 272 and the insulator 273.
- the transistor 200 is preferably surrounded by the insulator 272 and the insulator 273 which have a function of suppressing diffusion of impurities such as water or hydrogen and oxygen.
- the insulator 224 which is in contact with the oxide 230 preferably releases oxygen by heating.
- oxygen released by heating may be referred to as excess oxygen.
- the insulator 224 may be formed using silicon oxide, silicon oxynitride, or the like as appropriate.
- an oxide material from which part of oxygen is released by heating is preferably used as the insulator 224.
- the oxide that desorbs oxygen by heating means that the desorption amount of oxygen molecules is 1.0 ⁇ 10 18 molecules/cm 3 or more, preferably by thermal desorption gas analysis (TDS (Thermal Desorption Spectroscopy) analysis).
- TDS Thermal Desorption gas analysis
- the surface temperature of the film during the TDS analysis is preferably 100° C. or higher and 700° C. or lower, or 100° C. or higher and 400° C. or lower.
- the insulator 222 preferably functions as a barrier insulating film which suppresses impurities such as water or hydrogen from entering the transistor 200 from the substrate side.
- the insulator 222 preferably has lower hydrogen permeability than the insulator 224.
- the insulator 222 preferably has a function of suppressing diffusion of oxygen (e.g., at least one of oxygen atoms and oxygen molecules) (the oxygen is less likely to permeate).
- the insulator 222 preferably has lower oxygen permeability than the insulator 224. Since the insulator 222 has a function of suppressing diffusion of oxygen and impurities, oxygen contained in the oxide 230 can be prevented from diffusing below the insulator 222, which is preferable. Further, the conductor 205 can be prevented from reacting with the insulator 224 or oxygen contained in the oxide 230.
- an insulator containing an oxide of one or both of aluminum and hafnium which are insulating materials, may be used.
- the insulator containing one or both oxides of aluminum and hafnium it is preferable to use aluminum oxide, hafnium oxide, an oxide containing aluminum and hafnium (hafnium aluminate), or the like.
- the insulator 222 is formed using such a material, the insulator 222 suppresses release of oxygen from the oxide 230 and entry of impurities such as hydrogen from the peripheral portion of the transistor 200 into the oxide 230. Functions as a layer.
- aluminum oxide, bismuth oxide, germanium oxide, niobium oxide, silicon oxide, titanium oxide, tungsten oxide, yttrium oxide, or zirconium oxide may be added to these insulators.
- these insulators may be nitrided. Silicon oxide, silicon oxynitride, or silicon nitride may be stacked over the above insulator and used.
- the insulator 222 is made of, for example, aluminum oxide, hafnium oxide, tantalum oxide, zirconium oxide, lead zirconate titanate (PZT), strontium titanate (SrTiO 3 ) or (Ba,Sr)TiO 3 (BST).
- An insulator including a so-called high-k material may be used in a single layer or a stacked layer. As transistors are miniaturized and highly integrated, thinning of the gate insulator may cause problems such as leakage current. By using a high-k material for the insulator functioning as a gate insulator, it is possible to reduce the gate potential during transistor operation while maintaining the physical film thickness.
- the insulator 222 and the insulator 224 may have a stacked structure of two or more layers.
- the laminated structure is not limited to the same material, and may be a laminated structure made of different materials.
- the oxide 243 (the oxide 243a and the oxide 243b) may be provided between the oxide 230b and the conductor 242 (the conductor 242a and the conductor 242b) which functions as a source electrode or a drain electrode. .. Since the conductor 242 and the oxide 230b are not in contact with each other, the conductor 242 can be suppressed from absorbing oxygen in the oxide 230b. That is, by preventing the conductor 242 from being oxidized, it is possible to suppress a decrease in the conductivity of the conductor 242. Therefore, the oxide 243 preferably has a function of suppressing oxidation of the conductor 242.
- the oxide 243 having a function of suppressing permeation of oxygen between the conductor 242 functioning as a source electrode or a drain electrode and the oxide 230b, electrical conductivity between the conductor 242 and the oxide 230b can be obtained. It is preferable because the resistance is reduced. With such a structure, electric characteristics of the transistor 200 and reliability of the transistor 200 can be improved.
- the oxide 243 is selected from aluminum, gallium, yttrium, tin, copper, vanadium, beryllium, boron, titanium, iron, nickel, germanium, zirconium, molybdenum, lanthanum, cerium, neodymium, hafnium, tantalum, tungsten, magnesium, or the like. You may use the metal oxide which has the element M which consists of 1 type or multiple types. In particular, the element M is preferably aluminum, gallium, yttrium, or tin. The oxide 243 preferably has a higher concentration of the element M than the oxide 230b. Alternatively, gallium oxide may be used as the oxide 243.
- the oxide 243 a metal oxide such as an In-M-Zn oxide may be used.
- the atomic ratio of the element M to In is preferably higher than the atomic ratio of the element M to In in the metal oxide used for the oxide 230b.
- the film thickness of the oxide 243 is preferably 0.5 nm or more and 5 nm or less, more preferably 1 nm or more and 3 nm or less.
- the oxide 243 preferably has crystallinity. When the oxide 243 has crystallinity, release of oxygen in the oxide 230 can be preferably suppressed. For example, when the oxide 243 has a crystal structure such as a hexagonal crystal, release of oxygen in the oxide 230 can be suppressed in some cases.
- the oxide 243 is not necessarily provided. In that case, when the conductor 242 (the conductor 242a and the conductor 242b) is in contact with the oxide 230, oxygen in the oxide 230 may diffuse into the conductor 242 and the conductor 242 may be oxidized. Oxidation of the conductor 242 is likely to reduce the conductivity of the conductor 242. Note that diffusion of oxygen in the oxide 230 into the conductor 242 can be restated as absorption of oxygen in the oxide 230 by the conductor 242.
- Oxygen in the oxide 230 diffuses into the conductor 242 (the conductor 242a and the conductor 242b), so that the conductor 242a and the oxide 230b are separated from each other and the conductor 242b and the oxide 230b are separated from each other.
- Different layers may be formed between them. Since the different layer contains more oxygen than the conductor 242, it is estimated that the different layer has an insulating property.
- the three-layer structure of the conductor 242, the different layer, and the oxide 230b can be regarded as a three-layer structure including a metal-insulator-semiconductor, and a MIS (Metal-Insulator-Semiconductor) structure. It may be referred to as a diode junction structure mainly including the MIS structure.
- the different layer is not limited to being formed between the conductor 242 and the oxide 230b.
- the different layer is formed between the conductor 242 and the oxide 230c, or It may be formed between the body 242 and the oxide 230b and between the conductor 242 and the oxide 230c.
- the conductor 242 (the conductor 242a and the conductor 242b) which functions as a source electrode and a drain electrode is provided over the oxide 243.
- the thickness of the conductor 242 may be, for example, 1 nm to 50 nm inclusive, preferably 2 nm to 25 nm inclusive.
- the conductor 242 aluminum, chromium, copper, silver, gold, platinum, tantalum, nickel, titanium, molybdenum, tungsten, hafnium, vanadium, niobium, manganese, magnesium, zirconium, beryllium, indium, ruthenium, iridium, strontium, It is preferable to use a metal element selected from lanthanum, an alloy containing the above metal element as a component, an alloy in which the above metal elements are combined, or the like.
- tantalum nitride, titanium nitride, tungsten, nitride containing titanium and aluminum, nitride containing tantalum and aluminum, ruthenium oxide, ruthenium nitride, oxide containing strontium and ruthenium, oxide containing lanthanum and nickel, or the like is used. It is preferable. Further, tantalum nitride, titanium nitride, nitride containing titanium and aluminum, nitride containing tantalum and aluminum, ruthenium oxide, ruthenium nitride, oxide containing strontium and ruthenium, and oxide containing lanthanum and nickel are difficult to oxidize. A conductive material or a material that maintains conductivity even when absorbing oxygen is preferable.
- the insulator 272 is provided in contact with the top surface of the conductor 242 and preferably functions as a barrier layer. With such a structure, absorption of excess oxygen included in the insulator 280 by the conductor 242 can be suppressed. Further, by suppressing the oxidation of the conductor 242, an increase in contact resistance between the transistor 200 and the wiring can be suppressed. Therefore, the transistor 200 can have favorable electrical characteristics and reliability.
- the insulator 272 preferably has a function of suppressing diffusion of oxygen.
- the insulator 272 preferably has a function of suppressing diffusion of oxygen as compared with the insulator 280.
- an insulator containing an oxide of one or both of aluminum and hafnium may be formed.
- an insulator containing aluminum nitride may be used.
- the insulator 272 is in contact with part of the top surface of the conductor 242b and the side surface of the conductor 242b.
- the insulator 272 is in contact with part of the top surface of the conductor 242a and the side surface of the conductor 242a.
- the insulator 273 is arranged over the insulator 272.
- the insulator 250 functions as a gate insulator.
- the insulator 250 is preferably placed in contact with the top surface of the oxide 230c.
- silicon oxide, silicon oxynitride, silicon nitride oxide, silicon nitride, fluorine-added silicon oxide, carbon-added silicon oxide, carbon-nitrogen-added silicon oxide, or silicon oxide having holes is used. be able to. In particular, silicon oxide and silicon oxynitride are preferable because they are stable to heat.
- the insulator 250 is preferably formed using an insulator from which oxygen is released by heating.
- an insulator from which oxygen is released by heating is provided as the insulator 250 in contact with the top surface of the oxide 230c, oxygen can be effectively supplied to the channel formation region of the oxide 230b.
- the concentration of impurities such as water or hydrogen in the insulator 250 be reduced.
- the thickness of the insulator 250 is preferably 1 nm or more and 20 nm or less.
- a metal oxide may be provided between the insulator 250 and the conductor 260.
- the metal oxide preferably suppresses oxygen diffusion from the insulator 250 to the conductor 260.
- oxygen diffusion from the insulator 250 to the conductor 260 is suppressed. That is, a decrease in the amount of oxygen supplied to the oxide 230 can be suppressed.
- oxidation of the conductor 260 due to oxygen in the insulator 250 can be suppressed.
- the metal oxide may have a function as a part of the gate insulator. Therefore, when silicon oxide, silicon oxynitride, or the like is used for the insulator 250, the metal oxide is preferably a high-k material having a high relative dielectric constant.
- the gate insulator has a stacked structure of the insulator 250 and the metal oxide, a stacked structure which is stable to heat and has a high relative dielectric constant can be obtained. Therefore, it is possible to reduce the gate potential applied during transistor operation while maintaining the physical film thickness of the gate insulator. Further, the equivalent oxide film thickness (EOT) of the insulator functioning as the gate insulator can be reduced.
- EOT equivalent oxide film thickness
- the metal oxide may have a function as a part of the gate.
- a conductive material containing oxygen may be provided on the channel formation region side.
- a conductive material containing oxygen and a metal element contained in a metal oxide in which a channel is formed as a conductor functioning as a gate it is preferable to use a conductive material containing oxygen and a metal element contained in a metal oxide in which a channel is formed as a conductor functioning as a gate.
- a conductive material containing the above metal element and nitrogen may be used.
- indium tin oxide, indium oxide containing tungsten oxide, indium zinc oxide containing tungsten oxide, indium oxide containing titanium oxide, indium tin oxide containing titanium oxide, indium zinc oxide, and silicon were added.
- Indium tin oxide may be used.
- indium gallium zinc oxide containing nitrogen may be used.
- the conductor 260 is shown as a two-layer structure in FIG. 14A, it may have a single-layer structure or a stacked structure of three or more layers.
- the conductor 260a has a function of suppressing diffusion of impurities such as hydrogen atoms, hydrogen molecules, water molecules, nitrogen atoms, nitrogen molecules, nitric oxide molecules (N 2 O, NO, NO 2, etc.), and copper atoms. It is preferable to use materials. Alternatively, it is preferable to use a conductive material having a function of suppressing diffusion of oxygen (eg, at least one of oxygen atoms and oxygen molecules).
- the conductor 260a has a function of suppressing diffusion of oxygen
- oxygen contained in the insulator 250 can prevent oxidation of the conductor 260b and decrease in conductivity.
- a conductive material having a function of suppressing diffusion of oxygen for example, tantalum, tantalum nitride, ruthenium, ruthenium oxide, or the like is preferably used.
- the conductor 260b is preferably formed using a conductive material containing tungsten, copper, or aluminum as its main component. Since the conductor 260 also functions as a wiring, a conductor having high conductivity is preferably used for the conductor 260b. For example, a conductive material containing tungsten, copper, or aluminum as its main component can be used. Further, the conductor 260b may have a stacked structure, for example, a stacked structure of titanium or titanium nitride and the above conductive material.
- a metal oxide which functions as an oxide semiconductor is preferably used.
- the metal oxide applicable to the oxide 230 according to the present invention will be described below.
- the metal oxide preferably contains at least indium or zinc. In particular, it is preferable to contain indium and zinc. In addition to these, it is preferable that gallium, yttrium, tin, and the like are contained. Further, one or more selected from boron, titanium, iron, nickel, germanium, zirconium, molybdenum, lanthanum, cerium, neodymium, hafnium, tantalum, tungsten, magnesium and the like may be contained.
- the metal oxide is an In-M-Zn oxide containing indium, element M, and zinc
- the element M is aluminum, gallium, yttrium, tin, copper, vanadium, beryllium, boron, titanium, iron, nickel,
- the element M is preferably aluminum, gallium, yttrium, or tin.
- metal oxides containing nitrogen may be collectively referred to as metal oxides. Further, the metal oxide containing nitrogen may be referred to as a metal oxynitride.
- the transistor 300 is described with reference to FIG. 14B.
- the transistor 300 is provided over the semiconductor substrate 311 and serves as a conductor 316 serving as a gate, an insulator 315 serving as a gate insulator, a semiconductor region 313 which is part of the semiconductor substrate 311, and a source region or a drain region.
- the transistor 300 may be either a p-channel type or an n-channel type.
- a semiconductor region 313 (a part of the semiconductor substrate 311) in which a channel is formed has a convex shape. Further, a side surface and an upper surface of the semiconductor region 313 are provided so as to be covered with a conductor 316 with an insulator 315 provided therebetween (not shown). Note that the conductor 316 may be formed using a material whose work function is adjusted. Such a transistor 300 is also called a FIN-type transistor because it uses a convex portion of the semiconductor substrate 311. Note that an insulator which functions as a mask for forming the protrusion may be provided in contact with the top of the protrusion. Although the case where a part of the semiconductor substrate 311 is processed to form the convex portion is described here, the SOI substrate may be processed to form a semiconductor film having a convex shape.
- transistor 300 illustrated in FIG. 14B is an example, and the structure thereof is not limited, and an appropriate transistor may be used depending on a circuit configuration or a driving method.
- the conductor 242a of the transistor 200M functions as one of the electrodes of the capacitor 292, and the insulator 272 and the insulator 273 function as a dielectric.
- a conductor 290 is provided so as to overlap with the conductor 242a with the insulator 272 and the insulator 273 interposed therebetween, and functions as the other electrode of the capacitor 292.
- the conductor 290 may be used as the other electrode of the capacitor 292 included in the adjacent memory device 420.
- the conductor 290 may be electrically connected to the conductor 290 included in the adjacent memory device 420.
- the conductor 290 is provided not only on the upper surface of the conductor 242a but also on the side surface of the conductor 242a with the insulator 272 and the insulator 273 interposed therebetween. At this time, the capacitor 292 is preferably larger than that obtained by the area where the conductor 242a and the conductor 290 overlap with each other.
- the conductor 424 is electrically connected to the conductor 242b and is also electrically connected to the conductor 424 positioned in a lower layer through the conductor 205.
- silicon nitride, silicon nitride oxide, aluminum oxide, hafnium oxide, or the like can be used. Further, these materials can be stacked and used.
- a stack of aluminum oxide and silicon nitride or a stack of hafnium oxide and silicon oxide can be used.
- the upper and lower sides of the stack are not limited.
- silicon nitride may be stacked on aluminum oxide, or aluminum oxide may be stacked on silicon nitride.
- zirconium oxide having a higher dielectric constant than the above materials may be used as the dielectric of the capacitor 292.
- zirconium oxide may be used as a single layer or may be used as part of a stack.
- a stack of zirconium oxide and aluminum oxide can be used.
- the dielectric of the capacitor 292 may be a stack of three layers, zirconium oxide is used for the first layer and the third layer, and the second layer between the first layer and the third layer is oxidized.
- Aluminum may be used.
- the area occupied by the capacitor 292 in the memory device 420 can be reduced. Therefore, the area required for the memory device 420 can be reduced, and the bit cost can be improved, which is preferable.
- the conductor 290 a material that can be used for the conductor 205, the conductor 242, the conductor 260, the conductor 424, or the like can be used.
- the conductor 424 is connected to at least part of the top surface of the conductor 242b.
- the transistor 200T in the memory unit 470 and the memory device 420 can be electrically connected to each other.
- a memory device 420A will be described as a modified example of the memory device 420 with reference to FIG. 15B.
- the memory device 420A has a transistor 200M and a capacitor 292A electrically connected to the transistor 200M.
- the capacitor 292A is provided below the transistor 200M.
- the conductor 242a is disposed in the opening provided in the oxide 243a, the oxide 230b, the oxide 230a, the insulator 224, and the insulator 222, and is electrically connected to the conductor 205 at the bottom of the opening. Connect to.
- the conductor 205 is electrically connected to the capacitor 292A.
- the capacitor 292A includes a conductor 294 functioning as one of electrodes, an insulator 295 functioning as a dielectric, and a conductor 297 functioning as the other of the electrodes.
- the conductor 297 overlaps with the conductor 294 with the insulator 295 provided therebetween.
- the conductor 297 is electrically connected to the conductor 205.
- the conductor 294 is provided at a bottom portion and a side surface of an opening formed in the insulator 298 provided over the insulator 296, and the insulator 295 is provided so as to cover the insulator 298 and the conductor 294.
- the conductor 297 is provided so as to be embedded in the recessed portion of the insulator 295.
- the conductor 299 is provided so as to be embedded in the insulator 296, and the conductor 299 is electrically connected to the conductor 294.
- the conductor 299 may be electrically connected to the conductor 294 of the adjacent memory device 420A.
- the conductor 297 is provided not only on the top surface of the conductor 294 but also on the side surface of the conductor 294 with the insulator 295 interposed therebetween.
- the capacitance 292A is preferable because a capacitance larger than the capacitance obtained by the area where the conductor 294 and the conductor 297 overlap with each other can be obtained.
- silicon nitride, silicon nitride oxide, aluminum oxide, hafnium oxide, or the like can be used. Further, these materials can be stacked and used.
- a stack of aluminum oxide and silicon nitride and a stack of hafnium oxide and silicon oxide can be used.
- the upper and lower sides of the stack are not limited.
- silicon nitride may be stacked on aluminum oxide, or aluminum oxide may be stacked on silicon nitride.
- zirconium oxide having a higher dielectric constant than the above materials may be used.
- zirconium oxide may be used as a single layer or as part of a stack.
- a stack of zirconium oxide and aluminum oxide can be used.
- the insulator 295 may be a stack of three layers, in which zirconium oxide is used for the first layer and the third layer, and aluminum oxide is used for the second layer between the first layer and the third layer. You may use.
- the area occupied by the capacitor 292A in the memory device 420A can be reduced. Therefore, the area required for the memory device 420A can be reduced, and the bit cost can be improved, which is preferable.
- a material that can be used for the conductor 205, the conductor 242, the conductor 260, the conductor 424, or the like can be used.
- insulator 298 a material that can be used for the insulator 214, the insulator 216, the insulator 224, the insulator 280, and the like can be used.
- a memory device 420B will be described as a modified example of the memory device 420 with reference to FIG. 15C.
- the memory device 420B has a transistor 200M and a capacitor 292B electrically connected to the transistor 200M.
- the capacitor 292B is provided above the transistor 200M.
- the capacitor 292B includes a conductor 276 that functions as one of electrodes, an insulator 277 that functions as a dielectric, and a conductor 278 that functions as the other of the electrodes.
- the conductor 278 overlaps with the conductor 276 with the insulator 277 interposed therebetween.
- the insulator 275 is provided over the insulator 282, and the conductor 276 is provided at bottoms and side surfaces of the openings formed in the insulator 275, the insulator 282, the insulator 280, the insulator 273, and the insulator 272.
- the insulator 277 is provided so as to cover the insulator 282 and the conductor 276.
- the conductor 278 is provided so as to overlap with the conductor 276 in a concave portion of the insulator 277, and at least part of the conductor 278 is provided over the insulator 275 with the insulator 277 interposed therebetween.
- the conductor 278 may be used as the other electrode of the capacitor 292B included in the adjacent memory device 420B. Alternatively, the conductor 278 may be electrically connected to the conductor 278 included in the adjacent memory device 420B.
- the conductor 278 is provided not only on the top surface of the conductor 276 but also on the side surface of the conductor 276 with the insulator 277 interposed therebetween. At this time, the capacitor 292B is preferably larger than that obtained by the area where the conductor 276 and the conductor 278 overlap with each other.
- the insulator 279 may be provided so as to fill the recessed portion of the conductor 278.
- silicon nitride, silicon nitride oxide, aluminum oxide, hafnium oxide, or the like can be used. Further, these materials can be stacked and used.
- a stack of aluminum oxide and silicon nitride and a stack of hafnium oxide and silicon oxide can be used.
- the upper and lower sides of the stack are not limited.
- silicon nitride may be stacked on aluminum oxide, or aluminum oxide may be stacked on silicon nitride.
- zirconium oxide having a higher dielectric constant than the above materials may be used.
- zirconium oxide may be used as a single layer or as part of a stack.
- a stack of zirconium oxide and aluminum oxide can be used.
- the insulator 277 may be a stack of three layers, in which zirconium oxide is used for the first layer and the third layer, and aluminum oxide is used for the second layer between the first layer and the third layer. You may use.
- the area occupied by the capacitor 292B in the memory device 420B can be reduced. Therefore, the area required for the memory device 420B can be reduced, and the bit cost can be improved, which is preferable.
- the conductor 276 and the conductor 278 a material that can be used for the conductor 205, the conductor 242, the conductor 260, the conductor 424, or the like can be used.
- insulator 275 and the insulator 279 a material that can be used for the insulator 214, the insulator 216, the insulator 224, the insulator 280, or the like can be used.
- 16 illustrates an example in which the memory device 420 is electrically connected to the conductor 242b functioning as one of a source and a drain of the transistor 200T through the conductor 424, the conductor 205, the conductor 246b, and the conductor 240b. Showing.
- connection method between the memory device 420 and the transistor 200T can be determined depending on the function of the circuit included in the transistor layer 413.
- FIG. 17 illustrates an example in which the memory unit 470 includes a transistor layer 413 including the transistor 200T and four memory device layers 415 (memory device layers 415_1 to 415_4).
- Each of the memory device layers 415_1 to 415_4 includes a plurality of memory devices 420.
- the memory device 420 is electrically connected to the memory device 420 included in the different memory device layer 415 and the transistor 200T included in the transistor layer 413 through the conductor 424 and the conductor 205.
- the memory unit 470 is sealed with the insulator 211, the insulator 212, the insulator 214, the insulator 287, the insulator 282, the insulator 283, and the insulator 284.
- An insulator 274 is provided around the insulator 284.
- a conductor 430 is provided in the insulator 274, the insulator 284, the insulator 283, and the insulator 211, and is electrically connected to the element layer 411.
- An insulator 280 is provided inside the sealing structure.
- the insulator 280 has a function of releasing oxygen by heating.
- the insulator 280 has an excess oxygen region.
- the insulator 211, the insulator 283, and the insulator 284 are preferably made of a material having a function of blocking hydrogen.
- the insulator 214, the insulator 282, and the insulator 287 are preferably a material having a function of trapping hydrogen or fixing hydrogen.
- examples of the material having a function of blocking hydrogen with respect to hydrogen include silicon nitride, silicon nitride oxide, and the like.
- examples of the material having a function of trapping hydrogen or fixing hydrogen include aluminum oxide, hafnium oxide, oxides containing aluminum and hafnium (hafnium aluminate), and the like.
- the barrier property refers to a function of suppressing diffusion of a corresponding substance (also referred to as low permeability).
- the corresponding substance has a function of capturing and fixing (also referred to as gettering).
- a crystal structure of a material used for the insulator 211, the insulator 212, the insulator 214, the insulator 287, the insulator 282, the insulator 283, and the insulator 284 may be used.
- an amorphous aluminum oxide film is preferably used as a material having a function of capturing hydrogen or fixing hydrogen. Amorphous aluminum oxide may trap and fix hydrogen in a larger amount than aluminum oxide having high crystallinity.
- excess oxygen in the insulator 280 can be modeled as follows with respect to diffusion of hydrogen in the oxide semiconductor in contact with the insulator 280.
- Hydrogen existing in the oxide semiconductor diffuses into another structure through the insulator 280 which is in contact with the oxide semiconductor.
- excess oxygen in the insulator 280 reacts with hydrogen in the oxide semiconductor to form an OH bond and diffuses in the insulator 280.
- a hydrogen atom having an OH bond is an atom in the insulator 282 (e.g., a metal atom, etc.) when it reaches a material (typically, the insulator 282) having a function of trapping hydrogen or fixing hydrogen. ), and is trapped or fixed in the insulator 282.
- the oxygen atoms of the excess oxygen that had the OH bond are estimated to remain in the insulator 280 as excess oxygen. That is, it is highly possible that excess oxygen in the insulator 280 plays a bridging role in the diffusion of hydrogen.
- the manufacturing process of the memory device is one of the important factors.
- the insulator 280 having excess oxygen is formed over the oxide semiconductor, and then the insulator 282 is formed.
- heat treatment is preferably performed. Specifically, the heat treatment is performed in an atmosphere containing oxygen, an atmosphere containing nitrogen, or a mixed atmosphere of oxygen and nitrogen at a temperature of 350° C. or higher, preferably 400° C. or higher.
- the heat treatment time is 1 hour or longer, preferably 4 hours or longer, more preferably 8 hours or longer.
- the insulator 283 and the insulator 284 are materials having a function of high blocking property against hydrogen; therefore, hydrogen diffused outward or hydrogen existing outside can be stored inside, specifically, in an oxide semiconductor. Alternatively, it is possible to suppress the entry into the insulator 280 side.
- the above heat treatment is described as an example of the structure performed after the insulator 282 is formed; however, the invention is not limited to this.
- the above heat treatment may be performed after each of the transistor layer 413 and the memory device layers 415_1 to 415_4.
- hydrogen is diffused above or in the lateral direction of the transistor layer 413.
- heat treatment is performed after formation of the memory device layers 415_1 to 415_4, hydrogen is diffused upward or laterally.
- the insulator 211 and the insulator 283 are bonded to each other, whereby the above-described sealing structure is formed.
- a memory device including an oxide semiconductor with reduced hydrogen concentration can be provided. Therefore, a highly reliable storage device can be provided. Further, according to one embodiment of the present invention, a memory device having favorable electric characteristics can be provided.
- FIGS. 18A to 18C are diagrams showing different examples of the arrangement of the conductors 424.
- 18A is a layout diagram when the memory device 420 is viewed from above
- FIG. 18B is a cross-sectional view of a portion indicated by an alternate long and short dash line of A1-A2 in FIG. 18A
- FIG. 18C is B1- in FIG. 18A. It is sectional drawing of the site
- the conductor 424 is provided not only in a region overlapping with the oxide 230a and the oxide 230b but also outside the oxide 230a and the oxide 230b.
- FIG. 18A shows an example in which the conductor 424 is provided so as to extend to the B2 side of the oxide 230a and the oxide 230b, this embodiment is not limited to this.
- the conductor 424 may be provided so as to protrude to the B1 side of the oxide 230a and the oxide 230b, or so as to protrude to both the B1 side and the B2 side.
- 18B and 18C illustrate an example in which the memory device layer 415_p is stacked on the memory device layer 415_p-1 (p is a natural number of 2 or more and n or less).
- the memory device 420 included in the memory device layer 415_p-1 is electrically connected to the memory device 420 included in the memory device layer 415_p through the conductor 424 and the conductor 205.
- the conductor 424 is connected to the conductor 242 of the memory device layer 415_p-1 and the conductor 205 of the memory device layer 415_p.
- the conductor 424 is also connected to the conductor 205 of the memory device layer 415_p-1 outside the conductor 242, the oxide 243, the oxide 230b, and the oxide 230a on the B2 side.
- the conductor 424 is formed along the side surface of the conductor 242, the oxide 243, the oxide 230b, and the oxide 230a on the B2 side, and the insulator 280, the insulator 273, the insulator 272, and the insulator 224 are formed.
- the conductors 205 are electrically connected through the openings formed in the insulator 222.
- the state where the conductor 424 is provided along the side surface of the conductor 242, the oxide 243, the oxide 230b, and the oxide 230a on the B2 side is illustrated by a dotted line in FIG. 18B.
- an insulator 241 may be formed between the conductor 242, the oxide 243, the oxide 230b, the oxide 230a, the insulator 224, and a side surface of the insulator 222 on the B2 side and the conductor 424. ..
- the memory device 420 can be electrically connected to the memory devices 420 provided in different memory device layers 415.
- the memory device 420 can also be electrically connected to the transistor 200T provided in the transistor layer 413.
- the conductor 424 is a bit line
- the conductor 424 is also provided in a region which does not overlap with the conductor 242 or the like, whereby the distance between the bit lines of the memory devices 420 adjacent to each other in the B1-B2 direction can be increased. ..
- the spacing between the conductors 424 on the conductor 242 is d1, but the conductivity is located in a layer lower than the oxide 230a, that is, in the openings formed in the insulator 224 and the insulator 222.
- the distance between the bodies 424 is d2, and d2 is larger than d1.
- the parasitic capacitance of the conductor 424 can be reduced by setting a part of the distance to d2. It is preferable to reduce the parasitic capacitance of the conductor 424 because the capacitance required for the capacitor 292 can be reduced.
- a metal oxide that can be used for the OS transistor described in any of the above embodiments that is, a CAC-OS (Cloud-Aligned Composite Semiconductor) and a CAAC-OS (c-axis aligned crystal semiconductor). ) Will be described.
- CAC-OS Cloud-Aligned Composite Semiconductor
- CAAC-OS c-axis aligned crystal semiconductor
- the CAC-OS or the CAC-metal oxide has a conductive function in a part of the material and an insulating function in a part of the material, and the whole material has a function as a semiconductor.
- a conductive function is a function of flowing electrons (or holes) serving as carriers, and an insulating function is carrier. It is a function that does not flow electrons.
- the switching function On/Off function
- both functions can be maximized.
- the CAC-OS or CAC-metal oxide has a conductive region and an insulating region.
- the conductive region has the above-mentioned conductive function
- the insulating region has the above-mentioned insulating function.
- the conductive region and the insulating region may be separated at the nanoparticle level.
- the conductive region and the insulating region may be unevenly distributed in the material.
- the conductive region may be observed as the periphery is blurred and connected in a cloud shape.
- the conductive region and the insulating region are dispersed in the material in a size of 0.5 nm to 10 nm, preferably 0.5 nm to 3 nm. There is.
- the CAC-OS or CAC-metal oxide is composed of components having different band gaps.
- the CAC-OS or the CAC-metal oxide is composed of a component having a wide gap due to the insulating region and a component having a narrow gap due to the conductive region.
- the carrier when the carrier flows, the carrier mainly flows in the component having the narrow gap.
- the component having the narrow gap acts complementarily to the component having the wide gap, and the carrier also flows to the component having the wide gap in conjunction with the component having the narrow gap. Therefore, when the CAC-OS or CAC-metal oxide is used in the channel formation region of the transistor, a high current driving force, that is, a high on-current and a high field-effect mobility can be obtained in the on state of the transistor.
- the CAC-OS or the CAC-metal oxide can be referred to as a matrix composite material or a metal matrix composite material.
- the oxide semiconductor is classified into a single crystal oxide semiconductor and a non-single crystal oxide semiconductor other than the single crystal oxide semiconductor.
- the non-single-crystal oxide semiconductor include a CAAC-OS (c-axis aligned crystal oxide semiconductor), a polycrystalline oxide semiconductor, an nc-OS (nanocrystal oxide semiconductor), and a pseudo-amorphous oxide semiconductor (a-like oxide).
- OS amorphous-like oxide semiconductor (OS) and amorphous oxide semiconductors.
- FIG. 19A is a diagram illustrating classification of crystal structures of oxide semiconductors, typically IGZO (a metal oxide containing In, Ga, and Zn).
- IGZO a metal oxide containing In, Ga, and Zn
- IGZO is roughly classified into Amorphous, Crystalline, and Crystal.
- Amorphous includes completely amorphous.
- CALC c-axis aligned crystalline
- nc nanocrystalline
- CAC Cloud-Aligned Composite
- single crystal and poly crystal are included in Crystal.
- the structure in the thick frame shown in FIG. 19A is a structure belonging to New crystalline phase.
- the structure is in the boundary region between Amorphous and Crystal. That is, it can be said that the energy-unstable Amorphous and Crystalline are completely different structures.
- the crystal structure of the film or the substrate can be evaluated using an X-ray diffraction (XRD: X-Ray Diffraction) image.
- XRD X-ray diffraction
- FIGS. 19B and 19C XRD spectra of quartz glass and IGZO (also referred to as crystalline IGZO) having a crystal structure classified into Crystalline are shown in FIGS. 19B and 19C.
- FIG. 19B is a quartz glass
- FIG. 19C is an XRD spectrum of crystalline IGZO.
- the thickness of the crystalline IGZO shown in FIG. 19C is 500 nm.
- the peak of the XRD spectrum of quartz glass is almost symmetrical.
- crystalline IGZO has an asymmetric peak in the XRD spectrum.
- the asymmetric peak in the XRD spectrum is evidence of the presence of crystals. In other words, unless the peak of the XRD spectrum is symmetrical, it cannot be said to be Amorphous.
- the CAAC-OS has a crystal structure having c-axis orientation and a plurality of nanocrystals connected in the ab plane direction and having strain.
- the strain refers to a portion where the orientation of the lattice arrangement is changed between a region where the lattice arrangement is uniform and another region where the lattice arrangement is uniform in the region where a plurality of nanocrystals are connected.
- the nanocrystal is basically a hexagon, but is not limited to a regular hexagon, and may be a non-regular hexagon.
- the strain may have a lattice arrangement such as a pentagon and a heptagon.
- a clear crystal grain boundary also referred to as a grain boundary
- the distortion of the lattice arrangement suppresses the formation of crystal grain boundaries. This is because the CAAC-OS can tolerate strain due to the fact that the arrangement of oxygen atoms is not dense in the ab plane direction, the bond distance between atoms changes due to substitution with a metal element, or the like. It is thought to be because.
- the crystal structure in which a clear grain boundary is confirmed is called a so-called polycrystal.
- the crystal grain boundaries serve as recombination centers, and carriers are likely to be trapped to cause a decrease in on-state current of the transistor or a decrease in field-effect mobility. Therefore, the CAAC-OS in which clear crystal grain boundaries are not confirmed is one of crystalline oxides having a crystal structure suitable for a semiconductor layer of a transistor.
- a structure containing Zn is preferable for forming the CAAC-OS.
- In—Zn oxide and In—Ga—Zn oxide are preferable because they can suppress generation of crystal grain boundaries more than In oxide.
- the CAAC-OS is a layered crystal in which a layer containing indium and oxygen (hereinafter, an In layer) and a layer containing elements M, zinc, and oxygen (hereinafter, a (M,Zn) layer) are stacked. It tends to have a structure (also called a layered structure).
- indium and the element M can be replaced with each other, and when the element M of the (M,Zn) layer is replaced with indium, it can be expressed as an (In,M,Zn) layer. Further, when the indium in the In layer is replaced with the element M, it can be expressed as an (In,M) layer.
- the CAAC-OS is an oxide semiconductor with high crystallinity.
- a clear crystal grain boundary cannot be confirmed; therefore, it can be said that a decrease in electron mobility due to the crystal grain boundary does not easily occur.
- the crystallinity of an oxide semiconductor might be lowered due to entry of impurities, generation of defects, or the like; therefore, the CAAC-OS can be referred to as an oxide semiconductor with few impurities and defects (such as oxygen vacancies). Therefore, the oxide semiconductor including the CAAC-OS has stable physical properties. Therefore, the oxide semiconductor including the CAAC-OS is highly heat resistant and highly reliable. Further, the CAAC-OS is stable even at a high temperature (so-called thermal budget) in the manufacturing process. Therefore, when the CAAC-OS is used for the OS transistor, the degree of freedom in the manufacturing process can be increased.
- the nc-OS has a periodic atomic arrangement in a minute region (for example, a region of 1 nm or more and 10 nm or less, particularly a region of 1 nm or more and 3 nm or less). Moreover, in the nc-OS, no regularity is found in the crystal orientation between different nanocrystals. Therefore, the orientation is not seen in the entire film. Therefore, the nc-OS may be indistinguishable from the a-like OS or the amorphous oxide semiconductor depending on the analysis method.
- the a-like OS is an oxide semiconductor having a structure between the nc-OS and the amorphous oxide semiconductor.
- the a-like OS has a void or a low density region. That is, the crystallinity of the a-like OS is lower than that of the nc-OS and the CAAC-OS.
- Oxide semiconductors have various structures and have different characteristics.
- the oxide semiconductor of one embodiment of the present invention may include two or more of an amorphous oxide semiconductor, a polycrystalline oxide semiconductor, an a-like OS, an nc-OS, and a CAAC-OS.
- An oxide semiconductor having a low carrier density is preferably used for the transistor.
- the concentration of impurities in the oxide semiconductor film may be lowered and the density of defect states may be lowered.
- low impurity concentration and low defect level density are referred to as high-purity intrinsic or substantially high-purity intrinsic.
- a highly purified intrinsic or substantially highly purified intrinsic oxide semiconductor film has a low density of defect states and thus has a low density of trap states in some cases.
- the charge trapped in the trap level of the oxide semiconductor takes a long time to disappear and may behave like fixed charge. Therefore, a transistor in which a channel formation region is formed in an oxide semiconductor with a high trap level density might have unstable electrical characteristics.
- Impurities include hydrogen, nitrogen, alkali metals, alkaline earth metals, iron, nickel, silicon and the like.
- the concentration of silicon or carbon in the oxide semiconductor and the concentration of silicon or carbon in the vicinity of the interface with the oxide semiconductor (the concentration obtained by secondary ion mass spectrometry (SIMS) are 2) It is set to be not more than ⁇ 10 18 atoms/cm 3 , preferably not more than 2 ⁇ 10 17 atoms/cm 3 .
- the oxide semiconductor contains an alkali metal or an alkaline earth metal
- a defect level might be formed and a carrier might be generated. Therefore, a transistor including an oxide semiconductor containing an alkali metal or an alkaline earth metal is likely to have normally-on characteristics. Therefore, it is preferable to reduce the concentration of alkali metal or alkaline earth metal in the oxide semiconductor.
- the concentration of alkali metal or alkaline earth metal in the oxide semiconductor obtained by SIMS is 1 ⁇ 10 18 atoms/cm 3 or less, preferably 2 ⁇ 10 16 atoms/cm 3 or less.
- the nitrogen concentration in the oxide semiconductor is less than 5 ⁇ 10 19 atoms/cm 3 in SIMS, preferably 5 ⁇ 10 18 atoms/cm 3 or less, more preferably 1 ⁇ 10 18 atoms/cm 3 or less, further It is preferably 5 ⁇ 10 17 atoms/cm 3 or less.
- the oxide semiconductor reacts with oxygen bonded to a metal atom to be water, which might cause oxygen deficiency.
- oxygen vacancies electrons that are carriers may be generated.
- part of hydrogen may be bonded to oxygen which is bonded to a metal atom to generate an electron which is a carrier. Therefore, a transistor including an oxide semiconductor containing hydrogen is likely to have normally-on characteristics. Therefore, it is preferable that hydrogen in the oxide semiconductor be reduced as much as possible.
- the hydrogen concentration obtained by SIMS is less than 1 ⁇ 10 20 atoms/cm 3 , preferably less than 1 ⁇ 10 19 atoms/cm 3 , and more preferably 5 ⁇ 10 18 atoms/cm 3. It is less than 3 , more preferably less than 1 ⁇ 10 18 atoms/cm 3 .
- FIG. 20A shows a perspective view of electronic component 700 and a substrate (mounting substrate 704) on which electronic component 700 is mounted.
- An electronic component 700 shown in FIG. 20A has a memory device 10A in which a device layer 34 is laminated on a semiconductor substrate 11 in a mold 711.
- the electronic component 700 has a land 712 outside the mold 711.
- the land 712 is electrically connected to the electrode pad 713, and the electrode pad 713 is electrically connected to the memory device 10A by the wire 714.
- the electronic component 700 is mounted on the printed board 702, for example. A plurality of such electronic components are combined and electrically connected to each other on the printed board 702, whereby the mounting board 704 is completed.
- FIG. 20B shows a perspective view of the electronic component 730.
- the electronic component 730 is an example of SiP (System in Package) or MCM (Multi Chip Module).
- an interposer 731 is provided on a package board 732 (printed board), and a semiconductor device 735 and a plurality of storage devices 10A are provided on the interposer 731.
- the electronic component 730 shows an example in which the storage device 10A is used as a wide band memory (HBM: High Bandwidth Memory).
- HBM High Bandwidth Memory
- an integrated circuit semiconductor device
- a CPU central processing unit
- a GPU graphics processing unit
- FPGA field-programmable gate array
- the package substrate 732 a ceramic substrate, a plastic substrate, a glass epoxy substrate, or the like can be used.
- the interposer 731 a silicon interposer, a resin interposer, or the like can be used.
- the interposer 731 has a plurality of wirings and has a function of electrically connecting a plurality of integrated circuits having different terminal pitches.
- the plurality of wirings are provided in a single layer or a multilayer.
- the interposer 731 has a function of electrically connecting an integrated circuit provided over the interposer 731 to an electrode provided over the package substrate 732.
- an interposer may be called a "redistribution board" or an "intermediate board.”
- a through electrode may be provided in the interposer 731 and the integrated circuit and the package substrate 732 may be electrically connected using the through electrode.
- TSV Three Silicon Via
- the interposer 731 It is preferable to use a silicon interposer as the interposer 731. Since the silicon interposer does not require an active element, it can be manufactured at a lower cost than an integrated circuit. On the other hand, since the wiring of the silicon interposer can be formed by a semiconductor process, it is easy to form fine wiring, which is difficult with the resin interposer.
- the interposer on which the HBM is mounted is required to have fine and high-density wiring. Therefore, it is preferable to use the silicon interposer as the interposer for mounting the HBM.
- the reliability is less likely to decrease due to the difference in expansion coefficient between the integrated circuit and the interposer.
- the silicon interposer has a high surface flatness, a defective connection between the integrated circuit provided on the silicon interposer and the silicon interposer is unlikely to occur.
- a 2.5D package 2.5-dimensional mounting
- a heat sink heat dissipation plate
- the heights of the integrated circuits provided on the interposer 731 are uniform.
- the memory device 10A and the semiconductor device 735 have the same height.
- An electrode 733 may be provided on the bottom of the package substrate 732 to mount the electronic component 730 on another substrate.
- FIG. 20B shows an example in which the electrode 733 is formed of a solder ball.
- BGA Ball Grid Array
- the electrode 733 may be formed of a conductive pin.
- PGA Peripheral Component Interconnect
- the electronic component 730 can be mounted on another substrate using various mounting methods other than BGA and PGA.
- SPGA Sttaggered Pin Grid Array
- LGA Land Grid Array
- QFP Quad Flat Package
- QFJ Quad Flat J-leaded package
- QFN Quad on-Flade
- QFN Quad-on-Flade
- the robot 7100 includes an illuminance sensor, a microphone, a camera, a speaker, a display, various sensors (infrared sensor, ultrasonic sensor, acceleration sensor, piezo sensor, optical sensor, gyro sensor, etc.), a moving mechanism, and the like.
- the electronic component 730 has a processor and the like and has a function of controlling these peripheral devices.
- the electronic component 700 has a function of storing data acquired by the sensor.
- the microphone has a function of detecting acoustic signals such as a user's voice and environmental sounds.
- the speaker has a function of emitting audio signals such as voice and warning sound.
- the robot 7100 can analyze an audio signal input via a microphone and emit a necessary audio signal from a speaker.
- the robot 7100 can communicate with the user using a microphone and a speaker.
- the camera has a function of capturing an image around the robot 7100.
- the robot 7100 has a function of moving using a moving mechanism.
- the robot 7100 can capture an image of the surroundings using a camera, analyze the image, and detect the presence or absence of an obstacle when moving.
- Aircraft 7120 has a propeller, a camera, a battery, and the like, and has a function of autonomously flying.
- the electronic component 730 has a function of controlling these peripheral devices.
- the image data captured by the camera is stored in the electronic component 700.
- the electronic component 730 can analyze the image data and detect the presence or absence of an obstacle when moving. Further, the electronic component 730 can estimate the remaining battery level from the change in the storage capacity of the battery.
- the cleaning robot 7140 has a display arranged on the upper surface, a plurality of cameras arranged on the side surface, a brush, operation buttons, various sensors, and the like. Although not shown, the cleaning robot 7140 includes tires, a suction port, and the like. The cleaning robot 7140 is self-propelled, can detect dust, and can suck the dust from the suction port provided on the lower surface.
- the electronic component 730 can analyze an image captured by the camera and determine the presence or absence of an obstacle such as a wall, furniture, or a step. Further, when the image analysis detects an object such as wiring that is likely to be entangled with the brush, the rotation of the brush can be stopped.
- the automobile 7160 has an engine, tires, brakes, a steering device, a camera, and the like.
- the electronic component 730 performs control for optimizing the traveling state of the automobile 7160 based on data such as navigation information, speed, engine state, gear selection state, and brake use frequency.
- the image data captured by the camera is stored in the electronic component 700.
- the electronic component 700 and/or the electronic component 730 can be incorporated in the TV device 7200 (television receiver), smartphone 7210, PC (personal computer) 7220, 7230, game machine 7240, game machine 7260, and the like.
- the electronic component 730 built in the TV device 7200 can function as an image engine.
- the electronic component 730 performs image processing such as noise removal and resolution up conversion.
- the smartphone 7210 is an example of a mobile information terminal.
- the smartphone 7210 has a microphone, a camera, a speaker, various sensors, and a display unit.
- the electronic component 730 controls these peripheral devices.
- the PC 7220 and the PC 7230 are examples of a notebook PC and a stationary PC, respectively.
- a keyboard 7232 and a monitor device 7233 can be connected to the PC 7230 wirelessly or by wire.
- the game machine 7240 is an example of a portable game machine.
- the game machine 7260 is an example of a stationary game machine.
- a controller 7262 is connected to the game machine 7260 wirelessly or by wire. Electronic component 700 and/or electronic component 730 may also be incorporated into controller 7262.
- FIG. 22 shows various storage devices layer by layer.
- a storage device located in the upper layer is required to have a high access speed, and a storage device located in the lower layer is required to have a large storage capacity and a high recording density.
- a memory, an SRAM (Static Random Access Memory), a DRAM, and a 3D NAND memory that are mixedly mounted as a register in an arithmetic processing device such as a CPU are shown in order from the uppermost layer.
- a memory that is mixedly mounted as a register in an arithmetic processing device such as a CPU is used for temporary storage of arithmetic results, and thus is frequently accessed from the arithmetic processing device. Therefore, an operation speed faster than the storage capacity is required.
- the register also has a function of holding setting information of the arithmetic processing unit.
- the SRAM is used for a cache, for example.
- the cache has a function of copying a part of the information held in the main memory and holding it. By copying frequently used data in the cache, the access speed to the data can be increased.
- the DRAM is used as, for example, a main memory.
- the main memory has a function of holding a program or data read from the storage.
- the recording density of DRAM is about 0.1 to 0.3 Gbit/mm 2 .
- the 3D NAND memory is used for storage, for example.
- the storage has a function of holding data that needs to be stored for a long time, various programs used in the arithmetic processing device, and the like. Therefore, the storage is required to have a storage capacity larger than the operating speed and a high recording density.
- the storage density of the storage device used for storage is approximately 0.6 to 6.0 Gbit/mm 2 .
- the storage device according to one embodiment of the present invention has high operating speed and can hold data for a long time.
- the storage device according to one embodiment of the present invention can be suitably used as a storage device located in the boundary area 901 including both the hierarchy where the cache is located and the hierarchy where the main memory is located. Further, the storage device according to one embodiment of the present invention can be preferably used as a storage device located in the boundary area 902 including both the hierarchy where the main memory is located and the hierarchy where the storage is located.
Abstract
Description
図2は、記憶装置の構成例を示す模式図である。
図3は、記憶装置の構成例を示す回路図である。
図4は、記憶装置の構成例を示す模式図である。
図5A、図5Bは、記憶装置の構成例を示す模式図である。
図6Aは、検査ビット生成回路の構成例を示す回路図である。図6Bは、タイミングチャートである。図6Cは、真理値表である。
図7Aは、エラー検出回路の構成例を示す回路図である。図7Bは、タイミングチャートである。
図8は、真理値表である。
図9Aは、XOR回路を表すシンボルである。図9Bは、XOR回路の構成例を示す回路図である。
図9Cは、タイミングチャートである。図9Dは、真理値表である。
図10Aは、NAND回路を表すシンボルである。図10Bは、NAND回路の構成例を示す回路図である。図10Cは、タイミングチャートである。図10Dは、真理値表である。
図11Aは、ディレイ回路を表すシンボルである。図11Bは、ディレイ回路の構成例を示す回路図である。図11Cは、タイミングチャートである。図11Dは、真理値表である。
図12は、記憶装置の構成例を示す模式図である。
図13は、記憶装置の構成例を示す断面模式図である。
図14A、図14Bは、トランジスタの構成例を示す断面模式図である。
図15A乃至図15Cは、記憶装置の構成例を示す断面模式図である。
図16は、記憶装置の構成例を示す断面模式図である。
図17は、記憶装置の構成例を示す断面模式図である。
図18Aは、記憶装置の構成例を示す上面図である。図18B、図18Cは、記憶装置の構成例を示す断面模式図である。
図19Aは、IGZOの結晶構造の分類を説明する図である。図19Bは、石英ガラスのXRDスペクトルを説明する図である。図19Cは、結晶性IGZOのXRDスペクトルを説明する図である。
図20A、図20Bは、電子部品の一例を説明する模式図である。
図21は、電子機器の例を示す図である。
図22は、各種の記憶装置を階層ごとに示す図である。
本発明の一形態の記憶装置の構成例について、図1乃至図11を用いて説明する。本発明の一形態の記憶装置は、半導体特性を利用することで機能しうる記憶装置であり、メモリとも呼ばれている。
図1Aは、本発明の一形態である、記憶装置10Aの構成例を示すブロック図である。なお、本明細書等で説明する図面においては、主な信号の流れを矢印または線で示しており、電源線等は省略する場合がある。
図1Aで説明した各構成において、素子層34_1乃至34_N、および素子層26について説明するため、記憶装置10Aの構成例を示す模式図を、図1Bに示す。図1Bに示す模式図は、図1Aで説明した各構成の配置を説明するため、x軸、y軸、z軸方向を規定した斜視図である。
図2では、図1Aおよび図1Bを用いて説明した、記憶装置10Aの垂直方向(z軸方向)に平行な一断面の模式図について示す。
図6Aは、検査ビット生成回路54の構成例を示す回路図である。検査ビット生成回路54は、XOR回路53_1乃至XOR回路53_3を有する。なお、XOR回路53の構成例は後述する。
図9Aは、XOR回路53を表すシンボルであり、図9Bは、XOR回路53の構成例を示す回路図である。図9Bに示すように、XOR回路53は、NAND回路51_1乃至NAND回路51_4、ディレイ回路52_1、および、ディレイ回路52_2を有する。また、XOR回路53は、入力端子D、入力端子E、および、制御信号S_C5乃至制御信号S_C8が入力される入力端子C5乃至入力端子C8を有し、出力端子Zから信号を出力する。
本発明の一形態の記憶装置は、各素子層に設けられるトランジスタとして、オフ電流が非常に小さいOSトランジスタを用いる。OSトランジスタは、例えば、Siトランジスタが設けられるシリコン基板上に積層して設けることができるため、垂直方向に繰り返し同じ製造工程を用いて作製することができ、製造コストの低減を図ることができる。また、本発明の一形態の記憶装置は、メモリセルを構成するトランジスタを平面方向ではなく、垂直方向に配置してメモリ密度の向上を図ることができ、記憶装置の小型化を図ることができる。
本実施の形態では、上記実施の形態1で説明した記憶装置10Aに適用可能な回路の変形例について、図12を用いて説明する。
以下では、本発明の一態様に係る記憶装置の一例について説明する。
そこで、外部からの不純物混入を抑制するために、不純物の拡散を抑制する材料(以下、不純物に対するバリア性材料ともいう)を用いて、トランジスタ200を封止するとよい。
図14Aを用いて、トランジスタ層413が有するトランジスタ200T、およびメモリデバイス420が有するトランジスタ200Mに用いることができるトランジスタ200について説明する。
酸化物230として、酸化物半導体として機能する金属酸化物を用いることが好ましい。以下では、本発明に係る酸化物230に適用可能な金属酸化物について説明する。
図14Bを用いてトランジスタ300を説明する。トランジスタ300は、半導体基板311上に設けられ、ゲートとして機能する導電体316、ゲート絶縁体として機能する絶縁体315、半導体基板311の一部からなる半導体領域313、およびソース領域またはドレイン領域として機能する低抵抗領域314a、および低抵抗領域314bを有する。トランジスタ300は、pチャネル型、あるいはnチャネル型のいずれでもよい。
次に、図13に示すメモリデバイス420について、図15Aを用いて説明する。なお、メモリデバイス420が有するトランジスタ200Mについて、トランジスタ200と重複する説明は省略する。
次に、図15Bを用いて、メモリデバイス420の変形例として、メモリデバイス420Aを説明する。メモリデバイス420Aは、トランジスタ200Mと、トランジスタ200Mと電気的に接続する容量292Aを有する。容量292Aは、トランジスタ200Mの下方に設けられる。
次に、図15Cを用いて、メモリデバイス420の変形例として、メモリデバイス420Bを説明する。メモリデバイス420Bは、トランジスタ200Mと、トランジスタ200Mと電気的に接続する容量292Bを有する。容量292Bは、トランジスタ200Mの上方に設けられる。
図13において一点鎖線で囲んだ領域422にて、メモリデバイス420は、導電体424および導電体205を介してトランジスタ200Tのゲートと電気的に接続されているが、本実施の形態はこれに限らない。
本実施の形態では、上記実施の形態で説明したOSトランジスタに用いることができる金属酸化物である、CAC−OS(Cloud−Aligned Composite oxide semiconductor)、およびCAAC−OS(c−axis aligned crystalline oxide semiconductor)の構成について説明する。
CAC−OSまたはCAC−metal oxideとは、材料の一部では導電性の機能と、材料の一部では絶縁性の機能とを有し、材料の全体では半導体としての機能を有する。なお、CAC−OSまたはCAC−metal oxideを、トランジスタのチャネル形成領域に用いる場合、導電性の機能は、キャリアとなる電子(またはホール)を流す機能であり、絶縁性の機能は、キャリアとなる電子を流さない機能である。導電性の機能と、絶縁性の機能とを、それぞれ相補的に作用させることで、スイッチングさせる機能(On/Offさせる機能)をCAC−OSまたはCAC−metal oxideに付与することができる。CAC−OSまたはCAC−metal oxideにおいて、それぞれの機能を分離させることで、双方の機能を最大限に高めることができる。
酸化物半導体は、単結晶酸化物半導体と、それ以外の非単結晶酸化物半導体と、に分けられる。非単結晶酸化物半導体としては、例えば、CAAC−OS(c−axis aligned crystalline oxide semiconductor)、多結晶酸化物半導体、nc−OS(nanocrystalline oxide semiconductor)、擬似非晶質酸化物半導体(a−like OS:amorphous−like oxide semiconductor)および非晶質酸化物半導体などがある。
続いて、上記酸化物半導体をトランジスタに用いる場合について説明する。
ここで、酸化物半導体中における各不純物の影響について説明する。
本実施の形態は、上記実施の形態に示す記憶装置などが組み込まれた電子部品および電子機器の一例を示す。
まず、記憶装置10A等が組み込まれた電子部品の例を、図20Aおよび図20Bを用いて説明を行う。
次に、上記電子部品を備えた電子機器の例について図21を用いて説明を行う。
一般に、コンピュータなどの半導体装置では、用途に応じて様々な記憶装置(メモリ)が用いられる。図22に、各種の記憶装置を階層ごとに示す。上層に位置する記憶装置ほど速いアクセス速度が求められ、下層に位置する記憶装置ほど大きな記憶容量と高い記録密度が求められる。図22では、最上層から順に、CPUなどの演算処理装置にレジスタとして混載されるメモリ、SRAM(Static Random Access Memory)、DRAM、3D NANDメモリを示している。
Claims (9)
- メモリセルを有する第1素子層と、
エラー検出回路を有する第2素子層と、
駆動回路を有する半導体基板と、を有し、
前記第2素子層は、前記半導体基板と前記第1素子層との間に設けられる、記憶装置。 - 複数の第1素子層と、
エラー検出回路を有する第2素子層と、
駆動回路を有する半導体基板と、を有し、
前記第2素子層は、前記半導体基板と前記第1素子層との間に設けられ、
前記複数の第1素子層は、それぞれ、メモリセルを有し、
前記複数の第1素子層は、それぞれ積層して設けられる、記憶装置。 - 請求項1または請求項2において、
前記メモリセルを構成するトランジスタ、および、前記エラー検出回路を構成するトランジスタは、それぞれ、チャネル形成領域に金属酸化物を有する、記憶装置。 - 請求項1または請求項2において、
前記メモリセルを構成するトランジスタ、および、前記エラー検出回路を構成するトランジスタは、それぞれ、フロントゲートと、バックゲートとを有する、記憶装置。 - 請求項1または請求項2において、
前記メモリセルを構成するトランジスタ、および、前記エラー検出回路を構成するトランジスタは、それぞれ、チャネル形成領域に金属酸化物を有し、
前記メモリセルを構成するトランジスタ、および、前記エラー検出回路を構成するトランジスタは、それぞれ、フロントゲートと、バックゲートとを有する、記憶装置。 - 第1乃至第Nの第1素子層(Nは2以上の自然数)と、
第2素子層と、
半導体基板と、を有し、
前記第K(Kは1以上N以下の整数)の第1素子層には、前記第Kの第1素子層に形成されたトランジスタを用いて、メモリセルが構成され、
前記第2素子層には、前記第2素子層に形成されたトランジスタを用いて、エラー検出回路が構成され、
前記半導体基板には、前記半導体基板に形成されたトランジスタを用いて、駆動回路が構成され、
前記第2素子層は、前記半導体基板の上方に積層して設けられ、
前記第1の第1素子層は、前記第2素子層の上方に積層して設けられ、
前記第L(Lは2以上N以下の整数)の第1素子層は、前記第L−1の第1素子層の上方に積層して設けられる、記憶装置。 - 請求項6において、
前記第Kの第1素子層に形成されたトランジスタ、および、前記第2素子層に形成されたトランジスタは、それぞれ、チャネル形成領域に金属酸化物を有する、記憶装置。 - 請求項6において、
前記第Kの第1素子層に形成されたトランジスタ、および、前記第2素子層に形成されたトランジスタは、それぞれ、フロントゲートと、バックゲートとを有する、記憶装置。 - 請求項6において、
前記第Kの第1素子層に形成されたトランジスタ、および、前記第2素子層に形成されたトランジスタは、それぞれ、チャネル形成領域に金属酸化物を有し、
前記第Kの第1素子層に形成されたトランジスタ、および、前記第2素子層に形成されたトランジスタは、それぞれ、フロントゲートと、バックゲートとを有する、記憶装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US17/419,745 US20220085019A1 (en) | 2019-02-22 | 2020-02-11 | Memory device having error detection function, semiconductor device, and electronic device |
JP2021501130A JPWO2020170069A1 (ja) | 2019-02-22 | 2020-02-11 | |
KR1020217028191A KR20210130734A (ko) | 2019-02-22 | 2020-02-11 | 오류 검출 기능을 가지는 기억 장치, 반도체 장치, 및 전자 기기 |
CN202080014345.6A CN113424310A (zh) | 2019-02-22 | 2020-02-11 | 具有错误检测功能的存储装置、半导体装置以及电子设备 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019-030525 | 2019-02-22 | ||
JP2019030525 | 2019-02-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2020170069A1 true WO2020170069A1 (ja) | 2020-08-27 |
Family
ID=72144818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2020/051043 WO2020170069A1 (ja) | 2019-02-22 | 2020-02-11 | エラー検出機能を有する記憶装置、半導体装置、および、電子機器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20220085019A1 (ja) |
JP (1) | JPWO2020170069A1 (ja) |
KR (1) | KR20210130734A (ja) |
CN (1) | CN113424310A (ja) |
WO (1) | WO2020170069A1 (ja) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130044538A1 (en) * | 2011-08-16 | 2013-02-21 | Hyung-Rok Oh | Stacked mram device and memory system having the same |
JP2016164780A (ja) * | 2015-02-26 | 2016-09-08 | 株式会社半導体エネルギー研究所 | メモリシステム、および情報処理システム |
JP2016224932A (ja) * | 2015-05-26 | 2016-12-28 | 株式会社半導体エネルギー研究所 | メモリシステム、及び情報処理システム |
US20170148514A1 (en) * | 2015-11-19 | 2017-05-25 | Samsung Electronics Co., Ltd. | Nonvolatile memory modules and electronic devices having the same |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012256821A (ja) | 2010-09-13 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 記憶装置 |
US9013921B2 (en) * | 2012-12-06 | 2015-04-21 | Samsung Electronics Co., Ltd. | Semiconductor memory device |
US9362007B2 (en) * | 2013-06-20 | 2016-06-07 | Samsung Electronics Co., Ltd. | Semiconductor memory device |
US9424953B2 (en) * | 2013-06-20 | 2016-08-23 | Samsung Electronics Co., Ltd. | Semiconductor memory device including repair circuit |
JP2015053096A (ja) * | 2013-09-09 | 2015-03-19 | マイクロン テクノロジー, インク. | 半導体装置、及び誤り訂正方法 |
US9583177B2 (en) * | 2014-12-10 | 2017-02-28 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and semiconductor device including memory device |
US9728243B2 (en) * | 2015-05-11 | 2017-08-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device or electronic component including the same |
KR102336458B1 (ko) * | 2015-07-30 | 2021-12-08 | 삼성전자주식회사 | 고속으로 결함 비트 라인을 검출하는 불휘발성 메모리 장치 및 그것의 테스트 시스템 |
US10097207B2 (en) * | 2016-03-10 | 2018-10-09 | Toshiba Memory Corporation | ECC circuit, storage device and memory system |
KR102636039B1 (ko) * | 2016-05-12 | 2024-02-14 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 그것의 읽기 방법 및 카피백 방법 |
US10263119B2 (en) * | 2016-09-23 | 2019-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Programmable device with high reliability for a semiconductor device, display system, and electronic device |
KR102648774B1 (ko) * | 2016-11-10 | 2024-03-19 | 에스케이하이닉스 주식회사 | 랜더마이즈 동작을 수행하는 반도체 메모리 장치 |
-
2020
- 2020-02-11 CN CN202080014345.6A patent/CN113424310A/zh active Pending
- 2020-02-11 KR KR1020217028191A patent/KR20210130734A/ko unknown
- 2020-02-11 WO PCT/IB2020/051043 patent/WO2020170069A1/ja active Application Filing
- 2020-02-11 US US17/419,745 patent/US20220085019A1/en active Pending
- 2020-02-11 JP JP2021501130A patent/JPWO2020170069A1/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130044538A1 (en) * | 2011-08-16 | 2013-02-21 | Hyung-Rok Oh | Stacked mram device and memory system having the same |
JP2016164780A (ja) * | 2015-02-26 | 2016-09-08 | 株式会社半導体エネルギー研究所 | メモリシステム、および情報処理システム |
JP2016224932A (ja) * | 2015-05-26 | 2016-12-28 | 株式会社半導体エネルギー研究所 | メモリシステム、及び情報処理システム |
US20170148514A1 (en) * | 2015-11-19 | 2017-05-25 | Samsung Electronics Co., Ltd. | Nonvolatile memory modules and electronic devices having the same |
Also Published As
Publication number | Publication date |
---|---|
US20220085019A1 (en) | 2022-03-17 |
KR20210130734A (ko) | 2021-11-01 |
JPWO2020170069A1 (ja) | 2020-08-27 |
CN113424310A (zh) | 2021-09-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7429686B2 (ja) | 半導体装置 | |
JP7439215B2 (ja) | 半導体装置 | |
JP7459079B2 (ja) | 半導体装置 | |
JP7462575B2 (ja) | 半導体装置 | |
WO2020157553A1 (ja) | 記憶装置 | |
JP7117322B2 (ja) | 半導体装置 | |
WO2020157558A1 (ja) | 記憶装置、半導体装置、および、電子機器 | |
WO2017134495A1 (ja) | 金属酸化物膜、半導体装置、及び半導体装置の作製方法 | |
WO2020170067A1 (ja) | 半導体装置および当該半導体装置を有する電気機器 | |
WO2020170069A1 (ja) | エラー検出機能を有する記憶装置、半導体装置、および、電子機器 | |
WO2020245697A1 (ja) | 半導体装置 | |
JP6942612B2 (ja) | 記憶装置、半導体ウエハ、電子機器 | |
KR20240015740A (ko) | 반도체 장치, 전자 부품, 및 전자 기기 | |
WO2023156875A1 (ja) | 記憶装置 | |
JP7417596B2 (ja) | 半導体装置 | |
JP7467430B2 (ja) | 記憶装置 | |
JP7344904B2 (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 20759486 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2021501130 Country of ref document: JP Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
ENP | Entry into the national phase |
Ref document number: 20217028191 Country of ref document: KR Kind code of ref document: A |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 20759486 Country of ref document: EP Kind code of ref document: A1 |